On-Wafer Measurements - Agilent Technologies 8719D User Manual

On-Wafer Measurements

Hewlett-Packard Company, "On-Wafer Measurements Using the HP 8510 Network Analyzer and
Cascade Microtech Wafer Probes," Product Note 8510-6 HP publication number 5954-1579
Barr, J.T., T. Burcham, A.C. Davidson, E. W. Strid, "Advancements in On-Wafer Probing
Calibration Techniques, n Hewlett-Packard RF and Microwave Measurement Symposium paper,
1991
Lautzenhiser, S., A. Davidson, D. Jones, "Improve Accuracy of On-Wafer Tests Via LRM
Calibration," Reprinting from Microwaves and RF" HP publication number 5952-1286, January
1990
"On-Wafer Calibration: Practical Considerations, n HP 8510/8720 News HP publication number
Application and Operation Concept8