Markers E - Agilent Technologies Nano Indenter G200 User Manual

Agilent Nano Indenter G200
User's Guide
E
Scratch Testing
Quick Start Guide
NanoSuite Reference
Required Inputs
Markers
Editable Post-Test Inputs
Results
Theory
Plastically Deformed Scratches
Fractured Scratches
Influence of Indenter Geometry
Measure of Indenter Geometry Using the Indentation
Technique
Time-Dependent Properties Acting on Scratch Behavior
Relaxation
Mechanisms
Originally developed for depth-sensing indentation testing, the standard
Nano Indenter G200 can also do controlled scratch tests. The Nano
Indenter G200 indentation/scratch head is load-controlled. The load is
applied normal to the sample surface by the electromagnetic system.
During a scratch test, the normal force on the sample is controlled and
can be held constant, increased, or decreased. Scratch velocity and
scratch path followed by the indenter on the specimen surface are
defined by the test method.
Although the standard G200 can perform standard scratch testing, the
NOT E
Lateral Force Measurement (LFM) option enables you to measure
lateral forces on the indenter during the scratch. The LFM option is
discussed in
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Appendix F, "Lateral Force Measurement".
Agilent Technologies
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