Systematic Errors - Agilent Technologies ENA Series User Manual

Systematic Errors

Systematic errors are caused by imperfections in the measuring instrument and the test
setup (cables, connectors, fixtures, etc.). Assuming that these errors are repeatable (i.e.,
predictable) and their characteristics do not change relative to time, then it is possible to
eliminate these errors mathematically at the time of measurement by determining the
characteristics of these errors in a calibration. There are six types of systematic errors, as
follows.
Errors caused by signal leaks in the measuring system:
• Directivity
• Isolation (cross-talk)
Errors caused by reflections in the measuring system:
• Source match
• Load match
Errors caused by the frequency response of the receiver within the measuring instrument:
• Reflection tracking
• Transmission tracking
The E5070A/E5071A has 2 receivers for each test port, the reference receiver and the test
receiver (transmission measurement or reflection measurement) and allows you to perform
measurements using these receivers at the same time. Figure 4-1 shows the architecture of
the test ports of the E5070A/E5071A and systematic errors.
Figure 4-1 E5070A/E5071A Port Architecture and Systematic Errors
Chapter 4
Measurement Errors and their Characteristics
Calibration
79