Keithley 4200-SCS Reference Manual page 263

Semiconductor characterization system
Hide thumbs Also See for 4200-SCS:
Table of Contents

Advertisement

Model 4200-SCS Reference Manual
Understanding and configuring the Sampling Mode area of the Timing window
The sampling mode allows measuring of voltages/currents as a function of time while forcing
constant voltages/currents. For example, sampling mode would be used to profile capacitor
charging voltage while forcing a constant current. Time is measured relative to when the SMUs
apply the forced voltage or current (that is, t = 0 at the step change from 0.0 V/0.0A to the applied
voltage/current).
KITE enables the Sampling Mode option only when all terminals of the device under test are
configured for static forcing functions: Open, Common, Voltage Bias, or Current Bias (refer back
to
Static forcing
forcing function, the Sampling Mode option is unavailable.
If an ITM is configured for the Sampling Mode, you can configure three Sampling Mode settings:
Interval, #Samples, and Hold Time. You can configure these settings for all measurement-Speed
modes: Fast, Normal, Quiet, and Custom, as discussed below.
Sampling Mode settings
The Interval, #Samples and Hold Time settings control the Sampling Mode, as follows:
Interval: Specifies the time between measurements (data points). Interval can be set from 0 to
1000 s, in units of microseconds, milliseconds, and seconds. The default Hold Time is 0.1 s.
#Samples: Specifies the number of data points to be acquired. #Samples can be set from 1 to
4096. The default #Samples is 100.
Hold Time setting: After initial application of voltage/current by the SMUs, the source settling
times can be substantial. To allow for settling, you can specify an extra Hold Time delay to be
applied before making the first measurement. You can specify a Hold Time from 0 to 1000 s, in
units of microseconds, milliseconds, and seconds. The default Hold Time is 1s.
Sampling Mode timing diagram
Figure 6-154
Figure 6-154
Sampling Mode timing diagram
4200-901-01 Rev. S / May 2017
functions). If any terminal of the device under test is configured for a step or sweep
shows a timing diagram for the Sampling Mode test mode.
MT
Return to
Section Topics
Section 6: Keithley Interactive Test Environment (KITE)
MT
MT
6-137

Advertisement

Table of Contents
loading

Table of Contents