Keithley 4200-SCS Reference Manual page 508

Semiconductor characterization system
Hide thumbs Also See for 4200-SCS:
Table of Contents

Advertisement

Section 7: Keithley CONfiguration Utility (KCON)
Instrument Connection Scheme area
The following Instrument Connection Scheme selections define the scheme for interconnections
between the instruments, the switch-matrix rows and columns, and the test system (prober or test
fixture).
Row-Column (instruments to rows and prober/test fixture to columns) or Instrument Card
(both instrument and prober/test fixture to columns)
Local Sense (connections only to instrument FORCE terminals) or Remote Sense
(connections both to instrument FORCE and SENSE terminals)
These selections are discussed below in more detail:
Row-Column
Figure 7-27
Row-Column, Local Sense Connection Scheme example
FORCE
A
SMU1
FORCE
B
SMU2
FORCE
C
SMU3
FORCE
D
SMU4
INPUT
E
CMTR1
OUTPUT
F
OUTPUT 1
G
PGU1
OUTPUT 2
H
PGU2
1
2
1
2
F
F
F = FORCE TERMINAL OF PIN
S = SENSE TERMINAL OF PIN
Instrument Card
7-32
With the Row-Column scheme, instruments are connected to switch-
matrix rows, and prober/test fixture pins are connected to switch-matrix
columns. This connection scheme is the simplest. Instrument signals
can route to prober/test-fixture pins through only one matrix card, as
illustrated in
number of external instruments. If you need to connect numerous
external instruments to the prober/test-fixture, use the Instrument Card
scheme.
CARD 1
CARD1
3
4
5
6
7
8
9
10
11
12
3
4
5
6
7
8
9
10
11
12
F
F
F
F
F
F
F
F
F
F
With the Instrument Card scheme, both instruments and prober/test-
fixture pins are connected to the columns of the switch matrix.
Instrument signals route to the prober/test-fixture pins through two or
more matrix cards, as illustrated in
scheme can support large systems with numerous instruments by
removing the eight-row instrument connection limitation.
Return to
Figure
7-27. However, the Row-Column scheme limits the
CARD 2
CARD2
A
B
C
D
E
F
G
H
13
14
15
16
17
18
19
20
21
22
23
13
14
15
16
17
18
19
20
21
22
23
F
F
F
F
F
F
F
F
F
F
F
Section Topics
Model 4200-SCS Reference Manual
CARD 3
CARD3
A
B
C
D
E
F
G
H
24
25
26
27
28
29
30
31
32
24
25
26
27
28
29
30
31
32
F
F
F
F
F
F
F
F
F
Probe Station or Test Fixture
Figure
7-28. This connection
4200-901-01 Rev. S / May 2017
33
34
35
36
33
34
35
36
F
F
F
F

Advertisement

Table of Contents
loading

Table of Contents