Keithley 4200-SCS Reference Manual page 444

Section 6: Keithley Interactive Test Environment (KITE)
• Segment stress/measure
stressing (Segment ARB
• Stress is provided by a Segment ARB waveform generated by a pulse generator card.
• DC bias voltage and current limit for the device can be provided by the SMUs in the
NOTE
Figure 6-373
Test data example for an individual test: four cycles
Click to display
Cycle 1 data
Cycle Mode
In the Cycle Mode, KITE repeatedly cycles through the subsite tests with no stressing. The user
specifies the number of cycles to be performed. Assume a test sequence for a subsite plan that is
made up of three tests.
test is run four times.
6-318
between the internal pulse cards and other supported external pulse instruments, a
Keithley pulse card may also be referred to as a VPU (or Voltage Pulse Unit)
®
Each channel of the pulse generator card can stress one device terminal.
system.
Only Cycle Mode is supported with 4225-RPMs in the system. The Stress/Measure
and Segment Stress/Measure modes are not supported if RPMs are in the system. To
run Stress/Measure and Segment Stress/Measure modes, all RPMs must be
disconnected from the 4200-SCS and you must update the RPM configuration in
KCON (see Tools > Update DC Preamp and RPM Configuration
Figure 6-374
Return to
mode: This mode performs tests and also provides device
waveform stress):
shows a four-cycle sequence for those tests. As shown, each
Section Topics
Model 4200-SCS Reference Manual
in Section 7).
Click to display
Cycle 2 data
Click to display
Cycle 3 data
Click to display
Cycle 4 data
4200-901-01 Rev. S / May 2017