Keithley 4200-SCS Reference Manual page 238

Semiconductor characterization system
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Section 6: Keithley Interactive Test Environment (KITE)
Understanding Master Sweeps vs. Slave Sweeps
It is possible to simultaneously apply multiple sweep forcing functions to multiple device terminals.
However, all of the sweep forcing functions in the ITM must track with regard to increment number
and duration. Therefore, one of the sweep functions must be user-designated as the Master. All
other sweep functions, by default, are then automatically designated by KITE as slaves.
Figure 6-134
Figure 6-134
Master Sweep Function vs. Slave Sweep Function
To specify a particular sweep function as the master sweep function, click the Master checkbox in
the Forcing Function area of its Forcing Functions/Measure Options window. If you do not
specify a particular sweep function as the master step function, the first sweep function that you
assign to an ITM is the master, by default.
In Forcing Functions/Measure Options windows, KITE enforces tracking relationships between
master and slave sweep parameters as follows:
Linear sweep master/linear sweep slaves or Log sweep master/linear sweep slaves:
KITE sets the slave Data Points value and Step size to be the same as the master Data
Points value and Step size. User changes to the slave Data Points value are not allowed.
Log sweep master/log sweep slaves or Linear sweep master/log sweep slaves: KITE
sets the slave Data Points value and Step size to be the same as the master Data Points
value and Step size. User changes to the slave Data Points value are ignored.
6-112
illustrates this concept.
Master Sweep
Function
Step width and number of steps of slave
function track step width and number of
steps of master function
Slave Sweep
Function
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Model 4200-SCS Reference Manual
4200-901-01 Rev. S / May 2017

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