Keithley 4200-SCS Reference Manual page 730

Semiconductor characterization system
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Section 8: Keithley User Library Tool (KULT)
Table 8-25
Code status or error titles
Code
2802 – 2807 RPM: Invalid Configuration Requested
2801
2800
2702
2701
1905
1904
1902
1901
1900
400 – 402
100
55
54
53
52
51
50
40
24
23
22
21
20
15
14
13
12
11
9
8
4
1
0
-4
-5
-6
-20
-21
-22
-23
-24
-25
-40
-87
8-214
Status or error titles
RPM: Returned ID Error Response
RPM: Command Response Timeout
PMU: Temperature Within Normal Range
PMU: High Temperature Limit Exceeded
PMU: Measure Program Error
PMU: Source Program Error
PMU: Transmission to analog from digital error
PMU: Handshake from analog to digital error
PMU: DA Communication Timeout
PMU: Invalid Attributes in SW Command
LPTLib is executing function %s on instrument ID %d.
%s is no longer in thermal shutdown.
%s VXIBus device busy (command ID %04x). Timed out after %g seconds.
%s VXIbus transaction recovered after %u timeouts.
%s VXIbus transaction (command ID %04x) timed out after %g seconds.
Interlock reset.
Interlock tripped.
%s
Config %d-%d complete for %s (%d).
Config %d-%d starting for %s (%d).
Binding %s (%d) to driver %s.
Loading driver %s.
Preloading model code %08x (%s).
Executor started.
%s channel closed.
%s channel starting.
TAPI services shutting down.
Starting TAPI services.
System configuration complete.
System configuration starting.
System initialization complete.
The call was successful (no error).
The call was successful (no error).
Too many instruments in configuration file %s.
Memory allocation failure.
Memory allocation error during configuration with configuration file %s.
Command not executed because a previous error was encountered.
Tester is in a fatal error state.
Fatal condition detected while in testing state.
Execution aborted by user.
Too many arguments.
%s is unavailable because it is in use by another test station.
%s.
Can not load library %s.
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Model 4200-SCS Reference Manual
4200-901-01 Rev. S / May 2017

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