Measurement Of Harmonic Distortion; Measurement Flow; Setting Frequency-Offset Function - Agilent Technologies ENA Series User Manual

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Frequency-Offset Measurement (Option 008)

Measurement of Harmonic Distortion

Using the frequency-offset function and absolute measurement function in combination

allows you to measure harmonic distortion of nonlinear devices such as mixers and

Table 8-4 shows the measurement flow.

Measurement Flow of Harmonic Distortion

Frequency-Offset" on page

"2. Implementing Receiver

Calibration" on page 327

"3. Setting Absolute

Measurement Parameters"

"4. Harmonic Distortion

Measurement" on page 328

The frequency-offset function allows you to make measurements while the frequencies are

different at each test port. In this case, measurement is done by using the setting example

for measurement frequency in Figure 8-12. For the setting of frequency-offset sweep, see

"1. Setting Frequency-Offset" on page 313.

Sets frequency-offset function

Implements receiver calibration

Sets absolute measurement parameters

Procedures for setting absolute measurement parameters

Implements harmonic distortion measurement

Connection of DUT

Procedures for setting measurement parameters

E5070b E5071b