Combined Stressing And Testing - Keithley 4200-SCS Reference Manual

Model 4200-SCS Reference Manual

Combined stressing and testing

Figure 6-380
Figure
Figure 6-380
Example of combined stressing and testing
a) Continue with stress and test cycles (3,4,...n) until a device degrades to all enabled target values or goes into compliance.
b) Stop testing this device, but continue stress and test cycles until another device degrades to all target values or goes into compliance.
c) Stop testing this second device, but continue stress and test cycles as in steps a and b until one of following occurs: all devices have
either degraded to target values or gone into compliance OR total stress time reaches a user-specified value, whichever comes first.
NOTE
4200-901-01 Rev. S / May 2017
summarizes an HCI evaluation, for the stressing configuration shown in
6-377A. Similar operations apply to other types of stress-measure studies.
Automatically connect the needed SMUs to Device 1, via the switch matrix.
Perform pre-stress parametric tests on each device individually, in device-number sequence
Test Device #1
1. Disconnect
Device #1
Q1 SMU5
2. Connect
SMU2
SMU1
Device #2
Automatically connect all devices to SMUs, via the switch matrix, as determined by the drain
and gate voltages that were specified for each device.
SMU5 SMU6
SMU1 SMU2
Automatically connect the needed SMUs to Device 1, via the switch matrix.
10 second time delay (to promote uniform pre-test decay for all devices).
Test Cycle 1. Perform post-stress parametric tests on each device individually, in device-number sequence.
Test Device #1
1. Disconnect
Device #1
Q1 SMU5
2. Connect
SMU2
SMU1
Device #2
For information about Reliability Stress Measure testing, refer to Section 3 of the User
Manual, "How to perform reliability (stress-measure) tests on my
Return to
Section 6: Keithley Interactive Test Environment (KITE)
Test Device #2
Q2 SMU5
SMU2
SMU1
Disconnect all devices.
Stress Cycle 1. Stress all of the devices simultaneously.
Disconnect all devices.
Test Device #2
Q2 SMU5
SMU2
SMU1
a) Disconnect all devices.
b) Reconnect all devices for stress cycle 2.
c) Perform stress cycle 2.
a) Disconnect all devices.
b) Reconnect all devices for test cycle 2.
c) 10 second time delay.
d) Perform test cycle 2.
Section Topics
1. Disconnect
Device #19
2. Connect
SMU1
Device #20
SMU7 SMU8
SMU3 SMU4
1. Disconnect
Device #19
2. Connect
SMU1
Device #20
device".
Test Device #20
Qn SMU5
SMU2
Test Device #20
Qn SMU5
SMU2
6-325