Keithley 4200-SCS Reference Manual page 460

Semiconductor characterization system
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Section 6: Keithley Interactive Test Environment (KITE)
If you select New Unsaved Data if Found, KITE generates the KDF using the most recent data
that has been acquired, even if this data has not yet been saved. If you select "Saved data ONLY,"
KITE generates the KDF using only data that has already been saved.
For example, suppose a project contains three subsites: A, B, and C. You tested all three subsites
in the past and saved the data. Just now, you tested subsite B again (by itself: but have not yet
saved the new data. As a result, you presently have two sets of data files) a set of saved files
containing data for all three subsites and a set of temporary files containing only unsaved data for
subsite B. See the illustration below.
Figure 6-387
Unsaved and Saved project data files
If you select New Unsaved Data if Found, KITE generates the KDF from the unsaved subsite B
files and the saved subsite A and subsite C files. See the illustration below.
Figure 6-388
KDF conversion: New Unsaved Data if Found
6-334
Unsaved project data files
New unsaved
subsite B files
Saved project data files
Saved subsite A files
Saved subsite B files
Saved subsite C files
KDF conversion when New Unsaved Data if Found is selected
Unsaved project data files
New unsaved
subsite B files
Saved project data files
Saved subsite A files
Saved subsite B files
Saved subsite C files
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Section Topics
Model 4200-SCS Reference Manual
KDF
Saved subsite A
files in KDF format
New unsaved subsite
B files in KDF format
Saved subsite C
files in KDF format
4200-901-01 Rev. S / May 2017

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