Assigning/Reassigning Forcing Functions To The Device Terminals; Selecting Sweeping Or Sampling Mode; Reviewing The Available Forcing Functions - Keithley 4200-SCS Reference Manual

Semiconductor characterization system

Hide thumbs Also See for 4200-SCS:

Table of Contents

Model 4200-SCS Reference Manual

Select the test mode prior to configuring a completely new ITM, or prior to reconfiguring an existing

ITM that is currently in the Sampling mode. Select the test mode by first clicking the scroll arrow at

the right of the Mode combo box and then clicking on the desired mode.

Assigning/reassigning forcing functions to the device terminals

A forcing function defines how an SMU applies a current or voltage to a device terminal (including

possibly maintaining a zero-voltage/current state). You must initially assign at least one forcing

function to a completely new ITM. You can reassign forcing functions to an existing, library ITM,

thereby effectively converting it to a new ITM. This subsection helps you to assign forcing

KITE provides four forcing functions in the Sampling test mode and six additional forcing

functions in the Sweeping test mode (for more information about test modes, refer to the last

subsection). These functions are summarized in

pulse output are also identified in

4200-901-01 Rev. S / May 2017

For an existing library ITM that is in the Sweeping mode, the Mode combo box allows you

only to observe that it is in the Sweeping mode. You cannot change the Sweeping mode to

Sampling mode, unless you first change all of the dynamic forcing functions of the ITM to

static forcing functions. This lockout helps to avoid errors by allowing only mode-appropriate

timing options (see

Timing window later in this

If you select the sampling mode, you must ultimately specify the sampling interval

and number of samples in the ITM timing window (otherwise, KITE uses default

parameters). This is discussed later under

Sweeping Mode area of the Timing window later in this

Section 6: Keithley Interactive Test Environment (KITE)

Understanding and configuring the

Pulse Mode later in this

Section Topics

6-6. The forcing functions that can provide

Table of Contents