Agilent Technologies Nano Indenter G200 User Manual page 307

Theory 7
Figure 7-3 Schematic representation of instrument frame stiffness for
an indentation process
The value of K generally accounts for the indenter column, fixturing for
f
NOT E
both indenter tip and sample, translation mechanisms, gantry, and
connections between all these parts. The indenter tip includes only the
part of the tip that is of the same material as that which contacts the test
material, usually diamond or sapphire.
Analysis of Instrument Frame Stiffness
For evaluating displacement into surface, h:
h  P K

h = –
(12)
f
For evaluating contact stiffness, S, when obtained by continuous
stiffness measurement (CSM):
Agilent Nano Indenter G200 User's Guide 7-10