F Lateral Force Measurement; Quick Start Guide; Quick Start Guide Theory - Agilent Technologies Nano Indenter G200 User Manual

Agilent Nano Indenter G200
User's Guide
F
Lateral Force Measurement

Quick Start Guide

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Theory F-4
The Lateral Force Measurement (LFM) option, available on the Nano
Indenter G200, enables measurement of forces in the X-Y plane. This in
turn enables the calculation of the scratch friction coefficient for
scratches made in any direction. The resolution for frictional force
measurement is better than 10 mN over a range of 200 mN.
This section references material for Scratch Testing. Be sure to review
NOT E
and understand Appendix E, "Scratch Testing" before continuing with
LFM.
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