Quick Start Guide B - Agilent Technologies Nano Indenter G200 User Manual

Indentation Head Assembly
Displacement Resolution
Range of Indenter Travel
Loading Column Mass
Load Application
Displacement Measurement
Typical Leaf Spring Stiffness
Typical Damping Coefficient
Typical Resonant Frequency
Loading Capability
Maximum Load
Load Resolution
Agilent Nano Indenter G200
User's Guide
B
Dynamic Contact Module II
Quick Start Guide B-2
Switching to the DCM II Head
Switching to the XP Head
NanoSuite Reference
Commonly Used Procedures
Changing the Tip B-9
Required Tools
Procedure B-10
Testing the DCM II Performance
The advantages of the Dynamic Contact Module II (DCM II) are:
• Improved resolution in both force and displacement.
• Decreased sensitivity to environmental noise.
These two advantages enable you to make meaningful measurements of
mechanical properties at displacements as small as 10 nm. The table
below shows the specifications for the DCM II.
Agilent Technologies
B-2
B-6
B-8
B-9
B-9
B-15
0.0002 nm
70 mm
< 150 mg
Coil/Magnet Assembly
Capacitance Gauge
_ 100 N/m
0.02 Ns/m
120 Hz
30 mN (3 gm)
3 nN (0.3 mgm)
B-1