Agilent Technologies Nano Indenter G200 User Manual page 448

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Theory
Agilent Nano Indenter G200 User's Guide
The LFM probes (shown in
deflection of the indenter shaft relative to its normal position. As shown
in
Figure
F-3, K
represents the stiffness of the spring that supports the
L
shaft. The forces exerted in the directions of each of the probes are
calculated according to the formulas in the schematic.
Figure F-3Schematic for LFM illustrating indenter deflection measured
by LFM probes
The X and Y deflection values are stored in the _XDeflection and
_YDeflection channels. The resolved forces are stored in the _XForce
and _YForce channels.
Lateral Force Measurement F
Figure 3- 12
on page 3-10) measure
F-4

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