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Chapter 6 Using LTE/LTE-A TDD Analyzer
Conducting modulation measurement
e
f
g
h
To set limit
1
Tap Menu > Limit.
2
Tap the test items and set the limits depending on your selected measurement
mode:
To set the limit for
Frequency Error
RS EVM
P-SS EVM
S-SS EVM
DL RS Power
P-SS Power
S-SS Power
PBCH Power
IQ Origin Power
3
Optional: Tap the Save hot key on the side bar and select the save option from the
choices available for your measurement.
Figure 79
Page 158
An automatically detected or manually entered MBSFN ID appears on the
screen.
To set the delay, tap Delay and enter the value using the on-screen keyboard
to set the amount of delay in μs.
NOTE
The Delay setting is used only when there is a time offset in the signals to be
measured.
To select the Cyclic Prefix, tap Cyclic Prefix and select Normal or
Extended.
To set the threshold for PDSCH, tap PDSCH Threshold and enter a value by
using the on-screen keyboard.
Tap PDSCH Mode to select REG to calculate EVM based on Resource
Element Group or Average to calculate EVM after adding all PDCCH signals
from one subframe.
Select and set
Test limits On/Off, High/Low Limit
Test limits On/Off, High Limit
Test limits On/Off, High Limit
Test limits On/Off, High Limit
Test limits On/Off, High/Low Limit
Test limits On/Off, High/Low Limit
Test limits On/Off, High/Low Limit
Test limits On/Off, High/Low Limit
Test limits On/Off, High Limit
shows an example of LTE/LTE-A TDD control channel measurement.
SPA06MA-O User's Guide
22145360, R005
April 2021
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