Perform The Following Steps To Select And Set The Number Of Test Cycles To Perform - Keithley 4200-SCS Reference Manual

Semiconductor characterization system
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Model 4200-SCS Reference Manual
Figure 6-374
Subsite cycling example: four cycles

Perform the following steps to select and set the number of test cycles to perform:

1.
2.
3.
4.
Stress/Measure Mode
NOTE
The test sequence for the Stress/Measure Mode is similar to the test sequence for the Cycle
Mode, but includes components for stressing, % change and target evaluation.
shows an example of the basic testing sequence. The added components for stressing, % change
an target evaluation are shown in blue. Measured readings for the individual test data sheets and
Subsite Plan data sheet are acquired in the same manner as for the Cycle Mode (see
cycling data sheets
As shown in
cycle, all the devices in the Subsite Plan are stressed with voltage or current for a specified period
of time. After the stress period expires, stressing is stopped and the three tests are run. Notice that
after each test is run, the % or Abs (absolute) Change and Targets are evaluated.
% Change: A post-stress Output Value reading is compared to its pre-stress Output Value
reading. The % Change is calculated and listed in the Subsite Plan data sheet. The % Change for
post-stressed Output Values are calculated as follows:
% Change = ABS[(Post-Stress Reading: Pre-Stress Reading) / Pre-Stress Reading x 100]
Abs Change: A post-stress Output Value reading is compared to its pre-stress Output Value
reading. The Abs (absolute) Change is calculated and listed in the Subsite Plan data sheet. The
Abs Change for post-stressed Output Values are calculated as follows:
Abs Change = ABS[Post-Stress Reading: Pre-Stress Reading]
4200-901-01 Rev. S / May 2017
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In the Project Navigator, double-click the name of the subsite.
Click the Subsite Setup tab.
Select the Cycle Mode and enter the number of cycles to be performed.
Click the Apply button located at the bottom-right corner of the tab.
See
Stress/Measure Mode
in the User Manual).
Figure
6-375, the first cycle runs all tests with no stressing. At the start of the 2nd
Return to
Section Topics
Section 6: Keithley Interactive Test Environment (KITE)
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for details on using this stress/measure mode.
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Figure 6-375
Subsite
6-319

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