Express Test To A Displacement - Agilent Technologies Nano Indenter G200 User Manual

Express Test to a Displacement

Agilent Nano Indenter G200 User's Guide
on the test sample using the
The purpose of the method is to use Express Test for rapid
characterization of Young's modulus and hardness by performing an
array of indentations to a user-defined depth and is available as both
Batch (Method Name-Batch) and Individual Methods. The method may
be used on bulk materials, but is especially suited for composite
materials where constituent materials have different properties.
Launch NanoSuite.
1
At the User Login prompt, select the proper profile name and click
2
OK.
From the Open Method dialog box, select Express Test > Batch>
3
Express Test to a Displacement-Batch for a Batch test as shown in
Figure H-5 on page H-7 or Express Test> Express Test to a
Displacement as an Individual test.
Figure H-5Select Express Test to a Displacement from the Open
Method dialog box
Click Open.
4
Locate sample target area using the microscope image (40X
5
Objective recommended).
Adjust the Panel Inputs as needed:
6
• Memo: Provides space for user-specified information about each
test.
• Poisson's Ratio: The Poisson's Ratio for the test material.
• Prescribed Displacement: Maximum indentation displacement
(approximate).
• Surface Approach Distance: This input may either be set to
Standard or High. Use the High setting for rough samples. Using
High will increase test time.
Express Test, Varied Force
Express Test I
method.
H-7