Systematic Errors - Agilent Technologies ENA Series User Manual

Systematic Errors

Systematic errors are caused by imperfections in the measuring instrument and the test
setup (cables, connectors, fixtures, etc.). Assuming that these errors are repeatable (i.e.,
predictable) and their characteristics do not change over time, it is possible to eliminate
them mathematically at the time of measurement by determining the characteristics of
these errors through calibration. There are six types of systematic errors, as follows.
Errors caused by signal leaks in the measuring system:
• Directivity
• Isolation (cross-talk)
Errors caused by reflections in the measuring system:
• Source match
• Load match
Errors caused by the frequency response of the receiver within the measuring instrument:
• Reflection tracking
• Transmission tracking
The E5070B/E5071B has two receivers for each test port the reference receiver and the test
receiver (transmission measurement or reflection measurement). You can perform
measurements with both of these receivers at the same time. Figure 4-1 shows the
architecture of the test ports of the E5070B/E5071B and systematic errors.
Figure 4-1 E5070B/E5071B port architecture and systematic errors
Chapter 4
Measurement Errors and their Characteristics
Calibration
95