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Summary of Contents for Viavi MSAM
- Page 1 JDSU HS Datacom Module Specs Provided by www.AAATesters.com Multiple Services Application Module (MSAM) Data Communications and Diphase Testing Manual...
- Page 3 Multiple Services Application Module (MSAM) Data Communications and Diphase Testing Manual Viavi Solutions 1-844-GO-VIAVI www.viavisolutions.com...
- Page 4 Copyright/Trademarks © Copyright 2016 Viavi Solutions Inc. All rights reserved. No part of this guide may be reproduced or transmitted, electronically or otherwise, without written permission of the publisher. Viavi Solutions and the Viavi logo are trademarks of Viavi Solutions Inc.
- Page 5 In order to maintain compliance with the limits of a Class A digital device ViaviViavi requires that quality interface cables be used when connecting to this equipment. Any changes or modifications not expressly approved by Viavi could void the user's authority to operate the equipment.
- Page 6 Viavi after 2005-08-13 can be returned for disposal at the end of its useful life. Viavi will ensure that all waste equipment and batteries returned are reused, recycled, or disposed of in an environmentally friendly manner, and in compli- ance with all applicable national and international waste legislation.
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Page 7: Table Of Contents
Contents About this Manual Purpose and scope ............x Assumptions . - Page 8 Contents Step 5: Viewing test results ..........9 Setting the result group and category .
- Page 9 Resolution ............43 Which MSAM or application module is selected?......43 Resolution .
- Page 10 Contents Data Communications and Diphase Testing Manual Page viii 21148872, Rev. 002 January 2016...
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Page 11: About This Manual
About this Manual This prefix explains how to use this manual. Topics discussed include the following: • “Purpose and scope” on page x • “Assumptions” on page x • “Terminology” on page x • “Data Communications and Diphase Testing Manual” on page xi •... -
Page 12: Purpose And Scope
T-BERD ⁄ MTS 8000 — The T-BERD ⁄ MTS 8000 family of products. When used with an MSAM, typically a combination of a base unit, one or more battery modules, one or more dual module carriers (DMCs), MSAMs, and PIMs. -
Page 13: Data Communications And Diphase Testing Manual
PIMs inserted into the MSAM provide the physical connectors. • PIM — The physical interface module (inserted into the MSAM) used to test a variety of services. PIMs provide the connectors required to connect to a circuit for testing. -
Page 14: Conventions
About this Manual Conventions Conventions This guide uses typographical and symbols conventions as described in the following tables. Table 1 Text formatting and other typographical conventions Item(s) Example(s) Buttons, keys, or switches that Press the On button. you press or flip on a physical –... - Page 15 About this Manual Conventions Table 2 Symbol conventions This symbol indicates a note that includes important supplemental infor- mation or tips related to the main text. This symbol represents a general hazard. It may be associated with either a DANGER, WARNING, CAUTION, or ALERT message. See Table 3 more information.
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Page 16: Technical Assistance
Indicates that there is an action that must be performed in order to protect equipment and data or to avoid software damage and ser- vice interruption. Technical assistance If you require technical assistance, call 1-844-GO-VIAVI. For the latest TAC informa- tion, go to http://www.viavisolutions.com/en/services-and-support/support/technical- assistance. -
Page 17: Chapter 1 Basic Testing
Basic Testing Chapter 1 This chapter provides basic information about Data Communications and Diphase testing using the MSAM. Topics discussed in this chapter include the following: • “Navigating the Main screen” on page 2 • “Identifying test requirements” on page 4 •... -
Page 18: Navigating The Main Screen
Chapter 1 Basic Testing Navigating the Main screen Navigating the Main screen When testing using an HS Datacom or Diphase PIM, the Main screen on the instrument provides buttons and LEDs that help you quickly configure your test and determine whether data is transmitted and received properly (see Figure Figure 1... -
Page 19: Equipment
Chapter 1 Basic Testing Navigating the Main screen Equipment Use the Equipment button to indicate whether the instrument will emulate a DTE or DCE. Synth Frequency (kHz) Use the Synth Frequency (kHz) button to specify the synthesizer frequency for the instrument’s internal clock during testing. -
Page 20: Diphase Leds
Chapter 1 Basic Testing Identifying test requirements Table 4 Datacom signal lead circuits and direction (Continued) MIL-188c RS-232/V.24 MIL-188-114 EIA-530/EIA- V.35 RS-449/V.36 Circuit Direction ITU-T 530A (X.21) Data Set (DCE) Ready From DCE Data Terminal (DTE) To DCE 108.2 Ready Receiver Line From DCE RLSD... -
Page 21: Interface
Chapter 1 Basic Testing Identifying test requirements Interface Determine which data communications interface you are testing, and the PIM and cable you’ll need to connect to the interface. The instrument currently supports a PIM that allow you to test RS-232/V.24, EIA-530, EIA-530A, MIL-188c, X.21, V.35, RS-449/V.36, and MIL-188-114 interfaces, and a PIM that allows you to conduct Diphase testing. -
Page 22: Flow Control
Chapter 1 Basic Testing Step 1: Configuring the test Flow control Determine whether the device you will connect the instrument to uses flow control. If so, you can set up the instrument for out-of-band (hardware) flow control. If you are testing in asynchronous mode, you can also use in-band flow control. -
Page 23: Step 2: Performing A Self Test
Chapter 1 Basic Testing Step 2: Performing a self test A setup screen with a series of tabs appears. See Figure 2 Figure 2 Setup Screen (Timing tab) To navigate to a different setup screen, select the corresponding tab at the top of the screen. -
Page 24: Step 3: Connecting The Instrument To The Circuit
Before connecting to the circuit, verify that the DATACOM PIM is inserted securely in your MSAM, and that you have the correct cable designed to be used with the universal connector provided on the PIM, and with the interface you are testing. -
Page 25: Step 5: Viewing Test Results
Chapter 1 Basic Testing Step 5: Viewing test results The test starts. NOTE: Running Multiple Tests If you are using two MSAMs with HS Datacom PIMs in a DMC (Dual Module Carrier), you can run two HS Datacom tests simultaneously. For details and constraints, refer to the Getting Started manual that shipped with your instru- ment. -
Page 26: Additional Test Result Information
Chapter 1 Basic Testing Step 5: Viewing test results Additional test result information For detailed information on the following topics, refer to the Getting Started manual that shipped with your instrument. • Expanding and collapsing result measurements • Changing the result layout •... -
Page 27: Data Communications Testing
Data Communications Testing Chapter 2 This chapter provides step-by-step instructions for testing data communications inter- faces. Topics discussed in this chapter include the following: • “Data communications testing features and capabilities” on page 12 • “Specifying interface settings” on page 12 •... -
Page 28: Data Communications Testing Features And Capabilities
Data communications testing involves specifying the settings required to perform the test, connecting to the interface you are testing, starting the test, and then observing test results. Using the MSAM, you can perform BER analysis of a variety of data communications interfaces, measure round trip delay, and troubleshoot timing issues using the test results provided. -
Page 29: Specifying The Timing Settings
Chapter 2 Data Communications Testing Specifying the timing settings whether you are testing a balanced or unbalanced circuit for the interface, and the receive input termination (balanced circuits only). To specify interface settings Select the Setup soft key, then select the Interface setup tab. Select the interface, emulation mode, and, if applicable, balanced or unbalanced setting for the circuit you are testing (for example MIL-188-114, DTE, and Balanced). -
Page 30: Specifying Data Settings
Chapter 2 Data Communications Testing Specifying data settings In Rx Timing Source and Tx Timing Source, select a clock source for received and transmitted data. – If you select External (BNC), be certain to connect the external clock source to the instrument using the BNC connector labeled "CLK IN"... -
Page 31: Specifying Signal And Flow Control Settings
Chapter 2 Data Communications Testing Specifying signal and flow control settings To specify the data settings Select the Setup soft key, then select the Data setup tab. Specify the following settings. Setting Sync Async Value Data Bits – 5 bits for baudot encoding –... -
Page 32: Selecting A Ber Pattern
Chapter 2 Data Communications Testing Selecting a BER pattern The available settings vary based on the current timing mode (synchronous, or asyn- chronous), and the interface that you are testing. To specify the signal and flow control settings Select the Setup soft key, then select the Signaling setup tab. Specify the following settings. - Page 33 Chapter 2 Data Communications Testing Selecting a BER pattern Setting Sync Async Value Sync Loss Criteria – Low. Declares pattern sync loss when 100 bit errors are counted in less than 1000 bits. – Medium. Declares pattern sync loss when 250 bit errors are counted in less than 1000 bits.
- Page 34 Chapter 2 Data Communications Testing Selecting a BER pattern Table 7 lists the available BER patterns for the instrument. Table 7 BER patterns Pattern Description Provides Mark All ones Logic one (idle condition) data signal. Intended to test transmission circuits for maximum ones condition. NOTE: When you set up the instrument to transmit the MARK pattern and to use an internal clock source for the received data, and the unit is not connected to...
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Page 35: Defining User Programmable Patterns
Chapter 2 Data Communications Testing Defining user programmable patterns Table 7 BER patterns (Continued) Pattern Description Provides 2^15-1 ITU Compatible with O.151 specification for 64, 1544, 2048, 3152, and 6312 kb/s data rates. provides maxi- 2^15-1 ANSI mum number of sequential zeros allowable in framed, non-B8ZS testing. -
Page 36: Performing Ber Analysis
The pattern can be up to 2048 bytes long. NOTE: The MSAM reads User Byte Patterns left to right. The FIREBERD 6000 reads equivalent LUP patterns right to left. If you need assistance defining patterns on the instrument that will be compatible with the FIREBERD 6000, contact your Viavi technical assistance at 1-844-GO- VIAVI. -
Page 37: Measuring Round Trip Delay
Chapter 2 Data Communications Testing Measuring round trip delay To perform BER analysis of a circuit Configure the instrument. For details, see: – “Specifying interface settings” on page 12 – “Specifying the timing settings” on page 13 – “Specifying data settings” on page 14 –... -
Page 38: Troubleshooting Inverted Clocks
Chapter 2 Data Communications Testing Troubleshooting inverted clocks Connect to the circuit under test (see “Step 3: Connecting the instrument to the circuit” on page Establish a hard loopback at the far end. Start the test (see “Step 4: Starting the test” on page Verify that the PATTERN SYNC LED is illuminated. -
Page 39: Diphase Testing
Diphase Testing Chapter 3 This chapter provides step-by-step instructions for Diphase testing. Topics discussed in this chapter include the following: • “About Diphase testing” on page 24 • “Manchester (Diphase) encoding” on page 24 • “Conditioned Diphase encoding” on page 25 •... -
Page 40: About Diphase Testing
About Diphase testing About Diphase testing Using the MSAM with a Diphase PIM, you can test multiplexors, cable spans, radio spans, and perform end-to-end tests. Figure 4 illustrates the various access points where you can connect the instrument to verify channel routing, cable integrity, and communication across radio or satellite links. -
Page 41: Conditioned Diphase Encoding
Chapter 3 Diphase Testing Conditioned Diphase encoding Conditioned Diphase encoding In Conditioned Diphase encoding, the phase transition for each bit is determined by the phase transition for the previous encoded bit. • Each time the data signal is a logic level 0, the phase transition is the same as that for the previous encoded bit. -
Page 42: Specifying Data Settings
Chapter 3 Diphase Testing Specifying data settings Specifying data settings After specifying the clock frequency, you specify the block length for the data, the encoding scheme, and the duration of the interval between updates to interval based results. To specify the data settings Select the Setup soft key, then select the Data setup tab. -
Page 43: Measuring Round Trip Delay
Chapter 3 Diphase Testing Measuring round trip delay To perform BER analysis of a circuit Configure the instrument. For details, see: – “Specifying the clock frequency” on page 25 – “Specifying data settings” on page 26 – “Selecting a BER pattern” on page 16 If this is the first test you are performing today, perform a self-test (see “Step 2: Performing a self test”... - Page 44 Chapter 3 Diphase Testing Measuring round trip delay Observe the test results, particularly the R-Trip Delay result in the BERT category (see “Step 5: Viewing test results” on page Round trip delay is measured. Data Communications and Diphase Testing Manual Page 28 21148872, Rev.
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Page 45: Test Results
Test Results Chapter 4 This chapter describes the categories and test results that are available when performing Data communications or Diphase tests. Topics discussed in this chapter include the following: • “About test results” on page 30 • “Summary Status results” on page 30 •... -
Page 46: About Test Results
Chapter 4 Test Results About test results About test results After you connect the instrument to the circuit and detect a receive clock, results for the configured test automatically accumulate. Results are organized by result group, and then by result category. A result group exists for each type of test you can perform using the instrument (for example, data communications or Conditioned Diphase tests). -
Page 47: Led Results
Chapter 4 Test Results LED results If errors, anomalies, alarms, or defects have been detected, the background is red, and the errored results are displayed (see Figure Figure 8 Errored Summary Status results (Diphase application) This allows you to immediately view errored results without searching through each category. -
Page 48: Data Led Results
Chapter 4 Test Results LED results Table 8 describes the LEDs, and indicates whether each LED is applicable when running HS Datacom or Diphase tests. Table 8 HS Datacom and Diphase LEDs Indicates Rx Clock Present Green – A receive clock is detected. –... -
Page 49: Control Led Results
Chapter 4 Test Results LED results used by the standard for the interface you selected when you configured your test. Table 9 lists the Data LEDs. Table 9 Data LEDs Data LED Circuits Rx Data Receiver Signal Element Timing Transmit Data Transmitter Signal Element Timing 1. -
Page 50: Signal Results
Chapter 4 Test Results Signal results Signal results Table 11 provides descriptions of the test results in the Signal category. Table 11 Signal results Test Result Description Clock In Frequency Frequency derived from clock input connector. Datacom only. Clock Out Frequency Frequency derived from clock output connector. -
Page 51: Data Results
Chapter 4 Test Results Data results Table 12 BERT results (Continued) Test Result Description Round Trip Delay (ms) Time in milliseconds between the transmission and receipt of 16 consecutive bit errors in the RT- Round Trip Delay, Avg (ms) Delay test pattern. Round Trip Delay, Min (ms) Round Trip Delay, Max (ms) –... -
Page 52: Results
Chapter 4 Test Results G.821 results Table 13 Data results (Continued) Test Result Description Rx Async Data Losses Number of receiver synchronization losses resulting from a loss of data after at least one data transition has occurred. Characters Sent Count of the number of transmitted characters since the last test restart in asynchronous timing mode. -
Page 53: Interpreting Available And Unavailable Seconds
Chapter 4 Test Results G.821 results Table 14 G.821 results (Continued) Test Result Description Number of seconds judged unavailable due to 10 or more SES (see “SES”). Count includes the 10 SES. See “Interpret- ing available and unavailable seconds” on page Interpreting available and unavailable seconds CCITT Recommendation G.821 defines unavailable and available time as follows: “A period of unavailable time begins when the bit error rate (BER) in each second is... -
Page 54: Histograms
Chapter 4 Test Results Histograms Histograms Histograms provide a real-time graphical display of test results. Controls are available that allow you to navigate the display. To view a Histogram • On the instrument, set the Result Group to Summary, and the category to Histo- gram. -
Page 55: Event Logs
Chapter 4 Test Results Event Logs Event Logs Event Logs list any errors, anomalies, alarms, or defects that occur during the course of your test. The log displays the value for each event, and provides the date and time that the event occurred. To view the Event Log •... - Page 56 Chapter 4 Test Results Event Logs Data Communications and Diphase Testing Manual Page 40 21148872, Rev. 002 January 2016...
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Page 57: Troubleshooting
Troubleshooting Chapter 5 This chapter describes how to identify and correct issues encountered when using the instrument. Topics discussed in this chapter include the following: • “About troubleshooting” on page 42 • “Before testing” on page 42 • “Performing tests” on page 42 •... -
Page 58: About Troubleshooting
Only the applications for currently inserted PIMs will appear on the Test menu. For example, if an SFP and XFP PIM are inserted in the MSAM chassis, you will not see HS Datacom applications. Some applications only appear if you purchased the associ- ated testing option. -
Page 59: Some Settings Are Disabled When I Configure My Tests
Resolution Press the Results or the Start/Stop key to display the user interface. Which MSAM or application module is selected? When testing using an 8000 and two MSAMs (via a DMC), which test is in the fore- ground, and which is running in the background? -
Page 60: The Unit Is Not Obtaining Pattern Synchronization
Chapter 5 Troubleshooting Performing tests Verify that the Receive timing setting is correct for the circuit under test. For higher speed DCE emulation, you usually need to select terminal timing to avoid clock and data phase issues. Verify that the frequency of the circuit under test does not exceed the maximum rate supported by the instrument (see Table 6 on page 14 for the maximum supported... -
Page 61: Upgrades And Options
Do software and test options move with the MSAM? Test options are available when you connect the MSAM to a different base unit; however, the base unit software and BERT (MSAM) software reside on the base unit. - Page 62 Chapter 5 Troubleshooting Upgrades and options Data Communications and Diphase Testing Manual Page 46 21148872, Rev. 002 January 2016...
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Page 63: Glossary
Glossary AC — Alternating Current. An AC power adapter is supplied with the instrument. Asynchronous mode — Timing or transmission mode in which data is transferred as a series of bits separated by start and stop bits, not related to time. See Synchronous mode. - Page 64 Glossary CONUS — Continental United States. Acronym used to identify standards for circuits in the continental United States. CS — Clear to send from DCE circuit (RS-449/ V.36, and MIL-188-114). CTS — Clear to send from DCE circuit (all supported interfaces except RS-449/ V.36, MIL-188-114, and X.21).
- Page 65 Glossary Histogram — Print output of specific results in a bar graph format. I — Clear to send from DCE circuit (X.21). IC — Ring indicator from DCE (RS-449/ V.36, MIL-188-114). Inv — Inversion or inverted. Appears on user interface. IITU —...
- Page 66 Glossary RD — Receive data from DCE circuit (all supported interfaces except X.21). See R. RI — Ring indicator from DCE (RS-232/V.24, EIA-530, and MIL-188c). See IC and CI. RL — Remote loopback to DCE circuit (all supported interfaces except X.21). RLSD —...
- Page 67 Glossary Synchronous mode — Timing or transmission mode in which sending and receiving devices are synchronized with each other using a common clock, and no start or stop bits are used. See Asynchronous mode. T — Transmit data to DCE circuit (X.21). TD —...
- Page 68 Glossary Data Communications and Diphase Testing Manual Page 52 21148872, Rev. 002 January 2016...
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Page 69: Index
Index BER patterns G.821 results defining user programmable Graphical Histogram results listed Graphs, about selecting sync loss BER testing example 20, selecting a pattern Histograms about viewing CCITT designations, signal leads Circuits, signal lead Layout, changing result Collapsing measurements LEDs Compliance information results Conditioned Diphase encoding... - Page 70 Index Safety information Setting result group and category Settings,BER patterns Signal leads CCITT designations circuits Signal results Specifying BER pattern sync loss criteria Summary results Sync Loss T-Carrier testing features and capabilities Test results about graphs changing layout collapsing Control LED custom Data Data LED...
- Page 71 Index User programmable patterns, defining Viewing histograms Data Communications and Diphase Testing Manual January 2016 21148872, Rev. 002 Page 55...
- Page 72 Index Data Communications and Diphase Testing Manual Page 56 21148872, Rev. 002 January 2016...
- Page 74 21148872 Rev. 002 January 2016 English Viavi Solutions North America: 1.844.GO VIAVI / 1.844.468.4284 Latin America +52 55 5543 6644 EMEA +49 7121 862273 APAC +1 512 201 6534 All Other Regions: viavisolutions.com/contacts email TAC@viavisolutions.com...
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