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Nano Indenter G200
Agilent Technologies Nano Indenter G200 Manuals
Manuals and User Guides for Agilent Technologies Nano Indenter G200. We have
1
Agilent Technologies Nano Indenter G200 manual available for free PDF download: User Manual
Agilent Technologies Nano Indenter G200 User Manual (478 pages)
Brand:
Agilent Technologies
| Category:
Laboratory Equipment
| Size: 32.01 MB
Table of Contents
Table of Content I Read this First
6
Specifications
3
Disclaimers
4
Contact Information
5
Table of Contents
6
Introduction
16
Your G200 System
16
Agilent Technologies
18
A Word about Us
18
Company History
18
Contacting Agilent Technologies
18
2 Quick Start Guide
20
Hardware Overview
21
Facility and Instrument Dimensions
22
Specifications
24
Software Interface Overview
25
Nanosuite Software
25
Getting Started
27
Power up the System
27
Launch Nanosuite
29
Prepare a Sample for Testing
30
Install the Sample Disk into the Sample Tray
35
Install the Sample Tray into the Indenter
37
Adjust the Height of the Samples
38
Methods and Batches in Nanosuite
46
First Batch Test
46
Second Batch Test
66
Results a
70
Third Batch Test
71
Congratulations
71
3 Instrument Reference
72
Instrument Reference
73
Components
73
Allen Wrench Set
73
Aperture Levers
73
Computer/Central Processing Unit (CPU)
74
Controller
74
Crystalbond Hot Melt
74
CSM Controller
75
Dynamic Contact Module II
76
Gantry Assembly
76
Head Assembly
77
High Load Mechanism
78
Indenter
79
Isolation Cabinet
79
Lateral Force Measurement
81
Locking Pins
81
Microscope
83
Motion System
83
Mounting Specimens
85
Objectives
85
Sample Disks
86
Sample Mount System
87
Sample Tray
87
Single-Crystal Aluminum Sample
88
Specimen
89
Standard Reference Materials
90
Temperature Probe
90
Tip-Change Tool
91
Tip-Retaining Nut
91
Vibration Isolation Table
92
Nanosuite
93
Test Page
94
Title Bar
95
File Menu
95
New Sample, Open Sample
97
Memo
97
Properties
98
Print
98
Print Preview
99
Email
99
Export, Export Preview, and Batch Export
100
Import
100
Method Menu
103
Open Method
103
Method Packaging
103
Edit Method
104
Print Method
104
Print Preview Method
104
Edit Menu
105
View Menu
106
Save Current Review Page Configuration
107
Load a Saved Review Page Configuration
108
Test Menu
110
Next Test Segment
110
Run Post-Sample
110
Configure Menu
111
Device
111
Meters
111
Statistics
113
Workspace
113
Toolbar
114
Review Graph
115
Real-Time Graph
116
Tools Menu
118
Calibrate
118
Set Full Scale Load Range
119
Validate Method
119
Channel Diagnostics
119
Preallocate
119
Recalculate Sample
119
Recalculate Test
119
User Menu
120
Login
120
Logout
120
Password
120
View Profile
120
Users
122
Tip Menu
123
Select Tip
123
Configure Tip
124
Print Preview of Tip Configuration
125
Change Indenter Tip
125
Export Menu
126
Mode Menu
127
System Menu
128
Help Menu
129
Topics
129
About
129
Request Product Support
129
Toolbar
131
Review Page Toolbar
131
Define Page Toolbar
135
Status Bar
137
Handset Area
138
Test Page Panels
138
Navigating the Nano Handset Schematic
139
Navigating the Nano Video Handset
141
System Controls
149
Required Inputs Panel
150
Real-Time Graph
152
Meters
154
Review Page
155
Legend Panel
155
Review Graph Panel
158
Channels Tab
160
Channels Right-Click Menu
160
Review Graph Setup
163
3D Tab
174
3D Right-Click Menu
175
Histogram Tab
184
Histogram Right-Click Menu
186
Data Panel
191
Results Panel
195
Simulation Mode
197
5 Analyst
199
Analyst 5
200
Understanding Excel Formats and Analyst
200
Launching Analyst
201
Menu Bar
202
Toolbar
203
Sample View Pane
203
View Pane
204
Message Pane
204
Analyst Menu Bar
205
File
205
Edit
207
Options
212
Tools
213
Help
213
Analyst Toolbar
214
Sample View Pane
215
Project Level
215
Sample Level
215
Test Level
215
Project Level
216
Sample Level
217
Test Level
218
View Pane
219
6 Commonly Used Procedures
220
Using Nanosuite System Agent
221
Defining a General Batch
227
Executing a General Batch
240
Changing the Indenter
244
Frame Stiffness and Area Function Calibration
250
General Information
250
Area Function Information
255
Frame Stiffness and Area Function Calibration: Express Test
264
Table of Contents
266
Frame Stiffness Calibration: ISO 14577 Method
270
Right-Click Anywhere on the Schematic Map and Select Move to
274
Target from the Resulting Pop-Up Menu, as Shown in
274
Right-Click Anywhere on the Schematic Map and Select Nano Video
275
Handset from the Resulting Pop-Up Menu, as Shown in
275
Find a Location on the Sample that Is Free of Contaminants and Dust
275
Allow Testing to Complete
276
Access the Frame Stiffness and Area Function Information by Choosing Tip > Configure Tip as Shown in Figure
277
Frame Stiffness Calibration: CSM Method
280
Cleaning the Tip
287
Best Method
287
Alternative Method 1
287
Setting the Surface Marker
288
Editing Input Values
291
Comparing Samples in Analyst
292
Adjusting the Vibration Isolation Table
296
7 Theory
298
Indentation Process Overview
300
Continuous Load-Displacement Data
300
Elastic Modulus of Test Material
302
Tip Materials Parameters
302
Determining the Contact Stiffness and Contact Area
303
The Power-Law Relation
303
Contact Depth
304
Projected Contact Area
304
Determining Contact Stiffness Dynamically
305
Frame Stiffness and Indenter Area Function Theory
306
Instrument Frame Stiffness: Indentation Definition
306
Frame Stiffness Summary
314
Determining Indenter Area Function
314
Area Function Summary
320
Diagnostics
321
Best Experimental Practice
325
Choosing an Indenter Geometry
325
Environmental Control
325
Surface Preparation
326
Testing Procedure
326
Calculations Using Raw Displacement and Load Data
327
Reference to the Point of Contact
327
Thermal Drift
327
Compensating for Deformation of the Load Frame
329
Compensating for the Force Exerted by the Support Springs
329
References
329
Quick Start Guide
332
Nanosuite Reference
334
Required Inputs
334
Results
335
Commonly Used Procedures
336
Setting the Displacement Range for Averaged Properties
336
Theory
337
Dynamic Modeling of the Indentation System and Sample Contact
337
Calculating Continuous Elastic Modulus and Hardness
341
Computing Parameters for Polymers
342
Quick Start Guide B
343
B Dynamic Contact Module II
344
Quick Start Guide
344
S Witching to the DCM II Head
344
Switching to the XP Head
348
Nanosuite Reference
350
Changing the Tip
351
Commonly Used Procedures
351
Testing the DCM II Performance
357
Quick Start Guide C
360
C High Load
361
Quick Start Guide
361
Results C
362
Nanosuite Reference
364
Required Inputs
364
Results
365
D Nanosuite Explorer
366
Test Flow View D
366
D Nanosuite Explorer
368
Nanosuite Explorer Overview
368
Test Flow View
368
Test Flow Pane
369
Settings Pane
372
Configuration Pane
377
Configuration View
377
Channel Tabs
390
Settings Pane
390
Formula Tabs
399
Inputs Tabs
404
Insert Menu
410
Method Error Log
410
Tutorial
411
Exercise 1
411
Exercise 2
413
Exercise 3
419
Exercise 4
420
Markers E
425
Quick Start Guide
426
Nanosuite Reference
430
Required Inputs
430
Markers
432
Editable Post-Test Inputs
433
Results
433
Theory
435
Plastically Deformed Scratches
435
Fractured Scratches
436
Influence of Indenter Geometry
437
Measure of Indenter Geometry Using the Indentation Technique
438
Relaxation
440
Time-Dependent Properties Acting on Scratch Behavior
440
Mechanisms
443
F Lateral Force Measurement
445
Quick Start Guide Theory
445
Introduction G
449
Quick Start Guide
445
Setting up a New User in Nanosuite
450
Exercise
450
Introduction
450
Investigate an Unfamiliar Nanosuite Method
457
Exercise
457
Introduction
457
Getting Started H
461
Getting Started
462
Express Test Tip Calibration
462
Express Test Methods
464
Express Test for Thin Films-Batch
464
Express Test to a Displacement
464
Express Test to a Displacement
467
Express Test to a Force
470
Express Test Tip Calibration
472
Express Test, Varied Force
472
DCM
475
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