Page 1: Network Analyzers
User’s Guide Agilent Technologies 8719ET/20ET/22ET 8719ES/20ES/22ES Network Analyzers Part Number: 08720-90392 Printed in USA June 2002 Supersedes: February 2001 © Copyright 1999–2002 Agilent Technologies, Inc.
Page 2 Notice The information contained in this document is subject to change without notice. Agilent Technologies makes no warranty of any kind with regard to this material, including but not limited to, the implied warranties of merchantability and fitness for a particular purpose.
Page 3: Safety Notes
Safety Notes The following safety notes are used throughout this manual. Familiarize yourself with each of the notes and its meaning before operating this instrument. All pertinent safety notes for using this product are located in Chapter 8 , “Safety and Regulatory Information.”...
Page 4 Documentation Map The Installation and Quick Start Guide provides procedures for installing, configuring, and verifying the operation of the analyzer. It also will help you familiarize yourself with the basic operation of the analyzer. The User’s Guide shows how to make measurements, explains commonly-used features, and tells you how to get the most performance from your analyzer.
Page 5: Table Of Contents
Contents 1. Making Measurements Using This Chapter ............1-2 More Instrument Functions Not Described in This Guide .
Page 6 Contents Using Limit Lines to Test a Device..........1-72 Setting Up the Measurement Parameters .
Page 7 Contents Performing a Power Meter (Source) Calibration Over the RF Range ....2-15 Setting the Analyzer to Make an R Channel Measurement......2-17 High Dynamic Range Swept RF/IF Conversion Loss .
Page 8 Contents 4. Printing, Plotting, and Saving Measurement Results Using This Chapter ............4-2 Printing or Plotting Your Measurement Results .
Page 9 Contents What You Can Save to the Analyzer’s Internal Memory ......4-36 What You Can Save to a Floppy Disk .........4-37 What You Can Save to a Computer .
Page 10 Contents Increasing Dynamic Range ..........5-15 Increase the Test Port Input Power .
Page 11 Contents Matched Adapters ............6-45 Modify the Cal Kit Thru Definition .
Page 12 Contents Swept List Frequency Sweep (Hz) ......... . . 7-17 Power Sweep (dBm) .
Page 13 Contents The TRL Calibration Procedure ..........7-72 GPIB Operation .
Page 14 Contents Contents-xiv...
Page 15: Making Measurements
Making Measurements...
Page 16: Using This Chapter
Making Measurements Using This Chapter Using This Chapter This chapter contains the following example procedures for making measurements. Mixer and time domain measurements are covered in Chapter 2 , "Making Mixer Measurements (Option 089 Only)" Chapter 3 , “Making Time Domain Measurements.” This chapter also describes how to use most display, marker, and sequencing functions.
Page 17: More Instrument Functions Not Described In This Guide
Making Measurements More Instrument Functions Not Described in This Guide More Instrument Functions Not Described in This Guide To learn about instrument functions not covered in this user’s guide, refer to the following chapters in the reference guide. “Menu Maps” contains maps of the instrument menu structure.
Page 18: Making A Basic Measurement
Making Measurements Making a Basic Measurement Making a Basic Measurement There are five basic steps when you are making a measurement. 1. Connect the device under test and any required test equipment. CAUTION Damage may result to the device under test (DUT) if it is sensitive to the analyzer’s default output power level.
Page 19: Step 3. Perform And Apply The Appropriate Error-Correction
Making Measurements Making a Basic Measurement Setting the Frequency Range To set the center frequency to 134 MHz, press: Center M/µ To set the span to 30 MHz, press: Span M/µ NOTE You could also press the keys and enter the frequency Start Stop range limits as start frequency and stop frequency values.
Page 20: Step 5. Output The Measurement Results
Making Measurements Making a Basic Measurement Step 5. Output the measurement results. To create a printed copy of the measurement results, press: PRINT MONOCHROME PLOT Copy Refer to Chapter 4 , “Printing, Plotting, and Saving Measurement Results,” procedures on how to set up a printer and define a print, plot, or save results.
Page 21: Measuring Magnitude And Insertion Phase Response
Making Measurements Measuring Magnitude and Insertion Phase Response Measuring Magnitude and Insertion Phase Response This measurement example shows you how to measure the maximum amplitude of a surface acoustic wave (SAW) filter and then how to view the measurement data in the phase format, which provides information about the phase response.
Page 22: Measuring Insertion Phase Response
Making Measurements Measuring Magnitude and Insertion Phase Response If the channels are coupled (the default condition), this calibration is valid for both channels. 4. Reconnect your test device. 5. To better view the measurement trace, press: AUTO SCALE Scale Ref 6.
Page 23 Making Measurements Measuring Magnitude and Insertion Phase Response Figure 1-4 Example Insertion Phase Response Measurement The phase response shown in Figure 1-5 is undersampled; that is, there is more than 180° phase delay between frequency points. If the ∆Φ ≥ 180°, incorrect phase and delay information may result.
Page 24: Using Display Functions
Making Measurements Using Display Functions Using Display Functions This section provides the necessary information for using the display functions. These functions are very helpful for displaying measurement data so that it will be easy to read. This section covers the following topics: •...
Page 25: Titling The Active Channel Display
Making Measurements Using Display Functions Titling the Active Channel Display 1. Press to access the title menu. MORE TITLE Display 2. Press and enter the title you want for your measurement display. ERASE TITLE • If you have a DIN keyboard attached to the analyzer, type the title you want from the keyboard.
Page 26: Viewing Both Primary Measurement Channels
Making Measurements Using Display Functions Viewing Both Primary Measurement Channels In some cases, you may want to view more than one measured parameter at a time. Simultaneous gain and phase measurements, for example, are useful in evaluating stability in negative feedback amplifiers. You can easily make such measurements using the dual channel display.
Page 27 Making Measurements Using Display Functions Figure 1-8 Example Dual Channel with Split Display On 3. To return to a single-graticule display, press: SPLIT DISPLAY 1X NOTE You can control the stimulus functions of the two channels independent of each other by pressing COUPLED CH OFF Sweep Setup Dual Channel Mode with Decoupled Stimulus...
Page 28: Viewing Four Measurement Channels
Making Measurements Using Display Functions However, there are two configurations that will not sweep continuously. 1. For analyzers with source attenuators, with channel 1 having one attenuation value and channel 2 set to a different attenuation value, then continuous sweep is disabled to avoid wear on the attenuator.
Page 29 Making Measurements Using Display Functions Figure 1-9 Three-Channel Display 4. Press Chan 4 (or press , set to ON). AUX CHAN Chan 2 This enables channel 4 and the screen now displays four separate grids as shown in Figure 1-10. Channel 4 is in the lower-right quadrant of the screen. 1- 15...
Page 30 Making Measurements Using Display Functions Figure 1-10 Four-Channel Display 5. Press Chan 4 Observe that the amber LED adjacent to the key is lit and the CH4 indicator Chan 4 on the display has a box around it. This indicates that channel 4 is now active and can be configured.
Page 31: Customizing The Four-Channel Display
Making Measurements Using Display Functions Once made active, a channel can be configured independently of the other channels in most variables except stimulus. For example, once channel 3 is active, you can change its format to a Smith chart by pressing SMITH CHART Format Customizing the Four-Channel Display...
Page 32 Making Measurements Using Display Functions 4 Param Displays Softkey menu does two things: 4 PARAM DISPLAYS • provides a quick way to set up a four-parameter display • gives information for using softkeys in the menu Display Figure 1-11 shows the first screen.
Page 33: Using Memory Traces And Memory Math Functions
Making Measurements Using Display Functions Using Memory Traces and Memory Math Functions The analyzer has four available memory traces, one per channel. Memory traces are totally channel dependent: channel 1 cannot access the channel 2 memory trace or vice versa. Memory traces can be saved with instrument states: one memory trace can be saved per channel for each saved instrument state.
Page 34 Making Measurements Using Display Functions To View the Measurement Data and Memory Trace The analyzer default setting shows you the current measurement data for the active channel. 1. To view a data trace that you have already stored to the active channel memory, press: Display MEMORY This is the only memory display mode where you can change the smoothing and gating...
Page 35: Blanking The Display
Making Measurements Using Display Functions Blanking the Display Pressing switches off the analyzer ADJUST DISPLAY BLANK DISPLAY Display display while leaving the instrument in its current measurement state. This feature may be helpful in prolonging the life of the LCD in applications where the analyzer is left unattended (such as in an automated test system).
Page 36: Adjusting The Colors Of The Display
Making Measurements Using Display Functions Adjusting the Colors of the Display Setting Display Intensity To adjust the intensity of the display, press Display ADJUST DISPLAY INTENSITY and rotate the front panel knob, use the ( ) keys, or use the numerical keypad to set the intensity value between 50 and 100 percent.
Page 37 Making Measurements Using Display Functions Maximum viewing with the LCD display is achieved when primary colors or a NOTE combination of them are selected at full brightness (100%). Table 1-2 lists the recommended colors and their corresponding tint numbers. Table 1-2 Display Colors with Maximum Viewing Angle Display Color Tint Brightness...
Page 38: Using Markers
Making Measurements Using Markers Using Markers key displays a movable active marker on the screen and provides access to a Marker series of menus to control up to five display markers for each channel. Markers are used to obtain numerical readings of measured values. They also provide capabilities for reducing measurement time by changing stimulus parameters, searching the trace for specific values, or statistically analyzing part or all of the trace.
Page 39: To Activate Display Markers
Making Measurements Using Markers NOTE Using will also affect marker search and positioning MARKERS: DISCRETE functions when the value entered in a search or positioning function does not exist as a measurement point. The marker will be positioned to the closest adjacent point that satisfies the search or positioning value.
Page 40: To Move Marker Information Off The Grids
Making Measurements Using Markers Figure 1-13 Active and Inactive Markers Example • To switch off all of the markers, press ALL OFF To Move Marker Information Off the Grids If marker information obscures the display traces, you can turn off the softkey menu and move the marker information off the display traces and into the softkey menu area.
Page 41 Making Measurements Using Markers Figure 1-14 Marker Information Moved into the Softkey Menu Area pg654e 4. Restore the softkey menu and move the marker information back onto the graticules: Press The display will be similar to Figure 1-15. 1- 27...
Page 42: To Use Delta (∆) Markers
Making Measurements Using Markers Figure 1-15 Marker Information on the Graticules pg655e You can also restore the softkey menu by pressing a hardkey which opens a menu (such as ) or pressing a softkey. Meas ∆ To Use Delta ( ) Markers This is a relative mode, where the marker values show the position of the active marker relative to the delta reference marker.
Page 43: To Activate A Fixed Marker
Making Measurements Using Markers Figure 1-16 Marker 1 as the Reference Marker Example 4. To change the reference marker to marker 2, press: ∆ ∆ MODE MENU REF=2 To Activate a Fixed Marker When a reference marker is fixed, it does not rely on a current trace to maintain its fixed position.
Page 44 Making Measurements Using Markers Figure 1-17 Example of a Fixed Reference Marker Using MKR ZERO ∆ ∆ Using the Key to Activate a Fixed Reference Marker REF= FIXED MKR 1. To set the frequency value of a fixed marker that appears on the analyzer display, press: ∆...
Page 45: To Couple And Uncouple Display Markers
Making Measurements Using Markers Figure 1-18 Example of a Fixed Reference Marker Using (∆)REF=(∆)FIXED MKR To Couple and Uncouple Display Markers At a preset state, the markers have the same stimulus values on each channel, but they can be uncoupled so that each channel has independent markers. Press and select from the following keys: Marker Fctn...
Page 46: To Use Polar Format Markers
Making Measurements Using Markers To Use Polar Format Markers The analyzer can display the marker value as magnitude and phase, or as a real/imaginary pair: gives linear magnitude and phase, gives log magnitude and LIN MKR LOG MKR phase, gives the real value first, then the imaginary value. Re/Im You can use these markers only when you are viewing a polar display format.
Page 47: To Use Smith Chart Markers
Making Measurements Using Markers To Use Smith Chart Markers For greater accuracy when using markers in the Smith chart format, activate the discrete marker mode. Press MKR MODE MENU MARKERS:DISCRETE Marker Fctn To use Smith chart format: 1. Press SMITH CHART Format 2.
Page 48: To Set Measurement Parameters Using Markers
Making Measurements Using Markers Figure 1-21 Example of Impedance Smith Chart Markers To Set Measurement Parameters Using Markers The analyzer allows you to set measurement parameters with the markers, without going through the usual key sequence. You can change certain stimulus and response parameters to make them equal to the current active marker value.
Page 49 Making Measurements Using Markers Setting the Stop Frequency 1. Press and turn the front panel knob, or enter a value from the front panel Marker Fctn keypad to position the marker at the value that you want for the stop frequency. 2.
Page 50 Making Measurements Using Markers Figure 1-24 Example of Setting the Center Frequency Using a Marker Setting the Frequency Span You can set the span equal to the spacing between two markers. If you set the center frequency before you set the frequency span, you will have a better view of the area of interest.
Page 51 Making Measurements Using Markers Figure 1-25 Example of Setting the Frequency Span Using Marker Setting the Display Reference Value 1. Press and turn the front panel knob, or enter a value from the front panel Marker Fctn keypad to position the marker at the value that you want for the analyzer display reference value.
Page 52: Setting The Cw Frequency
Making Measurements Using Markers 1. Press PHASE Format 2. Press and turn the front panel knob, or enter a value from the front panel Marker Fctn keypad to position the marker at a point of interest. 3. Press to automatically add or subtract enough line length to the MARKER→DELAY receiver input to compensate for the phase slope at the active marker position.
Page 53: To Search For A Specific Amplitude
Making Measurements Using Markers To Search for a Specific Amplitude These functions place the marker at an amplitude-related point on the trace. If you switch on tracking, the analyzer searches every new trace for the target point. Searching for the Maximum Amplitude 1.
Page 54 Making Measurements Using Markers Figure 1-29 Example of Searching for the Minimum Amplitude Using a Marker Searching for a Target Amplitude 1. Press to access the marker search menu. Marker Search 2. Press to move the active marker to the target point on the SEARCH: TARGET measurement trace.
Page 55 Making Measurements Using Markers Searching for a Bandwidth The analyzer can automatically calculate and display the bandwidth (BW:), center frequency (CENT:), Q, and loss of the device under test at the center frequency. (Q stands for “quality factor,” defined as the ratio of a circuit's resonant frequency to its bandwidth.) These values are shown in the marker data readout.
Page 56: To Calculate The Statistics Of The Measurement Data
Making Measurements Using Markers To Calculate the Statistics of the Measurement Data This function calculates the mean, standard deviation, and peak-to-peak values of the section of the displayed trace between the active marker and the delta reference. If there is no delta reference, the analyzer calculates the statistics for the entire trace.
Page 57: Measuring Electrical Length And Phase Distortion
Making Measurements Measuring Electrical Length and Phase Distortion Measuring Electrical Length and Phase Distortion Electrical Length The analyzer mathematically implements a function similar to the mechanical “line stretchers” of earlier analyzers. This feature simulates a variable length lossless transmission line, which you can add to or remove from the analyzer's receiver input to compensate for interconnecting cables, etc.
Page 58 Making Measurements Measuring Electrical Length and Phase Distortion You may also want to select settings for the number of data points, averaging, and IF bandwidth. 3. Substitute a thru for the device and perform a response calibration by pressing: CALIBRATE MENU RESPONSE THRU 4.
Page 59: Measuring Phase Distortion
Making Measurements Measuring Electrical Length and Phase Distortion The measurement value that the analyzer displays represents the electrical length of your device relative to the speed of light in free space. The physical length of your device is related to this value by the propagation velocity of its medium. NOTE Velocity factor is the ratio of the velocity of wave propagation in a coaxial cable to the velocity of wave propagation in free space.
Page 60 Making Measurements Measuring Electrical Length and Phase Distortion Deviation From Linear Phase By adding electrical length to “flatten out” the phase response, you have removed the linear phase shift through your device. The deviation from linear phase shift through your device is all that remains.
Page 61 Making Measurements Measuring Electrical Length and Phase Distortion The default aperture is the total frequency span divided by the number of points across the display (i.e. 201 points or 0.5% of the total span in this example). 1. Continue with the same instrument settings and measurements as in the previous procedure, “Deviation From Linear Phase.”...
Page 62 Making Measurements Measuring Electrical Length and Phase Distortion Figure 1-38 Group Delay Example Measurement with Smoothing 5. To increase the effective group delay aperture, by increasing the number of measurement points over which the analyzer calculates the group delay, press: SMOOTHING APERTURE As the aperture is increased the “smoothness”...
Page 63: Characterizing A Duplexer (Es Analyzers Only)
Making Measurements Characterizing a Duplexer (ES Analyzers Only) Characterizing a Duplexer (ES Analyzers Only) This measurement example demonstrates how to characterize a 3-port device, in this case a duplexer, using four-parameter display mode. You must use a test adapter or a special 3-port test adapter to route the signals from the analyzer (a two-port instrument) to the duplexer (a three-port device).
Page 64 Making Measurements Characterizing a Duplexer (ES Analyzers Only) 3. Set up channel 1 for the Tx-Ant stimulus parameters (start/stop frequency, power level, IF bandwidth). In this example, a wide frequency range that covers both the Tx-Ant and Ant-Rx parameters has been chosen. 4.
Page 65 Making Measurements Characterizing a Duplexer (ES Analyzers Only) 15.Set up a 2-graticule, 4-parameter display with transmission measurements on the top graticule and reflection measurements on the bottom graticule: Press Display DUAL|QUAD SETUP 4-PARAM DISPLAYS SETUP B Meas Trans: REV S12 (A/R) Chan 4 Refl: REV S22 (B/R) Chan 1...
Page 66: Measuring Amplifiers
Making Measurements Measuring Amplifiers Measuring Amplifiers The analyzer allows you to measure the transmission and reflection characteristics of many amplifiers and active devices. You can measure scalar parameters such as gain, gain flatness, gain compression, reverse isolation, return loss (SWR), and gain drift versus time. Additionally, you can measure vector parameters such as deviation from linear phase, group delay, complex impedance and AM-to-PM conversion.
Page 67: Measuring Gain Compression
Making Measurements Measuring Amplifiers Measuring Gain Compression Gain compression occurs when the input power of an amplifier is increased to a level that reduces the gain of the amplifier and causes a nonlinear increase in output power. The point at which the gain is reduced by 1 dB is called the 1 dB compression point. The gain compression will vary with frequency, so it is necessary to find the worst-case point of gain compression in the frequency band.
Page 68 Making Measurements Measuring Amplifiers 4. To produce a normalized trace that represents gain compression, perform either step 5 or step 6. (Step 5 uses trace math and step 6 uses uncoupled channels and the display function D1/D2 to D2 ON DATA →MEMORY 5.
Page 69 Making Measurements Measuring Amplifiers Figure 1-44 Gain Compression Using Linear Sweep and D2/D1 to D2 ON 12.If was selected, recouple the channel stimulus by pressing: COUPLED CH OFF COUPLED CH ON Sweep Setup 13.To place the marker exactly on a measurement point, press: MARKER MODE MENU MARKERS:DISCRETE Marker Fctn...
Page 70 Making Measurements Measuring Amplifiers A receiver calibration will improve the accuracy of this measurement. Refer NOTE Chapter 6 , “Calibrating for Increased Measurement Accuracy.” 22.Press MARKER MODE MENU MARKERS:COUPLED Marker Fctn 23.To find the 1 dB compression point on channel 1, press: SEARCH:MAX MKR ZERO Marker Search...
Page 71: Measuring Gain And Reverse Isolation Simultaneously (Es Analyzers Only)
Making Measurements Measuring Amplifiers Measuring Gain and Reverse Isolation Simultaneously (ES Analyzers Only) Since an amplifier will have high gain in the forward direction and high isolation in the reverse direction, the gain (S ) will be much greater than the reverse isolation (S Therefore, the power you apply to the input of the amplifier for the forward measurement ) should be considerably lower than the power you apply to the output for the reverse measurement (S...
Page 72 Making Measurements Measuring Amplifiers Figure 1-46 Gain and Reverse Isolation 1-58...
Page 73: Making High Power Measurements With Option 085 (Es Analyzers Only)
Making Measurements Measuring Amplifiers Making High Power Measurements with Option 085 (ES Analyzers Only) Analyzers equipped with Option 085 can be configured to measure high power devices. This ability is useful if the required input power for a device under test is greater than the analyzer can provide, or if the maximum output power from an amplifier under test exceeds safe input limits for a standard analyzer.
Page 74 Making Measurements Measuring Amplifiers 5. Switch on the booster amplifier. 6. Using a power meter, measure the output power from the coupled arm and the open port of the coupler. NOTE Depending on the power meter being used, additional attenuation may have to be added between the coupler port and the power meter.
Page 75 Making Measurements Measuring Amplifiers Figure 1-48 High Power Test Setup (Step 2a) Figure 1-49 High Power Test Setup (Step 2b) Selecting Power Ranges and Attenuator Settings 14.Select a power range that will not exceed the maximum estimated power level that will force the DUT into compression.
Page 76 Making Measurements Measuring Amplifiers 16.Estimate the maximum amount of gain that could be provided by the DUT and, as a result, the maximum amount of power that could be received by TEST PORT 2 when the DUT is in compression. For example, if a DUT with a maximum gain of +10 dB receives an input of +20 dBm, then the maximum amount of power that could be received by TEST PORT 2 is +30 dBm.
Page 77 Making Measurements Measuring Amplifiers With the previous points in mind, the amount of attenuation can be calculated from the following equations: • Attenuator A = +20 dBm − 13 dB − (−10 dBm). Attenuator A = +17 dB • Attenuator B = +30 dBm − 13 dB − (−10 dBm). Attenuator B = +27 dB 18.Set the internal step attenuators to the values calculated in the previous step (rounding off to the highest 5 dB step).
Page 78 Making Measurements Measuring Amplifiers Figure 1-51 High Power Test Setup (Step 3) 26.Make any other desired high power measurements. Ratio measurements such as gain will be correctly displayed. However, the displayed absolute power levels on the analyzer will not be correct. To correctly interpret power levels, the gain of the booster amplifier and the attenuator settings must be taken into consideration.
Page 79: Making High Power Measurements With Option 012 (Es Analyzers Only)
Making Measurements Measuring Amplifiers Making High Power Measurements with Option 012 (ES Analyzers Only) Analyzers equipped with Option 012 can be configured to measure devices that have high power outputs. With direct sampler access, you can insert attenuators between the couplers and samplers, protecting the samplers from excessive power.
Page 80 Making Measurements Measuring Amplifiers With the previous points in mind, the amount of attenuation can be calculated from the following equations: • Attenuator value = +20 dBm − 13 dB − (−10 dBm). Attenuator Value = +17 dB 3. Choose the S21 measurement parameter by pressing Trans: FWD S21 (B/R) Meas 4.
Page 81: Using The Swept List Mode To Test A Device
Making Measurements Using the Swept List Mode to Test a Device Using the Swept List Mode to Test a Device When using a list frequency sweep, the analyzer has the ability to sweep arbitrary frequency segments, each containing a list of frequency points. One major advantage of using list frequency sweep is that it allows you to measure the minimum number of data points, and only at the frequencies of interest.
Page 82: Observe The Characteristics Of The Filter
Making Measurements Using the Swept List Mode to Test a Device 2. Set the following measurement parameters: Trans: FWD S21 (B/R) or on ET models: TRANSMISSN Meas Center M/µ Span M/µ Observe the Characteristics of the Filter Figure 1-55 Characteristics of a Filter •...
Page 83 Making Measurements Using the Swept List Mode to Test a Device Set Up the Lower Stopband Parameters 3. To set up the segment for the lower stopband, press START M/µ STOP M/µ NUMBER of POINTS 4. To maximize the dynamic range in the stopband (increasing the incident power and narrowing the IF bandwidth), press MORE until ON is selected...
Page 84: Calibrate And Measure
Making Measurements Using the Swept List Mode to Test a Device 8. To maximize the dynamic range in the stopband (increasing the incident power and narrowing the IF bandwidth), press: MORE SEGMENT POWER SEGMENT IF BW RETURN DONE 9. Press DONE LIST FREQ [SWEPT] Calibrate and Measure 1.
Page 85 Making Measurements Using the Swept List Mode to Test a Device Figure 1-57 Filter Measurements Using Linear Sweep and Swept List Mode Using Linear Sweep (Power: 0 dBm/IF BW: 3700 Hz) Using Swept List Mode 1- 71...
Page 86: Using Limit Lines To Test A Device
Making Measurements Using Limit Lines to Test a Device Using Limit Lines to Test a Device Limit testing is a measurement technique that compares measurement data to constraints that you define. Depending on the results of this comparison, the analyzer will indicate if your device either passes or fails the test.
Page 87: Creating Flat Limit Lines
Making Measurements Using Limit Lines to Test a Device 3. Substitute a thru for the device and perform a response calibration by pressing: CALIBRATE MENU RESPONSE THRU 4. Reconnect your test device. 5. To better view the measurement trace, press: AUTO SCALE Scale Ref Creating Flat Limit Lines...
Page 88 Making Measurements Using Limit Lines to Test a Device 5. To terminate the flat line segment by establishing a single point limit, press: STIMULUS VALUE DONE M/µ LIMIT TYPE SINGLE POINT RETURN Figure 1-59 shows the flat limit lines that you have just created with the following parameters: •...
Page 89: Creating A Sloping Limit Line
Making Measurements Using Limit Lines to Test a Device • To create a limit line that tests the high side of the bandpass filter, press: STIMULUS VALUE M/µ −65 UPPER LIMIT −200 LOWER LIMIT DONE LIMIT TYPE FLAT LINE RETURN STIMULUS VALUE M/µ...
Page 90 Making Measurements Using Limit Lines to Test a Device 1. To access the limits menu and activate the limit lines, press: LIMIT MENU LIMIT LINE LIMIT LINE ON EDIT LIMIT LINE System CLEAR LIST 2. To establish the start frequency and limits for a sloping limit line that tests the low side of the filter, press: STIMULUS VALUE M/µ...
Page 91: Creating Single Point Limits
Making Measurements Using Limit Lines to Test a Device Figure 1-61 Sloping Limit Lines Creating Single Point Limits In this example procedure, the following limits are set: • from −23 dB to −28.5 dB at 141 MHz • from −23 dB to −28.5 dB at 126.5 MHz 1.
Page 92: Editing Limit Segments
Making Measurements Using Limit Lines to Test a Device Figure 1-62 Example Single Points Limit Line Editing Limit Segments This example shows you how to edit the upper limit of a limit line. 1. To access the limits menu and activate the limit lines, press: LIMIT MENU LIMIT LINE LIMIT LINE ON...
Page 93: Running A Limit Test
Making Measurements Using Limit Lines to Test a Device Running a Limit Test 1. To access the limits menu and activate the limit lines, press: LIMIT MENU LIMIT LINE LIMIT LINE ON EDIT LIMIT LINE System Reviewing the Limit Line Segments The limit table data that you have previously entered is shown on the analyzer display.
Page 94 Making Measurements Using Limit Lines to Test a Device 1. To offset all of the segments in the limit table by a fixed frequency, (for example, 3 MHz), press: System LIMIT MENU LIMIT LINE LIMIT LINE OFFSETS STIMULUS OFFSET M/µ The analyzer beeps and a FAIL notation appears on the analyzer display, as shown in Figure 1-63.
Page 95: Using Ripple Limits To Test A Device
Making Measurements Using Ripple Limits to Test a Device Using Ripple Limits to Test a Device Setting Up the List of Ripple Limits to Test Two tasks are involved in preparing for ripple testing: • First, set up the analyzer settings to view the frequency of interest. •...
Page 96 Making Measurements Using Ripple Limits to Test a Device Figure 1-65 Connections for an Example Ripple Test Measurement 2. Press and choose the measurement settings. For this example, the Preset measurement settings are as follows: • or on ET models: Meas Trans: FWD S21 (B/R) TRANSMISSN...
Page 97 Making Measurements Using Ripple Limits to Test a Device Figure 1-66 Filter Pass Band Before Ripple Test Setting Up Limits for Ripple Testing This section instructs you on setting up the ripple test parameters. You must set up the analyzer to check the DUT at the correct frequencies and compare the measured values against the maximum allowable ripple value for each frequency band.
Page 98: Editing Ripple Test Limits
Making Measurements Using Ripple Limits to Test a Device 1. To access the ripple test menu, press: LIMIT MENU RIPPLE LIMIT System 2. To access the ripple test edit menu, press EDIT RIPL LIMIT 3. Add the first frequency band (Frequency Band 1) to be tested by pressing 4.
Page 99 Making Measurements Using Ripple Limits to Test a Device 3. Make the changes to the selected band by pressing: and the new value to change the lower frequency of the MINIMUM FREQUENCY frequency band. and the new value to change the upper frequency of the MAXIMUM FREQUENCY frequency band.
Page 100: Running The Ripple Test
Making Measurements Using Ripple Limits to Test a Device Deleting Existing Frequency Bands Frequency band limits may be deleted for testing the ripple. This procedure guides you through deleting existing frequency band limits. You may delete individual frequency bands or delete all of the frequency bands from the list. 1.
Page 101 Making Measurements Using Ripple Limits to Test a Device Figure 1-67 Filter Passband with Ripple Test Activated As the analyzer measures the ripple, a message is displayed indicating whether the measurement passes or fails: • If the ripple test passes, a RIPLn PASS message (where n = the channel number) is displayed in the color assigned to Channel 1 Memory.
Page 102 Making Measurements Using Ripple Limits to Test a Device • If the ripple test fails, the ripple limits are drawn on the display for each frequency band. Within each frequency band, the lower ripple limit is drawn at the lowest point on the measured trace and the upper ripple limit is drawn at the user-specified maximum ripple value above the lower ripple limit.
Page 103 Making Measurements Using Ripple Limits to Test a Device To display the ripple value, press . Pressing this softkey toggles RIPL VALUE [ ] between , and RIPL VALUE [OFF] RIPL VALUE [ABSOLUTE ] from the Ripple Test Menu until ON is RIPL VALUE [MARGIN ] RIPL TEST on OFF displayed on the softkey.
Page 104 Making Measurements Using Ripple Limits to Test a Device Figure 1-69 Filter Pass Band with Absolute Ripple Value for Band 1 Activated Viewing the Ripple Value in Margin Format When is selected, the margin by which the ripple value passed RIPL VALUE [MARGIN ] or failed is displayed.
Page 105 Making Measurements Using Ripple Limits to Test a Device Figure 1-70 shows the ripple test with margin ripple value displayed for Frequency Band 2. Notice that Frequency Band 2 passes the ripple test with a margin of 0.097 dB. The plus sign (+) indicates this band passes the ripple test by the amount displayed. A minus sign (−) would indicate that the band failed by the displayed amount.
Page 106: Using Bandwidth Limits To Test A Bandpass Filter
Making Measurements Using Bandwidth Limits to Test a Bandpass Filter Using Bandwidth Limits to Test a Bandpass Filter The bandwidth testing mode can be used to test the bandwidth of a bandpass filter. The bandwidth test finds the peak of a signal in the passband and locates a point on each side of the passband at an amplitude below the peak (that you specify during the test setup).
Page 107 Making Measurements Using Bandwidth Limits to Test a Bandpass Filter Figure 1-72 Connections for a Bandpass Filter Example Measurement 2. Press and choose the measurement settings. For this example, the Preset measurement settings are as follows: or on ET models: Meas Trans: FWD S21 (B/R) TRANSMISSN...
Page 108: Running A Bandwidth Test
Making Measurements Using Bandwidth Limits to Test a Bandpass Filter 3. Substitute a thru for the device and perform a response calibration by pressing: CALIBRATE MENU RESPONSE THRU 4. Reconnect your test device. Refer to Figure 1-73. Setting Up the Bandwidth Limits When you set up the bandwidth limits to test the bandpass filter, you will set •...
Page 109 Making Measurements Using Bandwidth Limits to Test a Bandpass Filter Activating the Bandwidth Test 1. Start the bandwidth test by pressing the softkey until ON is BW TEST on OFF displayed. The bandwidth test continues to run until the softkey is returned to the OFF position. The test displays a message in the upper left corner of the graticule showing that the bandwidth test is being performed and the channel on which the test is being performed.
Page 110 Making Measurements Using Bandwidth Limits to Test a Bandpass Filter Figure 1-75 Bandwidth Markers Placed 40 dB Below the Bandpass Peak Displaying the Bandwidth Value 1. Display the bandwidth value by pressing the softkey until ON BW DISPLAY on OFF is displayed on the softkey.
Page 111 Making Measurements Using Bandwidth Limits to Test a Bandpass Filter Figure 1-76 Filter Pass Band with Bandwidth Value Displayed 1- 97...
Page 112: Using Test Sequencing
Making Measurements Using Test Sequencing Using Test Sequencing Test sequencing allows you to automate repetitive tasks. As you make a measurement, the analyzer memorizes the keystrokes. Later you can repeat the entire sequence by pressing a single key. Because the sequence is defined with normal measurement keystrokes, you do not need additional programming expertise.
Page 113 Making Measurements Using Test Sequencing Figure 1-77 Test Sequencing Help Instructions 2. To select a sequence position in which to store your sequence, press: SEQUENCE 1 SEQ1 This choice selects sequence position #1. The default title is SEQ1 for this sequence. Refer to "Changing the Sequence Title"...
Page 114: Running A Sequence
Making Measurements Using Test Sequencing The previous keystrokes will create a displayed list as shown: Start of Sequence RECALL PRST STATE Trans: FWD S21 (B/R) LOG MAG CENTER 134 M/u SPAN 50 M/u SCALE/DIV AUTO SCALE 4. To complete the sequence creation, press: DONE SEQ MODIFY When you create a sequence, the analyzer stores it in volatile memory where CAUTION...
Page 115 Making Measurements Using Test Sequencing 3. To move the cursor to the command that you wish to delete, press: • If you wish to scroll through the sequence without executing each line as you do so, you can press the key and scroll through the command list backwards.
Page 116: Clearing A Sequence From Memory
Making Measurements Using Test Sequencing The following list is the commands entered in "Creating a Sequence" on page 1-98. Notice that for longer sequences, only a portion of the list can appear on the screen at one time. Start of Sequence RECALL PRST STATE Trans: FWD S21 (B/R) LOG MAG...
Page 117: Changing The Sequence Title
Making Measurements Using Test Sequencing Changing the Sequence Title If you are storing sequences on a disk, you should replace the default titles (SEQ1, SEQ2, …). 1. To select a sequence that you want to retitle, press: and select the particular sequence softkey. MORE TITLE SEQUENCE The analyzer shows the available title characters.
Page 118: Storing A Sequence On A Disk
Making Measurements Using Test Sequencing Storing a Sequence on a Disk 1. To format a disk, refer to Chapter 4 , “Printing, Plotting, and Saving Measurement Results.” 2. To save a sequence to the internal disk, press: and select the particular sequence softkey. MORE STORE SEQ TO DISK The disk drive access light should turn on briefly.
Page 119: Printing A Sequence
Making Measurements Using Test Sequencing Printing a Sequence 1. Configure a compatible printer to the analyzer. (Refer to the “Options and Accessories” chapter of the reference guide.) 2. To print a sequence, press: and the softkey for the desired sequence. MORE PRINT SEQUENCE NOTE...
Page 120 Making Measurements Using Test Sequencing Commands That Require a Clean Sweep Many front panel commands disrupt the sweep in progress, for example, changing the channel or measurement type. When the analyzer does execute a disruptive command in a sequence, some instrument functions are inhibited until a complete sweep is taken. This applies to the following functions: •...
Page 121 Making Measurements Using Test Sequencing Presetting the instrument does not run the Auto Sequence automatically. NOTE Gosub Sequence Command softkey, located in the Sequencing menu, activates a feature GOSUB SEQUENCE that allows the sequence to branch off to another sequence, then return to the original sequence.
Page 122 Making Measurements Using Test Sequencing The TESTSET I/O bits are set using the TESTSET I/O FWD TESTSET I/O REV keys under the keys. The values of the outputs (pins 11, 22, and 23) TTL I/O TTL OUT are described in Table 1-5.
Page 123 Making Measurements Using Test Sequencing Electrical specifications for TTL high: • volts(H) ≥ 2.7 volts (V) • current = 20 microamps (µA) Electrical specifications for TTL low: • volts(L) ≤ 0.4 volts (V) • current = 0.2 milliamps (mA) Figure 1-78 Parallel Port Input and Output Bus Pin Locations in GPIO Mode 1- 109...
Page 124 Making Measurements Using Test Sequencing Test Set Interconnect Control Figure 1-79 Test Set Interconnect Pin Designations Control of the external switch (8762B Option T24) can be done through the test set interface on the rear panel of the analyzer. Pin 22 (TTL 1) on the TEST SET-I/O INTERCONNECT connector is a TTL line that changes from TTL high to TTL low when changing TTL I/O FWD from 7 to 6.
Page 125 Making Measurements Using Test Sequencing Table 1-5 Test Set Interconnect Pin Designation Pin Number Pin Description Pin 1 No Connection (NC) Sweep delay: holds off sweeps until test set has finished sweeping (85046A/B and 85047B Pin 2 only) Same as Test Sequence (TTL OUT) output BNC connector Pin 3 Pin 4 Pin 5...
Page 126 Making Measurements Using Test Sequencing TTL Out Menu The softkey provides access to the TTL out menu. This menu TTL OUT allows you to choose between the following output parameters of the TTL output signal: • TTL OUT HIGH • TTL OUT LOW •...
Page 127 Making Measurements Using Test Sequencing Loop counter decision making The analyzer has a numeric register called a loop counter. The value of this register can be set by a sequence, and it can be incriminated or decremented each time a sequence repeats itself. The decision making commands jump to another sequence if the IF LOOP COUNTER = 0 IF LOOP COUNTER <>...
Page 128: Using Test Sequencing To Test A Device
Making Measurements Using Test Sequencing to Test a Device Using Test Sequencing to Test a Device Test sequencing allows you to automate repetitive tasks. As you make a measurement, the analyzer memorizes the keystrokes. Later you can repeat the entire sequence by pressing a single key.
Page 129: Loop Counter Example Sequence
Making Measurements Using Test Sequencing to Test a Device The following sequences will be created: SEQUENCE SEQ1 Start of Sequence CENTER 134 M/u SPAN 50 M/u DO SEQUENCE SEQUENCE 2 SEQUENCE SEQ2 Start of Sequence Trans:FWD S21 (B/R) LOG MAG SCALE/DIV AUTO SCALE You can extend this process of calling the next sequence from the last line of the present...
Page 130: Generating Files In A Loop Counter Example Sequence
Making Measurements Using Test Sequencing to Test a Device To create a second sequence that will perform a desired measurement function, decrement the loop counter, and call itself until the loop counter value is equal to zero, press: NEW SEQ/MODIFY SEQ SEQUENCE 2 SEQ2 or on ET models: Trans: FWD S21 (B/R)
Page 131 Making Measurements Using Test Sequencing to Test a Device FILE UTILITIES SEQUENCE FILE NAMING Save/Recall FILE NAME FILE0 ERASE TITLE LOOP COUNTER DONE PLOT NAME PLOTFILE ERASE TITLE LOOP COUNTER DONE RETURN Sweep Setup TRIGGER MENU SINGLE SAVE STATE Save/Recall PLOT Copy SPECIAL FUNCTIONS...
Page 132: Limit Test Example Sequence
Making Measurements Using Test Sequencing to Test a Device • The plot file names generated by this sequence will be: PL00007.FP through PL00001.FP To run the sequence, press: SEQUENCE 1 SEQ 1 Preset Limit Test Example Sequence This measurement example shows you how to create a sequence that will branch the sequence according to the outcome of a limit test.
Page 133 Making Measurements Using Test Sequencing to Test a Device This will create a displayed list for sequence 2, as shown: Start of Sequence INTERNAL DISK DATA ARRAY FILENAME FILE 0 SAVE FILE 3. To create a sequence that prompts you to tune a device that has failed the limit test, and calls sequence 1 to retest the device, press: NEW SEQ/MODIFY SEQ SEQUENCE 3 SEQ3...
Page 134 Making Measurements Using Test Sequencing to Test a Device 1-120...
Page 135: Making Mixer Measurements (Option 089 Only)
Making Mixer Measurements (Option 089 Only)
Page 136: Using This Chapter
Making Mixer Measurements (Option 089 Only) Using This Chapter Using This Chapter This chapter contains the following: • Information on mixer measurement capabilities. • Information on mixer measurement considerations. • Example procedures for making the following mixer measurements: — Conversion loss using the frequency offset mode —...
Page 137: Mixer Measurement Capabilities
Making Mixer Measurements (Option 089 Only) Mixer Measurement Capabilities Mixer Measurement Capabilities The analyzer is capable of measuring the following mixer (frequency converter) parameters: Figure 2-1 Mixer Parameters • Transmission characteristics include conversion loss, conversion compression, group delay, and RF feedthrough. •...
Page 138: Measurement Considerations
Making Mixer Measurements (Option 089 Only) Measurement Considerations Measurement Considerations In mixer transmission measurements, you have RF and LO inputs and an IF output. Also emanating from the IF port are several other mixing products of the RF and LO signals. In mixer measurements, leakage signals from one mixer port propagate and appear at the other two mixer ports.
Page 139: Reducing The Effect Of Spurious Responses
Making Mixer Measurements (Option 089 Only) Measurement Considerations Figure 2-2 Conversion Loss versus Output Frequency without Attenuators at Mixer Ports Figure 2-3 Example of Conversion Loss versus Output Frequency with Attenuation at All Mixer Ports Reducing the Effect of Spurious Responses By choosing test frequencies (frequency list mode), you can reduce the effect of spurious responses on measurements by avoiding frequencies that produce IF signal path distortion.
Page 140: Eliminating Unwanted Mixing And Leakage Signals
Making Mixer Measurements (Option 089 Only) Measurement Considerations Eliminating Unwanted Mixing and Leakage Signals By placing filters between the mixer’s IF port and the receiver’s input port, you can eliminate unwanted mixing and leakage signals from entering the analyzer’s receiver. Filtering is required in both fixed and broadband measurements.
Page 141: How Rf And If Are Defined
Making Mixer Measurements (Option 089 Only) Measurement Considerations Figure 2-5 Example of Conversion Loss versus Output Frequency with Correct IF Signal Path Filtering and Attenuation at All Mixer Ports How RF and IF Are Defined When you choose between in the frequency offset menus, the RF <...
Page 142 Making Mixer Measurements (Option 089 Only) Measurement Considerations Figure 2-6 Examples of Up Converters and Down Converters In standard mixer measurements, the input of the mixer is always connected to the analyzer’s RF source, and the output of the mixer always produces the IF frequencies that are received by the analyzer’s receiver.
Page 143: Frequency Offset Mode Operation
Making Mixer Measurements (Option 089 Only) Measurement Considerations Figure 2-7 Down Converter Port Connections • In an up converter measurement where the softkey is selected, the UP CONVERTER notation on the setup diagram indicates that the analyzer's source frequency is labeled IF, connecting to the mixer IF port, and the analyzer's receiver frequency is labeled RF, connecting to the mixer RF port.
Page 144: Lo Frequency Accuracy And Stability
Making Mixer Measurements (Option 089 Only) Measurement Considerations Frequency offset measurements do not begin until all of the frequency offset mode parameters are set. These include the following: • Start and Stop IF Frequencies • LO frequency • Up Converter / Down Converter •...
Page 145 3. Connect the analyzer source output, port 1, directly to the R channel input as shown in Figure 2-9. To prevent connector damage on the 8719ES, use an adapter (part number CAUTION 1250-1462) as a connector saver for R CHANNEL IN.
Page 146: Power Meter Calibration
Making Mixer Measurements (Option 089 Only) Measurement Considerations 6. You cannot trust R channel power settings without knowing about the offset involved. Perform a receiver calibration to remove any power offsets by pressing: −10 RECEIVER CAL TAKE RCVR CAL SWEEP Once completed, the R channel should display the reference power (−10 dBm in this example).
Page 147: Conversion Loss Using The Frequency Offset Mode
Making Mixer Measurements (Option 089 Only) Conversion Loss Using the Frequency Offset Mode Conversion Loss Using the Frequency Offset Mode Conversion loss is the measure of efficiency of a mixer. It is the ratio of side-band IF power to RF signal power, and is usually expressed in dB. The mixer translates the incoming signal, (RF), to a replica, (IF), displaced in frequency by the local oscillator, (LO).
Page 148: Setting Measurement Parameters For The Power Meter Calibration
Making Mixer Measurements (Option 089 Only) Conversion Loss Using the Frequency Offset Mode Setting Measurement Parameters for the Power Meter Calibration 1. Connect the measurement equipment as shown in Step 1 of Figure 2-11. Figure 2-11 Connections for R Channel and Source Calibration CAUTION Note that the front panel jumper between R In and R Out must remain installed during the procedure steps that use the connections in Step 1 of...
Page 149: Performing A Power Meter (Source) Calibration Over The Rf Range
Making Mixer Measurements (Option 089 Only) Conversion Loss Using the Frequency Offset Mode Performing a Power Meter (Source) Calibration Over the RF Range 1. Calibrate and zero the power meter. 2. Set the power meter’s address: SET ADDRESSES ADDRESS: P MTR/GPIB (where aa is the GPIB address of the power meter) 3.
Page 150 Making Mixer Measurements (Option 089 Only) Conversion Loss Using the Frequency Offset Mode 5. To perform a one sweep power meter calibration over the RF frequency range at 0 dBm (−10 dBm for 8722ES), press: PWRMTR CAL ONE SWEEP −10 (or on 8722ES: TAKE CAL SWEEP Because power meter calibration requires a longer sweep time, you may want...
Page 151: Setting The Analyzer To Make An R Channel Measurement
Making Mixer Measurements (Option 089 Only) Conversion Loss Using the Frequency Offset Mode Setting the Analyzer to Make an R Channel Measurement 1. Connect the equipment as shown in Figure 2-12. Figure 2-12 R-Channel Mixer Measurement Equipment Setup An error message will be displayed while the R In port is disconnected. NOTE Ignore this error message until step 3 is complete.
Page 152 Making Mixer Measurements (Option 089 Only) Conversion Loss Using the Frequency Offset Mode 4. Turn on frequency offset operation by pressing FREQS OFFS ON Notice in this high-side LO, down conversion configuration, the analyzer’s source is actually sweeping backwards, as shown in Figure 2-13.
Page 153 Making Mixer Measurements (Option 089 Only) Conversion Loss Using the Frequency Offset Mode 5. To view the conversion loss in the best vertical resolution, press Scale Ref AUTOSCALE Figure 2-15 Conversion Loss Example Measurement In this measurement, you set the input power and measured the output power. Figure 2-15 shows the absolute loss through the mixer versus mixer output frequency.
Page 154: High Dynamic Range Swept Rf/If Conversion Loss
Making Mixer Measurements (Option 089 Only) High Dynamic Range Swept RF/IF Conversion Loss High Dynamic Range Swept RF/IF Conversion Loss The frequency offset mode enables the testing of high dynamic range frequency converters (mixers), by tuning the analyzer’s high dynamic range receiver above or below its source, by a fixed offset.
Page 155 Making Mixer Measurements (Option 089 Only) High Dynamic Range Swept RF/IF Conversion Loss Figure 2-16 Connections for Power Meter Calibration 3. Select the analyzer as the system controller: Local SYSTEM CONTROLLER 4. Set the power meter’s address: SET ADDRESSES (where aa is the power meter GPIB address) ADDRESS: P MTR/GPIB 5.
Page 156: Perform A Receiver Calibration Over The If Range
Making Mixer Measurements (Option 089 Only) High Dynamic Range Swept RF/IF Conversion Loss Because power meter calibration requires a longer sweep time, you may want NOTE to reduce the number of points before pressing . After the TAKE CAL SWEEP power meter calibration is finished, return the number of points to its original value and the analyzer will automatically interpolate this calibration.
Page 157: Perform A Power Meter Calibration Over The Rf Range
Making Mixer Measurements (Option 089 Only) High Dynamic Range Swept RF/IF Conversion Loss Using the Mixer Measurement Diagram While the analyzer is still set to the IF frequency range, press: INSTRUMENT MODE FREQ OFFS MENU System LO MENU FREQUENCY:CW 1500 M/µ...
Page 158: Perform The High Dynamic Range Measurement
Making Mixer Measurements (Option 089 Only) High Dynamic Range Swept RF/IF Conversion Loss Perform the High Dynamic Range Measurement 1. Return the analyzer to the IF frequency range. Press Start M/µ Stop 2. Make the connections shown in Figure 2-19 3.
Page 159 Making Mixer Measurements (Option 089 Only) High Dynamic Range Swept RF/IF Conversion Loss Figure 2-19 Connections for a High Dynamic Range Swept IF Conversion Loss Measurement 4. Set the analyzers LO frequency to match the frequency of the LO source by pressing: System INSTRUMENT MODE FREQ OFFS MENU LO FREQUENCY 1500...
Page 160 Making Mixer Measurements (Option 089 Only) High Dynamic Range Swept RF/IF Conversion Loss Figure 2-20 Example of Swept IF Conversion Loss Measurement 2-26...
Page 161: Fixed If Mixer Measurements
Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Fixed IF Mixer Measurements A fixed IF can be produced by using both a swept RF and LO that are offset by a certain frequency. With proper filtering, only this offset frequency will be present at the IF port of the mixer.
Page 162 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements You may have to consult the user’s guide of the external source being used to NOTE determine how to set the source to receive SCPI commands. 3. Be sure to connect the 10 MHz reference signals of the external sources to the EXT REF connector on the rear panel of the analyzer (a BNC tee must be used).
Page 163 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Putting the Analyzer into Tuned Receiver Mode SYSTEM CONTROLLER Local System INSTRUMENT MODE TUNED RECEIVER Setting Up a Frequency List Sweep of 26 Points SWEEP TYPE MENU EDIT LIST Sweep Setup START M/µ...
Page 164 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Initializing a Loop Counter Value to 26 SPECIAL FUNCTIONS DECISION MAKING MKING LOOP COUNTER Scale Ref REFERENCE POSITION −20 REFERENCE VALUE TRIGGER MENU MANUAL TRG ON POINT Sweep Setup TG ON POINT Addressing and Configuring the Two Sources MORE TITLE...
Page 165 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements TUNED RECEIVER EDIT LIST CW FREQ 100M/u NUMBER OF POINTS 26x1 DONE DONE LIST FREQ TITLE POW:LEV 6DBM PERIPHERAL HPIB ADDR 19x1 TITLE TO PERIPHERAL TITLE FREQ:MODE CW;CW 100MHZ TITLE TO PERIPHERAL CALIBRATE: RESPONSE CAL STANDARD DONE CAL CLASS...
Page 166: Sequence 2 Setup
Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Sequence 2 Setup The following sequence makes a series of measurements until all 26 CW measurements are made and the loop counter value is equal to zero. This sequence includes: •...
Page 167 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Press and the analyzer will NEW SEQ/MODIFY SEQ SEQUENCE 2 SEQ2 display the following sequence commands: SEQUENCE SEQ2 Start of Sequence WAIT x 1 x1 MANUAL TRG ON POINT TITLE FREQ:CW UP PERIPHERAL HPIB ADDR 19x1...
Page 168 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements When the sequences are finished you should have a result as shown in Figure 2-23. Figure 2-23 Example Fixed IF Mixer Measurement The displayed trace represents the conversion loss of the mixer at 26 points. Each point corresponds to one of the 26 different sets of RF and LO frequencies that were used to create the same fixed IF frequency.
Page 169: Phase Or Group Delay Measurements
Making Mixer Measurements (Option 089 Only) Phase or Group Delay Measurements Phase or Group Delay Measurements For information on group delay principles, refer to "Setting the Electrical Delay" on page 1-37. Phase Measurements When you are making linear measurements, you must provide a reference for determining phase by splitting the RF source power and send part of the signal into the reference channel.
Page 170 Making Mixer Measurements (Option 089 Only) Phase or Group Delay Measurements An important characteristic to remember when selecting a calibration mixer is that the delay of the device should be kept as low as possible. To do this, select a mixer with very wide bandwidth (wider bandwidth results in smaller delay).
Page 171 Making Mixer Measurements (Option 089 Only) Phase or Group Delay Measurements Figure 2-24 Connections for a Group Delay Measurement 6. To select the converter type and a high-side LO measurement configuration, press: System INSTRUMENT MODE FREQ OFFS MENU DOWN CONVERTER RF<LO FREQ OFFS ON 7.
Page 172 Making Mixer Measurements (Option 089 Only) Phase or Group Delay Measurements 10.Replace the "calibration" mixer with the device under test. If measuring group delay, set the delay equal to the "calibration" mixer delay (for example −0.6 ns) by pressing: Scale Ref ELECTRICAL DELAY −06 11.Scale the data for best vertical resolution.
Page 173: Amplitude And Phase Tracking
Making Mixer Measurements (Option 089 Only) Amplitude and Phase Tracking Amplitude and Phase Tracking The match between mixers is defined as the absolute difference in amplitude or phase response over a specified frequency range. The tracking between mixers is essentially how well the devices are matched over a specified interval.
Page 174: Conversion Compression Using The Frequency Offset Mode
1 dB compression point. NOTE Because this procedure was performed with an 8719ES/20ES, Option 007, the analyzer was able to produce an output power of +10 dBm. If the default output power of your analyzer is not high enough to force the mixer under test into compression, then the following procedure may have to be performed with the addition of Option 007 or Option 085.
Page 175 Making Mixer Measurements (Option 089 Only) Conversion Compression Using the Frequency Offset Mode INSTRUMENT MODE FREQ OFFS MENU System LO FREQUENCY 800 M/µ 4. To set the analyzer to the desired power sweep range, press: Power PWR RANGE MAN POWER RANGES RANGE 0 −10 Start Stop...
Page 176 Making Mixer Measurements (Option 089 Only) Conversion Compression Using the Frequency Offset Mode 8. Make the connections as shown in Figure 2-29. To prevent connector damage, use an adapter (part number 1250-1462) as a CAUTION connector saver for R CHANNEL IN. Figure 2-29 Connections for the Second Portion of Conversion Compression Measurement 9.
Page 177 Making Mixer Measurements (Option 089 Only) Conversion Compression Using the Frequency Offset Mode The measurements setup diagram is shown in Figure 2-30. Figure 2-30 Measurement Setup Diagram Shown on Analyzer Display 12.To view the mixer’s output power as a function of its input power, press: VIEW MEASURE 13.To set up an active marker to search for the 1 dB compression point of the mixer, press: Scale Ref...
Page 178 Making Mixer Measurements (Option 089 Only) Conversion Compression Using the Frequency Offset Mode The measurement results show the mixer’s 1 dB compression point. By changing the target value, you can easily locate other compression points (for example, 0.5 dB, 3 dB). Figure 2-31.
Page 179: Isolation Example Measurements
Making Mixer Measurements (Option 089 Only) Isolation Example Measurements Isolation Example Measurements Isolation is the measure of signal leakage in a mixer. Feedthrough is specifically the forward signal leakage to the IF port. High isolation means that the amount of leakage or feedthrough between the mixer’s ports is very small.
Page 180 Making Mixer Measurements (Option 089 Only) Isolation Example Measurements 4. Make the connections as shown in Figure 2-33. Figure 2-33 Connections for a Response Calibration 5. Perform a response calibration by pressing CALIBRATE MENU RESPONSE THRU NOTE A full 2-port calibration will increase the accuracy of isolation measurements. Refer to Chapter 5 , “Optimizing Measurement Results.”...
Page 181: Rf Feedthrough
Making Mixer Measurements (Option 089 Only) Isolation Example Measurements 7. To adjust the display scale, press: AUTO SCALE Scale Ref The measurement results show the mixer’s LO to RF isolation. Figure 2-35 Example Mixer LO to RF Isolation Measurement RF Feedthrough The procedure and equipment configuration necessary for this measurement are very similar to those of the previous LO to RF Isolation procedure, with the addition of an external source to drive the mixer’s LO port as we measure the mixer’s RF feedthrough.
Page 182 Making Mixer Measurements (Option 089 Only) Isolation Example Measurements Isolation is dependent on LO power level and frequency. To ensure good test NOTE results, you should choose these parameters as close to actual operating conditions as possible. 5. Make the connections as shown in Figure 2-36.
Page 183 Making Mixer Measurements (Option 089 Only) Isolation Example Measurements You may see spurious responses on the analyzer trace due to interference NOTE caused by LO to IF leakage in the mixer. This can be reduced with averaging or by reducing the IF bandwidth. Figure 2-38 Example Mixer RF Feedthrough Measurement You can measure the IF to RF isolation in a similar manner, but with the following modifications:...
Page 184: Swr / Return Loss
Making Mixer Measurements (Option 089 Only) Isolation Example Measurements SWR / Return Loss Reflection coefficient (Γ) is defined as the ratio between the reflected voltage (V ) and incident voltage (V ). Standing wave ratio (SWR) is defined as the ratio of maximum standing wave voltage to the minimum standing wave voltage and can be derived from the reflection coefficient (Γ) using the following equation.
Page 185 Making Time Domain Measurements...
Page 186: Making Time Domain Measurements Using This Chapter
Making Time Domain Measurements Using This Chapter Using This Chapter This chapter contains the following: • An introduction to time domain measurements • Example procedures for making time domain transmission and reflection response measurements • Information on the following time domain concepts: —...
Page 187: Introduction To Time Domain Measurements
Making Time Domain Measurements Introduction to Time Domain Measurements Introduction to Time Domain Measurements The analyzers with Option 010 allow you to measure the time domain response of a device. Time domain analysis is useful for isolating a device problem in time or in distance. Time and distance are related by the velocity factor of your device under test (DUT) which is described in "Time Domain Bandpass Mode"...
Page 188 Making Time Domain Measurements Introduction to Time Domain Measurements Figure 3-1 Device Frequency Domain and Time Domain Reflection Responses The time domain measurement shows the effect of each discontinuity as a function of time (or distance), and shows that the test device response consists of three separate impedance changes.
Page 189: Making Transmission Response Measurements
Making Time Domain Measurements Making Transmission Response Measurements Making Transmission Response Measurements In this example measurement there are three components of the transmission response: • RF leakage at near zero time • the main travel path through the device (1.6 µs travel time) •...
Page 190 Making Time Domain Measurements Making Transmission Response Measurements 5. To transform the data from the frequency domain to the time domain and set the sweep from 0 s to 6 µs, press: TRANSFORM MENU BANDPASS TRANSFORM ON System Start Stop M/µ...
Page 191 Making Time Domain Measurements Making Transmission Response Measurements 11.To activate the gating function to remove any unwanted responses, press: GATE ON As shown in Figure 3-4, only response from the main path is displayed. You may remove the displayed response from inside the gate markers by NOTE pressing and turning the front panel knob to exchange the "flag"...
Page 192 Making Time Domain Measurements Making Transmission Response Measurements Figure 3-5 Gate Shape • To see the effect of the gating in the frequency domain, press: TRANSFORM MENU TRANSFORM OFF System AUTO SCALE Scale Ref → Display DATA DISPLAY: DATA AND MEMORY System TRANSFORM MENU SPECIFY GATE...
Page 193: Making Reflection Response Measurements
Making Time Domain Measurements Making Reflection Response Measurements Making Reflection Response Measurements The time domain response of a reflection measurement is often compared with the time domain reflectometry (TDR) measurements. Like the TDR, the analyzer measures the size of the reflections versus time (or distance). Unlike the TDR, the time domain capability of the analyzer allows you to choose the frequency range over which you would like to make the measurement.
Page 194 Making Time Domain Measurements Making Reflection Response Measurements Figure 3-8 Device Response in the Frequency Domain 5. To transform the data from the frequency domain to the time domain, press: System TRANSFORM MENU BANDPASS TRANSFORM ON 6. To view the time domain over the length (<4 meters) of the cable under test, press: LIN MAG Format Start...
Page 195 Making Time Domain Measurements Making Reflection Response Measurements 8. To position the marker on the reflection of interest, press: and turn the front panel knob, or enter a value from the front panel keypad. Marker In this example, the velocity factor was set to one-half the actual value, so the marker reads the time and distance to the reflection.
Page 196: Time Domain Bandpass Mode
Making Time Domain Measurements Time Domain Bandpass Mode Time Domain Bandpass Mode This mode is called bandpass because it works with band-limited devices. Traditional TDR requires that the test device be able to operate down to dc. Using bandpass mode, there are no restrictions on the measurement frequency range.
Page 197 Making Time Domain Measurements Time Domain Bandpass Mode Figure 3-10 A Reflection Measurement of Two Cables The ripples in reflection coefficient versus frequency in the frequency domain measurement are caused by the reflections at each connector "beating" against each other. One at a time, loosen the connectors at each end of the cable and observe the response in both the frequency domain and the time domain.
Page 198: Transmission Measurements Using Bandpass Mode
Making Time Domain Measurements Time Domain Bandpass Mode Table 3-1 Time Domain Reflection Formats Format Parameter Reflection Coefficient (unitless) (0 < ρ < 1) LIN MAG Reflection Coefficient (unitless) (−1 < ρ < 1) REAL LOG MAG Return Loss (dB) Standing Wave Ratio (unitless) Transmission Measurements Using Bandpass Mode The bandpass mode can also transform transmission measurements to the time domain.
Page 199: Time Domain Low Pass Mode
Making Time Domain Measurements Time Domain Low Pass Mode Time Domain Low Pass Mode This mode is used to simulate a traditional time domain reflectometry (TDR) measurement. It provides information to determine the type of discontinuity (resistive, capacitive, or inductive) that is present. Low pass provides the best resolution for a given bandwidth in the frequency domain.
Page 200: Reflection Measurements In Time Domain Low Pass
Making Time Domain Measurements Time Domain Low Pass Mode Table 3-2 Minimum Frequency Ranges for Time Domain Low Pass Number of Points Minimum Frequency Range Number of Points Minimum Frequency Range 50 MHz to 2.55 GHz 50 MHz to 40.05 GHz Minimum Allowable Stop Frequencies The lowest analyzer measurement frequency is 50 MHz, therefore for each value of n there is a minimum allowable stop frequency that can be used.
Page 201 Making Time Domain Measurements Time Domain Low Pass Mode The real format can also be used in the low pass impulse mode, but for the best dynamic range for simultaneously viewing large and small discontinuities, use the log magnitude format. 3- 17...
Page 202: Fault Location Measurements Using Low Pass
Making Time Domain Measurements Time Domain Low Pass Mode Fault Location Measurements Using Low Pass As described, the low pass mode can simulate the TDR response of the test device. This response contains information useful in determining the type of discontinuity present. Figure 3-13 illustrates the low pass responses of known discontinuities.
Page 203: Transmission Measurements In Time Domain Low Pass
Making Time Domain Measurements Time Domain Low Pass Mode Figure 3-14 Low Pass Step Measurements of Common Cable Faults (Real Format) Transmission Measurements in Time Domain Low Pass Measuring Small Signal Transient Response Using Low Pass Step Use the low pass mode to analyze the test device’s small signal transient response. The transmission response of a device to a step input is often measured at lower frequencies, using a function generator (to provide the step to the test device) and a sampling oscilloscope (to analyze the test device output response).
Page 204 Making Time Domain Measurements Time Domain Low Pass Mode Figure 3-15 Time Domain Low Pass Measurement of an Amplifier Small Signal Transient Response Interpreting the Low Pass Step Transmission Response Horizontal Axis The low pass transmission measurement horizontal axis displays the average transit time through the test device over the frequency range used in the measurement.
Page 205 Making Time Domain Measurements Time Domain Low Pass Mode Figure 3-16 Transmission Measurements Using Low Pass Impulse Mode 3- 21...
Page 206: Transforming Cw Time Measurements Into The Frequency Domain
Making Time Domain Measurements Transforming CW Time Measurements into the Frequency Domain Transforming CW Time Measurements into the Frequency Domain The analyzer can display the amplitude and phase of CW signals versus time. For example, use this mode for measurements such as amplifier gain as a function of warmup time (i.e. drift).
Page 207 Making Time Domain Measurements Transforming CW Time Measurements into the Frequency Domain Interpreting the Forward Transform Horizontal Axis In a frequency domain transform of a CW time measurement, the horizontal axis is measured in units of frequency. The center frequency is the offset of the CW frequency. For example, with a center frequency of 0 Hz, the CW frequency (250 MHz in the example) is in the center of the display.
Page 208 Making Time Domain Measurements Transforming CW Time Measurements into the Frequency Domain Figure 3-19 Separating the Amplitude and Phase Components of Test-Device-Induced Modulation Forward Transform Range In the forward transform (from CW time to the frequency domain), range is defined as the frequency span that can be displayed before aliasing occurs, and is similar to range as defined for time domain measurements.
Page 209 Making Time Domain Measurements Transforming CW Time Measurements into the Frequency Domain Figure 3-20 Range of a Forward Transform Measurement To increase the frequency domain measurement range, increase the span. The maximum range is inversely proportional to the sweep time, therefore it may be necessary to increase the number of points or decrease the sweep time.
Page 210: Masking
Making Time Domain Measurements Masking Masking Masking occurs when a discontinuity (fault) closest to the reference plane affects the response of each subsequent discontinuity. This happens because the energy reflected from the first discontinuity never reaches subsequent discontinuities. For example, if a transmission line has two discontinuities that each reflect 50% of the incident voltage, the time domain response (real format) shows the correct reflection coefficient for the first discontinuity (ρ=0.50).
Page 211: Windowing
Making Time Domain Measurements Windowing Windowing The analyzer provides a windowing feature that makes time domain measurements more useful for isolating and identifying individual responses. Windowing is needed because of the abrupt transitions in a frequency domain measurement at the start and stop frequencies.
Page 212 Making Time Domain Measurements Windowing Table 3-3 Impulse Width, Sidelobe Level, and Windowing Values Window Type Impulse Sidelobe Low Pass Impulse Step Sidelobe Step Rise Time (10 − 90%) Level Width (50%) Level −13 dB −21 dB Minimum 0.60/Freq Span 0.45/Freq Span −44 dB −60 dB...
Page 213 Making Time Domain Measurements Windowing Figure 3-23 The Effects of Windowing on the Time Domain Responses of a Short Circuit (Real Format) 3- 29...
Page 214: Range
Making Time Domain Measurements Range Range In the time domain, range is defined as the length in time that a measurement can be made without encountering a repetition of the response, called aliasing. A time domain response repeats at regular intervals because the frequency domain data is taken at discrete frequency points, rather than continuously over the frequency band.
Page 215 Making Time Domain Measurements Range In this example, the range is 100 ns, or 30 meters electrical length. To prevent the time domain responses from overlapping, the test device must be 30 meters or less in electrical length for a transmission measurement (15 meters for a reflection measurement). The analyzer limits the stop time to prevent the display of aliased responses.
Page 216: Resolution
Making Time Domain Measurements Resolution Resolution Two different resolution terms are used in the time domain: • response resolution • range resolution Response Resolution Time domain response resolution is defined as the ability to resolve two closely-spaced responses, or a measure of how close two responses can be to each other and still be distinguished from each other.
Page 217 Making Time Domain Measurements Resolution For example, a cable with a teflon dielectric (0.7 relative velocity factor), measured under the conditions stated above, has a fault location measurement response resolution of 0.45 centimeters. This is the maximum fault location response resolution. Factors such as reduced frequency span, greater frequency domain data windowing, and a large discontinuity shadowing the response of a smaller discontinuity, all act to degrade the effective response resolution.
Page 218: Range Resolution
Making Time Domain Measurements Resolution Range Resolution Time domain range resolution is defined as the ability to locate a single response in time. If only one response is present, range resolution is a measure of how closely you can pinpoint the peak of that response.
Page 219: Gating
Making Time Domain Measurements Gating Gating Gating provides the flexibility of selectively removing time domain responses. The remaining time domain responses can then be transformed back to the frequency domain. For reflection (or fault location) measurements, use this feature to remove the effects of unwanted discontinuities in the time domain.
Page 220: Selecting Gate Shape
Making Time Domain Measurements Gating Figure 3-27 Gate Shape Selecting Gate Shape The four gate shapes available are listed in Table 3-4. Each gate has a different passband flatness, cutoff rate, and sidelobe levels. Table 3-4 Gate Characteristics Gate Shape Passband Ripple Sidelobe Levels Cutoff Time...
Page 221: Printing, Plotting, And Saving Measurement Results
Printing, Plotting, and Saving Measurement Results...
Page 222: Using This Chapter
Printing, Plotting, and Saving Measurement Results Using This Chapter Using This Chapter This chapter contains instructions for the following tasks: • Printing or plotting your measurement results Configuring a print function Defining a print function Printing one measurement per page Printing multiple measurements per page Configuring a plot function Defining a plot function...
Page 223: Printing Or Plotting Your Measurement Results
Printing, Plotting, and Saving Measurement Results Printing or Plotting Your Measurement Results Printing or Plotting Your Measurement Results You can print your measurement results to the following peripherals: • printers with GPIB interfaces • printers with parallel interfaces • printers with serial interfaces You can plot your measurement results to the following peripherals: •...
Page 224: Configuring A Print Function
Printing, Plotting, and Saving Measurement Results Configuring a Print Function Configuring a Print Function All copy configuration settings are stored in non-volatile memory. Therefore, they are not affected if you press or switch off the analyzer power. Preset 1. Connect the printer to the interface port. Figure 4-1 Printer Connections to the Analyzer 2.
Page 225 Printing, Plotting, and Saving Measurement Results Configuring a Print Function 3. Select one of the following printer interfaces: • Choose if your printer has a GPIB interface, and then PRNTR PORT GPIB configure the print function as follows: a. Enter the GPIB address of the printer, followed by b.
Page 226: Defining A Print Function
Printing, Plotting, and Saving Measurement Results Defining a Print Function Defining a Print Function NOTE The print definition is set to default values whenever the power is cycled. However, you can save the print definition by saving the instrument state. 1.
Page 227: To Reset The Printing Parameters To Default Values
Printing, Plotting, and Saving Measurement Results Defining a Print Function To Reset the Printing Parameters to Default Values 1. Press DEFINE PRINT DEFAULT PRNT SETUP Copy Table 4-1 Default Values for Printing Parameters Printing Parameter Default Printer Mode Monochrome Auto Feed Printer Colors Channel 1 and 3 Data Magenta...
Page 228: Printing One Measurement Per Page
Printing, Plotting, and Saving Measurement Results Printing One Measurement Per Page Printing One Measurement Per Page 1. Configure and define the print function, as explained in "Configuring a Print Function" on page 4-4 "Defining a Print Function" on page 4-6. 2.
Page 229: Printing Multiple Measurements Per Page
Printing, Plotting, and Saving Measurement Results Printing Multiple Measurements Per Page Printing Multiple Measurements Per Page 1. Configure and define the print function, as explained in "Configuring a Print Function" on page 4-4 "Defining a Print Function" on page 4-6. 2.
Page 230: Configuring A Plot Function
Printing, Plotting, and Saving Measurement Results Configuring a Plot Function Configuring a Plot Function All copy configuration settings are stored in non-volatile memory. Therefore, they are not affected if you press or switch off the analyzer power. Preset Peripheral Interface Recommended Cables Parallel 92284A...
Page 231 Printing, Plotting, and Saving Measurement Results Configuring a Plot Function Information regarding a printer compatibility guide (an up-to-date list of printers that are compatible with the network analyzer) is available in "Printing or Plotting Your Measurement Results" on page 4-3. 3.
Page 232: If You Are Plotting To A Pen Plotter
Printing, Plotting, and Saving Measurement Results Configuring a Plot Function If You Are Plotting to a Pen Plotter 1. Press and then until SET ADDRESSES PLOTTER PORT PLTR TYPE Local appears. PLTR TYPE [PLOTTER] 2. Configure the analyzer for one of the following plotter interfaces: •...
Page 233: If You Are Plotting Measurement Results To A Disk Drive
Printing, Plotting, and Saving Measurement Results Configuring a Plot Function If You Are Plotting Measurement Results to a Disk Drive The plot files that you generate from the analyzer, contain the HPGL representation of the measurement display. The files will not contain any setup or formfeed commands. CAUTION Do not mistake the line switch for the disk eject button when you are removing the disk from the analyzer.
Page 234 Printing, Plotting, and Saving Measurement Results Configuring a Plot Function Figure 4-4 Automatic File Naming Convention for LIF Format To Output the Plot Files • You can plot the files to a plotter from a personal computer. • You can output your plot files to an HPGL compatible printer, by following the sequence "Outputting Plot Files from a PC to an HPGL Compatible Printer"...
Page 235: Defining A Plot Function
Printing, Plotting, and Saving Measurement Results Defining a Plot Function Defining a Plot Function 1. Press DEFINE PLOT Copy Choosing Display Elements • Choose which of the following measurement display elements that you want to appear on your plot: Choose PLOT DATA ON if you want the measurement data trace to appear on your plot.
Page 236: Selecting Pen Numbers And Colors
Printing, Plotting, and Saving Measurement Results Defining a Plot Function The peripheral ignores AUTO-FEED ON when you are plotting to a NOTE quadrant. Selecting Pen Numbers and Colors • Press MORE and select the plot element where you want to change the pen number. For example, press PEN NUM DATA and then modify the pen number.
Page 237: Selecting Line Types
Printing, Plotting, and Saving Measurement Results Defining a Plot Function Selecting Line Types • Press MORE and select each plot element line type that you want to modify. — Select LINE TYPE DATA to modify the line type for the data trace. Then enter the new line type (see Figure 4-6), followed by...
Page 238: Choosing Plot Speed
Printing, Plotting, and Saving Measurement Results Defining a Plot Function Figure 4-7 Locations of P1 and P2 in Mode SCALE PLOT [GRAT] Choosing Plot Speed • Press until the plot speed appears that you want. PLOT SPEED Choose for normal plotting. PLOT SPEED [FAST] Choose for plotting directly on transparencies.
Page 239: Plotting One Measurement Per Page Using A Pen Plotter
Printing, Plotting, and Saving Measurement Results Plotting One Measurement Per Page Using a Pen Plotter Plotting One Measurement Per Page Using a Pen Plotter 1. Configure and define the plot, as explained in "Configuring a Plot Function" on page 4-10 "Defining a Plot Function"...
Page 240: Plotting Multiple Measurements Per Page Using A Pen Plotter
Printing, Plotting, and Saving Measurement Results Plotting Multiple Measurements Per Page Using a Pen Plotter Plotting Multiple Measurements Per Page Using a Pen Plotter 1. Configure and define the plot, as explained in "Configuring a Plot Function" on page 4-10 "Defining a Plot Function"...
Page 241: If You Are Plotting To An Hpgl Compatible Printer
Printing, Plotting, and Saving Measurement Results Plotting Multiple Measurements Per Page Using a Pen Plotter If You Are Plotting to an HPGL Compatible Printer 1. Configure and define the plot, as explained in "Configuring a Plot Function" on page 4-10 "Defining a Plot Function"...
Page 242: To View Plot Files On A Pc
Printing, Plotting, and Saving Measurement Results To View Plot Files on a PC To View Plot Files on a PC Plot files can be viewed and manipulated on a PC using a word processor or graphics presentation program. Plot files contain a text stream of HPGL (Hewlett-Packard Graphics Language) commands.
Page 243: Using Ami Pro
Printing, Plotting, and Saving Measurement Results To View Plot Files on a PC Using Ami Pro To view plot files in Ami Pro, perform the following steps: 1. From the FILE pull-down menu, select IMPORT PICTURE. 2. In the dialog box, change the File Type selection to HPGL. This automatically changes the file suffix in the filename box to *.PLT.
Page 244: Converting Hpgl Files For Use With Other Pc Applications
Printing, Plotting, and Saving Measurement Results Outputting Plot Files from a PC to a Plotter Converting HPGL Files for Use with Other PC Applications A utility can convert hpgl (or .fp) files to other PC applications. This utility, named hp2xx, is available to be downloaded without charge (on donation basis only) from Free Software Foundation.
Page 245: Outputting Plot Files From A Pc To An Hpgl Compatible Printer
Printing, Plotting, and Saving Measurement Results Outputting Plot Files from a PC to an HPGL Compatible Printer Outputting Plot Files from a PC to an HPGL Compatible Printer To output the plot files to an HPGL compatible printer, you can use the HPGL initialization sequence linked in a series as follows: Step 1.
Page 246: Step 2. Store The Exit Hpgl Mode And Form Feed Sequence
Printing, Plotting, and Saving Measurement Results Outputting Single Page Plots Using a Printer Step 2. Store the exit HPGL mode and form feed sequence. 1. Create a test file by typing in each character as shown in the left column of Table 4-8.
Page 247: Outputting Multiple Plots To A Single Page Using A Printer
Printing, Plotting, and Saving Measurement Results Outputting Multiple Plots to a Single Page Using a Printer Outputting Multiple Plots to a Single Page Using a Printer Refer to "Plotting Multiple Measurements Per Page Using a Pen Plotter" on page 4-20 the naming conventions for plot files that you want printed on the same page.
Page 248: Plotting Multiple Measurements Per Page From Disk
Printing, Plotting, and Saving Measurement Results Plotting Multiple Measurements Per Page from Disk Plotting Multiple Measurements Per Page from Disk The following procedures show you how to store plot files on a LIF formatted disk. A naming convention is used so you can later run an HP BASIC program on an external controller that will output the files to the following peripherals: •...
Page 249: To Plot Multiple Measurements On A Full Page
Printing, Plotting, and Saving Measurement Results Plotting Multiple Measurements Per Page from Disk To Plot Multiple Measurements on a Full Page You may want to plot various files to the same page, for example, to show measurement data traces for different input settings, or parameters, on the same graticule. 1.
Page 250: To Plot Measurements In Page Quadrants
Printing, Plotting, and Saving Measurement Results Plotting Multiple Measurements Per Page from Disk Figure 4-10 shows plots for both the frequency and time domain responses of the same device. Figure 4-10 Plotting Two Files on the Same Page To Plot Measurements in Page Quadrants 1.
Page 251 Printing, Plotting, and Saving Measurement Results Plotting Multiple Measurements Per Page from Disk 4. Press . The analyzer assigns the first available default filename for the selected PLOT quadrant. For example, the analyzer would assign PLOT01LU if there were no other left-upper quadrant plots on the disk.
Page 252: Titling The Displayed Measurement
Printing, Plotting, and Saving Measurement Results Titling the Displayed Measurement Titling the Displayed Measurement 1. Press to access the title menu. MORE TITLE Display 2. Press and enter the title you want for your measurement display. ERASE TITLE • If you have a DIN keyboard attached to the analyzer, type the title you want from the keyboard.
Page 253: Configuring The Analyzer To Produce A Time Stamp
Printing, Plotting, and Saving Measurement Results Configuring the Analyzer to Produce a Time Stamp Configuring the Analyzer to Produce a Time Stamp You can set a clock, and then activate it, if you want the time and date to appear on your hardcopies.
Page 254: Printing Or Plotting The List Values Or Operating Parameters
Printing, Plotting, and Saving Measurement Results Printing or Plotting the List Values or Operating Parameters Printing or Plotting the List Values or Operating Parameters Press and select the information that you want to appear on your hardcopy. LIST Copy • Choose if you want a tabular listing of the measured data points, and LIST VALUES their current values, to appear on your hardcopy.
Page 255: Solving Problems With Printing Or Plotting
Printing, Plotting, and Saving Measurement Results Solving Problems with Printing or Plotting Solving Problems with Printing or Plotting If you encounter a problem when you are printing or plotting, check the following list for possible causes: • Look in the analyzer display message area. The analyzer may show a message that will identify the problem.
Page 256: Saving And Recalling Instrument States
Printing, Plotting, and Saving Measurement Results Saving and Recalling Instrument States Saving and Recalling Instrument States Places Where You Can Save • analyzer internal memory • floppy disk using the analyzer's internal disk drive • floppy disk using an external disk drive •...
Page 257: What You Can Save To A Floppy Disk
Printing, Plotting, and Saving Measurement Results Saving and Recalling Instrument States What You Can Save to a Floppy Disk You can save an instrument state and measurement results to a disk. The default file names are FILEn, where n gets incremented by one each time a file with a default name is added to the directory.
Page 258: Saving An Instrument State
Printing, Plotting, and Saving Measurement Results Saving an Instrument State Saving an Instrument State 1. Press and select one of the storage devices: SELECT DISK Save/Recall INTERNAL MEMORY INTERNAL DISK connect an external disk drive to the analyzer’s GPIB connector, EXTERNAL DISK and configure as follows: a.
Page 259: Saving Measurement Results
Printing, Plotting, and Saving Measurement Results Saving Measurement Results Saving Measurement Results Instrument states combined with measurements results can only be saved to disk. Files that contain data-only, and the various save options available under the key, are also only valid for disk saves. DEFINE DISK-SAVE The analyzer stores data in arrays along the processing flow of numerical data, from IF detection to display.
Page 260 Printing, Plotting, and Saving Measurement Results Saving Measurement Results Figure 4-13 Data Processing Flow Diagram If the analyzer has an active two-port measurement calibration, all four NOTE S-parameters will be saved with the measurement results. All four S-parameters may be viewed if the raw data array has been saved. 1.
Page 261: Ascii Data Formats
Printing, Plotting, and Saving Measurement Results Saving Measurement Results If you select , or , the data DATA ARRAY ON RAW ARRAY ON FORMAT ARY ON is stored to disk in IEEE-64 bit real format (for LIF disks), and 32 bit PC format for DOS disks.
Page 262 Printing, Plotting, and Saving Measurement Results Saving Measurement Results , or , or is selected, a CITIfile is DATA ARRAY ON DATA ONLY ON FORMAT ARY ON saved for each displayed channel with the suffix letter “D”, or “F”, followed by a number. The number following “D”...
Page 263 Printing, Plotting, and Saving Measurement Results Saving Measurement Results The "format" choice is selected by the current selection under the FORMAT menu. To select the DB format, the FORMAT must be LOG MAG. For MA, the FORMAT must be LIN MAG (unlike CITIfile), and all other FORMAT selections will output RI data. The S2P data will always represent the format array data, including effects of electrical delay and port extensions.
Page 264: Saving In Textual (Csv) Form
Printing, Plotting, and Saving Measurement Results Saving Measurement Results Saving in Textual (CSV) Form Textual measurement results can be saved in a comma-separated value (CSV) format and imported into a spreadsheet application. Additional information is also saved as a preamble to the measurement results. The saved information includes: •...
Page 265 Printing, Plotting, and Saving Measurement Results Saving Measurement Results How the Analyzer Names These Files Sequentially When text files are saved, the analyzer generates the file names automatically in the following format: txtcss.csv where: is a constant that indicates that this is a text file, is the indicator of the channel (1−4) on which the measurement data was taken.
Page 266: Saving In Graphical (Jpeg) Form
Printing, Plotting, and Saving Measurement Results Saving Measurement Results Saving in Graphical (JPEG) Form Graphical measurement results can be saved in JPEG format and used as an illustration in a text editor or desktop publishing application. Up to eight traces may be saved in the →...
Page 267: Instrument State Files
Printing, Plotting, and Saving Measurement Results Saving Measurement Results Instrument State Files When an instrument state is saved to a floppy disk, some or all of the following files may be produced. This depends upon which arrays are selected under the DEFINE SAVE STATE softkey menu, and whether the selected save format is BINARY or ASCII.
Page 268 Printing, Plotting, and Saving Measurement Results Saving Measurement Results Files with .d1 and .d2 File Extensions There are two type of files with .d1 and .d2 file extensions. There is FileXX.d1 (or .d2) and DataXX.d1 (or .d2). FileXX.d1, produced only when is turned ON, may be either binary DATA ARRAY on OFF or ASCII.
Page 269: Saving Time Gated Frequency Data
Printing, Plotting, and Saving Measurement Results Saving Measurement Results Files with .g0 File Extension FileXX.g0, produced only when is turned ON, is a binary file GRAPHICS on OFF containing the active measurement trace and display graticule. The contents of this file are not meant to be read in an external computer, so this file is only of use in the instrument.
Page 270 Printing, Plotting, and Saving Measurement Results Saving Measurement Results Raw Arrays On the analyzer, press the DEFINE DISK-SAVE RAW ARRAY ON Save/Recall Data created the first time in this manner will be saved as filename “FILE00.r1”. The file extension .r1 indicates the data was created while channel 1 was active and stored in the analyzer's raw data array.
Page 271: Re-Saving An Instrument State
Printing, Plotting, and Saving Measurement Results Re-Saving an Instrument State Re-Saving an Instrument State If you re-save a file, the analyzer overwrites the existing file contents. NOTE You cannot re-save a file that contains data only. You must create a new file. 1.
Page 272: Deleting A File
Printing, Plotting, and Saving Measurement Results Deleting a File Deleting a File 1. Press SELECT DISK Save/Recall 2. Choose from the following storage devices: INTERNAL MEMORY INTERNAL DISK (If necessary, refer to the external disk setup procedure in EXTERNAL DISK "Saving an Instrument State"...
Page 273: Renaming A File
Printing, Plotting, and Saving Measurement Results Renaming a File Renaming a File 1. Press AUTO-FEED OFF Save/Recall 2. Choose from the following storage devices: INTERNAL MEMORY INTERNAL DISK (If necessary, refer to the external disk setup procedure in EXTERNAL DISK "Saving an Instrument State"...
Page 274: Recalling A File
Printing, Plotting, and Saving Measurement Results Recalling a File Recalling a File 1. Press SELECT DISK Save/Recall 2. Choose from the following storage devices: INTERNAL MEMORY INTERNAL DISK (If necessary, refer to the external disk setup procedure in EXTERNAL DISK "Saving an Instrument State"...
Page 275: Solving Problems With Saving Or Recalling Files
Printing, Plotting, and Saving Measurement Results Solving Problems with Saving or Recalling Files Solving Problems with Saving or Recalling Files If you encounter a problem when you are storing files to disk, or the analyzer internal memory, check the following list for possible causes: •...
Page 276 Printing, Plotting, and Saving Measurement Results Solving Problems with Saving or Recalling Files 4-56...
Page 277 Optimizing Measurement Results...
Page 278: Optimizing Measurement Results Using This Chapter
Optimizing Measurement Results Using This Chapter Using This Chapter This chapter describes techniques and analyzer functions that help you achieve the best measurement results. The following topics are included in this chapter: • "Increasing Measurement Accuracy" on page 5-4 Interconnecting cables Improper calibration techniques Sweeping too fast for electrically long devices Connector repeatability...
Page 279: Taking Care Of Microwave Connectors
This type of information is typically located in chapter 3 of the calibration kit manuals. For additional connector care instruction, contact your local Agilent Technologies Sales and Service Office about course numbers HP/Agilent 85050A+24A and 85050A+24D.
Page 280: Increasing Measurement Accuracy
Optimizing Measurement Results Increasing Measurement Accuracy Increasing Measurement Accuracy The following all contribute to loss of accuracy in a measurement. Interconnecting Cables Cables that connect the device under test (DUT) to the analyzer are often the most significant contribution to random errors of your measurement. You should frequently perform the following steps as a precaution against errors caused by cable interconnections: •...
Page 281: Temperature Drift
Optimizing Measurement Results Increasing Measurement Accuracy Temperature Drift Electrical characteristics will change with temperature due to the thermal expansion characteristics of devices within the analyzer, calibration devices, test devices, cables, and adapters. Therefore, the operating temperature is a critical factor in their performance. During a measurement calibration, the temperature of the calibration devices must be stable and within 25 ±5 °C.
Page 282 Optimizing Measurement Results Increasing Measurement Accuracy Table 5-2 Differences between PORT EXTENSIONS and ELECTRICAL DELAY PORT EXTENSIONS ELECTRICAL DELAY Main Effect The end of a cable becomes the Compensates for the electrical test port plane for all length of a cable. Set the cable’s electrical length ×...
Page 283: Maintaining Test Port Output Power During Sweep Retrace
Optimizing Measurement Results Maintaining Test Port Output Power During Sweep Retrace Maintaining Test Port Output Power During Sweep Retrace During standard operation, the analyzer provides output power during its forward frequency sweep, but may not provide output power during its sweep retrace. If the device under test (such as an amplifier with AGC circuitry) requires constant power, then you can set the analyzer to maintain test port output power during its sweep retrace.
Page 284: Making Accurate Measurements Of Electrically Long Devices
Optimizing Measurement Results Making Accurate Measurements of Electrically Long Devices Making Accurate Measurements of Electrically Long Devices A device with a long electrical delay, such as a long length of cable, a SAW filter, or normal devices measured over wide sweeps with very fast rates presents some unusual measurement problems to a network analyzer operating in swept frequency mode.
Page 285 Optimizing Measurement Results Making Accurate Measurements of Electrically Long Devices Decreasing the Sweep Rate The sweep rate can be decreased by increasing the analyzer’s sweep time. To increase the analyzer’s sweep time, press and use the front SWEEP TIME [MANUAL] Sweep Setup panel knob, the keys, or the front panel keypad enter in the appropriate...
Page 286: Increasing Sweep Speed
Optimizing Measurement Results Increasing Sweep Speed Increasing Sweep Speed You can increase the analyzer sweep speed by avoiding the use of some features that require computational time for implementation and updating, such as bandwidth marker tracking. You can also increase the sweep speed by making adjustments to the measurement settings.
Page 287: To Decrease The Frequency Span
Optimizing Measurement Results Increasing Sweep Speed Sweep Speed-Related Errors IF delay occurs during swept measurements when the signal from the analyzer source is delayed in reaching the analyzer receiver because of an electrically long device. The receiver has a narrow IF band pass filter that tracks the receiver frequency because the receiver is sweeping.
Page 288: To Set The Auto Sweep Time Mode
Optimizing Measurement Results Increasing Sweep Speed To Set the Auto Sweep Time Mode Auto sweep time mode is the default mode (the preset mode). This mode maintains the fastest sweep speed possible for the current measurement settings. • Press , to re-enter the auto mode. SWEEP TIME Sweep Setup To Widen the System Bandwidth...
Page 289: To View A Single Measurement Channel
Optimizing Measurement Results Increasing Sweep Speed To View a Single Measurement Channel Viewing a single channel will increase the measurement speed if the analyzer’s channels are in alternate, or uncoupled mode. 1. Press DUAL | QUAD SETUP DUAL CHAN on OFF Display AUX CHAN on OFF 2.
Page 290 Optimizing Measurement Results Increasing Sweep Speed • Continuous: In this mode the analyzer will switch between the test ports on every sweep. Although this type of test set switching provides the greatest measurement accuracy, it requires a reverse sweep for every forward sweep. NOTE Analyzers configured with Option 007 or Option 085 use a mechanical switch and are not allowed to switch between test ports on every sweep in...
Page 291: Increasing Dynamic Range
Optimizing Measurement Results Increasing Dynamic Range Increasing Dynamic Range Dynamic range is the difference between the analyzer’s maximum allowable input level and minimum measurable power. For a measurement to be valid, input signals must be within these boundaries. The dynamic range is affected by these factors: •...
Page 292: Reducing Noise
Optimizing Measurement Results Reducing Noise Reducing Noise You can use two analyzer functions to help reduce the effect of noise on the data trace: • activate measurement averaging • reduce system bandwidth • use direct sampler access configurations (Option 012 Only) To Activate Averaging The noise is reduced with each new sweep as the effective averaging factor increments.
Page 293: To Use Direct Sampler Access Configurations (Option 012 Only)
Optimizing Measurement Results Reducing Noise To Use Direct Sampler Access Configurations (Option 012 Only) Direct sampler access to both the A and B samplers can decrease the noise floor of the analyzer. In the standard configuration (Option 012 with all jumpers in place), the signal entering one of the test ports passes through a coupler with 14 dB coupling before it reaches the sampler.
Page 294: Reducing Receiver Crosstalk
Optimizing Measurement Results Reducing Receiver Crosstalk Reducing Receiver Crosstalk To reduce receiver crosstalk you can do the following: • Perform a response and isolation measurement calibration. • Set the sweep to the alternate mode. Alternate sweep is intended for measuring wide dynamic range devices, such as high pass and bandpass filters.
Page 295 Calibrating for Increased Measurement Accuracy...
Page 296: Calibrating For Increased Measurement Accuracy How To Use This Chapter
Calibrating for Increased Measurement Accuracy How to Use This Chapter How to Use This Chapter This chapter is divided into the following subjects: • "Calibration Considerations" on page 6-4 • "Procedures for Error Correcting Your Measurements" on page 6-10 — frequency response error correction —...
Page 297: Introduction
Calibrating for Increased Measurement Accuracy Introduction Introduction The accuracy of network analysis is greatly influenced by factors external to the network analyzer. Components of the measurement setup, such as interconnecting cables and adapters, introduce variations in magnitude and phase that can mask the actual response of the device under test.
Page 298: Calibration Considerations
Calibrating for Increased Measurement Accuracy Calibration Considerations Calibration Considerations Measurement Parameters Calibration procedures are parameter-specific, rather than channel-specific. When a parameter is selected, the instrument checks the available calibration data, and uses the data found for that parameter. For example, if a transmission response calibration is performed for B/R, and an S 1-port calibration for A/R, the analyzer retains both calibration sets and corrects whichever parameter is displayed.
Page 299: Saving Calibration Data
Calibrating for Increased Measurement Accuracy Calibration Considerations • 90 to 100 dB: Isolation calibration is recommended with test port power greater than 0 dBm. For this isolation calibration, averaging should be turned on with an averaging factor at least four times the measurement averaging factor. For example, use an averaging factor of 16 for the isolation calibration, and then reduce the averaging factor to four for the measurement after calibration.
Page 300: Frequency Response Of Calibration Standards
Calibrating for Increased Measurement Accuracy Calibration Considerations Frequency Response of Calibration Standards In order for the response of a reference standard to show as a dot on the smith chart display format, it must have no phase shift with respect to frequency. Standards that exhibit such "perfect"...
Page 301 Calibrating for Increased Measurement Accuracy Calibration Considerations Table 6-1 Calibration Standard Types and Expected Phase Shift Test Port Connector Type Standard Type Expected Phase Shift 7-mm Short 180° Type-N male 3.5-mm male Offset Short × × 360° f l 180° ------------------------------- - 3.5-mm female 2.4-mm male...
Page 302: Interpolated Error Correction
Calibrating for Increased Measurement Accuracy Calibration Considerations Figure 6-1 Typical Responses of Calibration Standards after Calibration CH1 S 11 1 U FS 1: 998.84 mU -179.92 CH1 S 11 1 U FS 1: 999.62 mU 142.07 3 000 000 000 MHz 3 000 000 000 MHz START .300...
Page 303: Error-Correction Stimulus State
Calibrating for Increased Measurement Accuracy Calibration Considerations The preset state of the instrument can be configured so that interpolated NOTE error correction is on or off. Press CONFIGURE MENU System to configure USER SETTINGS PRESET SETTINGS CAL INTERP ON off the preset state of interpolated error correction.
Page 304: Procedures For Error Correcting Your Measurements
Calibrating for Increased Measurement Accuracy Procedures for Error Correcting Your Measurements Procedures for Error Correcting Your Measurements This section has example procedures or information on the following topics: • frequency response correction • frequency response and isolation correction • enhanced frequency response correction (with enhanced reflection error correction) •...
Page 305 Calibrating for Increased Measurement Accuracy Procedures for Error Correcting Your Measurements Table 6-2 Purpose and Use of Different Error Correction Procedures Correction Procedure Corresponding Errors Corrected Standard Devices Measurement Enhanced Response Transmission or Directivity, source Short, open, load, and and Enhanced reflection match, and frequency thru or ECal module.
Page 306: Frequency Response Error Corrections
Calibrating for Increased Measurement Accuracy Frequency Response Error Corrections Frequency Response Error Corrections You can remove the frequency response of the test setup for the following measurements: • reflection measurements • transmission measurements • combined reflection and transmission measurements Response Error Correction for Reflection Measurements 1.
Page 307 Calibrating for Increased Measurement Accuracy Frequency Response Error Corrections Figure 6-2 Standard Connections for a Response Error Correction for Reflection Measurement 7. To measure the standard when the displayed trace has settled, press SHORT OPEN If the calibration kit you selected has a choice between male and female calibration standards, remember to select the sex that applies to the test port and not the standard.
Page 308: Response Error Correction For Transmission Measurements
Calibrating for Increased Measurement Accuracy Frequency Response Error Corrections Response Error Correction for Transmission Measurements 1. Press Preset 2. Select the type of measurement you want to make. If you want to make a transmission measurement in the forward direction (S press: or on ET models: Trans: FWD S21 (B/R)
Page 309: Receiver Calibration
Calibrating for Increased Measurement Accuracy Frequency Response Error Corrections Do not use an open or short standard for a transmission response correction. NOTE NOTE You can save or store the measurement correction to use for later measurements. Refer to the Chapter 4 , “Printing, Plotting, and Saving Measurement Results”...
Page 310 Calibrating for Increased Measurement Accuracy Frequency Response Error Corrections Figure 6-4 Standard Connections for a Receiver Calibration 3. To choose a non-ratioed measurement, press: Meas INPUT PORTS For ES analyzers, press . This sets the source at PORT 1. TEST PORTS 1 4.
Page 311: Frequency Response And Isolation Error Corrections
Calibrating for Increased Measurement Accuracy Frequency Response and Isolation Error Corrections Frequency Response and Isolation Error Corrections You can make a response and isolation correction for the following measurements: • reflection measurements • transmission measurements • combined reflection and transmission measurements Although you can perform a response and isolation correction for reflection NOTE measurements, we recommend that you perform an S...
Page 312 Calibrating for Increased Measurement Accuracy Frequency Response and Isolation Error Corrections 7. Make a "thru" connection between the points where you will connect your device under test. NOTE Include any adapters that you will have in the device measurement. That is, connect the standard device to the particular connector where you will connect your device under test.
Page 313: Response And Isolation Error Correction For Reflection Measurements
Calibrating for Increased Measurement Accuracy Frequency Response and Isolation Error Corrections 12.Return the averaging to the original state of the measurement. For example, reduce the averaging factor by at least four times or turn averaging off. 13.To compute the isolation error coefficients, press: RESUME CAL SEQUENCE DONE RESP ISOL’N CAL...
Page 314 Calibrating for Increased Measurement Accuracy Frequency Response and Isolation Error Corrections 5. If your calibration kit is different than the kit specified under the softkey, CAL KIT [ ] press: (select your type of kit) CAL KIT SELECT CAL KIT RETURN If your type of calibration kit is not listed in the displayed menu, refer to "Modifying...
Page 315 Calibrating for Increased Measurement Accuracy Frequency Response and Isolation Error Corrections The analyzer displays WAIT - MEASURING CAL STANDARD during the standard measurement. The analyzer underlines the softkey that you selected after it finishes the measurement, and computes the error coefficients. 9.
Page 316: Enhanced Frequency Response Error Correction
Calibrating for Increased Measurement Accuracy Enhanced Frequency Response Error Correction Enhanced Frequency Response Error Correction The enhanced frequency response error correction removes the following errors in the forward direction in ET models or in both the forward and reverse directions in ES models: •...
Page 317 Calibrating for Increased Measurement Accuracy Enhanced Frequency Response Error Correction 6. To select the correction type, press CALIBRATE MENU ENHANCED RESPONSE and select the correction type. If you want to make measurements in the forward direction, press: or on ET models: S11/S21 ENH.
Page 318 Calibrating for Increased Measurement Accuracy Enhanced Frequency Response Error Correction 12.To measure the standard, when the displayed trace has settled, press: , select the type of load you are using, and then press when LOADS DONE: LOADS the analyzer has finished measuring the load. Notice that the softkey is now underlined.
Page 319: Enhanced Reflection Calibration
Calibrating for Increased Measurement Accuracy Enhanced Frequency Response Error Correction b. Activate at least four times more averages than desired during the device measurement. c. Press RESUME CAL SEQUENCE ISOLATION FWD or REV ISOL’N STD DONE d. Return the averaging to the original state of the measurement, and press RESUME CAL SEQUENCE 18.To compute the error coefficients, press DONE ENH RESP CAL...
Page 320: One-Port Reflection Error Correction
Calibrating for Increased Measurement Accuracy One-Port Reflection Error Correction One-Port Reflection Error Correction • removes directivity errors of the test setup • removes source match errors of the test setup • removes frequency response of the test setup You can perform a 1-port correction for an S or an S measurement for ES analyzers.
Page 321 Calibrating for Increased Measurement Accuracy One-Port Reflection Error Correction Include any adapters that you will have in the device measurement. That is, NOTE connect the calibration standard to the particular connector where you will connect your device under test. Figure 6-8 Standard Connections for a One Port Reflection Error Correction 8.
Page 322 Calibrating for Increased Measurement Accuracy One-Port Reflection Error Correction The analyzer displays the corrected data trace. The analyzer also shows the notation Cor to the left of the screen, indicating that the correction is switched on for this channel. The open, short, and load could be measured in any order, and need not follow NOTE the order in this example.
Page 323: Full Two-Port Error Correction (Es Analyzers Only)
Calibrating for Increased Measurement Accuracy Full Two-Port Error Correction (ES Analyzers Only) Full Two-Port Error Correction (ES Analyzers Only) • removes directivity errors of the test setup in forward and reverse directions • removes source match errors of the test setup in forward and reverse directions •...
Page 324 Calibrating for Increased Measurement Accuracy Full Two-Port Error Correction (ES Analyzers Only) Figure 6-9 Standard Connections for Full Two-Port Error Correction 6. To measure the standard, when the displayed trace has settled, press: FORWARD: OPEN The analyzer displays WAIT - MEASURING CAL STANDARD during the standard measurement.
Page 325 Calibrating for Increased Measurement Accuracy Full Two-Port Error Correction (ES Analyzers Only) 14.Make a "thru" connection between the points where you will connect your device under test as shown in Figure 6-9. NOTE Include any adapters or cables that you will have in the device measurement. That is, connect the standard device where you will connect your DUT.
Page 326 Calibrating for Increased Measurement Accuracy Full Two-Port Error Correction (ES Analyzers Only) 17.To compute the error coefficients, press: DONE 2-PORT CAL The analyzer displays the corrected measurement trace. The analyzer also shows the notation Cor at the left of the screen, indicating that error correction is on. NOTE You can save or store the measurement correction to use for later measurements.
Page 327: Power Meter Measurement Calibration
Calibrating for Increased Measurement Accuracy Power Meter Measurement Calibration Power Meter Measurement Calibration A GPIB-compatible power meter can monitor and correct RF source power to achieve leveled power at the test port. During a power meter calibration, the power meter samples the power at each measurement point across the frequency band of interest.
Page 328: Interpolation In Power Meter Calibration
Calibrating for Increased Measurement Accuracy Power Meter Measurement Calibration Interpolation in Power Meter Calibration If the frequency is changed in linear sweep, or the start/stop power is changed in power sweep, then the calibration data is interpolated for the new range. If calibration power is changed in any of the sweep types, the values in the power setting array are increased or decreased to reflect the new power level.
Page 329: Compensating For Directional Coupler Response
Calibrating for Increased Measurement Accuracy Power Meter Measurement Calibration If you are modifying the frequency, enter the new value, followed by a M/µ key. If you are modifying the correction factor, enter the new value, followed by the key. 4. Press after you have finished modifying the segment.
Page 330: Using Sample-And-Sweep Correction Mode
Calibrating for Increased Measurement Accuracy Power Meter Measurement Calibration NOTE Remember to subtract the through arm loss from the coupler arm loss before entering it into the power loss table, to ensure the correct power at the output of the coupler. 4.
Page 331 Calibrating for Increased Measurement Accuracy Power Meter Measurement Calibration 3. Select the analyzer as the system controller: Local SYSTEM CONTROLLER 4. Set the power meter’s address (“XX” represents the address in the following keystrokes: SET ADDRESSES ADDRESS: P MTR/GPIB 5. Select the appropriate power meter by pressing until the correct POWER MTR [ ] model number is displayed (436A or 438A/437).
Page 332: Using Continuous Correction Mode
Calibrating for Increased Measurement Accuracy Power Meter Measurement Calibration Using Continuous Correction Mode You can set the analyzer to update the correction table at each sweep (as in a leveling application), using the continuous sample mode. When the analyzer is in this mode, it continuously checks power at every point in each sweep.
Page 333 Calibrating for Increased Measurement Accuracy Power Meter Measurement Calibration To Calibrate the Analyzer Receiver to Measure Absolute Power You can use the power meter calibration as a reference to calibrate the analyzer receiver to accurately measure absolute power. The following procedure shows you how to calibrate the receiver to any power level.
Page 334: Calibrating For Noninsertable Devices
Calibrating for Increased Measurement Accuracy Calibrating for Noninsertable Devices Calibrating for Noninsertable Devices A test device that cannot be connected directly into a transmission test configuration is considered to be noninsertable. Some examples of noninsertable test devices are: • a fixture with two female SMA connectors, or a cable with two male type-N connectors. •...
Page 335: Adapter Removal Calibration (Es Analyzers Only)
Calibrating for Increased Measurement Accuracy Calibrating for Noninsertable Devices Adapter Removal Calibration (ES Analyzers Only) Adapter removal calibration provides the most complete and accurate procedure for measuring noninsertable devices. The following adapters are needed: • Adapter A1, which mates with port 1 of the device, must be installed on test set port 1. •...
Page 336: Perform The 2-Port Error Corrections
Calibrating for Increased Measurement Accuracy Calibrating for Noninsertable Devices Perform the 2-Port Error Corrections 1. Check the firmware to see if your revision supports adapter removal calibration by pressing: MORE ADAPTER REMOVAL HELP ADAPT REMOVAL 2. Determine the delay of adapter A3. a.
Page 337 Calibrating for Increased Measurement Accuracy Calibrating for Noninsertable Devices NOTE You must use the floppy disk to store the following calibrations. Select the floppy disk by pressing SELECT DISK INTERNAL DISK Save/Recall 3. Connect adapter A3 (same sex and connector type as the DUT) to adapter A2 on port 2 as shown in Figure 6-15.
Page 338 Calibrating for Increased Measurement Accuracy Calibrating for Noninsertable Devices 6. Perform a full 2-port calibration between ports 1 and 2 using calibration standards appropriate for the connector type at port 2 (the connector type for adapter A2). Save the calibration by selecting .
Page 339: Verify The Results
Calibrating for Increased Measurement Accuracy Calibrating for Noninsertable Devices Verify the Results Since the effect of the adapter has been removed, it is easy to verify the accuracy of the technique by simply measuring the adapter itself. Because the adapter was used during the creation of the two cal sets, and the technique removes its effects, measurement of the adapter itself should show the S-parameters.
Page 340: Modify The Cal Kit Thru Definition
Calibrating for Increased Measurement Accuracy Calibrating for Noninsertable Devices Modify the Cal Kit Thru Definition With this method, it is only necessary to use a thru adapter. The calibration kit thru definition is modified to compensate for the adapter and then saved as a user kit. However, the electrical delay of the adapter must first be found.
Page 341: Minimizing Error When Using Adapters
Calibrating for Increased Measurement Accuracy Minimizing Error When Using Adapters 9. Perform the desired calibration with this new user kit. 10.Connect the test device as shown in Figure 6-17 and measure the device. Minimizing Error When Using Adapters To minimize the error introduced when you add an adapter to a measurement system, the adapter needs to have low SWR or mismatch, low loss, and high repeatability.
Page 342: Making Non-Coaxial Measurements
Calibrating for Increased Measurement Accuracy Making Non-Coaxial Measurements Making Non-Coaxial Measurements Non-coaxial, on-wafer measurements present a unique set of challenges for error correction in the analyzer: • The close spacing between the microwave probes makes it difficult to maintain a high degree of isolation between the input and the output.
Page 343 For example, if the fixture’s loss is much less than the acceptable measurement uncertainty at the test frequency, then it can be ignored. For additional information about fixtures, refer to Agilent Technologies Application Note 1287-9, “In-Fixture Measurements Using Vector Network Analyzers,” literature number 5968-5329E.
Page 344: Calibrating For Non-Coaxial Devices (Es Analyzers Only)
Calibrating for Increased Measurement Accuracy Calibrating for Non-Coaxial Devices (ES Analyzers Only) Calibrating for Non-Coaxial Devices (ES Analyzers Only) The analyzer has the capability of making calibrations using the TRL*/LRM* method. TRL* and LRM* are implementations of the thru-reflect-line and line-reflect-match calibrations, modified for the three-sampler receiver architecture in the analyzer.
Page 345 Calibrating for Increased Measurement Accuracy Calibrating for Non-Coaxial Devices (ES Analyzers Only) 6. For the purposes of this example, change the name of the standard by pressing: and modifying the name to "LINE." LABEL STD 7. When the title area shows the new label, press: DONE STD DONE (DEFINED) Assign the Standards to the Various TRL Classes...
Page 346 Calibrating for Increased Measurement Accuracy Calibrating for Non-Coaxial Devices (ES Analyzers Only) Perform the TRL Calibration 1. Press CAL KIT SELECT CAL KIT USER KIT RETURN RETURN CALIBRATE MENU TRL*/LRM* 2-PORT 2. To measure the "TRL THRU," connect the "zero length" transmission line between the two test ports.
Page 347 Calibrating for Increased Measurement Accuracy Calibrating for Non-Coaxial Devices (ES Analyzers Only) You can save or store the measurement correction to use for later NOTE measurements. Refer to Chapter 4 , “Printing, Plotting, and Saving Measurement Results” for procedures. 13.Connect the device under test. The device S-parameters are now being measured. 6- 53...
Page 348: Lrm Error Correction
Calibrating for Increased Measurement Accuracy LRM Error Correction LRM Error Correction Create a User-Defined LRM Calibration Kit In order to use the LRM technique, the calibration standards characteristics must be entered into the analyzer’s user defined calibration kit. The following steps show you how to define a calibration kit to utilize a set of LRM (LINE, REFLECT, MATCH) standards.
Page 349 Calibrating for Increased Measurement Accuracy LRM Error Correction Assign the Standards to the Various LRM Classes 8. To assign the calibration standards to the various TRL calibration classes, press: CAL KIT MODIFY SPECIFY CLASS MORE MORE TRL REFLECT 9. Since you previously designated standard #1 for the REFLECT standard, press: 10.Since you previously designated standard #3 for the LINE/MATCH standard, press: TRL LINE OR MATCH 11.Since you previously designated standard #4 for the THRU/LINE standard, press:...
Page 350: Perform The Lrm Calibration
Calibrating for Increased Measurement Accuracy LRM Error Correction Perform the LRM Calibration 1. You must have a LRM calibration kit defined and saved in the USER KIT, as shown in "Modifying Calibration Kits" on page 7-57. NOTE This must be done before performing the following sequence. 2.
Page 351 Calibrating for Increased Measurement Accuracy LRM Error Correction You should perform the isolation measurement when the highest dynamic NOTE range is desired. To perform the best isolation measurements, you should reduce the system bandwidth or activate the averaging function. A poorly measured isolation class can actually degrade the overall measurement performance.
Page 352: Calibrating Using Electronic Calibration (Ecal)
Calibrating for Increased Measurement Accuracy Calibrating Using Electronic Calibration (ECal) Calibrating Using Electronic Calibration (ECal) This section describes Electronic Calibration (ECal). Use the following steps to perform the calibration. 1. Set up the measurement for which you are calibrating. Refer to “Set Up the Measurement.”...
Page 353: Connect The Ecal Equipment
Calibrating for Increased Measurement Accuracy Calibrating Using Electronic Calibration (ECal) Connect the ECal Equipment 1. Connect the power supply to the PC interface unit. Refer to Figure 6-21. Figure 6-21 ECal Setup 2. Connect the power supply to the ac source. 3.
Page 354: Select The Ecal Options
Calibrating for Increased Measurement Accuracy Calibrating Using Electronic Calibration (ECal) 5. If you need to calibrate with a second ECal module, connect one end of another DB25 cable to the connector on the PC interface unit labeled "DB25 Interface to ECal Module B".
Page 355 Calibrating for Increased Measurement Accuracy Calibrating Using Electronic Calibration (ECal) • ECal using isolation averaging During the isolation measurement portion of ECal, you are actually measuring instrument crosstalk. Typically, the data during this measurement is near the noise floor. (See also "Omitting Isolation Calibration"...
Page 356: Perform The Calibration
Calibrating for Increased Measurement Accuracy Calibrating Using Electronic Calibration (ECal) Perform the Calibration 1. Press ECal MENU When ECal is first selected (or when you select module A or module B), there is a small initial delay so that the network analyzer can detect and download the calibration information from the internal memory of the ECal module.
Page 357 Calibrating for Increased Measurement Accuracy Calibrating Using Electronic Calibration (ECal) Figure 6-22 Manual Thru Setup 5. After you connect the manual thru, press to complete the manual CONTINUE ECal thru portion of the ECal. 6. If you are calibrating using two ECal modules, a prompt is displayed directing you to remove the first module and connect the second module.
Page 358: Display The Module Information
Calibrating for Increased Measurement Accuracy Calibrating Using Electronic Calibration (ECal) 7. After you connect the second ECal module, press to continue the CONTINUE ECal ECal. 8. Repeat steps 4 and 5 if you selected to calibrate using the manual thru option. 9.
Page 359: Perform The Confidence Check
Calibrating for Increased Measurement Accuracy Calibrating Using Electronic Calibration (ECal) Perform the Confidence Check The confidence check is a means of visually checking the quality of the calibration. The confidence check displays the currently measured data (DATA trace) and the factory-premeasured data (MEM trace) for the module’s confidence state.
Page 360 Calibrating for Increased Measurement Accuracy Calibrating Using Electronic Calibration (ECal) 5. Press until the calibration confidence check trace that you want to TRACE TYPE [ ] view is displayed. Pressing the softkey toggles between the five trace-type display TRACE TYPE [ ] options.
Page 361: Investigating The Calibration Results Using The Ecal Service Menu
Calibrating for Increased Measurement Accuracy Calibrating Using Electronic Calibration (ECal) Investigating the Calibration Results Using the ECal Service Menu CAUTION The confidence check described in the previous section displays the ECal data of a single state. This confidence state is a calibrated standard not used during ECal.
Page 362 Calibrating for Increased Measurement Accuracy Calibrating Using Electronic Calibration (ECal) NOTE When there is no premeasured calibration data for a given state and measurement parameter, a warning is displayed indicating that no module date is available. Toggles the analyzer to show the data for the following S-parameters: PARAMETER [ ] •...
Page 363: Adapter Removal Using Ecal (Es Analyzers Only)
Calibrating for Increased Measurement Accuracy Adapter Removal Using ECal (ES Analyzers Only) Adapter Removal Using ECal (ES Analyzers Only) A device under test (DUT) whose connectors cannot be connected directly to a test configuration is considered to be a noninsertable device. See Figure 6-25 Noninsertable devices can be caused because the DUT has:...
Page 364 Calibrating for Increased Measurement Accuracy Adapter Removal Using ECal (ES Analyzers Only) Figure 6-26 Adapters Needed The following requirements must also be met: • An ECal module for performing a 2-port error correction for each connector type must be available. •...
Page 365: Perform The 2-Port Error Corrections
Calibrating for Increased Measurement Accuracy Adapter Removal Using ECal (ES Analyzers Only) Perform the 2-Port Error Corrections 1. Connect adapter A3 to adapter A2 on port 2 as shown in Figure 6-27. Figure 6-27 Two-Port Cal Set 1 2. Connect the ECal module between adapter A1 and adapter A3. 3.
Page 366 Calibrating for Increased Measurement Accuracy Adapter Removal Using ECal (ES Analyzers Only) Figure 6-28 Two-Port Cal Set 2 7. Connect the ECal module between adapter A3 and adapter A2. 8. Press ECal MENU 9. Press FULL 2-PORT to perform the second 2-port error correction using the ECal module.
Page 367: Determine The Electrical Delay
Calibrating for Increased Measurement Accuracy Adapter Removal Using ECal (ES Analyzers Only) Determine the Electrical Delay This procedure determines the electrical delay of adapter A3 using a short. 1. Refer to Figure 6-29 while performing the steps in this procedure. 2.
Page 368: Remove The Adapter
Calibrating for Increased Measurement Accuracy Adapter Removal Using ECal (ES Analyzers Only) Remove the Adapter When the two sets of error correction files have been created (now referred to as "calibration sets"), the A3 adapter may be removed. 1. Press to display the following menu: MORE ADAPTER REMOVAL...
Page 369: Verify The Results
Calibrating for Increased Measurement Accuracy Adapter Removal Using ECal (ES Analyzers Only) 10.Connect the DUT to the network analyzer as shown in Figure 6-30 to perform calibrated measurements. Figure 6-30 Calibrated Measurement Verify the Results Since the effect of the adapter has been removed, it is easy to verify the accuracy of the technique by simply measuring the adapter itself.
Page 370 Calibrating for Increased Measurement Accuracy Adapter Removal Using ECal (ES Analyzers Only) 6-76...
Page 371: Operating Concepts
Operating Concepts 7- 1...
Page 372: Using This Chapter
Operating Concepts Using This Chapter Using This Chapter This chapter provides conceptual information on how specific functions of the network analyzer operate. The following topics are discussed: • “System Operation” on page 7-3 • “Processing” on page 7-5 • “Output Power” on page 7-9 •...
Page 373: System Operation
Operating Concepts System Operation System Operation Network analyzers measure the reflection and transmission characteristics of devices and networks. A network analyzer test system consists of the following: • source • signal-separation devices • receiver • display The analyzer applies a signal that is transmitted through the test device, or reflected from its input, and then compares it with the incident signal generated by the swept RF source.
Page 374: The Built-In Test Set
Operating Concepts System Operation The RF output power is leveled by an internal ALC (automatic leveling control) circuit. To achieve frequency accuracy and phase measuring capability, the analyzer is phase locked to a highly stable crystal oscillator. For this purpose, a portion of the transmitted signal is routed to the R channel input of the receiver, where it is sampled by the phase detection loop and fed back to the source.
Page 375: Processing
Operating Concepts Processing Processing The analyzer’s receiver converts the R, A, and B input signals into useful measurement information. This conversion occurs in two main steps: • The swept high frequency input signals are translated to fixed low frequency IF signals, using analog sampling or mixing techniques.
Page 376: Processing Details
Operating Concepts Processing While only a single flow path is shown, two identical paths are available, corresponding to channel 1 and channel 2. Each channel also has an auxiliary channel for which the data is processed along with the primary channel’s data. Channel 3 is the auxiliary channel for channel 1, while channel 4 is the auxiliary channel for channel 2.
Page 377 Operating Concepts Processing Pre-Raw Data Arrays These data arrays store the results of all the preceding data processing operations. (Up to this point, all processing is performed real-time with the sweep by the IF processor. The remaining operations are not necessarily synchronized with the sweep, and are performed by the main processor.) When full 2-port error correction is on, the raw arrays contain all four S-parameter measurements required for accuracy enhancement.
Page 378 Operating Concepts Processing Transform (Option 010 Only) This transform converts frequency domain information into the time domain when it is activated. The results resemble time domain reflectometry (TDR) or impulse-response measurements. The transform uses the chirp-Z inverse fast Fourier transform (FFT) algorithm to accomplish the conversion.
Page 379: Output Power
Operating Concepts Output Power Output Power Understanding the Power Ranges The built-in synthesized source contains a programmable step attenuator that allows you to directly and accurately set power levels in twelve different power ranges. Each range has a total span of 20 dB (15 dB, 8722ET/ES). The twelve ranges cover the instrument’s full operating range.
Page 380: Power Coupling Options
Operating Concepts Output Power NOTE After measurement calibration, you can change the power within a range and still maintain nearly full accuracy. In some cases better accuracy can be achieved by changing the power within a range. It can be useful to set different power levels for calibration and measurement to minimize the effects of sampler compression or noise floor.
Page 381: Sweep Time
Operating Concepts Sweep Time Sweep Time softkey selects sweep time as the active entry and shows whether SWEEP TIME [ ] the automatic or manual mode is active. The following explains the difference between automatic and manual sweep time: • Manual sweep time. As long as the selected sweep speed is within the capability of the instrument, it will remain fixed, regardless of changes to other measurement parameters.
Page 382 Operating Concepts Sweep Time In addition to the these parameters, the actual cycle time of the analyzer is also dependent on the following measurement parameters: • smoothing • limit test • trace math • marker statistics • time domain (Option 010 only) Refer to the specifications and characteristics chapters of the reference guide to see the minimum cycle time values for specific measurement parameters.
Page 383: Source Attenuator Switch Protection
Operating Concepts Source Attenuator Switch Protection Source Attenuator Switch Protection The programmable step attenuator of the source can be switched between port 1 and port 2 when the test port power is uncoupled, or between channel 1 and channel 2 when the channel power is uncoupled.
Page 384: Channel Stimulus Coupling
Operating Concepts Channel Stimulus Coupling Channel Stimulus Coupling toggles the channel coupling of stimulus values. With COUPLED CH on OFF (the preset condition), both channels have the same stimulus values. COUPLED CH ON (The inactive channel takes on the stimulus values of the active channel.) In the stimulus coupled mode, the following parameters are coupled: •...
Page 385: Sweep Types
Operating Concepts Sweep Types Sweep Types The following sweep types will function with the interpolated error-correction feature (described in “Interpolated Error Correction” on page 6-8): • linear frequency • power sweep • CW time The following sweep types will not function with the interpolated error correction feature: •...
Page 386 Operating Concepts Sweep Types Earlier 8719, 8720, and 8722 models allowed a maximum of 1632 points, but NOTE this value was reduced to 1601 to add the 4 channels in the 4-parameter display feature. One list is common to both channels. Once a frequency list has been defined and a measurement calibration performed on the full frequency list, one or all of the frequency segments can be measured and displayed without loss of calibration.
Page 387: Swept List Frequency Sweep (Hz)
Operating Concepts Sweep Types The frequency subsweeps, or segments, can be defined in any of the following terms: • start/stop/number of points • start/stop/step • center/span/number of points • center/span/step • CW frequency The subsweeps can overlap, and do not have to be entered in any particular order. The analyzer sorts the segments automatically and lists them on the display in order of increasing start frequency, even if they are entered in center/span format.
Page 388 Operating Concepts Sweep Types The frequency subsweeps, or segments, can be defined in any of the following terms: • start/stop/number of points/power/IFBW • start/stop/step/power/IFBW • center/span/number of points/power/IFBW • center/span/step/power/IFBW “Setting Segment Power” “Setting Segment IF Bandwidth” on page 7-19 information on how to set the segment power and IF bandwidth.
Page 389: Power Sweep (Dbm)
Operating Concepts Sweep Types Setting Segment IF Bandwidth To enable the function, you must first select SEGMENT IF BW LIST IF BW ON off the edit subsweep menu. List IF bandwidth is off by default and the asterisks that appear in the "IFBW"...
Page 390: S-Parameters
Operating Concepts S-Parameters S-Parameters key accesses the S-parameter menu which contains softkeys that can be used Meas to select the parameters or inputs that define the type of measurement being performed. Understanding S-Parameters S-parameters (scattering parameters) are a convention used to characterize the way a device modifies signal flow.
Page 391 Operating Concepts S-Parameters Figure 7-3 S-Parameters of a Two-Port Device S-parameters are exactly equivalent to these more common description terms, requiring only that the measurements be taken with all test device ports properly terminated. S-Parameter Definition Test Set Description Direction Input reflection coefficient Forward gain Reverse Gain...
Page 392: The S-Parameter Menu
Operating Concepts S-Parameters The S-Parameter Menu The S-parameter menu allows you to define the input ports and test set direction for S-parameter measurements. The analyzer automatically switches the direction of the measurement according to the selections you made in this menu. Therefore, the analyzer can measure all four S-parameters with a single connection.
Page 393 Operating Concepts S-Parameters Figure 7-4 Reflection Impedance and Admittance Conversions In a transmission measurement, the data can be converted to its equivalent series impedance or admittance using the model and equations shown in Figure 7-5. Figure 7-5 Transmission Impedance and Admittance Conversions Avoid the use of Smith chart, SWR, and delay formats for display of Z and Y NOTE conversions, as these formats are not easily interpreted.
Page 394: Analyzer Display Formats
Operating Concepts Analyzer Display Formats Analyzer Display Formats key accesses the format menu. This menu allows you to select the Format appropriate display format for the measured data. The analyzer automatically changes the units of measurement to correspond with the displayed format.
Page 395: Group Delay Format
Operating Concepts Analyzer Display Formats Figure 7-7 Phase Format Group Delay Format softkey selects the group delay format, with marker values given in seconds. DELAY The bandpass filter response formatted as group delay is shown in Figure 7-8. Group delay principles are described in the next few pages.
Page 396: Smith Chart Format
Operating Concepts Analyzer Display Formats Smith Chart Format softkey displays a Smith chart format. Refer to Figure 7-9. This is SMITH CHART used in reflection measurements to provide a readout of the data in terms of impedance. The intersecting dotted lines on the Smith chart represent constant resistance and constant reactance values, normalized to the characteristic impedance, Z , of the system.
Page 397: Polar Format
Operating Concepts Analyzer Display Formats Polar Format softkey displays a polar format as shown in Figure 7-10. Each point on the POLAR polar format corresponds to a particular value of both magnitude and phase. Quantities are read vectorally: the magnitude at any point is determined by its displacement from the center (which has zero value), and the phase by the angle counterclockwise from the positive x-axis.
Page 398: Swr Format
Operating Concepts Analyzer Display Formats Figure 7-11 Linear Magnitude Format SWR Format softkey reformats a reflection measurement into its equivalent SWR (standing 7-12. SWR is equivalent to (1 + ρ)/(1 − ρ), where ρ is the wave ratio) value. See Figure reflection coefficient.
Page 399: Real Format
Operating Concepts Analyzer Display Formats Real Format softkey displays only the real (resistive) portion of the measured data on a REAL Cartesian format. See Figure 7-13. This is similar to the linear magnitude format, but can show both positive and negative values. It is primarily used for analyzing responses in the time domain, and also to display an auxiliary input voltage signal for service purposes.
Page 400 Operating Concepts Analyzer Display Formats Figure 7-14 Constant Group Delay Note, however, that the phase characteristic typically consists of both linear and higher order (deviations from linear) components. The linear component can be attributed to the electrical length of the test device, and represents the average signal transit time. The higher order components are interpreted as variations in transit time for different frequencies, and represent a source of signal distortion.
Page 401 Operating Concepts Analyzer Display Formats Figure 7-16 Rate of Phase Change Versus Frequency When deviations from linear phase are present, changing the frequency step can result in different values for group delay. Note that in this case the computed slope varies as the aperture ∆f is increased.
Page 402 Operating Concepts Analyzer Display Formats The default group delay aperture is the frequency span divided by the number of points across the display. To set the aperture to a different value, turn on smoothing in the average menu, and vary the smoothing aperture. The aperture can be varied up to 20% of the span swept.
Page 403: Electrical Delay
Operating Concepts Electrical Delay Electrical Delay softkey adjusts the electrical delay to balance the phase of the ELECTRICAL DELAY test device. This softkey must be used in conjunction with COAXIAL DELAY (with cut-off frequency) in order to identify which type of WAVEGUIDE DELAY transmission line the delay is being added to.
Page 404: Noise Reduction Techniques
Operating Concepts Noise Reduction Techniques Noise Reduction Techniques key is used to access three different noise reduction techniques: sweep-to-sweep averaging, display smoothing, and variable IF bandwidth. All of these can be used simultaneously. Averaging and smoothing can be set independently for each channel, and the IF bandwidth can be set independently if the stimulus is uncoupled.
Page 405: Smoothing
Operating Concepts Noise Reduction Techniques Smoothing Smoothing (similar to video filtering) averages the formatted active channel data over a portion of the displayed trace. Smoothing computes each displayed data point based on one sweep only, using a moving average of several adjacent data points for the current sweep. The smoothing aperture is a percent of the swept stimulus span, up to a maximum of 20%.
Page 406 Operating Concepts Noise Reduction Techniques Another difference between sweep-to-sweep averaging and variable IF bandwidth is the sweep time. Averaging displays the first complete trace faster but takes several sweeps to reach a fully averaged trace. IF bandwidth reduction lowers the noise floor in one sweep, but the sweep time may be slower.
Page 407: Measurement Calibration
Operating Concepts Measurement Calibration Measurement Calibration Measurement calibration is an accuracy enhancement procedure that effectively removes the system errors that cause uncertainty in measuring a test device. It measures known standard devices, and uses the results of these measurements to characterize the system. This section discusses the following topics: •...
Page 408: What Causes Measurement Errors
Operating Concepts Measurement Calibration What Causes Measurement Errors? Network analysis measurement errors can be separated into systematic, random, and drift errors. Correctable systematic errors are the repeatable errors that the system can measure. These are errors due to mismatch and leakage in the test setup, isolation between the reference and test signal paths, and system frequency response.
Page 409 Operating Concepts Measurement Calibration However, an actual coupler is not perfect, as shown in Figure 7-21b. A small amount of the incident signal appears at the coupled output due to leakage as well as reflection from the termination in the coupled arm. Also, reflections from the coupler output connector appear at the coupled output, adding uncertainty to the signal reflected from the device.
Page 410 Operating Concepts Measurement Calibration Load Match Load match error results from an imperfect match at the output of the test device. It is caused by impedance mismatches between the test device output port and port 2 of the measurement system. Some of the transmitted signal is reflected from port 2 back to the test device as illustrated in Figure 7-23.
Page 411: Characterizing Microwave Systematic Errors
Operating Concepts Measurement Calibration Frequency Response (Tracking) This is the vector sum of all test setup variations in which magnitude and phase change as a function of frequency. This includes variations contributed by signal-separation devices, test cables, adapters, and variations between the reference and test signal paths. This error is a factor in both transmission and reflection measurements.
Page 412 Operating Concepts Measurement Calibration To characterize the errors, the reflection coefficient is measured by first separating the incident signal (I) from the reflected signal (R), then taking the ratio of the two values. See Figure 7-25. Ideally, (R) consists only of the signal reflected by the test device (S , for S actual).
Page 413 Operating Concepts Measurement Calibration This re-reflection effect and the resultant incident power variation are caused by the source match error, E as shown in Figure 7-27. Figure 7-27 Source Match E Frequency response (tracking) error is caused by variations in magnitude and phase flatness versus frequency between the test and reference signal paths.
Page 414 Operating Concepts Measurement Calibration If the value of these three "E" errors and the measured test device response were known for each frequency, this equation could be solved for S to obtain the actual test device response. Because each of these errors changes with frequency, their values must be known at each test frequency.
Page 415 Operating Concepts Measurement Calibration Figure 7-30 Measured Effective Directivity Next, a short circuit termination whose response is known to a very high degree is used to establish another condition as shown in Figure 7-31. Figure 7-31 Short Circuit Termination The open circuit gives the third independent condition. In order to accurately model the phase variation with frequency due to fringing capacitance from the open connector, a specially designed shielded open circuit is used for this step.
Page 416 Operating Concepts Measurement Calibration Figure 7-32 Open Circuit Termination This completes the calibration procedure for one port devices. Device Measurement Now the unknown is measured to obtain a value for the measured response, S , at each frequency. Refer to Figure 7-33.
Page 417 Operating Concepts Measurement Calibration Two-Port Error Model (ES Models Only) The error model for measurement of the transmission coefficients (magnitude and phase) of a two-port device is derived in a similar manner. The potential sources of error are frequency response (tracking), source match, load match, and isolation as shown in Figure 7-34.
Page 418 Operating Concepts Measurement Calibration As in the reflection model, source match can cause the incident signal to vary as a function of test device S . Also, since the test setup transmission return port is never exactly the characteristic impedance, some of the transmitted signal is reflected from the test set port 2, and from other mismatches between the test device output and the receiver input, to return to the test device.
Page 419 Operating Concepts Measurement Calibration NOTE It is very important that the exact electrical length of the thru be known. Most calibration kits assume a zero length thru. For some connection types such as Type-N, this implies one male and one female port. If the test system requires a non-zero length thru, for example, one with two male test ports, the exact electrical delay of the thru adapter must be used to modify the built-in calibration kit definition of the thru.
Page 420 Operating Concepts Measurement Calibration The analyzer’s test set can measure both the forward and reverse characteristics of the test device without you having to manually remove and physically reverse the device. A full two-port error model illustrated in Figure 7-38. This illustration depicts how the analyzer effectively removes both the forward and reverse error terms for transmission and reflection measurements.
Page 421: How Effective Is Accuracy Enhancement
Operating Concepts Measurement Calibration Figure 7-39 Full Two-Port Error Model Equations How Effective Is Accuracy Enhancement? In addition to the errors removed by accuracy enhancement, other systematic errors exist due to limitations of dynamic accuracy, test set switch repeatability, and test cable stability.
Page 422 Operating Concepts Measurement Calibration Figure 7-40a shows a measurement in log magnitude format with a response calibration only. Figure 7-40b shows the improvement in the same measurement using an S11 one-port calibration. Figure 7-41a shows the measurement on a Smith chart with response calibration only, and Figure 7-41b shows the same measurement with an S11 one-port...
Page 423 Operating Concepts Measurement Calibration The response of a device in a log magnitude format is shown in Figure 7-42. Figure 7-42a shows the response using a response calibration and Figure 7-42b the response using a full two-port calibration. Figure 7-42 Response versus Full Two-Port Calibration 7- 53...
Page 424: Calibration Routines
Operating Concepts Calibration Routines Calibration Routines There are twelve different error terms for a two-port measurement that can be corrected by accuracy enhancement in the analyzer. These are directivity, source match, load match, isolation, reflection tracking, and transmission tracking, each in both the forward and reverse direction.
Page 425: Full Two-Port Calibration (Es Models Only)
Operating Concepts Calibration Routines Enhanced Reflection Calibration The enhanced reflection calibration is activated by selecting under ENH. REFL. ON off menu. ENHANCED RESPONSE The enhanced reflection calibration effectively removes load match error from the enhanced response calibration performed on a bilateral device. A bilateral device has an identical forward (S ) and reverse transmission (S ) response.
Page 426: E-Cal
Operating Concepts Calibration Routines E-CAL The E-Cal calibration menu is activated by pressing in the calibration E-CAL MENU menu. The E-Cal (Electronic Calibration) system determines systemic errors of the analyzer through a one-time connection of an E-Cal module to the network analyzer ports. The random error of connector repeatability is reduced substantially through a one-time connection when compared to frequent connections and disconnections of the conventional short/open/load methods.
Page 427: Modifying Calibration Kits
Operating Concepts Modifying Calibration Kits Modifying Calibration Kits Modifying calibration kits is necessary only if unusual standards (such as in TRL*) are used or the very highest accuracy is required. Unless a calibration kit model is provided with the calibration devices used, a solid understanding of error-correction and the system error model are absolutely essential to making modifications.
Page 428: Procedure
Operating Concepts Modifying Calibration Kits Procedure The following steps are used to modify or define a user kit: 1. Select the predefined kit to be modified. (This is not necessary for defining a new calibration kit.) 2. Define the standards: •...
Page 429 Operating Concepts Modifying Calibration Kits • leads to a menu for constructing a label for the user-modified cal kit. If a LABEL KIT label is supplied, it will appear as one of the five softkey choices in the select cal kit menu.
Page 430 Operating Concepts Modifying Calibration Kits After a standard number is entered, selection of the standard type will present one of five menus for entering the electrical characteristics (model coefficients) corresponding to that standard type, such as . These menus are tailored to the current type, so that only OPEN characteristics applicable to the standard type can be modified.
Page 431 Operating Concepts Modifying Calibration Kits • defines the standard type as a transmission line of specified length, for DELAY/THRU calibrating transmission measurements. • defines the standard type to be a load, but with an ARBITRARY IMPEDANCE arbitrary impedance (different from system Z0). —...
Page 432 Operating Concepts Modifying Calibration Kits The following is a description of the softkeys located within the specify offset menu: • allows you to specify the one-way electrical delay from the OFFSET DELAY measurement (reference) plane to the standard, in seconds (s). (In a transmission standard, offset delay is the delay from plane to plane.) Delay can be calculated from the precise physical length of the offset, the permittivity constant of the medium, and the speed of light.
Page 433 Operating Concepts Modifying Calibration Kits A class often consists of a single standard, but may be composed of more than one standard if band-limited standards are used. For example, if there were two load standards—a fixed load for low frequencies, and a sliding load for high frequencies—then that class would have two standards.
Page 434 Operating Concepts Modifying Calibration Kits It is often simpler to keep the number of standards per class to the bare NOTE minimum needed (often one) to avoid confusion during calibration. Each class can be given a user-definable label as described under label class menus. Standards are assigned to a class simply by entering the standard’s reference number (established while defining a standard) under a particular class.
Page 435: Verify Performance
Operating Concepts Modifying Calibration Kits • allows you to enter the standard numbers for a TRL line or TRL LINE OR MATCH match calibration. Label Class Menu The label class menus are used to define meaningful labels for the calibration classes. These then become softkey labels during a measurement calibration.
Page 436: Modifying And Saving A Calibration Kit From The Calibration Kit Selection Menu
Operating Concepts Modifying Calibration Kits Modifying and Saving a Calibration Kit from the Calibration Kit Selection Menu To modify a calibration kit from the calibration kit selection menu, press: CAL KIT SELECT CAL KIT MODIFY KIT DONE (MODIFIED) To save the modified calibration kit, press: CAL KIT SELECT CAL KIT USER KIT...
Page 437: Trl*/Lrm* Calibration (Es Models Only)
Operating Concepts TRL*/LRM* Calibration (ES Models Only) TRL*/LRM* Calibration (ES Models Only) The network analyzer has the capability of making calibrations using the "TRL" (thru-reflect-line) method. This section contains information on the following subjects: • Why Use TRL Calibration? • TRL Terminology •...
Page 438: Trl Terminology
Operating Concepts TRL*/LRM* Calibration (ES Models Only) TRL Terminology Notice that the letters TRL, LRL, LRM, etc. are often interchanged, depending on the standards used. For example, "LRL" indicates that two lines and a reflect standard are used; "TRM" indicates that a thru, reflection and match standards are used. All of these refer to the same basic method.
Page 439 Operating Concepts TRL*/LRM* Calibration (ES Models Only) Also notice that the forward source match (E ) and reverse load match (E ) are both represented by ε , while the reverse source match (E ) and forward load match (E ) are both represented by ε...
Page 440 Operating Concepts TRL*/LRM* Calibration (ES Models Only) Figure 7-44 8-term TRL (or TRL*) Error Model and Generalized Coefficients Source match and load match A TRL calibration assumes a perfectly balanced test set architecture as shown by the term which represents both the forward source match (E ) and reverse load match (E ), and by the ε...
Page 441: Improving Raw Source Match And Load Match For Trl*/Lrm* Calibration
Operating Concepts TRL*/LRM* Calibration (ES Models Only) Improving Raw Source Match and Load Match for TRL*/LRM* Calibration A technique that can be used to improve the raw test port mismatch is to add high quality fixed attenuators. The effective match of the system is improved because the fixed attenuators usually have a return loss that is better than that of the network analyzer.
Page 442: How True Trl/Lrm Works (Option 400 Only)
Operating Concepts TRL*/LRM* Calibration (ES Models Only) Transmission magnitude uncertainty = E where: = effective directivity = effective reflection tracking = effective source match = effective load match = effective crosstalk = effective transmission tracking = S-parameters of the device under test How True TRL/LRM Works (Option 400 Only) The TRL implementation with Option 400 requires a total of fourteen measurements to quantify ten unknowns as opposed to only a total of twelve measurements for TRL*.
Page 443 Operating Concepts TRL*/LRM* Calibration (ES Models Only) • Attenuation of the thru need not be known. • If the thru is used to set the reference plane, the insertion phase or electrical length must be well-known and specified. If a non-zero length thru is specified to have zero delay, the reference plane is established in the middle of the thru, resulting in phase errors during measurement of devices.
Page 444 Operating Concepts TRL*/LRM* Calibration (ES Models Only) Fabricating and defining calibration standards for TRL/LRM When calibrating a network analyzer, the actual calibration standards must have known physical characteristics. For the reflect standard, these characteristics include the offset in electrical delay (seconds) and the loss (ohms/second of delay). The characteristic impedance, , is not used in the calculations in that it is determined by the line OFFSET Z0...
Page 445 Operating Concepts TRL*/LRM* Calibration (ES Models Only) where: f = frequency l = length of line v = velocity = speed of light × velocity factor which can be reduced to the following using frequencies in MHz and length in centimeters: ×...
Page 446 Operating Concepts TRL*/LRM* Calibration (ES Models Only) The TRM calibration technique is related to TRL with the difference being that it bases the characteristic impedance of the measurement on a matched Z termination instead of a transmission line for the third measurement standard. Like the TRL thru standard, the TRM THRU standard can either be of zero length or non-zero length.
Page 447 Operating Concepts TRL*/LRM* Calibration (ES Models Only) The location of the reference plane is determined by the selection of SET REF: THRU . By default, the reference plane is set with the thru standard which SET REF: REFLECT must have a known insertion phase or electrical length. If a non-zero length thru is specified to have zero delay, the reference plane will be established in the middle of the thru.
Page 448: Gpib Operation
Operating Concepts GPIB Operation GPIB Operation This section contains information on the following topics: • local key • GPIB controller modes • instrument addresses • using the parallel port Local This key is allows you to return the analyzer to local (front panel) operation from remote (computer controlled) operation.
Page 449: Gpib Status Indicators
Operating Concepts GPIB Operation GPIB STATUS Indicators When the analyzer is connected to other instruments over GPIB, the GPIB STATUS indicators in the instrument state function block light up to display the current status of the analyzer. R = remote operation L = listen mode T = talk mode S = service request (SRQ) asserted by the analyzer...
Page 450: Address Menu
Operating Concepts GPIB Operation Address Menu This menu can be accessed by pressing the softkey within the GPIB SET ADDRESS menu. In communications through the General Purpose Interface Bus (GPIB), each instrument on the bus is identified by a GPIB address. This decimal-based address code must be different for each instrument on the bus.
Page 451 Operating Concepts GPIB Operation The GPIO Mode The GPIO mode turns the parallel port into a "general purpose input/output" port. In this mode the port can be connected to test fixtures, power supplies, and other peripheral equipment that might be used to interact with the analyzer during measurements.
Page 452: Limit Line Operation
Operating Concepts Limit Line Operation Limit Line Operation This menu can be accessed by pressing within the system LIMIT MENU LIMIT LINE menu. You can have limit lines drawn on the display to represent upper and lower limits or device specifications with which to compare the test device.
Page 453: Edit Limits Menu
Operating Concepts Limit Line Operation If limit lines are on, they are plotted with the data on a plot. If limit testing is on, the PASS or FAIL message is plotted, and the failing portions of the trace that are a different color on the display are also a different color on the plot.
Page 454: Knowing The Instrument Modes
Operating Concepts Knowing the Instrument Modes Knowing the Instrument Modes There are three major instrument modes of the analyzer: • network analyzer mode • tuned receiver mode • frequency offset operation (Option 089) Network Analyzer Mode This is the standard mode of operation for the analyzer, and is active after you press or switch on the AC power.
Page 455: Frequency Offset Operation (Option 089)
Operating Concepts Knowing the Instrument Modes Figure 7-46 Typical Test Setup for Tuned Receiver Mode Tuned Receiver Mode In-Depth Description If you press , the analyzer receiver System INSTRUMENT MODE TUNED RECEIVER operates independently of any signal source. The following features and limitations apply to the tuned receiver mode: •...
Page 456 Operating Concepts Knowing the Instrument Modes 7-86...
Page 457 Safety and Regulatory Information...
Page 458: Safety And Regulatory Information General Information
For any assistance, contact your nearest Agilent Technologies Sales and Service Office. Shipment for Service If you are sending the instrument to Agilent Technologies for service, ship the analyzer to the nearest service center for repair, including a description of any failed test and any error message.
Page 459 Safety and Regulatory Information General Information Table 8-1 Contacting Agilent Online assistance: www.agilent.com/find/assist United States Latin America Canada Europe (tel) 1 800 452 4844 (tel) (305) 269 7500 (tel) 1 877 894 4414 (tel) (+31) 20 547 2323 (fax) (305) 269 7599 (fax) (905) 282-6495 (fax) (+31) 20 547 2390 New Zealand...
Page 460: Safety Symbols
Safety and Regulatory Information Safety Symbols Safety Symbols The following safety symbols are used throughout this manual. Familiarize yourself with each of the symbols and its meaning before operating this instrument. CAUTION Caution denotes a hazard. It calls attention to a procedure that, if not correctly performed or adhered to, would result in damage to or destruction of the instrument.
Page 461: Safety Considerations
Safety and Regulatory Information Safety Considerations Safety Considerations NOTE This instrument has been designed and tested in accordance with IEC Publication 1010, Safety Requirements for Electronics Measuring Apparatus, and has been supplied in a safe condition. This instruction documentation contains information and warnings which must be followed by the user to ensure safe operation and to maintain the instrument in a safe condition.
Page 462: Servicing
Safety and Regulatory Information Safety Considerations Servicing WARNING No operator serviceable parts inside. Refer servicing to qualified personnel. To prevent electrical shock, do not remove covers. These servicing instructions are for use by qualified personnel only. WARNING To avoid electrical shock, do not perform any servicing unless you are qualified to do so.
Page 463: General
Safety and Regulatory Information Safety Considerations General WARNING To prevent electrical shock, disconnect the analyzer from mains before cleaning. Use a dry cloth or one slightly dampened with water to clean the external case parts. Do not attempt to clean internally. WARNING If this product is not used as specified, the protection provided by the equipment could be impaired.
Page 464: Compliance With German Ftz Emissions Requirements
Safety and Regulatory Information Safety Considerations Compliance with German FTZ Emissions Requirements This network analyzer complies with German FTZ 526/527 Radiated Emissions and Conducted Emission requirements. Compliance with German Noise Requirements This is to declare that this instrument is in conformance with the German Regulation on Noise Declaration for Machines (Laermangabe nach der Maschinenlaermrerordung −3.
Page 465: Declaration Of Conformity
Safety and Regulatory Information Declaration of Conformity Declaration of Conformity 8- 9...
Page 466 Safety and Regulatory Information Declaration of Conformity 8-10...
Page 467 Index Numerics analyzer internal memory, what you can save 4-36 2-port error corrections, cables, interconnecting applying power performing 6-42 6-71 calculating statistics of arrays 4 Param Displays softkey 1-18 measurement data 1-42 format calculations, ratio pre-raw data calibrating for non-coaxial devices 6-50 aborting a print or plot process...
Page 468 Index TRL*/LRM* two-port modifying 1-101 data trace 1-19 calibration 7-55 commands that require clean saving to display memory 1-19 calibration standards sweep 1-106 decision making functions 1-112 calibration techniques commands that sequencing decoupled improper completes before next channel power 1-13 calibration, measurement 7-37 command...
Page 469 Index titling 1-11 dynamic range, increasing 5-15 error-correction, vector adjusting colors of the display errors, measurement 7-38 1-22 exit HPGL mode 4-26 blanking the display 1-21 sending to the printer 4-26 – ECal 6-58 6-75 data trace external adapter removal calibration saving to display memory calibration 5-13...
Page 470 Index flat limit lines 1-73 transmission measurements swept RF/IF conversion loss floppy disk, what you can save 6-17 2-20 4-37 frequency response error high dynamic range form feed sequence 4-26 corrections 6-12 measurement 2-24 sending to the printer 4-26 receiver calibration 6-15 high dynamic range swept RF/IF format...
Page 471 Index improving raw source match and forward stepping in edit mode forward transform vertical axis load match for TRL*/LRM* 1-106 3-22 calibration 7-71 gosub sequence command 1-107 low pass response horizontal increase sweep speed GPIO mode 1-107 axis 3-16 using fast 2-port calibration limit test decision making low pass response vertical axis 5-13...
Page 472 Index line segments, editing 1-78 making transmission response characterizing microwave deleting line segments 1-78 measurements systematic errors 7-41 line types, selecting 4-17 manual mode measurement errors 7-38 linear frequency sweep 7-15 manual sweep time mode 7-11 measurement considerations linear magnitude format 7-27 manual thru 6-60...
Page 473 Index insertion phase response minimum amplitude, searching noise reduction techniques 7-34 1-39 averaging 7-34 separate transmission paths minimum bandwidth 1-94 IF bandwidth reduction 7-35 through the test device minimum sweep time 7-11 smoothing 7-35 using low pass impulse mixer non-coaxial mode 3-20 fixed IF measurements...
Page 474 Index storing the HPGL initialization choosing display elements 4-15 using sample-and-sweep sequence 4-25 choosing plot speed 4-18 correction mode 6-36 choosing scale 4-17 power ranges resetting plotting parameters to automatic mode default values 4-18 manual mode page quadrants, plotting selecting auto-feed 4-15 power ranges, selecting 1-61...
Page 475 Index scale and offset reflection measurements using using the calculation 2-22 smoothing bandpass using the mixer measurement sweep-to-sweep averaging interpreting the band pass diagram 2-17 2-23 trace math operation reflection response vertical RF range transform axis 3-13 power meter calibration 2-23 vector error-correction reflection measurements using...
Page 476 Index places where you can save 4-36 frequency range for time domain tracking the amplitude 1-41 what you can save to a low pass 3-15 spreadsheet, saving test file for a computer 4-37 gate 3-35 4-44 – what you can save to a floppy setting ripple limits 1-81 1-84...
Page 477 Index swept edit list menu 7-17 limit test example sequence title, display 1-11 swept edit subsweep menu 7-17 1-118 titling the displayed swept list mode loading a sequence from a disk measurement 4-32 calibrate 1-70 1-104 to produce a time stamp 4-33 characteristics of the filter 1-68...
Page 478 Index creating a user-defined TRL calibration kit 6-50 uncoupling display markers 1-31 TRL options 7-76 understanding power ranges TRL terminology 7-68 understanding S-parameters TRL* error model 7-68 7-20 TRL*/LRM* calibration 7-67 upper stopband parameters 1-69 fabricating and defining using continuous correction mode calibration standards for 6-38 TRL/LRM...

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8719et 8720es 8720et 8722es 8722et

Agilent Technologies 8719ES User Manual

Making Measurements

Making Mixer Measurements (Option 089 Only)

Chapter 3 Making Time Domain Measurements Using this Chapter

Printing, Plotting, and Saving Measurement Results

Optimizing Measurement Results Using this Chapter

Calibrating for Increased Measurement Accuracy How to Use this Chapter

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Summary of Contents for Agilent Technologies 8719ES