Agilent Technologies Nano Indenter G200 User Manual page 447

Agilent Nano Indenter G200 User's Guide
Install the sample tray, with the fused silica standard in the center
4
hole, into the instrument according to
the Indenter" on page 2-18.
Set up a batch of samples for CSM testing:
5
Select Batch Mode from the Mode menu.
a
Follow the instructions for
b
Chapter 2, "Quick Start Guide using the fused silica in the center
of the sample tray. Follow the procedure exactly as written. In the
Required Inputs section, keep the default values and click Next
Step.
Click the Review tab to reveal the test results.
6
Click the first test number in the Legend pane to select the first test.
7
In addition to the channels calculated by the standard scratch method,
these tests include data from the LFM probes.
Right-click on the graph and select Y-Axis Channel > Friction
8
Force Along Scratch (mN).
This is the force data acquired from the LFM probes.
Right-click anywhere in the graph and select Y-Axis Channel >
9
Friction Coefficient.
The values in this channel are calculated by dividing the values in the
Friction Force Along Scratch channel by the values in the Load Applied
On The Sample channel.
Lateral Force Measurement F
"Install the Sample Tray into
"First Batch Test" on page 2-27 in
F-3