Keithley 4200-SCS Reference Manual page 617

Model 4200-SCS Reference Manual
Breakdown sweep
bsweepX
Purpose
Format
Remarks
4200-901-01 Rev. S / May 2017
double volts, rdng [5];
:
.
conpin(GND, 11, 0);/* Make connections. */
conpin(SMU3, 14, 0);
.
forcev(SMU3, volts);/* Perform test. */
.
bmeasi(SMU3, rdng, 5, 0, 0, 0);/* Block current measurement */
/* of 5 readings using SMU3. */
Supplies a series of ascending or descending voltages or currents and shuts down the
source when a trigger condition is encountered.
int bsweepi(int inst_id, double startval, double endval, long
num_points, double delay_time, double *result);
int bsweepv(int inst_id, double startval, double endval, long
num_points, double delay_time, double *result);
The sourcing instrument's identification code.
inst_id
The initial voltage or current level applied as the first step in the
startval
sweep. This value can be positive or negative.
The final voltage or current level applied as the last step in the
endval
sweep. This value can be positive or negative.
The number of separate current and voltage force points between
num_points
startval and endval. The range may be from 1 through 32,767.
The delay in seconds between each step and the measurements
delay_time
defined by the active measure list.
Assigned to the result of the trigger. This value represents the
result
source value applied at the time of the trigger or breakdown.
bsweepX is used with trigXg, trigXl, or trigcomp. These trigger functions are
used to provide the termination point for the sweep. At the time of trigger or breakdown,
all sources are shut down to prevent damage to the device under test. Typically, this
termination point is the test current required for a given breakdown voltage.
Once triggered, bsweepX terminates the sweep and clears all sources by executing a
devclr command internally. The standard sweepX command will continue to force
the last value. This is useful for device characterization curves, but can cause problems
when used in device breakdown conditions.
bsweepX can be used with smeasX, sintgX, savgX, or rtfary functions.
Measurements are stored in a one-dimensional array in the consecutive order in which
they were taken.
The system maintains a measurement scan table consisting of devices to test. This
table is maintained using the smeasX, sintgX, savgX, or clrscn calls. As multiple
calls to sweep functions are made, these commands are appended to the
measurement scan table. Measurements are taken after the programmed
delay_time is performed at the beginning of each bsweepX step.
When multiple calls to bsweepX are executed in the same test sequence, the arrays
defined by smeasX, sintgX, or savgX calls are all loaded sequentially. The results
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Section 8: Keithley User Library Tool (KULT)
8-101