Agilent Technologies 8719D User Manual

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User's Guide

Agilent Technologies

8719D/20D/22D

Network Analyzers

Manufacturing Part Number: 08720-90288

Printed in USA

April 2012

Print Date:

February 1999

Supersedes:

, 2012

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Summary of Contents for Agilent Technologies 8719D

Page 1 User’s Guide Agilent Technologies 8719D/20D/22D Network Analyzers Manufacturing Part Number: 08720-90288 Printed in USA April 2012 Print Date: February 1999 Supersedes: , 2012 © Agilent Technologies, Inc. 1996 - 1999...
Page 2 This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-Packard's former test and measurement, semiconductor products and chemical analysis businesses are now part of Agilent Technologies. To reduce potential confusion, the only change to product numbers and names has been in the company name prefix: where a product number/name was HP XXXX the current name/number is now Agilent XXXX.
Page 3 Printing Copies of Documentation from the Web To print copies of documentation from the Web, download the PDF file from the Agilent web site: • Go to http://www.agilent.com. • Enter the document’s part number (located on the title page) in the Quick Search box. •...
Page 4 Contacting Agilent This information supersedes all prior HP contact information. Online assistance: www.agilent.com/find/assist Americas Brazil Canada Mexico United States (tel) 1 800 254 2440 (tel) +1 877 894 4414 (tel) (+55) 11 3351 7012 (tel) 800 829 4444 (fax) 1 800 254 4222 (fax) +1 303 662 3369 (fax) (+55) 11 3351 7024 (alt) (+1) 303 662 3998...
Page 5 User’s Guide HP 8719D/2OD/22D Network Analyzer HP Part No. 08720-90288 Supersedes: October 1998 Printed in USA February 1999...
Page 6 Notice. The information contained in this document is subject to change without notice. Hewlett-Packard makes no warranty of any kind with regard to this material, including but not limited to, the implied warranties of merchantability and fitness for a particular purpose.
Page 7 Certification Hewlett-Packard Company certifies that this product met its published specifications at the time of shipment from the factory. Hewlett-Packard further certifies that its calibration measurements are traceable to the United States National Institute of Standards and Technology, to the extent allowed by the Institute’s calibration facility, and to the calibration facilities of other International Standards Organization members.
Page 8 Maintenance Clean the cabinet using a damp cloth only. Assistance available for and other customer assisturn agrm Product maintenance...
Page 9 Hewlett-Packard Sales and Service OfEces US FIELD OPERA!I’IONS Hewlett-Packard Company (800) 403-0801 EUROPEAN FIELD OPERATIONS Prance Hewlett-Packard S.A. Hewlett-Packard Prance Hewlett-Packard GmbH 160, Route du Nant-d’Avril 1 Avenue Du Canada Hewlett-Packard Strasse Zone D’Activite De Courtaboeuf 61352 Bad Homburg v.d.H 1217 Meyrin a/Geneva Switzerland France...
Page 10 Safety Symbols The following safety symbols are used throughout this manual. FamiIiarize yourself with each of the symbols and its meaning before operating this instrument. Caution denotes a hazard. It calls attention to a procedure that, if not Caution correctly performed or adhered to, would result in damage to or destruction of the instrument.
Page 11 General Safety Considerations Warning This is a safety Class I product (provided with a protective earthing ground incorporated in the power cord). The mains plug shall only be inserted in a socket outlet provided with a protective earth contact. Any interruption of the protective conductor, inside or outside the instrument, is likely to make the instrument dangerous.
Page 12 User’s Guide Overview Chapter 1, “HP 8719D/20D/22D Description and Options,” describes features, functions, and available options Chapter 2, “Making Measurements,” contains step-by-step procedures for making measurements or using particular functions. Chapter 3, “Making Mixer Measurements,” contains step-by-step procedures for making calibrated and error-corrected mixer measurements.
Page 13 Network Analyzer Documentation Set The Installation and Quick Start Guide familiarizes you with the network analyzer’s front and rear panels, electrical and environmental operating requirements, as well as procedures for installing, configuring, and verifying the operation of the analyzer. The User’s Guide shows how to make measurements, explains commonly-used features, and tells you how to get the most performance from your analyzer.
Page 14 DECLARATION OF CONFORMITY EN 45014 Hewlett-Packard Co. Manufacturer’s Address: Microwave Instruments Division 1400 Fountaingrove Parkway Santa Rosa, CA 95403- 1799 declares that the product Product Name: Network Analyzer Model Number: HP 87190, HP 87200, HP 87220 Product Options: This declaration covers all options of the above products.
Page 15: Table Of Contents
1. EP 8719D/20D/22D Description and Options Where to Look for More Information ..... Analyzer Description ......
Page 16 Required Equipment ......2-13 Procedure for Characterizing a Duplexer ....2-13 Using Analyzer Display Markers .
Page 17 2-62 ....... . Measurements Using the Tuned Receiver Mode ....2-64 Typical test setup .
Page 18 4. Printing, Plotting, and Saving Measurement Results Where to Look for More Information ..... Printing or Plotting Your Measurement Results ....Configuring a Print Function .
Page 19 4-41 ......4-42 4-42 ....... 4-43 Formatting a Disk .
Page 20 Remove the Adapter ......5-44 Verify the Results ......5-46 Example Program .
Page 21 The Electrical Delay Block ............Conversion Transform (Option 010 Only) .
Page 22 6-28 S-Parameters ....... . Understanding S-Parameters ......6-28 6-29 The S-Parameter Menu .
Page 23 6-59 Frequency Response (Tracking) ..... . 6-59 Characterizing Microwave Systematic Errors ....6-59 .
Page 24 6-102 Loss of Power Meter Calibration Data ....6-102 Interpolation in Power Meter Calibration ....6-102 .
Page 25 Reflection Measurements Using Bandpass Mode ....6-121 Interpreting the bandpass reflection response horizontal axis ..6-122 Interpreting the bandpass reflection response vertical axis ..6-122 Transmission Measurements Using Bandpass Mode .
Page 26 Decision Making Functions ......6-144 Decision makmg functions jump to a softkey location, not to a specific 6-144 sequence title .
Page 27 HP 8719D and HP 8720D Measurement Port Specifications ... HP 8719D/8720D with 3.5 mm Connectors ....
Page 28 Key Definitions Where to Look for More Information ..... Guide Terms and Conventions ......Analyzer Functions .
Page 29 11-17 Controller ....... . 11-18 HP-IB Bus Structure ......11-18 Data Bus .
Page 30 Figures l-l. HP 8719D/20D/22D Front Panel ..... . . 1-2. Analyzer Display (Single Channel, Cartesian Format) ... . .
Page 31 2-43. Sloping Limit Lines ......2-47 2-44. Example Single Points Limit Line ..... . 2-48 2-45.
Page 32 6-5. StimuIus Function Block ......6-15 6-6. Power Range Transitions in the Automatic Mode (HP 8719D/20D, Standard) . . 6-7. Power Range Transitions in the Automatic Mode (HP 8722D, Standard) ..
Page 33 ....6-52. Response versus FuII Two-Port Calibration 6-53. HP 8719D/20D/22D functional block diagram for a 2-port error-corrected 6-92 measurement& system......
Page 34 6-79. Separating the Amplitude and Phase Components of Test-Device-Induced Modulation ....... 6-138 6-80.
Page 35 2-2. Gate Characteristics ......2-82 4-2. Default Pen Numbers and Corresponding Colors ....4-13 4-3.
Page 36: Ep 8719D/20D/22D Description And Options
This chapter contains information on the following topics: Analyzer Overview Analyzer Description Rear Panel Features and Connectors Analyzer Options Available Service and Support Options Where to Look for More Information Additional information about many of the topics discussed in this chapter is located in the following areas: measurements or using particular functions.
Page 37: Analyzer Description
Analyzer Description The HP 8719D/20D/22D is a high performance vector network analyzer for laboratory or production measurements of reflection and transmission parameters. It integrates a high resolution synthesized RF source, an S-parameter test set, and a four-channel three-input receiver (four-input receiver, Option 400) to measure and display magnitude, phase, and group delay responses of active and passive RF networks.
Page 38 other devices without an external controller. input bits through test sequencing. This can be useful for interfacing to material handlers or custom test sets. HP 87 1 gD/200/22D Description and Options...
Page 39: Front Panel Features
Front Panel Features Figure l-l. HP 8719D/20D/22D Front Panel These features are described in more detail later in this chapter, and in the “Key Definitions” chapter. Display. This shows the measurement data traces, measurement annotation, and softkey labels. The display is divided into specific information areas, illustrated in Figure l-2.
Page 40: Instrument State Function Block
The ENTRY block. This block includes the knob, the step QD QD keys, the number pad, and the backspace @ key. These allow you to enter numerical data and control the markers. You can use the numeric keypad to select digits, decimal points, and a minus sign for numerical entries.
Page 41: Analyzer Display
Analyzer Display Figure 1-2. Analyzer Display (Single Channel, Cartesian Format) The analyzer display shows various measurement information: The currently selected measurement parameters. Figure 1-2 illustrates the locations of the different information labels described below. In addition to the full-screen display shown in Figure l-2, a split display is available, as described in the “Making Measurements”...
Page 42 Stimulus stop Value. This value could be any one of the following: The upper limit of a power sweep. When the stimulus is in center/span mode, the span isshown in this space. The stimulus values can be blanked, as described under U ~~~~,.;.?~~~ Key” in the “Key (For CW time and power sweep measurements, the CW frequency is displayed centered between the start and stop times or power values.) Status Notations.
Page 43 Hld = Hold sweep. (See HOLD in the “Key Definitions” chapter.) m a n = Waiting for manual trigger. PC = Power meter calibration is on. (For power meter calibration procedures, refer to the “Optimizing Measurement Results” chapter. For power meter calibration theory, refer to the “Application and Operation Concepts”...
Page 44 also indicated by a small triangle adjacent to the graticule, at the left for channel 1 and at the right for channel 2 in Cartesian formats. 12. Marker Values. These are the values of the active marker, in units appropriate to the current measurement.
Page 45: Rear Panel Features And Connectors
Power cord receptacle, with fuse. For information on replacing the fuse, refer to the HP 8719D~OD/ZZD Network Anu&ze.r Ihstallation and Quick Sturt HP 8719D/2OD/ZZD Network Ana1gw.r Semrice Guide. Line voltage selector switch. For more information refer to the HP 8719DL?OD/ZZD Network Analgwr Installation and Quick Start Guide.
Page 46 10 MHZ REFERENCE ADJUST. (Option lD5) This allows for a frequency reference signal EXTERNAL REFERENCE INPUT connector. input that can phase lock the analyzer to an external frequency standard for increased frequency accuracy. The analyzer automatically enables the external frequency reference feature when a signal is connected to this input.
Page 47: Analyzer Options Available
Analyzer Options Available Option lD6, High Stability Frequency Reference Option lD5 offers f0.05 ppm temperature stability from 0 to 55 OC (referenced to 25 “C). Option 007, Mechanical Transfer Switch This option replaces the solid state transfer switch with a mechanical switch in the test set, providing the instrument with greater power handling capability.
Page 48: Option 010, Time Domain
Hewlett-Packard sales or service office for information on options available for your analyzer. See the table titled “Hewlett-Packard Sales and Service Offices” in the front of this manual for a table of sales and service offices. HP 8719D/20D122D Description and Options...
Page 49: Where To Look For More Information
This chapter contains the following example procedures for measurements or using making particular functions: Basic Measurement Sequence and Example Four-Parameter Display Mode Using the Analyzer Display Markers Measuring Magnitude and Insertion Phase Response Measuring Electrical Length and Phase Distortion Deviation from linear phase Group delay Testing a Device with Limit Lines Measuring Gain Compression...
Page 50: Principles Of Microwave Connector Care
Principles of Microwave Connector Care Proper connector care and connection techniques are critical for accurate, repeatable measurements. Refer to the calibration kit documentation for connector care information. Prior to making connections to the network analyzer, carefully review the information about inspecting, cleaning and gaging connectors.
Page 51: Basic Measurement Sequence And Example
Basic Measurement Sequence and Example Basic Measurement Sequence There are five basic steps when you are making a measurement. 1. Connect the device under test and any required test equipment. Damage may result to the device under test if it is sensitive to analyzer’s Caution default output power level.
Page 52: Setting The Source Power
You could also press the Istart_] and Lstoe) keys and enter the frequency range Note limits as start frequency and stop frequency values. Setting the Source Power. To change the power level to -5 dBm, press: Note ..... . . power ranges, to keep the power setting within the defined range.
Page 53: Using The Display Functions
Using the Display Functions In some cases, you may want to view more than one measured parameter at a time. Simultaneous gain and phase measurements for example, are useful in evaluating stability in negative feedback amplifiers. You can easily make such measurements using the dual channel display.
Page 54: To Save A Data Trace To The Display Memory
2. To view both primary channels on a single graticule, press: Set SFiZ~~ZKSP to 1X. Example of Viewing Both Primary Channels on a Single Graticule You can control the stimulus functions of the two primary channels Note independent of other, by pressing LMenu_) ;~~~~~~~~~~~~~~~~~ . However, each auxiliary channels 3 and 4 are permanently coupled by stimulus to primary channels 1 and 2 respectively.
Page 55: To Divide Measurement Data By The Memory Trace
You can use this feature for ratio comparison of two traces, for example, measurements of gain or attenuation. 1. You must have already stored a data trace to the active channel memory, as described in “To Save a Data Trace to the Display Memory. n 2.
Page 56: To Title The Active Channel Display
........If you have a DIN keyboard attached to the analyzer, type the title you want from the keyboard.
Page 57: Using The Four-Parameter Display
Using the Four-Parameter Display All four S-parameters of a two-port device may be viewed simultaneously by enabling auxiliary channels 3 and 4. Although independent of other channels in most variables, channels 3 and 4 are permanently coupled to channels 1 and 2 respectively by stimulus. That is, if channel 1 is set for a center frequency of 200 MHz and a span of 50 MHz, channel 3 wiII have the same stimulus values.
Page 58 The display will appear as shown in Figure 2-5. Channel 1 is in the upper left quadrant of the display, channel 2 is in the upper right quadrant, and channel 3 is in the lower half of the display. 1 7 S e p 1 9 9 8 11:13: 3 1 .
Page 59 This enables channel 4 and the screen now displays four separate grids as shown in Figure 2-6. Channel 4 is in the lower-right quadrant of the screen. 2 Sep 1 9 9 8 . 5 dE/ R E F - 2 dB DUAL CHAN O N o f f O N o f f...
Page 60: Quick Four-Parameter Display
Observe that the LED is flashing, indicating that channel 3 is active. 14. Rotate the front panel control knob and notice that marker 2 still moves on all four channel traces. 15. To independently control the channel markers: Rotate the front panel control knob. Marker 2 moves only on the channel 3 trace. Once made active, a channel can be configured independently of the other channels in most variables except stimulus.
Page 61: Required Equipment
Required Equipment Characterizing a duplexer requires that the test signals between the analyzer (a Z-port instrument) and the duplexer (a 3-port device) are routed correctly. This example uses one of the following adapters to perform this function: HP 87533 Option K36 duplexer test adapter You must also have a set of calibration standards for performing a full 2-port calibration on your test set up.
Page 62 11. Perform a full 2-port calibration on channel 2: Press (ETJ ~~~~~~ HIT& ‘I’LL ,3-PIIRT ......i ............
Page 63 5 Aug 1 9 9 8 1 0 dB/REF - 4 0 dE T r a n s : F W D T r a n s . : R E V Ref 1: REV ANALOG IN A u x I n p u t CONVERSION INPUT PORTS...
Page 64: Using Analyzer Display Markers
Using Analyzer Display Markers The analyzer markers provide numerical readout of trace data. You can control the marker search, the statistical functions, and the capability for quickly changing stimulus parameters with markers, from the ($GZZZJ key. Markers have a stimulus value (the x-axis value in a Cartesian format) and a response value (the y-axis value in a Cartesian format).
Page 65: Active Marker Control
The active marker appears on the analyzer display as V. The active marker stimulus value is displayed in the active entry area. You can modify the stimulus value of the active marker, using the front panel knob or numerical keypad. All of the marker response and stimulus Figure 2-8.
Page 66: Lb Move Marker Information Off Of The Grids
If marker information obscures the display traces, you can turn off the softkey menu and move the marker information off of the display traces and into the softkey menu area. Pressing the backspace key @ performs this function. This is a toggle function of the backspace key. That is, pressing &) alternately hides and restores the current softkey menu.
Page 67: Marker Information On The Graticules
4. Restore the softkey menu and move the marker information back onto the graticules: Press The display will be similar to Figure 2- 11. 2 S e p 1 9 9 8 12:09: 4 3 5 dB/’ R E F - 2 dB 4 : - 1 .
Page 68: To Activate A Fixed Marker
This is a relative mode, where the marker values show the position of the active marker relative to the delta reference marker. You can switch on the delta mode by dehning one of the five markers as the delta reference. 1.
Page 69: Using The
Using the AREF=AFIXED MHR Key to Activate a F’ixed Reference Marker 1. To set the frequency value of a hxed marker that appears on the analyzer display, press: (Marker_) AMODE MENU AREF=AFIXED MKR AMODE MENU FIXED MKR POSITION FIXED STIMULUS and turn the front panel knob or enter a value from the front panel keypad.
Page 70: Using The :~$Il@J , : , , , Xjxj Key To Activate A Fixed Reference Marker
Using the MK&.$$i!%Cl Key to Activate a Fixed Reference Marker Marker zero enters the position of the active marker as the A reference position. Alternatively, you can specify the fixed point with .jZU$D HE~,.PfEUTXO~ . Marker zero is canceled by switching delta mode off.
Page 71 At a preset state, the markers have the same stimulus values on each channel, but they can be uncoupled so that each channel has independent markers. 1. F?ess (j-1 &&&$$#fJfi& $IEMlJ and select from the following keys: Choose ~~~~~~~~~~~~ if you want the analyzer to couple the marker stimulus values for the two display channels.
Page 72: To Use Smith Chart Markers
2. Select the type of polar marker you want from the following choices: Choose LLW ..!!I& if you want to view the magnitude and the phase of the active marker. The magnitude values appear in units and the phase values appear in degrees. Choose &JG.$LR if you want to view the logarithmic magnitude and the phase of the active marker.
Page 73: Setting The Start Frequency
Choose LIN MKR if you want the analyzer to show the linear magnitude and phase of the reflection coefficient at the marker. Choose LOG MRR if you want the analyzer to show the logarithmic magnitude and the phase of the reflection coefficient at the active marker. This is useful as a fast method of obtaining a reading of the log magnitude value without changing to log magnitude format.
Page 74: Setting The Stop Frequency
Figure 2-18. Example of Setting the Start Frequency Using a Marker Setting the Stop Frequency 1. FVess (JGGX$ and turn the front panel knob, or enter a value from the front panel keypad to position the marker at the value that you want for the stop frequency. log MAG -30 dB log MA6...
Page 75: Setting The Frequency Span
C E N T E R SPAN Figure Z-20. Example of Setting the Center Frequency Using a Marker Setting the Frequency Span You can the span equal to the spacing between two markers. If you set the center frequency before you set the frequency span, you will have a better view of the area of interest. 2.
Page 76: Setting The Display Reference Value
13.124 dE log MAI, CENTER SPAN 6.500 CENTER 10.443 SPAN 4.31 I;Hr Figure Z-21. Example of Setting the Frequency Span Using Markers Setting the Display Reference Value 1. Press @E&ZG) and turn the front panel knob, or enter a value from the front panel keypad to position the marker at the value that you want for the analyzer display reference value.
Page 77: Setting The Electrical Delay
Setting the Electrical Delay This feature adds phase delay to a variation in phase versus frequency, therefore it is only applicable for ratioed inputs. 2. Press (MarkerFctn) and turn the front panel knob, or enter a value from the front panel keypad to position the marker at a point of interest.
Page 78: To Search For A Specific Amplitude
To Search for a Specific Amplitude These functions place the marker at an amplitude-related point on the trace. If you switch on tracking, the analyzer searches every new trace for the target point. Searching for the Maximum Amplitude 1. press Ij) ~~~~~~~~ to access the marker search menu. trace.
Page 79: Searching For A Bandwidth
Press SEM%Il:. 2’~ to move the active marker to the target point on the measurement trace. If you want to change the target amplitude value (default is -3 dB), press X&S&% and enter the new value from the front panel keypad. If you want to search for,,multiple responses at the target amplitude value, press CENTER 11,.240 SPAN...
Page 80: Tracking The Amplitude That You Are Searching
Markers Figure 2-27. Example of Searching for a Bandwidth 1. Set up an amplitude search by following one of the previous procedures in ‘To Search for a Specific Amplitude. n with every new trace and put the active marker on that point. When tracking is not activated, the analyzer finds the specified amplitude on the current sweep and the marker remains at same stimulus value, regardless of changes in the trace response value with subsequent sweeps.
Page 81 This function calculates the mean, standard deviation, and peak-to-peak values of the section of the displayed trace between the active marker and the delta reference. If there is no delta reference, the analyzer calculates the statistics for the entire trace. 2.
Page 82: Measuring Magnitude And Insertion Phase Response
Measuring Magnitude and Insertion Phase Response The analyzer allows you to make two different measurements simultaneously. You can make these measurements in different formats for the same parameter. For example, you could measure both the magnitude and phase of transmission. You could also measure two different parameters (SH and SZZ).
Page 83: Measuring Insertion Phase Response
Reconnect your test device. 5. To better view the measurement trace, press: 6. To locate the maximum amplitude of the device response, as shown in Figure 2-30, press: Example Magnitude Response Measurement Measuring Insertion Phase Response 7. ‘Ib view both the magnitude and phase response of the device, as shown in Figure 2-31, press: The channel 2 portion of Figure 2-31 shows the insertion phase response of the device under test.
Page 84: Phase Samples
information may result. Figure 2-32 shows an example of phase samples with AC#J less than HO0 and greater than 180°. Figure 2-32. Phase Samples Undersampling may arise when measuring devices with long electrical length. To correct this problem, the frequency span should be reduced, or the number of points increased until Ad is less than 180°...
Page 85: Measuring Electrical Length And Phase Distortion
Measuring Electrical Length and Phase Distortion Electrical Length The analyzers mathematically implement a function similar to the mechanical “line stretchers” of earlier analyzers. This feature simulates a variable length lossless transmission line, which you can add to or remove from the analyzer’s receiver input to compensate for interconnecting cables, etc.
Page 86 Substitute a thru for the device and perform a response calibration and press: Reconnect your test device. Notice that in Figure 2-34 the SAW iilter under test has considerable phase shift within only a 2 MHz span. Other filters may require a wider frequency span to see the effects of phase shift.
Page 87: Measuring Phase Distortion
electrical length until you achieve the best flat line, as shown in Figure 2-35. The measurement value that the analyzer displays represents the electrical length of your device relative to the speed of light in free space. The physical of your device is length related to this value by the propagation velocity of its medium.
Page 88: Deviation From Linear Phase
Deviation From Linear Phase By adding electrical length to “flatten out” the phase response, you have removed the linear phase shift through your device. The deviation from linear phase shift through your device is all that remains. Follow the procedure in “Measuring Electrical Length. n To use the marker statistics to measure the maximum peak-to-peak deviation from linear phase, press: Activate and adjust the electrical delay to obtain a minimum peak-to-peak value.
Page 89: Group Delay Example Measurement
2. To view the measurement in delay format, as shown in Figure 2-37, press: 3. To activate a marker to measure the group delay at a particular frequency, press: Group delay measurements may require a specific aperture (Af) or frequency spacing between measurement points The phase shift between two adjacent frequency points must be less than 4.
Page 90: Group Delay Example Measurement With Smoothing Aperture Increased
5. ‘lb increase the effective group delay aperture, by increasing the number of measurement points over which the analyzer calculates the group delay, press: As the aperture is increased, the “smoothness” of the trace improves markedly, but at the expense of measurement detail. Group Delay Example Measurement with Smoothing Aperture Increased 242 Making Measurements...
Page 91: Setting Up The Measurement Parameters
Limit testing is a measurement technique that compares measurement data to constraints that you define. Depending on the results of this comparison, the analyzer will indicate if your device either passes or fails the test. Limit testing is implemented by creating individual flat, sloping, and single point limit lines on the analyzer display.
Page 92: Creating Flat Limit Lines
4. Reconnect your test device. 5. lb better view the measurement trace, press: Creating Flat Limit Lines In this example procedure, the following flat Iimit Iine values are set: Frequency Range .., ............Power Range 10.11 GHz to 10.37 GHz .
Page 93 5. To terminate the flat line segment by establishing a single point limit, press: ..: . . i . . . : i .., , , , .., . , Figure 2-41 shows the flat limit lines that you have just created with the following parameters: stimulus from 10.11 GHz to 10.37 GHz...
Page 94: Creating A Sloping Limit Line
7. ‘lb create a limit line that tests the high side of the bandpass lilter, press: Creating a Sloping Limit Line This example procedure shows you how to make limits that test the shape factor of a SAW filter. The following limits are set: Frequency Range .
Page 95 3. To terminate the lines and create a sloping limit line, press: 4. To establish the start frequency and limits for a sloping limit line that tests the high side of the filter, press: Figure 2-43. Sloping Limit Lines M a k i n g M e a s u r e m...
Page 96: Creating Single Point Limits
Creating Single Point Limits In this example procedure, the following En-tits are set: from +4 dB to -2 dB at 10.15 GHz from +4 dB to -2 dB at 10.33 GHz 1. To access the limits menu and activate the Iimit lines, press: 2.
Page 97: Editing Limit Segments
Editing Limit Segments This example shows you how to edit the upper limit of a limit line. 1. To access the limits menu and activate the limit lines, press: 2. To move the pointer symbol (>) on the analyzer display to the segment you wish to modify, press: .
Page 98: Runningalimittest
Running a Limit Test 1. To access the limits menu and activate the limit lines, press: Reviewing the Limit Line Segments The limit table data that you have previously entered is shown on the analyzer display. 2. To verify that each segment in your limits table is correct, review the entries by pressing: 3.
Page 99: Offsetting Limit Lines
Offsetting Limit Lines The limit offset functions allow you to adjust the limit lines to the frequency and output level of your device. For example, you could apply the stimulus offset feature for testing tunable filters. Or, you could apply the amplitude offset feature for testing variable attenuators, or This example shows you the offset feature and the limit test failure indications that can appear on the analyzer display.
Page 100: Measuring Gain Compression
Measuring Gain Compression Gain compression occurs when the input power of an amplifier is increased to a level that reduces the gain of the amplifier and causes a nonlinear increase in output power. The point at which the gain is reduced by 1 dB is called the 1 dl3 compression point. The gain compression will vary with frequency, so it is necessary to find the worst case point of gain compression in the frequency band.
Page 101 b. ‘lb uncouple the channel stimulus so that the channel power will be uncoupled, press: This will allow you to separately increase the power for channel 2 and channel 1, so that you can observe the gain compression on channel 2 while channel 1 remains unchanged.
Page 102 channel stimulus by (Menu 13. lb place the marker exuctZ@ on a measurement point, press: 14. To set the CW frequency before going into the power sweep mode, press: 16. Tlb choose the power range, press: 17. Enter the start and stop power levels for the sweep. Now, channel 1 is displaying a gain compression curve.
Page 103: Gain Compression Using Power Sweep
A receiver calibration will improve the accuracy of this measurement. Refer to Note Chapter 5, “Optimizing Measurement Results. n . Press 25. ‘lb find the 1 dB compression point on channel 1, press: Notice that the marker on channel 2 tracked the marker on channel 1. 27.
Page 104: Measuring Gain And Reverse Isolation Simultaneously
Measuring Gain and Reverse Isolation Simultaneously Since an amplifier will have high gain in the forward direction and high isolation in the reverse direction, the gain (E&l) will be much greater than the reverse isolation (Sla). Therefore, the power you apply to the input of the amplifier for the forward measurement ($1) should be considerably lower than the power you apply to the output for the reverse measurement saturated.
Page 105: Gain And Reverse Isolation
Note the calibration. However, the analyzer compensates for nominal power changes you make during a measurement, so that the error correction still remains approximately valid. In these cases, the Cor annunciator will change to CA. Figure 2-50. Gain and Reverse Isolation...
Page 106: High Power Measurements (Option 085 Only)
High Power Measurements (Option 085 Only) Analyzers equipped with Option 085 can be configured to measure high power devices. This ability is useful if the required input power for a device under test is greater than the analyzer can provide or if the maximum output power from an amplifier under test exceeds safe input high power measurements.
Page 107: Determining Power Levels
Determining Power Levels . . . i . . i 5. Switch on the booster amplifier. 6. Using a power meter, measure the output power from the coupled arm and the open port of the coupler. Depending on the power meter being used, additional attenuation may have to Note be added between the coupler port and the power meter.
Page 108: Additional Setup
Additional Setup Switch off the booster ampIifier. Make a connection between the open port of the 20 dB coupler and the RF IN connector on the rear panel of the analyzer. Make a connection between the coupled arm of the 20 dB coupler (along with any added attenuation) and the R CHANNEL IN connector on the front panel.
Page 109: Selecting Power Ranges And Attenuator Settings
Selecting Power Ranges and Attenuator Settings 14. Select a power range that will not exceed the maximum estimated power level that will force the DUT into compression. For example, if your booster amplifier has a gain of + 15 dB and the DUT will compress if supplied with +20 dBm, then you would adjust the analyzer output power to not exceed + 5 dBm by pressing (Menu) :$&$&...
Page 110: Finalsetup
The optimum sampler power level is -10 dBm. With the above points in mind, the amount of attenuation can be calculated from the following equations: Attenuator A = + 20 dBm - 16 dB - (-10 dBm). Attenuator A = -14 dB Attenuator B = +30 dBm - 16 dB - (-10 dBm).
Page 111 Figure 2-55. High Power ‘l&t Setup (Step 3) 26. Make any other desired high power measurements. Ratio measurements such as gain will be correctly displayed. However, the displayed absolute power levels on the analyzer will not be correct. To correctly interpret power levels, the gain of the booster amplifier and the attenuator settings must be taken into consideration.
Page 112: Measurements Using The Tuned Receiver Mode
NETWORK SYNTHESIZED SWEEPER If Figure 2-56. Typical ‘l&t Setup for Tuned Receiver Mode Tuned receiver mode in-depth description Frequency Bange HP 8719D: 50 MHz to 13.5 to 20.0 GHz HP 872OD: 50 MHz to 40.0 GHz HP 8722D: 50 MHz Compatible Sweep Types All sweep types may be used.
Page 113: External Source Requirements
External Source Requirements An analyzer in tuned receiver mode can receive input signals into PORT 1, PORT 2, or R CHANNEL IN (PORT 2 is recommended). Input power range specifications are provided in Chapter 7, “Specifications and Measurement Uncertainties. n Test sequencing allows you to automate repetitive tasks.
Page 114: Creating A Sequence
Creating a Sequence 1. ‘lb enter the sequence creation mode, press: shown in Figure 2-57, a list of instructions appear on the analyzer display to help you create or edit a sequence. 2. To select a sequence position in which to store your sequence, press: This choice selects sequence position #l.
Page 115: Running A Sequence
3. To create a test sequence, enter the parameters for the measurement that you wish to make. For this example, a SAW filter measurement is set up with the following parameters: The above keystrokes will create a displayed list as shown: Start of Sequence RECALL PRST STATE LOG MAG...
Page 116: Editing A Sequence
Editing a Sequence Deleting Commands 1. To enter the creation/editing mode, press: 2. To select the particular test sequence you wish to modify (sequence 1 in this example), press: 3. To move the cursor to the command that you wish to delete, press: If you use the 0-J key to move the cursor through the list of commands, the commands are actually performed when the cursor points to them.
Page 117: Modifying A Command
Modifying a Command 1. To enter the creation/editing mode, press: 2. To select the particular test sequence you wish to modify (sequence 1 in this example), press: The following list is the commands entered in “Creating a Sequence.” Notice that for longer sequences, only a portion of the list can appear on the screen at one time.
Page 118: Changing The Sequence Title
Changing the Sequence Title If you are storing sequences on a disk, you should replace the default titles (SEQl, SEQ2 . . . ). 1. ‘RI select a sequence that you want to retitle, press: The analyzer shows the available title characters. The current title is displayed in the upper-left corner of the screen.
Page 119: Storing A Sequence On A Disk
Storing a Sequence on a Disk 1. To format a disk, refer to the “Printing, Plotting, and Saving Measurement Results” chapter. 2. ‘lb save a sequence to the internal disk, press: The disk drive access light should turn on briefly. When it goes out, the sequence has been saved.
Page 120: Loading A Sequence From Disk
Loading a Sequence from Disk For this procedure to work, the desired file must exist on the disk in the analyzer drive. 1. To view the first six sequences on the disk, press: If the desired sequence is not among the first six files, press: 2.
Page 121: Cascading Multiple Example Sequences
Cascading Multiple Example Sequences By cascading test sequences, you can create subprograms for a larger test sequence. You can also cascade sequences to extend the length of test sequences to greater than 200 lines. In this example, you are shown two sequences that have been cascaded. You can do this by having the last command in sequence 1 call sequence position 2, regardless of the sequence title.
Page 122: Loop Counter Example Sequence
This example shows you the basic steps necessary for constructing a looping structure within a test sequence. A typical application of this loop counter structure is for repeating a specific measurement as you step through a series of CW frequencies or dc bias levels. For an example application, see “Fixed IF Mixer Measurements”...
Page 123: Generating Files In A Loop Counter Example Sequence
Generating Files in a Loop Counter Example Sequence example shows how to increment the names of files that me a loop structure..i ....: . . . : . ! . . : M a k i n g M e a s u r e m e n t s...
Page 124 Start of Sequence FILE NAME PLOT NAME SINGLE SAVE FILE 0 PLOT DECR LOOP COUNTER IF LOOP COUNTER 0 THEN DO SEQUENCE 2 Sequence 1 initializes the loop counter and calls sequence 2. Sequence 2 repeats until the loop counter reaches 0. It takes a single sweep, saves the data Gle and plots the display. The data file names generated by this sequence will be: The plot file names generated by this sequence will be: M a k i n g...
Page 125: Limit Test Example Sequence
Limit Test Example Sequence This measurement example shows you how to create a sequence that will branch the sequence according to the outcome of a limit test. Refer to “Testing a Device with Limit Lines,” located earlier in this chapter, for a procedure that shows you how to create a limit test. For this example, you must have already saved the following in register 1: device measurement parameters an active limit test...
Page 126 3. To create a sequence that prompts you to tune a device that has failed the limit test, and calls sequence 1 to retest the device, press: DO SEQUENCE SEQUENCE I SEQl This will create a displayed list for sequence 3, as shown: Start of Sequence TITLE TUNE DEVICE...
Page 127: Measuring A Device In The Time Domain (Option 010 Only)
Measuring a Device in the Time Domain (Option 010 Only) The HP 8719D/20D/22D Option 010 allows you to measure the time domain response of a device. Time domain analysis is useful for isolating a device problem in time or in distance.
Page 128: Time Domain Transmission Example Measurement
To choose the measurement parameters, press: SCALE [scaleRef) AUTO Substitute a thru for the device under test and perform a frequency response correction. Refer to “Calibrating the Analyzer, n located at the beginning of this chapter, for a detailed procedure. Reconnect your device under test.
Page 129: Gating In A Time Domain Transmission Example Measurement
8. ‘Ib access the gate function menu, press: 9. To set the gate parameters, by entering the marker value, press: center gate marker 10. To set the gate span, press: 11. To activate the gating function to remove any unwanted responses, press: As shown in Figure 2-60, only response from the main path is displayed.
Page 130: Gating Effects In A Frequency Domain Example Measurement
Gate Levels Gate Span Minimum fO.l dB Normal fO.l dB -68 clF3 Wide fO.l dB -57 dB Maximum -70 dB The passband ripple and sidelobe levels are descriptive of the gate shape. The cutoff time is the time between the stop time (-6 dB on the filter skirt) and the peak of the first sidelobe, and is equal on the left and right side skirts of the filter.
Page 131: Reflection Response In Time Domain
Reflection Response in Time Domain The time domain response of a reflection measurement is often compared with the time domain reflectometry (TDR) measurements. Like the TDR, the analyzers measure the size of the reflections versus time (or distance). Unlike the TDR, the time domain capability of the analyzers allows you to choose the frequency range over which you would like to make the measurement.
Page 132: Device Response In The Frequency Domain
4. To better view the measurement trace, press: ... i . i . . Figure 2-63 shows the frequency domain reflection response of the cables under test. The complex ripple pattern is caused by reflections from the adapters interacting with each other.
Page 133: Device Response In The Time Domain
7. lb enter the relative velocity of the cable under test, press: and enter a velocity factor for your cable under test Most cables have a relative velocity of 0.66 (for polyethylene dielectrics) or 0.7 Note PTFE (for dielectrics). If you would like the markers to read actual one-way distance rather than return trip distance, enter one-half the actual velocity factor.
Page 134: Non-Coaxial Measurements
Non-coaxial Measurements The capability of making non-coaxial measurements is available to the HP 8719/20/22 family of analyzers with TRL (thru-reflect-line) or LRM (line-reflect-match) calibration. For indepth information on TRL calibration, refer to Chapter 6, “Application and Operation Concepts. n Non-coaxial, on-wafer measurements present a unique set of challenges for error correction in the analyzer: The close spacing between the microwave probes makes it difficult to maintain a high degree of isolation between the input and the output.
Page 135: Making Mixer Measurements (Option 089 Only)
This chapter contains information and example procedures on the following topics: Measurement Considerations ..Reducing the effect of spurious responses Eliminating unwanted mixing and leakage signals How RF and IF are defined Frequency offset mode operation Differences between internal and external R-channel inputs Power meter calibration Conversion Loss Using the Frequency Offset Mode High Dynamic Range Swept RF/IF Conversion Loss...
Page 136: Measurement Considerations
Measurement Considerations To ensure successful mixer measurements, the following measurement challenges must be taken into consideration: Mixer Considerations ..Reducing the Effect of Spurious Responses Eliminating Unwanted Mixing and Leakage Signals Analyzer Operation How RF and IF Are Defined Frequency Offset Mode Operation Differences Between Internal and External R-Channel Inputs Power Meter Calibration...
Page 137: Up Converter Port Connections
In a down converter measurement where the DOUI# .@XWH#l@ softkey is selected, the notation on the analyzer’s setup diagram indicates that the analyzer’s source frequency is labeled RF, connecting to the mixer RF port, and the analyzer’s receiver frequency is labeled IF, connecting to the mixer IF port.
Page 138: Frequency Offset Mode Operation
The following steps can be performed to observe this offset in power. 1. The default source output power of the standard HP 8719D/20D is too high for the R-channel input. To reduce the source output power level to 0 dRm, press:...
Page 139: R-Channel External Connection
Figure 3-3. R-Channel External Connection 3. lb activate the frequency offset mode, press: Since the LO (offset) frequency is still set to the default value of 0 Hz, the analyzer will operate normally. 4. Measure the output power in the R-channel by pressing: Observe the 13 to 16 dD offset in measured power.
Page 140: Power Meter Calibration
Power Meter Calibration Mixer transmission measurements are generally configured as follows: For this reason, the set input power must be accurately controlled in order to ensure measurement accuracy. The amplitude variation of the analyzer is specified f 1 dB over any given source frequency. This may give a maximum 2 dE3 error for a mixer transmission test setup: f 1 dB for the source over the IF range during measurement and f 1 dB over the RF range during measurement.
Page 141: Conversion Loss Using The Frequency Offset Mode
2. Set the desired source power to the value which will provide -10 dBm or less to the R-channel input. For the HP 8719D/20D, press: Since the default source output power of the HP 8722D is below 0 dBm, no Note reduction in source output power is required for this procedure.
Page 142 to terminate the fIIter and the attenuation of the power splitter is used to improve the RF port match for the mixer. To prevent connector damage, use an adapter (HP part number 1250-1462) as a Caution connector saver for R CHANNEL IN. Figure 3-5.
Page 143: Connections For A One-Sweep Power Meter Calibration For Mixer Measurements
10. Perform a one power meter calibration over the IF frequency range at 0 dBm sweep (-10 dBm, HP 8722D): ..... . : . . : . . : .
Page 144: Measurement Setup From Display
14. To select the converter type and a high-side LO measurement configuration, press: Notice, in this high-side LO, down conversion configuration, the analyzer’s source is actually sweeping backwards, as shown in Figure 3-7. The measurements setup diagram is shown in Figure 3-8. 6 5 0 Figure 3-7.
Page 145 17. To view the conversion loss in the best vertical resolution, press: Figure 3-9. Conversion LQSS Example Measurement In this measurement, you set the input power and measured the output power. F’igure 3-9 shows the absolute loss through the mixer versus mixer output frequency. If the mixer under test contained built-in amplification, then the measurement results would have shown conversion gain.
Page 146: High Dynamic Range Swept Rf/If Conversion Loss
High Dynamic Range Swept RF/IF Conversion Loss The HP 8719D/20D/22D’s frequency offset mode enables the testing of high dynamic range frequency converters (mixers), by tuning the analyzer’s high dynamic range receiver above or below its source, by a fixed offset. This capability allows the complete measurement of both pass and reject band mixer characteristics.
Page 147: Connections For Broad Band Power Meter Calibration
Figure 3-10. Connections for Broad Band Power Meter Calibration 4. Select the HP 8719D/20D/22D as the system controller: 8. Perform a one sweep power meter calibration over the IF frequency range at 0 dBm (-10 dBm, HP 8722D): ........
Page 148 Because power meter calibration requires a longer sweep time,~,you may want Note to reduce the number of points before pressing ~~kK&~~~~~ ;$IiEI$? . After the power meter calibration is finished, return the number of points to its original 9. Connect the measurement equipment as shown in Figure 3-l 1. Figure 3-11.
Page 149: Connections For A High Dynamic Range Swept If Conversion Loss Measurement
L O W F I L T E R E X T E R N A L Figure 3-12. Connections for a High Dynamic Range Swept IF Conversion Loss Measurement 14. To set the frequency offset mode LO frequency, press: 15.
Page 150 Figure 3-13. Exumple of Swept IF Conversion Loss Measurement M e a s u r e m e n t s ( O p t i o n 0 6 6...
Page 151: Fixed If Mixer Measurements
Fixed IF Mixer Measurements A fixed IF can be produced by using both a swept RF and Lo that are offset by a certain frequency. With proper tlltering, only this offset frequency will be present at the IF port of the mixer.
Page 152: Connections For A Response Calibration
E X T E R N A L Figure 3-14. Connections for a Response Calibration 4. Press the following keys on the analyzer to create sequence 1: Note keyboard may be used for convenience. M a k i n g M i x e r M e a s u r e m e n t s ( O p t i o n...
Page 153 M a k i n g M i x e r M e a s u r e m e n t s ( O p t i o n...
Page 154 Calling the Next Measurement Sequence Start of Sequence RECALL PRST STATE SYSTEM CONTROLLER TUNED RECEIVER CNFREQ NUMBER OF POINTS DONE DONE LISTFREQ TITLE PERIPHERAL HPIB ADDR TITLE CALIBRATE: RESPONSE CAL STANDARD DONE CAL CLASS TITLE CONNECT MIXER PAUSE LOOP COUNTER SCALE/DIV REFERENCE POSITION 0 xl...
Page 155: Sequence 2 Setup
DO SEQUENCE Sequence 2 Setup The following sequence makes a series of measurements until all 26 CW measurements are made and the loop counter value is equal to zero. This sequence includes: taking data incrementing the source frequencies decrementing the loop counter labeling the screen 1.
Page 156: Connections For A Conversion Loss Using The Tuned Receiver Mode
MANUAL TRG ON POINT TITLE PERIPHERAL HPIB ADDR PERIPHERAL HPIB ADDR DECR LOOP COUNTER SEQUENCE 2 TITLE MEASUREMENT COMPLETED 2. Press the following keys to run the sequences: When the prompt CONNECT MIXER appears, connect the equipment as shown in F’igure 3-15. NETWORK ANALYZER E X T R E F E R E N C E...
Page 157 Figure 3-16. Example Fixed IF Mixer Measurement The displayed trace represents the conversion loss of the mixer at 26 points. Each point corresponds to one of the 26 different sets of RF and LO frequencies that were used to create the same fixed IF frequency.
Page 158: Phase Or Group Delay Measurements
Phase or Group Delay Measurements For information on group delay principles, refer to “Group Delay Principles” in Chapter 6. The accuracy of this measurement depends on the quality of the mixer that is being used for calibration and how well this mixer has been characterized. The following measurement must be performed with a broadband calibration mixer that has a known group delay.
Page 159: Connections For A Group Delay Measurement
T E S T Figure 3-17. Connections for a Group Delay Measurement 4. F’rom the front panel of the HP 8719D/20D/22D, set the desired receiver frequency and source output power by pressing: 5. ‘Ib set the frequency offset mode Lo frequency from the analyzer, press: 7.
Page 160: Group Delay Measurement
Replace the “calibration” mixer with the device under test. If measuring group delay, set the delay equal to the “calibration” mixer delay (for example -0.6 ns) by pressing: Scale the data for best vertical resolution. CENTER .300 000 000 GHz SPAN .lOO 000 000 GHz Figure 3-18.
Page 161: Amplitude And Phase Tracking
Amplitude and Phase Tracking Using the same measurement setup for “phase or group delay measurements”, you can determine how well two mixers track each other in terms of amplitude and phase. 1. Repeat steps 1 through 8 of the previous “Group Delay Measurements” section with the following exception: In step 7, select [F&X) PEA%%.
Page 162: Conversion Compression Using The Frequency Offset Mode
The following example uses a ratio of mixer output to input power and a marker search function to locate a mixer’s 1 dB compression point. Because this procedure was performed with an HP 8719D/20D, Option 007, the Note analyzer was able to produce an output power of + 10 dBm.
Page 163: Connections For The First Portion Of Conversion Compression Measurement
3. ‘Ib set the desired CW frequency and power sweep range, press: 4. Make the connections, as shown in Figure 3-20. To prevent connector damage, use an adapter (HP part number 1250-1462) as a Caution connector saver for R CHANNEL IN. NETWORK ANALYZER Figure 3-20.
Page 164: Connections For The Second Portion Of Conversion Compression Measurement
NETWORK ANALYZER Figure 3-2 1. Connections for the Second Portion of Conversion Compression Measurement 8. To set the frequency offset mode LO frequency, press: 9. To select the converter type, press: 10. ‘Ib select a low-side Lo measurement configuration, press: In this low-side Lo, up converter measurement, the analyzer source frequency is offset lower than the receiver frequency.
Page 165: Measurement Setup Diagram Shown On Analyzer Display
NETWORK ANALYZER R IN “ I Figure 3-22. Measurement Setup Diagram Shown on Analyzer Display 11. To view the mixer’s output power as a function of its input power, press: 12. To set up an active marker to search for the 1 dB compression point of the mixer, press: 13.
Page 166: Example Swept Power Conversion Compression Measurement
Figure 3-23. Example Swept Power Conversion Compression Measurement M a k i n g M i x e r M e a s u r e m e n t s ( O p t i o n...
Page 167: Isolation Example Measurements
Isolation Example Measurements Isolation is the measure of signal leakage in a mixer. Feedthrough is specifically the forward signal leakage to the IF port. High isolation means that the amount of leakage or feedthrough between the mixer’s ports is very small. Isolation measurements do not use the frequency offset mode.
Page 168 Figure 3-25. Connections a Response Calibration A full 2 port calibration will increase the accuracy of isolation measurements. Note Refer to Chapter 5, “Optimizing Measurement Results. n Make the connections as shown in Figure 3-26. NETWORK ANALYZER Mixer Isolation Measurement 7.
Page 169: Rf Feedthrough
Figure 3-27. Example Mixer LO to RF Isolation Measurement RF Feedthrough The procedure and equipment configuration necessary for this measurement are very similar to those above, with the addition of an external source to drive the mixer’s Lo port as we measure mixer’s RF feedthrough.
Page 170: Connections For A Response Calibration
Figure 3-28. Connections for a Response Calibration 7. Make the connections as shown in Figure 3-29. NETWORK ANALYZER Figure 3-29. Connections for a Mixer RF Feedthrough Measurement 8. Connect the external LO source to the mixer’s LO port. 9. The measurement results show the mixer’s RF feedthrough. You may see spurious responses on the analyzer trace due to interference Note caused by LO to IF leakage in the mixer.
Page 171 Figure 3-30. Example Mixer RF Feedthrough Measurement You can measure the IF to RF isolation in a similar manner, but with the following modifications: Use the analyzer source as the IF signal drive. View the leakage signal at the RF port. M a k i n g M i x e r M e a s u r e m e n t s...
Page 172: Printing, Plotting, And Saving Measurement Results
This chapter contains instructions for the following tasks: Printing or Plotting Your Measurement Results Defining a plot function Plotting a measurement to disk 0 Outputting plot files from a PC to a plotter Outputting plot fles from a PC to an HPGL compatible printer 0 Outputting single page plots using a printer 0 Outputting multiple plots to a single page using a printer Plotting Multiple Measurements per page from disk...
Page 173: Where To Look For More Information
Where to Look for More Information Additional information about many of the topics discussed in this chapter is located in the following areas: Chapter 2, “Making Measurements, n contains step-by-step procedures for making measurements or using particular functions. Chapter 8, “Menu Maps,” shows softkey menu relationships. Chapter 9, “Key Definitions,”...
Page 174: Printing Or Plotting Your Measurement Results
Printing or Plotting Your Measurement Results You can print your measurement results to the following peripherals: printers with parallel interfaces printers with serial interfaces You can plot your measurement results to the following peripherals: plotters with HP-IB interfaces plotters with parallel interfaces plotters with serial interfaces Refer to the “Compatible Peripherals”...
Page 175 2. Press m SlZT ~ARl$%&& .PRWl&V3RT PRFKUL~T%% until the correct printer choice appears: ... i . b. . , ..converts 100 dpi raster information to 300 dpi raster format. Note If your DeskJet printer does not support the 100 dpi raster format and your .
Page 176: If You Are Using A Color Printer
..’ ..:.:...:’ exchange by setting the electrical voltage on one line of the RS-232 serial cable. Because the RTR+&$R handshake takes place in the hardware rather than the Note ..Defining a Print Function The print definition is set to default values whenever the power is cycled.
Page 177: Printing One Measurement Per Page
Printing Parameters to Default Values Printing Perameter Printer Mode Monochrome Auto Feed Printer Colors Channel l/Channel 3 Data Channel 1/Chaunel3 Memorv Green Blue Channel 2/Cham-tel4 Data Channel a/Channel 4 Memory Graticule Ref Line Printing One Measurement Per Page Printing Multiple Measurements Per Page 3.
Page 178: Printing Two Measurements
Figure 4-2. Printing Two Measurements a n d S a v i n g M e a s u r e m e n t...
Page 179 All copy configuration settings are stored in non-volatile memory. Therefore, they are not affected if you press m or switch off the analyzer power. 1. Connect the peripheral to the interface port. Peripheral Interface Recommended Cables Parallel HP 922s4A HP-IB HP 2464ZG K E I’BOAPD P A R A L L E L...
Page 180 3. Configure the analyzer for one of the following printer interfaces: Choose ~~~,,.~~~~~ lWi$ if your printer has an HP-IB interface, and then configure the print function as follows: a. Enter the HP-IB address of the printer (default is Ol), followed by @. the HP-IB bus c.
Page 181 If Rm Are Plotting to a Pen Plotter 2. Configure the analyzer for one of the following plotter interfaces: plot function as follows: a. Enter the HP-IB address of the printer (default is 05), followed by @. the HP-IB bus. c.
Page 182: Ifyouareplottingtoadiskdrive
If You Are Plotting to a Disk Drive . . i Choose ~~~~~,:~~~~~~ if you will plot to the analyzer internal disk drive. Choose i$&‘,&&& -&f~& if you will plot to a disk drive that is external to the analyzer. Then conilgure the disk drive as follows: a.
Page 183 Defining a Plot Function The plot definition is set to default values whenever the power is cycled. Note However, you can save the plot deilnition by saving the instrument state. 2. Choose which of the following measurement display elements that you want to appear on your plot: 0 Choose .~~~~~~~~~~~ if you want the &splayed memory trace to appear on you plot.
Page 184 4. Press #!xORE and select the plot element where you want to change the pen number. For ...., . , example, .~~~..:~~:~~~~~~, and then modify the pen number. The pen number selects the .
Page 185 5. Press :~Ik%E and select each plot element line type that you want to modify. Select I&H?’ .!i”?kk &W& to modify the line type for the data trace. Then enter the new line type (see Figure 4-5), followed by @. Select LXI!E .
Page 186 6. Press Choose &Xi& H&T ‘@IIIZ~ if you want the normal scale selection for plotting. This includes space for all display annotations such as marker values and stimulus values. The entire analyzer display fits within the defined boundaries of Pl and P2 on the plotter, while maintaining the exact same aspect ratio as the display.
Page 187: Plotting One Measurement Per Page Using A Pen Plotter
Press m :@I@Xl#l$ .P&” #,&a .&IRE DlQ?A&~...Pf;olT : Se. i . . . s . . . Plotting One Measurement Per Page Using a Pen Plotter 1. Define the plot, as explained in “Defining the Plot F’unction” located earlier in this chapter. OUTPUT COMPLETED appears.
Page 188: Plotting Multiple Measurements Per Page Using A Pen Plotter
Plotting Multiple Measurements Per Page Using a Pen Plotter 1. Dehne the plot, as explained in “Defining the Plot Function” located earlier in this chapter. Press &J &$L .&i&f) . . 3. Choose the quadrant where you want your displayed measurement to appear on the hardcopy.
Page 189 4-18 Printing, Plotting, and Saving Measurement Results...
Page 190: Plotting A Measurement To Disk
Plotting a Measurement to Disk The plot files that you generate from the analyzer, contain the HPGL representation of the measurement display. The files will not contain any setup or formfeed commands. 1. Conllgure the analyzer to plot to disk, as explained in “Configuring a Plot Function” located earlier in this chapter.
Page 191 Plot files can be viewed and manipulated on a PC using a word processor or graphics presentation program. Plot files contain a text stream of HPGL (Hewlett-Packard Graphics Language) commands. In order to import a plot file into an application, that application must have an import filter for HPGL (often times call HGL).
Page 192: Usingamipro
1. Prom the PILE pull-down menu, select IMPORT PICTURE. 2. In the dialog box, change the Pile Type selection to HPGL. This automatically changes the The network analyzer does not use the suiIix * .PI.X, so you may want to change the filename filter to *.
Page 193: Using Freelance
1. From the FILE pull-down menu, select IMPORT. 2. Set the Ille type in the dialog box to HGL. The network analyzer does not use the suffix *.HGL, so you may want to change the filename iIlter to * . * or some other pattern that will allow you to locate the files you wish to import.
Page 194: Outputting Plot Files From A Pc To An Hpgl Compatible Printer
Outputting Plot Files from a PC to an HPGL Compatible Printer sequence linked in a series as follows: Step 1. Store the HPGL initialization sequence in a file named hpglinit. Step 2. Store the exit HPGL mode and form feed sequence in a file named exithpgl. Step 3.
Page 195: Step 2. Store The Exit Hpgl Mode And Form Feed Sequence
1. Create a test file, by typing in each character as shown in the left hand column of lXble 4-7. Do not insert spaces or linefeeds. 2. Name the file exithpgl. Remark Outputting Single Page Plots Using a Printer plot files are in the current directory and the selected printer port is PRN. Command Remark c:>...
Page 196: Outputting Multiple Plots To A Siie Page Using A Printer
Outputting Multiple Plots to a Single Page Using a Printer Refer to the “Plotting Multiple Measurements Per Page Using a Disk Drive,” located earlier in this chapter, for the naming conventions for plot files that you want printed on the same page. You can use the following batch file to automate the plot file printing.
Page 197: Plotting Multiple Measurements Per Page From Disk
HP-GW2 compatible printer, such as the LaserJet 4 series (monochrome) or the DeskJet The program is contained on the “Example Programs Disk” that is provided with the HP 8719D/Z0D/Z,Z~ Progrummer’s Guide. The file naming convention allows the program to initiate the following:...
Page 198: Measurement
6. Define the next measurement plot that you will be saving to disk. For example, you may want only the data trace to appear on the second plot for measurement comparison. In this case, you would press m ~3E~Xl4I$ H,#X and choose saved.
Page 199: Plot Quadrants
1. Define the plot, as explained in “Defining the Plot Function” located earlier in this chapter. 2. press lcopyl $$a $j&’ - 3. Choose the quadrant where you want your displayed measurementJo appear on the hardcopy. The selected quadrant appears in the brackets under ?I& $&A.$. quadrant.
Page 200: Titling The Displayed Measurement
Titling the Displayed Measurement You can create a title that is printed or plotted with your measurement result....i.: . . ; . . 3. Turn the front panel knob to move the arrow pointer to the hrst character of the title. 5.
Page 201: Abortingaprintorplotprocess
You can set a clock, and then activate it, if you want the time and date to appear on your hardcopies. Aborting a Print or Plot Process 1. Press the ILocal) key to stop all data transfer. 2. If your peripheral is not responding, press LLocal) again or reset the peripheral. Printing or Plotting the List Values or Operating Parameters Press m j#$&: and select the information that you want to appear on your hardcopy: their current values, to appear on your hardcopy.
Page 202 3. Repeat the previous two steps until you have created hardcopies for all the desired pages of listed values. If you are printing the list of measurement data points, each page contains 30 lines of data. The number of pages is determined by the number of measurement points that you have selected under the (Menu) key.
Page 203: Solving Problems With Printing Or Plotting
Solving Problems with Printing or Plotting If you encounter a problem when you are printing or plotting, check the following list for possible causes: Look in the analyzer display message area. The analyzer may show a message that will identify the problem. Refer to the “Error Messages” chapter if a message appears. If necessary, refer to the configuration procedures in this chapter to check that you have done the following: connected an interface cable between the peripheral and the analyzer...
Page 204: Saving And Recalling Instrument States
Saving and Recalling Instrument States analyzer internal memory floppy disk using the analyzer’s internal disk drive floppy disk using an external disk drive IBM compatible personal computer using HP-IB mnemonics The number of registers that the analyzer allows you to save depends on the size of associated error-correction sets, and memory traces.
Page 205: What You Can Save To A Computer
HP-IB mnemonics. For more information about the specific analyzer settings that can be saved, refer to the output commands located in the “Command Reference” chapter of the HP 8719D/2OD/22D Network Analyzer Programmer’s Guide. For an example program, refer to “Saving and Recalling Instruments States” in the “Progr amming Examples” chapter of the HP 87190/2OD/22D Network Anulgzer Programmer’s Gui&e.
Page 206: Saving An Instrument State
Saving an Instrument State q ;i&&, .jgg#jJgy a. Connect an external disk drive to the analyzer’s HP-IB connector, and conligure as follows: b. Press LLocal] I!@% ~~~;~~~ and enter the drive where your disk is located, followed by @. where you want to store the instrument state file. e.
Page 207: Saving Measurement Results
Saving Measurement Results Instrument states combined with measurements results can only be saved to disk. Files that are also only valid for disk saves. The analyzer stores data in arrays along the processing flow of numerical data, from IF detection to display. These arrays are points in the flow path where data is accessible, usually via HP-IB.
Page 208: Data Processing Flow Diagram
Figure 4-12. Data Processing Flow Diagram If the analyzer has an active two-port measurement calibration, all four S-parameters will be saved with the measurement results. All four S-parameters may be viewed if the raw data array has been saved. 1. If you want to title the displayed measurement, refer to “Titling the Displayed Measurement,”...
Page 209 f. Press (Local) and select one of the following: Choose .~~~~~~~~~~ to allow the computer controller to be involved in all peripheral access operations...., , . , i : : .., . , ; ~..; : . : . . ; . . , . . . < allows the analyzer to take or pass control.
Page 210: Ascii Data Formats
CITIFile (Common Instrumentation Transfer and Interchange file) is an ASCII data format that is useful when exchanging data between different computers and instruments. CITMles are always saved when the ASCII format has been selected as shown below: ....' .
Page 211 The template for component data files is as follows: ! comment line . . . where indicates that all following on this Iine is a comment indicates that entries following on this Iine are parameters that are being specified frequency units parameter S for S-parameters...
Page 212: Re-Saving An Instrument State
Re-Saving an Instrument State If you re-save a file, the analyzer overwrites the existing file contents. You cannot re-save a file that contains data only. You must create a new file. 1. Press Cm) #ZLJ&X$$~SK and select the storage device: ..A..
Page 213 Renaming a File Press 2. Choose from the following storage devices: q ~~~~ qg~,-&..‘ . : : . : x > . ; ; : i ..: . .., ... : . : . : ..? of the file that you want to rename.
Page 214: Solving Problems With Saving Or Recalling Files
Solving Problems with Saving or Recalling Files If you encounter a problem when you are storing llles to disk, or the analyzer internal memory, check the following list for possible causes: Look in the analyzer display message area. The analyzer may show a message that will identify the problem.
Page 215: Optimizing Measurement Results
This chapter describes techniques and analyzer functions that help you achieve the best measurement results. The following topics are included in this chapter: Increasing Measurement Accuracy Connector repeatability Interconnecting cables Reference plane and port extensions Measurement error-correction Frequency Response and Isolation Error-Correction One-Port Reflection Error-Correction Pull Two-Port Error-Correction TRL and TRM Error-Correction...
Page 216: Where To Look For More Information
Where to Look for More Information Additional information about many of the topics discussed in this chapter is located in the following areas: Chapter 2, “Making Measurements, n contains step-by-step procedures for making measurements or using particular functions. Chapter 4, “Printing, Plotting, and Saving Measurement Results,” contains instructions for saving to disk or to the analyzer internal memory, and printing and plotting displayed measurements.
Page 217: Frequency Drift
Minute changes in frequency accuracy and stability can occur as a result of temperature and aging (on the order of parts per million). Override the internal crystal with a high-stability external source, frequency standard, or (if your analyzer is equipped with option lD5) use the internal frequency standard. You should periodically check the accuracy of the analyzer measurements, by doing the following: Perform a measurement verification at least once per year...
Page 218: Measurement Error-Correction
Measurement Error-Correction The accuracy of network analysis is greatly influenced by factors external to the network analyzer. Components of the measurement setup, such as interconnecting cables and adapters, introduce variations in magnitude and phase that can mask the actual response of the device under test.
Page 219: Error-Correction Stimulus State
Corresponding Errors Corrected Measurement Devices Transmission or reflection Frequency response Thru for transmission, open measurement when the highest or short for reflection accuracy is not required. Same as response plus Response & isolation Transmission of high insertion loss Frequency response plus devices or reflection of high return isolation in transmission or isolation standard (load) directivity in reflection...
Page 220: Calibration Standards
The quality of the error-correction is limited by two factors: (1) the difference between the model of the calibration standards and the actual electrical characteristics of those standards, and (2) the condition of the calibration standards. ‘Ib make the highest quality measurement calibration, follow the suggestions below: Inspect the calibration standards, Clean the calibration standards.
Page 221: When To Use Interpolated Error-Correction
If you enter the opposite amount of electrical delay that was used by the analyzer during calibration, then the short calibration standard till appear to be “perfect.” The open calibration standard has additional phase shift caused by fringing capacitance. See “Calibration Considerations” in Chapter 6, “Application and Operation Concepts.
Page 222: Procedures For Error-Correcting Your Measurements
Procedures for Error-Correcting Your Measurements This section has example procedures or information on the following topics: frequency response correction frequency response and isolation correction one-port reflection correction True TRL/LRM correction with Option 400 (TRL*/LRM* with standard instruments) modifying calibration kit standards power meter measurement calibration procedure If you are making measurements on uncoupled measurement channels, you must make a correction for each channel.
Page 223: Frequency Response Error-Corrections
Frequency Response Error-Corrections You can remove the frequency response of the test setup for the following measurements: 1. Press B. 2. Select the type of measurement you want to make. If you want to make a reflection measurement on PORT 1 (in the forward direction, Sll), leave the instrument default setting.
Page 224 NETWORK ANALYZER Figure 5-l. Standard Connections for a Response Error-Correction for Reflection Measurement 8. To measure the standard when the displayed trace has settled, press: If the calibration kit you selected has a choice between male and female calibration standards, remember to select the sex that applies to the test port and not the standard. The analyzer displays WAIT - MEASURING CAL STANDARD during the standard measurement.
Page 225: Response Error-Correction For Transmission Measurements
1. Press B. 2. Select the type of measurement you want to make. If you want to make a transmission measurement in the forward direction (&I), press: If you want to make a transmission measurement in the reverse direction (S~Z), press: 3.
Page 226: Receiver Calibration
use an open or short standard for a transmission response correction. You can save or store the measurement correction to use for later measurements. Refer to the “Printing, Plotting, and Saving Measurement Results” chapter for procedures. 7. This completes the response correction for transmission measurements. You can connect and measure your device under test.
Page 227 6. lb perform a receiver error-correction, press: You can save or store the measurement correction to use for later measurements. Refer to the “Printing, Plotting, and Saving Measurement Results” chapter for procedures. 7. This completes the receiver calibration for transmission measurements. You can connect and measure your device under test.
Page 228: Frequency Response And Isolation Error-Corrections
Frequency Response and Isolation Error-Corrections Removes frequency response of the test setup. Removes isolation in transmission measurements. You can make a response and isolation correction for the following measurements: reflection measurements transmission measurements combined reflection and transmission measurements Although you can perform a response and isolation correction for reflection measurements, Hewlett-Packard recommends that you perform an Sll one-port error-correction: it is more accurate, and it is just as convenient.
Page 229: Standard Connections For A Response And Isolation Error-Correction For Transmission Measurements
NETWORK ANALYZER Figure 5-4. Standard Connections for a Response and Isolation Error-Correction for Reflection Measurements 8. To measure the standard, press: If the calibration kit you selected has a choice between male and female calibration standards, remember to select the sex that applies to the test port and not the standard. The analyzer displays WAIT - MEASURING CAL STANDARD during the standard measurement.
Page 230: Response And Isolation Error-Correction For Transmission Measurements
This procedure is intended for measurements that have a measurement range of greater than 90 dB. 1. Press-. 2. Select the type of measurement you want to make. If you want to make a transmission measurement in forward direction (&I), press: If you want to make a transmission measurement in the reverse direction (SYJ), press: 3.
Page 231: Standard Connections For A Response And Isolation Error-Correction For Reflection Measurements
FOR RESPONSE FOR ISOLATION Figure 5-5. Standard Connections for a Response and Isolation Error-Correction for Transmission Measurements If you will be measuring highly reflective devices, such as filters, use the test device, connected to the reference plane and terminated with a load, for the isolation standard.
Page 232: One-Port Reflection Error-Correction
One-Port Reflection Error-Correction Removes directivity errors of the test setup. Removes source match errors of the test setup. Removes frequency response of the test setup. You can perform a l-port correction for either an S1l or an S22 measurement. The only difference between the two procedures is the measurement parameter that you select.
Page 233: Standard Connections For A One Port Reflection Error-Correction
NETWORK ANALYZER Figure 5-6. Standard Connections for a One Port Reflection Error-Correction 8. To measure the standard, when the displayed trace has settled, press: If the calibration kit that you selected has a choice between male or female calibration standards, remember to select the sex that applies to the test port and not the standard.
Page 234 14. To compute the error coefficients, press: The analyzer displays the corrected data trace. The analyzer also shows the notation Cor to the left of the screen, indicating that the correction is switched on for this channel. The open, short, and load could be measured in any order, and need not follow the order in this example.
Page 235: Full Two-Port Error-Correction
Full Two-Port Error-Correction Removes directivity errors of the test setup in forward and reverse directions. Removes source match errors of the test setup in forward and reverse directions. Removes load match errors of the test setup in forward and reverse directions. Removes isolation errors of the test setup in forward and reverse directions (optional).
Page 236 6. lb measure the standard, when the displayed trace has settled, press: The analyzer displays WAIT - MEASURING CAL STANDARD during the standard measurement. The analyzer underlines the #p&J softkey after it measures the standard. 7. Disconnect the open, and connect a short circuit to PORT 1. 8.
Page 237 The thru in most calibration kits is defined with zero length. The correction will work properly if a non-zero length thru is used, unless the calibration kit is modified to change the defined thru to the length used. This is important for measurements of non-insertable devices (devices having ports that are both male or both female).
Page 238: Trl And Trm Error-Correction
TRL and T&M Error-Correction The standard HP 8719D/20D/22D analyzers provide TRL*/LRM* calibration. However, true set. The TRL implementation with Option 400 requires a total of fourteen measurements to quantify ten unknowns as opposed to only a total of twelve measurements for TRL*. (Both include the two isolation error terms.)
Page 239 Press ;~~.~~~~~ :lWJX.fj. FW*mV . The line data is measured and the L#~#$ATClll Tl&LIWX and &i&&i2 ‘ZI&X~ softkey labels are underlined. You could choose not to, perform the isolation measurement by pressing You should perform the isolation measurement when the highest dynamic range is desired.
Page 240: Trm Error-Correction
“Modifying Calibration Kit Standards,” located later in this section. This must be done before performing the following sequence. 3. ‘lb measure the “TRM THRU,” connect the “zero length” transmission line between the two test ports. 4. ‘lb make the necessary four measurements, press: 5.
Page 241 You should perform the isolation measurement when the highest dynamic range is desired. To perform the best isolation measurements, you should reduce the system bandwidth, and/or activate the averaging function. A poorly measured isolation class can actually degrade the overall measurement performance.
Page 242: Modifying Calibration Kit Standards
The following section provides a summary of the information in the 8510-5A application note, as well as HP 8719D/20D/22D menu-specific information. For a detailed description of the menus and softkeys located in this section, as well as information about when user-defined calibration kits should be used, refer to Chapter 6, “Application and Operation Concepts.”...
Page 243: Modifying Standards
2. Select the softkey that corresponds to the kit you want to modify. 4. Enter the number of the standard that you want to modify, followed by (XJ. Refer to your calibration kit manual for numbers of the specific standards in your kit. For example, to select a short, press (iJ (x1).
Page 244: Modifying Trl Standards
The part number of this product note is 5091-3645E. Although the product note was written for the HP 8510 family of network analyzers, it also applies to the HP 8719D/20D/22D. For a discussion on TRL calibration, refer to “TRL/LRM Calibration” in Chapter 6, “Application and Operation Concepts.”...
Page 245 Modify the Standard Definitions 1. Press the following keys to start modifying the standard definitions: .., . . . , ..select a short, press @ @. (In this example the REFLECT standard is a SHORT.) 2.
Page 246: Modifying Trm Standards
The part number of this product note is 5091-3645E. Although the product note was written for the HP 8510 family of network analyzers, it also applies to the HP 8719D/ZOD/ZZD. For a discussion on TRL calibration, refer to “TRL/LRM Calibration” in Chapter 6, “Application and Operation Concepts.
Page 247 6. For the purposes of this example, change the name of the standard by pressing ‘&kBEL:‘ST$: ?)&A!& X&&, if a previous title exists, and modifying the name to “MATCH.” 7. When the title area shows the new label, press: ....i Assign the Stamiards to the Various TRM Classes 8.
Page 248 Label the Classes convenience. 14. Change the label of the “TRL REFLECT” class to “TRMSHORT.” 15. Change the label of the “TRL LINE OR MATCH” class to “TRMLOAD.” 16. Change the label of the “TRL THRU” class to “TRMTHRU.” 18. Press ,&&K#@XT and create a label up to 8 characters long. For this example, enter “TRM 19.
Page 249: Power Meter Measurement Calibration
Power Meter Measurement Calibration You can use the power meter to monitor and correct the analyzer source power to achieve calibrated absolute power at the test port. You can also use this calibration to set a reference power for receiver power calibration, and mixer measurement calibration. The power meter can measure and correct power in two ways: continuous correction - each sweep mode sample-and-sweep correction - single sweep mode...
Page 250: Entering The Power Sensor Calibration Data
Entering the power sensor calibration data compensates for the frequency response of the power sensor, thus ensuring the accuracy of power meter calibration. Make sure that your analyzer and power meter are configured. Refer to the “Compatible Peripherals” chapter for configuration procedures. The analyzer shows the notation EMPTY, if you have not entered any segment information.
Page 251: Deleting Frequency Segments
1. Access the “Segment Menu” by pressing @ p@#&$&' ~$&&&&~ i&k (or Q& ‘f&&TO% SM§t& ‘B , depending on where the segment is that you want to delete). keys to locate and position the segment next to the pointer (>), shown on the display. Or press $?&WWI and enter the segment number followed by (XiJ.
Page 252: Using Sample-And-Sweep Correction Mode
1. Calibrate and zero the power meter. 2. Connect the equipment as shown in Figure 5-8. 3. Select the HP 8719D/ZOD/ZZD as the system controller: 4. Set the power meter’s address: 5. &lea the appropfiate power meter by pressing ~~~~~~~~~~~” Mtd the corre& model Set test port power to the approximate desired corrected power.
Page 253: Using Continuous Correction Mode
Because power meter calibration requires a longer sweep time, you may want to reduce the number of points before pressing .XME ML~-?MEE.. After the power meter calibration is finished, return the number of points to its original accuracy will be lost for the interpolated points. The analyzer will use the data table for subsequent sweeps to correct the output power level at each measurement point.
Page 254 to maintain at the input to your test device. Compensate for the power loss of the power splitter or directional coupler in the setup. 4. If you want the analyzer to ma$e more than one power measurement at each frequency data point, press ~~~;~~’...
Page 255: Calibrating For Noninsertable Devices
Calibrating for Noninsertable Devices A test device having the same sex connector on both the input and output cannot be connected directly into a transmission test configuration. Therefore, the device is considered to be performed: modify the cal kit thru definition Figure 5-10.
Page 256: Adapter Removal
The adapter removal technique provides a means to accurately measure noninsertable devices. The following adapters are needed: Adapter Al, which mates with port 1 of the device, must be installed on test set port 1. Adapter A2, which mates with port 2 of the device, must be installed on test set port 2. Adapter A3 must match the connectors on the test device.
Page 257: Perform The 2-Port Error Corrections
Perform the a-port Error Corrections 1. Connect adapter A3 to adapter A2 on port 2. (See Figure 5-12.) Figure 5-12. Two-Port CM Set 1 2. Perform the 2-port error correction using calibration standards appropriate for the connector type at port 1. When using adapter removal calibration, you must save calibration sets to the internal disk, not to internal memory.
Page 258: Remove The Adapter
Figure 5-13. Two-Port C&I Set 2 5. Perform the 2-port error correction using calibration standards appropriate for the connector type at port 2. 6. Save the results to disk. Name the file “PORT2.” 7. Determine the electrical delay of adapter A3 by performing steps 1 through 7 of “Modify the Cal Kit Thru Definition.’...
Page 259 bring up the following two choices: ..: a ..A . ’ : . . : a n i~~~,~:~~.p~~~~~~ directory. In the following two steps, calibration data is recalled, not instrument states. 10. From the diskdirectory, choose the hle associated with the port 1 error correction, then 11.
Page 260: Verify The Results
Since the effect of the adapter has been removed, it is easy to verify the accuracy of the technique by simply measuring the adapter itself. Because the adapter was used during the creation of the two cal sets, and the technique removes its effects, measurement of the adapter itself should show the S-parameters.
Page 261 Example Program The following is an example program for performing these same operations over HP-IB: 10 ! File: 20 ! 30 ! This demonstrates how to do adapter removal over HP--1B. 40 ! 50 ASSIGN 60 ! 70 ! Select internal disk. 80 ! 90 OUTPUT BNa*"INTD*"...
Page 262: Matched Adapters
With this method, you use two precision matched adapters which are “equal.” To be equal, the adapters must have the same match, ZO, insertion loss, and electrical delay. The adapters in most HP calibration kits have matched electrical length, even if the physical lengths appear different.
Page 263: Modify The Cal Kit Thru Definition
With this method it is only necessary to use adapter B. The calibration kit thru de6nition is modified to compensate for the adapter and then saved as a user kit. However, the electrical delay of the adapter must first be found. 1.
Page 264: Maintaining Test Port Output Power During Sweep Retrace
Maintaining ‘Ikst Port Output Power During Sweep Retrace During standard operation, the analyzer provides output power during its forward frequency sweep, but may provide output power during its sweep retrace. If the device under test (such as an amplifier with AGC circuitry) requires constant power, then you can set the analyzer to maintain test port output power during its sweep retrace.
Page 265: Making Accurate Measurements Of Electrically Long Devices
The faster the analyzer’s sweep rate, the larger AP becomes, and the larger the error in the test channel. The HP 8719D/20D/22D network analyzers do not sweep at a constant rate. The frequency range is covered in several bands, and the sweep rate may be different in each band. So if an...
Page 266: Decreasing The Time Delay
can be used to check the data. The disadvantage of the stepped-frequency mode is that it is slower than sweeping. Decreasing the Time Delay The other way to reduce AF’ is by decreasing the time delay, AT. Since AT is a property of the device that is being measured, it cannot literally be decreased.
Page 267: Increasing Sweep Speed
Increasing Sweep Speed You can increase the analyzer sweep speed by avoiding the use of some features that require computational time for implementation and updating, such as bandwidth marker tracking. You can also increase the sweep speed by making adjustments to the measurement settings. The following suggestions for increasing sweep speed are general rules that you should experiment with.
Page 268 2. Set the IF bandwidth to change the sweep time. The following table shows the relative increase in sweep time as you decrease system bandwidth. The characteristic values in the following table were derived using 51 measurement points. 1 The listed sweep times correspond to a preset state for the full span, By reducing the averaging factor (number of sweeps) or switching off averaging, you can increase the analyzer’s measurement speed.
Page 269 The analyzer sweep time does not change proportionally with the number of points, but as indicated below. Points 1.19 1.88 3.26 1601 1.23 6.01 sweep 1 The listed times correspond to 8 preset state. Different sweep speeds are associated with the following three types of non-power sweeps. Choose the sweep type that is most appropriate for your application.
Page 270: To Use External Calibration
Offloading the error correction process to an external PC increases throughput on the network analyzer. This can be accomplished with remote only commands. Refer to the HP 8719D/ZOD/ZZD Network Analyzer Prograrnmm’s Cuidefor information on how to use external calibration. Optimizing Measurement Results...
Page 271 With the 2-port calibration on, faster measurements may be made by not measuring the reverse path for every forward sweep. This is controlled by the test set switch command. When making measurements using full two-port error-correction, the following types of test set switching can be defined by the user: Hold: In this mode the analyzer does not switch between the test ports on every sweep.
Page 272: Increasing Dynamic Range
Increasing Dynamic Range Dynamic range is the difference between the analyzer’s maximum allowable input level and minimum measurable power. For a measurement to be valid, input signals must be within these boundaries, The dynamic range is affected by these factors: test port input power test port noise floor receiver crosstalk...
Page 273: Reducing Trace Noise
Reducing Trace Noise You can use two analyzer functions to help reduce the effect of noise on the data trace: activate measurement averaging reduce system bandwidth The noise is reduced with each new sweep as the effective averaging factor increments. 2.
Page 274: Reducing Recall Time
Reducing Recall Time To reduce time during recall, turn off the raw offset function by pressing: The raw offset function is normally on and controls the sampler and attenuator offsets. The creation of the sampler offset table takes considerable time during a recall of an instrument state.
Page 275: Application And Operation Concepts
This chapter provides conceptual information on the following primary operations and applications that are achievable with the HP 8719D/ZOD/22D network analyzer. System Operation Data Processing Active Channel Keys Stimulus Functions Response Functions S-Parameters Four parameter display Scale Reference Display Menu...
Page 276: System Operation
Other options are explained in Chapter 1, “HP 8719D/20D/22D Description and Options.” Figure 6-l is a simplified block diagram of the network analyzer system. A detailed block diagram of the analyzer is provided in the HP 8719o/2oo/Z~ Network Analyzer service operation.
Page 277: The Source Step Attenuator
The Source Step Attenuator The step attenuator contained in the source is used to adjust the power level to the test device without changing the level of the incident power in the reference path. The Built-In Test Set The analyzer features a built-in test set that provides connections to the test device, as well as to the signal-separation devices.
Page 278: Data Processing
The swept high frequency input signals are translated to fixed low frequency IF signals, using analog sampling or mixing techniques. (Refer to the HP 8719D/ZOD/Z,ZD Network Aruzl~zer Service Guide for more details on the theory of operation.) The IF signals are converted into digital data by an analog to digital converter (ADC). From this point on, all further signal processing is performed mathematically by the analyzer microprocessors.
Page 279: Processing Details
While only a single flow path is shown, two identical paths are available, corresponding to channel 1 and channel 2. When the channels are uncoupled, each channel is processed and controlled independently. A “data point” or “point” is a single piece of data representing a Data point definition: measurement at a single stimulus value.
Page 280: Pre-Raw Data Arrays
Pre-Raw Data Arrays These data arrays store the results of all the preceding data processing operations, (Up to this point, all processing is performed real-time with the sweep by the IF processor. The remaining operations are not necessarily synchronized with the sweep, and are performed by the main processor.) When full 2-port error correction is on, the raw arrays contain all four S-parameter measurements required for accuracy enhancement.
Page 281: Transform (Option 010 Only)
Transform (Option 010 Only) This transform converts frequency domain information into the time domain when it is activated. The results resemble time domain reflectometry (TDR) or impulse-response measurements. The transform uses the chirp-Z inverse fast Fourier transform (FFI’) algorithm to accomplish the conversion. The windowing operation, if enabled, is performed on the frequency domain data just before the transform.
Page 282: Active Channel Keys
Active Channel Keys The analyzer has four channels for making measurements. Channels 1 and 2 are the primary channels and channels 3 and 4 are the auxiliary channels. The primary channels can have different stimulus values (see “Uncoupling Stimulus Values Between Primary Channels,” below) but the auxiliary channels always have the same stimulus values as their primary channels.
Page 283: Enabling Auxiliary Channels
Enabling Auxiliary Channels channel 3 or 4, press: Once enabled, an auxiliary channel can be made active by pressing @Gi1) twice (for channel to the corresponding channel key. If the LED is steadily on, it indicates that primary channel 1 or 2 is active.
Page 284: Entry Block Keys
Entry Block Keys The entry block, illustrated in Figure 6-4, includes the numeric and units keypad, the knob, and the step keys. You can use these in combination with other front panel keys and softkeys for the following reasons: to modify the active entry to enter or change numeric data to change the value of the active marker to turn off the softkey menu...
Page 285: Knob
Knob You can use the knob to make continuous adjustments to current measurement parameter values or the active marker position. Values changed by the knob are effective immediately, and require no units terminator. Step Keys You can use the step keys @J (up) and @J (down) to step the current value of the active function up or down.
Page 286: Stimulus Functions
The preset stimulus mode is frequency, and the start and stop stimulus values are set to the following parameters: to 13.5 GHz BP 8719D: 50 MHz BP 87223): 50 MHz to 40.0 Frequency values can be blanked for security purposes, using the display menus.
Page 287: Stimulus Menu
Because the primary display channels are independent, the stimulus signals for the two primary channels can be uncoupled and their values set independently. The values are then displayed separately if the instrument is in dual channel display mode. In the uncoupled mode with dual channel display the instrument takes alternate sweeps to measure the two sets of data.
Page 288: The Power Menu
The Power Menu The power menu is used to define and control analyzer power. It consists of the following softkeys: . ~~,‘~~~G~:~~~~~ &. a.llows you to select power ranges automatically or manuahy. between coupler A and sampler A. n ~~~~~~~~~ (Option between coupler B and sampler B.
Page 289 However, the analyzer leaves the correction even though it’s invalid. The annotation C? will be displayed whenever you change the power after calibration. Figure 6-6. Power Range Transitions in the Automatic Mode (HP 8719D/2OD, Standard) Applioation and Operation Conoepts...
Page 290 Figure 6-7. Power Range Transitions in the Automatic Mode (HP 8722D, Standard) The power ranges for instruments equipped with Option 007 will be shifted Note 5 dB higher. Application and Operation Concepts...
Page 291: Power Coupling Options
Power Coupling Options There are two methods you can use to couple and uncouple power levels with the HP 8719D/20D/22D: channel coupling port coupling By uncoupling the channel powers, you effectively have two separate sources. Uncoupling the test ports allows you to have different power levels on each port.
Page 292: Sweep Time
Sweep Time The :;##l& ~XE#jl$ softkey selects sweeptime as the active entry and shows whether the automatic or manual mode is active. The following explains the difference between automatic and manual sweep time: Manual As long as the selected sweep speed is within the capability of the sweep time.
Page 293 Use ‘I&able 6-l to determine the minimum cycle time for the listed measurement parameters. The values listed represent the minimum time required for a CW time measurement with averaging off. IF Bandwidth Points 0.012 s 0.037 8 0.108 8 0.0255 s 0.060 s 0.172 s 0.604 8...
Page 294: Trigger Menu
Trigger Menu The trigger menu is used to select the type and number of groups for the sweep trigger. The following is a description of the softkeys located within this menu: The notation “Hid” is displayed at the left of the graticule. If the 1 indicator is on at the left side of the display, trigger a new sweep with ‘&?M% .
Page 295: Source Attenuator Switch Protection
Source Attenuator Switch Protection The programmable step attenuator of the source can be switched between port 1 and port 2 when the test port power is uncoupled or between channel 1 and channel 2 when the channel power is uncoupled. To avoid premature wear of the attenuator, measurement configurations requiring continuous switching between different power ranges are not allowed.
Page 296: Channel Stimulus Coupling
Channel Stimulus Coupling (the inactive primary channel and its auxiliary channel take on the stimulus values of the active channel). In the stimulus coupled mode, the following parameters are coupled: number of points source power number of groups IF bandwidth sweep time trigger type sweep type...
Page 297: Sweep Type Menu
Sweep Type Menu The following softkeys are located within the sweep type menu. Among them are the flve sweep types available. access to the single/all segment menu. ows list frequencies to be entered or modified using the edit list menu and edit n (g&&&?ggg The following sweep types will function with the interpolated error-correction feature (described later):...
Page 298: Logarithmic Frequency Sweep (Hz)
Logarithmic Frequency Sweep (Hz) The XJXZ-BNK~ softkey activates a logarithmic frequency sweep mode. The source is stepped ..... . : . . ; ..: . . . : : in logarithmic increments and the data is displayed on a logarithmic graticule.
Page 299: Power Sweep (Dbm)
Power Sweep (dBm) The POWER SYRUP softkey turns on a power sweep mode that is used to characterize power-sensitive circuits. In this mode, power is swept at a single frequency, from a start power value to a stop power value, selected using the Istart_] and (Stop_) keys and the entry block. This feature is convenient for such measurements as gain compression or AGC (automatic gain control) slope.
Page 300: Modifying List Frequencies
Modifying List Frequencies List frequencies can be entered or modified using the edit list and edit subsweep menus, Application of the functions in these menus is described below. Edit list menu This menu is used to edit the list of frequency segments (subsweeps) defined with the edit maximum of 1632 points.
Page 301: Response Functions
An illustration of the analyzer’s display showing the locations of these information labels is provided in Chapter 1, “HP 8719D/ZOD/22D Description and Options” Application and Operation Conoepts...
Page 302: S-Parameters
S-Parameters The m key provides access to the S-parameter menu which contains softkeys that can be used to select the parameters or inputs that define the type of measurement being performed. Understanding S-Parameters S-parameters (scattering parameters) are a convention used to characterize the way a device modifies signal flow.
Page 303: The S-Parameter Menu
For more information, refer to Chapter 10, ‘Service Key Menus Error Messages” in the HP 8719D/ZOD/ZZD Network Analgzer Service Guide. Conversion Menu This menu converts the measured reflection or transmission data to the equivalent complex impedance (Z) or admittance (Y) values. This is not the same as a two-port Y or Z parameter conversion, as only the measured parameter is used in the equations Two simple one-port conversions are available, depending on the measurement confIguration.
Page 304: Input Ports Menu
Figure 6-10. Reflection Impedance and Admittance Conversions In a transmission measurement, the data can be converted to its equivalent series impedance or admittance using the model and equations shown in Figure 6-l 1. Avoid the use of Smith chart, SWR, and delay formats for display of Z and Y Note conversions, as these formats are not easily interpreted.
Page 305: The Display Format Menu
The Display Format Menu The @GET) key provides access to the format menu. This menu allows you to select the appropriate display format for the measured data. The following list identifies which formats are available by means of which softkeys: The analyzer automatically changes the units of measurement to correspond with the displayed format.
Page 306: Group Delay Format
Figure 6-12. Log Magnitude Format Phase Format The ;Z#M#AZ. softkey displays a Cartesian format of the phase portion of the data, measured ii . . i ... . . c ..: . . in degrees.
Page 307: Smith Chart Format
Figure 6-14. Group Delay Format Smith Chart Format in reflection measurements to provide a readout of the data in terms of impedance. The intersecting dotted lines on the Smith chart represent constant resistance and constant reactance values, normalized to the characteristic impedance, ZO, of the system. Reactance values in the upper half of the Smith chart circle are positive (inductive) reactance, and those in the lower half of the circle are negative (capacitive) reactance.
Page 308: Polar Format
Figure 6-15. Standard and Inverse Smith Chart Formats Polar Format The ~%%I~ softkey displays a polar format (see F’igure 6-16). Each point on the polar format corresponds to a particular value of both magnitude and phase. Quantities are read vectorally: the magnitude at any point is determined by its displacement from the center (which has zero value), and the phase by the angle counterclockwise from the positive x-axis.
Page 309: Linear Magnitude Format
Linear Magnitude Format The ,s;e,,.~~~:,, softkey displays the linear magnitude format (see F’igure 6-17). This is a Cartesian format used for unitless measurements such as reflection coefficient magnitude p or transmission coefficient magnitude T, and for linear measurement units. It is used for display of conversion parameters and time domain transform data.
Page 310: Real Format
Real Format The REAL softkey displays only the real (resistive) portion of the measured data on a Cartesian format (see Figure 6-19). This is similar to the linear magnitude format, but can show both positive and negative values. It is primarily used for analyzing responses in the time domain, and also to display an auxiliary input voltage signal for service purposes.
Page 311: Group Delay Principles
Group Delay Principles For many networks, the amount of insertion phase is not as important as the linearity of the phase shift over a range of frequencies. The analyzer can measure this linearity and express it in two different ways: directly, as deviation from linear phase, or as group delay, a derived value.
Page 312 The analyzer computes group delay from the phase slope. Phase data is used to lind the phase change, A4, over a specified frequency aperture, Af, to obtain an approximation for the rate of change of phase with frequency (see Figure 6-22). This value, us, represents the group delay in seconds assuming linear phase change over Af.
Page 313 In determining the group delay aperture, there is a tradeoff between resolution of fine detail and the effects of noise. Noise can be reduced by increasing the aperture, but this will tend to smooth out the fine detail. More detail will become visible as the aperture is decreased, but the noise will also increase, possibly to the point of obscuring the detail.
Page 314: Scale Reference Menu
Scale Reference Menu The @ZiZGJ key provides access to the scale reference menu. Softkeys within this menu can be used to define the scale in which measured data is to be displayed, as well as simulate phase offset and electrical delay. The following softkeys are located within the scale reference menu. , ;&m# #&g&g Electrical Delay (with cut-off frequency) in order to identify which type of transmission line the delay is being...
Page 315 You may not be able to store 31 instrument states if they include a large Note amount of calibration data. The calibration data contributes considerably to the size of the instrument state file and therefore the available memory may be full prior to Wing all 31 registers.
Page 316: Dual Channel Mode
Dual Channel Mode . With IH$&L-~$l%Z& set to ON and ‘@&XT IGSF set to 1X, the two traces are overlaid on a single graticule (see Fiie 6-24a) With ~~~~~~~~~ set to ON and ~ZH%IJT~ ~ESP set to 2X or 4X, the measurement data is .
Page 317: Dual Channel Mode With Decoupled Channel Power
By decoupling the channel power or port power and using the dual channel mode, you can simultaneously view two measurements (or two sets of measurements if both auxiliary channels are enabled), having different power levels. Auxiliary channels 3 and 4 are permanently coupled by stimulus to primary Note channels 1 and 2 respectively.
Page 318: Four-Parameter Display Functions
Four-Parameter Display Functions The @&ZJ menu allows you to enable the auxiliary channels and configure a four-parameter display. This section describes those functions in the @Z&jT) menu which affect the four-parameter display. See “Using the Four-Parameter Display Mode” in Chapter 2 for the procedure to set up a four-parameter display.
Page 319: Param Displays Softkey
Channels 1 and 3 are overlaid in the top graticule, and channels 2 and 4 are overlaid in the bottom graticule. When ~P~~T~,~~~~.~~~ is selected, $XjQ@jjX,+ P&Q&##~: gives you two choices for a f our-graticule display: Channels 1 and 2 are in separate graticules in the upper half of the display, channels 3 and 4 are in separate graticules in the lower half of the display.
Page 320 3 S c p 1 9 9 8 11:19:38 SETUP A s e t u p s SETUP A SETUP B SETUP C SETUP B C h l C h l C h l SETUP C SETUP D SETUP D SETUP E SETUP F SETUP E...
Page 321: Memory Math Functions
Memory Math Functions Two trace math operations are implemented: (Note that normalization is :NA%@lNN not &W-NNN .) Memory traces are saved and recalled and trace math is done immediately after error-correction. This means that any data processing done after error-correction, including parameter conversion, time domain transformation (Option OlO), scaling, etc, can be performed on the memory trace.
Page 322: Setting Default Colors
Setting Default Colors Note cycling power to the instrument will reset the colors to the default color values. Blanking the Display Pressing :~~~~~~~~~~~ switches off the analyzer display while leaving the instrument in . . . / . . : : . x . . . : ..I . : . : ‘ ~ . ~ . . , . . ; . . : ; > >; ; ; . . ~ . . . i ; . i . ; : ; . : its current measurement state.
Page 323 . :#mx#$ To change the color of a display elements, press the softkey for that element (such as ..numeric keypad until the desired color appears. If you change the text or background intensity to the point where the display is tmreadable, you can recover a readable display by turning off the analyzer and then turning it back on.
Page 324: Averaging Menu
Averaging Menu The IAvg) key is used to access three different noise reduction techniques: sweep-to-sweep averaging, display smoothing, and variable IF bandwidth. All of these can be used simultaneously. Averaging and smoothing can be set independently for each channel, and the IF bandwidth can be set independently if the stimulus is uncoupled.
Page 325: Smoothing
Smoothing Smoothing (similar to video filtering) averages the formatted active channel data over a portion of the displayed trace. Smoothing computes each displayed data point based on one sweep only, using a moving average of several adjacent data points for the current sweep. The smoothing aperture is a percent of the swept stimulus span, up to a maximum of 20%.
Page 326: If Bandwidth Reduction
Figure 6-28. IF Bandwidth Reduction Another capability that can be used for effective noise reduction is the marker Hints statistics function, which computes the average value of part or all of the formatted trace. If your instrument is equipped with Option 085 (High Power System), another way of increasing dynamic range is to increase the input power to the test device using a booster amplifier.
Page 327 Markers The @iGiG) key displays a movable active marker on the screen and provides access to a series of menus to control up to five display markers for each channel. Markers are used to obtain numerical readings of measured values. They also provide capabilities for reducing measurement time by changing stimulus parameters, searching the trace for specific values, or statistically analyzing part or all of the trace.
Page 328: Marker Menu
With the use of a reference marker, a delta marker mode is available that displays both the stimulus and response values of the active marker relative to the reference. Any of the five markers or a fixed point can be designated as the delta reference marker. If the delta reference is one of the five markers, its stimulus value can be controlled by the user and its response value is the value of the trace at that stimulus value.
Page 329: Marker Function Menu
If the format is changed while a fixed marker is on, the hxed marker values become invalid. For example, if the value offset is set to 10 dB with a log magnitude format, and the format is then changed to phase, the value offset becomes 10 degrees. However, in polar and Smith chart formats, the specified values remain consistent between different marker types for those formats.
Page 330: Measurement Calibration
Measurement Calibration Measurement calibration is an accuracy enhancement procedure that effectively removes the system errors that cause uncertainty in measuring a test device. It measures known standard devices, and uses the results of these measurements to characterize the system. This section discusses the following topics: causes of measurement errors effectiveness of accuracy enhancement ensuring a valid calibration...
Page 331: What Causes Measurement Errors
What Causes Measurement Errors? Network analysis measurement errors can be separated into systematic, random, and drift errors. Correctable systematic errors are the repeatable errors that the system can measure. These are errors due to mismatch and leakage in the test setup, isolation between the reference and test signal paths, and system frequency response.
Page 332: Source Match
Source Match Source match is de&red as the vector sum of signals appearing at the analyzer receiver input due to the impedance mismatch at the test device looking back into the source, as well as to adapter and cable mismatches and losses. In a reflection measurement, the source match error signal is caused by some of the reflected signal from the test device being reflected from the source back toward the test device and re-reflected from the test device (Figure 6-31).
Page 333: Isolation (Crosstalk)
The error contributed by load match is dependent on the relationship between the actual output impedance of the test device and the effective match of the return port (port 2). It is a factor in all transmission measurements and in reflection measurements of two-port devices. The interaction between load match and source match is less signiilcant when the test device insertion loss is greater than about 6 dB.
Page 334 Figure 6-33. Sources of Error in a Reflection Measurement signal (I) from the reflected signal (R), then taking the ratio of the two values (see F’igure 6-34). Figure 6-34. Reflection Coefkient However, a.ll of the incident signal does not always reach the unknown (see Figure 6-35). Some of (I) may appear at the measurement system input due to leakage through the test set or through a signal separation device.
Page 335 Since the measurement system test port is never exactly the characteristic impedance (50 ohms), some of the reflected signal bounces off the test port, or other impedance transitions further down the line, and back to the unknown, adding to the original incident signal (I). This effect causes the magnitude and phase of the incident signal to vary as a function of Sll~ and frequency.
Page 336 All incident energy is absorbed. With &A = 0 the equation can be solved for Env, the directivity term. In practice, of course, the “perfect load” is difficult to achieve, although very good broadband loads are available in the HP 8719D/ZOD/22D compatible calibration kits.
Page 337 Figure 6-39. Measured Effective Directivity Next, a short circuit termination whose response is known to a very high degree is used to establish another condition (see Figure 6-40). The open circuit gives the third independent condition. In order to accurately model the phase variation with frequency due to fringing capacitance from the open connector, a specially designed shielded open circuit is used for this step.
Page 338 Figure 6-41. Open Circuit ‘Rmnination Application and Operation Concepts...
Page 339: Device Measurement
Device Measurement Now the unknown is measured to obtain a value for the measured response, SI1~, at each frequency (see Figure 6-42). Figure 6-42. Measured Sll This is the one-port error model equation solved for S 11.4. the three errors and SLIM are now known for each test frequency, &A can be computed as follows: For reflection measurements on two-port devices, same technique can be applied, but...
Page 340: Major Sources Of Error
Load Figure 6-43. Major Sources of Error The transmission coefficient is measured by taking the ratio of the incident signal (I) and the transmitted signal (T) (see Figure 6-44). Ideally, (I) consists only of power delivered by the source, and (‘I) consists only of power emerging at the test device output. Forward E T R Figure 6-44.
Page 341: Load Match Elf
Figure 6-45. Load Match Em The measured value, SZ~M, consists of signal components that vary as a function of the relationship between Esr and !&A as well as ELF and &A, so the input and output reflection coefficients of the test device must be measured and stored for use in the S21.4 error-correction computation.
Page 342: Source Match Esr
Figure 6-46. Isolation Em Thus there are two sets of error terms, forward and reverse, with each set consisting of six error terms, as follows: Directivity, Enr (forward) and Ena (reverse) Isolation, EXF and EXR Source Match, Esr and Esn The analyzer’s test set can measure both the forward and reverse characteristics of the test device without you having to manually remove and physically reverse the device.
Page 343 F’F II I Figure 6-47. Full Two-Port Error Model two-port device. Note that the mathematics for this comprehensive model use all forward and reverse error terms and measured values. Thus, to perform full error-correction for any one parameter, aJl four S-parameters must be measured. Applications of these error models are provided in the calibration procedures described in Chapter 5, “Optimizing Measurement Results.
Page 344 Figure 6-48. Full Two-Port Error Model Equations In addition to the errors removed by accuracy enhancement, other systematic errors exist due to limitations of dynamic accuracy, test set switch repeatability, and test cable stability. These, combined with random errors, also contribute to total system measurement uncertainty. Therefore, after accuracy enhancement procedures are performed, residual measurement...
Page 345: Calibration Considerations
Calibration Considerations Measurement Parameters Calibration procedures are parameter-specific, rather than channel-specific When a parameter is selected, the instrument checks available calibration data, and uses the data found for that parameter. For example, if a transmission response calibration is performed for B/R, and an S11 l-port calibration for A/R, the analyzer retains both calibration sets and corrects whichever parameter is displayed.
Page 346: The Calibration Standards
During measurement calibration, the analyzer measures actual, well-dellned standards and mathematically compares the results with ideal “models” of those standards. The differences are separated into error terms which are later removed during error-correction. Most of the differences are due to systematic errors - repeatable errors introduced by the analyzer, test set, and cables - which are correctable.
Page 347: Electrical Offset
Electrical Offset Some standards have reference planes that are electrically offset from the mating plane of the test port. These devices will show a phase shift with respect to frequency. ‘Pable 6-4 shows which reference devices exhibit an electrical offset phase shift. The amount of phase shift can be calculated with the formula: x f x 1)/c where: f = frequency...
Page 348 Type-N Female, Male 3.5 mm or Female O&et Short 7 mm or Type-N Ma/e Type-N Female, 3.5 mm Mole or Female Q&et Open Figure 6-49. Typical Responses of Calibration Standards after Vibration Application and Operation Concepts...
Page 349: How Effective Is Accuracy Enhancement
How Effective Is Accuracy Enhancement? The uncorrected performance of the analyzer is sufficient for many measurements. However, the vector accuracy enhancement procedures described in Chapter 5, “Optimizing Measurement Results,” will provide a much higher level of accuracy. Figure 6-50 through Figure 6-52 illustrate the improvements that can be made in measurement accuracy by using a more complete calibration routine.
Page 350 Figure 6-52 shows response of a device in a log magnitude format, using a response calibration in as shown on the left, and a full two-port calibration as shown on the right. Application and Operation Concepts...
Page 351: Correcting For Measurement Errors
Correcting for Measurement Errors The a key provides access to the correction menu which leads to a series of menus that implement the error-correction concepts described in this section. Accuracy enhancement (error-correction) is performed as a calibration step before you measure a test device. When the Lcal] key is pressed, the correction menu is displayed.
Page 352: Interpolated Error-Correction
Interpolated Error-correction This feature allows you to select a subset of the frequency range or a different number of points without recalibration. When interpolation is on, the system errors for the newly selected frequencies are calculated from the system errors of the original calibration. System performance is unspecified when using interpolated error-correction.
Page 353: The Calibrate Menu
The Calibrate Menu There are twelve different error terms for a two-port measurement that can be corrected by accuracy enhancement in the analyzer. These are directivity, source match, load match, isolation, reflection tracking, and transmission tracking, each in both the forward and reverse direction.
Page 354 The TRL/LRM two-port calibration, activated by pressing the ~~~~:~~~~~T softkey within the calibrate menu, provides the ability to make calibrations using the TRL or LRM method. True TRL/LRM calibration is available on instruments equipped with Option 400, Four Sampler Test Set. For more information, refer to “TRL/LRM Calibration,” located later in this section.
Page 355: Restarting A Calibration
Restarting a Calibration If you interrupt a calibration to go to another menu, such as averaging, you can continue the calibration by pressing the ~~~.~~~‘~~~~~~~ softkey in the correction menu. Cal Kit Menu The cal kit menu provides access to a series of menus used to specify the characteristics of calibration standards.
Page 356: Modifying Calibration Kits
5956-4352. Although the application note is written for the HP 8510 family of network analyzers, it also applies to the HP 8719D/20D/22D. Several situations exist that may require a user-defined calibration kit: kits.
Page 357: Modify Calibration Kit Menu
4. Store the modified calibration kit. For a step by step procedure on how to modify calibration kits, refer to “Modifying Calibration Kit Standards” located in Chapter 5, “Optimizing Measurement Results ’ Modify Calibration Kit Menu menu. This leads in turn to additional series of menus associated with modifying calibration kits.
Page 358: Define Standard Menus
Standard definition is the process of mathematically modeling the electrical characteristics (delay, attenuation, and impedance) of each calibration standard. These electrical characteristics (coefkients) can be mathematically derived from the physical dimensions and material of each calibration standard, or from its actual measured response. The parameters of the standards can be listed in TIkble 6-5.
Page 359 Each standard must be identified as one of five “types”: open, short, load, delay/thru, or arbitrary impedance. After a standard number is entered, selection of the standard type will present one of five menus for entering the electrical characteristics (model coefficients) corresponding to that standard type, such as &I%.
Page 360: Specify Offset Menu
to be a an arbitrary calibration, the analyzer will prompt for several load positions, and calculate the ideal load value from it. Any standard type can be further defined with offsets in delay, loss, and standard impedance; assigned minimum or maximum frequencies over which the standard applies; and defined as .
Page 361: Label Standard Menu
. OFFSET LUSS allows you to specify energy loss, due to skin effect, along a one-way length of coax offset. The value of loss is entered as ohms/nanosecond (or Giga ohms/second) at 1 GHz. (Such losses are negligible in waveguide, so enter 0 as the loss offset.) This is not the impedance of the standard itself.) For waveguide, the offset impedance as well as the system ZO must always be set to 10.
Page 362 Standard Itef Forward Transmission Reverse The number of standard classes required depends on the type of calibration being performed, and is identical to the number of error terms corrected. A response calibration requires only one class, and the standards for that class may include an open, or short, or thru. A l-port calibration requires three classes.
Page 363: Label Class Menu
. S22A allows you to enter the standard numbers for the first class required for an Sz2 l-port calibration. (For default calibration kits, this is the open.) . S22B allows you to enter the standard numbers for the second class required for an Szz l-port calibration.
Page 364: Verify Performance
The published specifications for the HP 8719D/20D/22D network analyzer Note system include accuracy enhancement with compatible calibration kits Measurement calibrations made with user-defined or modilled calibration kits are not subject to the HP 8719D/20D/22D specifications, although a procedure similar to the system verification procedure may be used.
Page 365: Trl/Lrm Calibration
The HP 8719D/20D/22D RF network analyzer has the capability of making calibrations using the “TRL” (thru-reflect-line) method. This section contains information on the following subjects: Why Use TRL Calibration? TRL l&minology How TRL*/LRM* Calibration Works How True TRL/LRM Works (Option 400 Only)
Page 366: How Trl*/Lrm* Calibration Works
Figure 6-53. error-corrected measurement& system. For an HP 8719D/20D/22D TRL* 2-port calibration, a total of 10 measurements are made to quantify eight unknowns (not including the two isolation error terms). Assume the two transmission leakage terms, EXF and EXR, are measured using the conventional technique. The eight TRL* error terms are represented by the error adapters shown in Figure 6-52.
Page 367 For the reflect step, identical high reflection coefficient standards (typically open or short circuits) are connected to each test port and measured (Sll and $2). line step, a short length of transmission line (different in length from the thru) is inserted between port 1 and port 2 and again the frequency response and port match are measured in both directions by measuring all four S-parameters.
Page 368: Source Match And Load Match
1 and port 2. Because the standard HP 8719D/20D/22D network analyzer is based on a three-sampler receiver architecture, it is not possible to differentiate the source match from the load match terms The terminating impedance of the switch is assumed to be either direction.
Page 369 HP 8719D/20D/22D HP 8719D/20D/22D OPTION STANDARD Figure 6-55. Comparison of Standard and Option 406 Instruments Improving Raw Source Match and Load Match For TRL*/LRM* Calibration A technique that can be used to improve the raw test port mismatch is to add high quality system is improved because the hxed attenuators usually have a return loss that is better than that of the network analyzer.
Page 370: The Trl Calibration Procedure
If the device measurement requires bias, it will be necessary to add external bias tees between the flxed attenuators and the llxture. The internal bias tees of the analyzer will not pass the bias properly through the external Exed attenuators. Be sure to calibrate with the external bias tees in place (no bias applied during calibration) to remove their effect from the measurement.
Page 371: Reflection Coefficient
REFLECT Reflection coefficient (I’ ) magnitude is optimally 1.0, but need not be known. Phase of P must known and specified to within f l/4 wavelength or f 90°. During computation of the error model, the root choice in the solution of a quadratic equation is based on the reflection data.
Page 372 The line standard must meet specific frequency related criteria, in conjunction with the length used by the thru standard. In particular, the insertion phase of the line must not be the same as the thru. The optimal line length is 114 wavelength (90 degrees) relative to a zero length thru at the center frequency of interest, and between 20 and 160 degrees of phase difference over the frequency range of interest.
Page 373: Trl Options
Another reason for showing this example is to point out the potential problem in calibrating at low frequencies using TRL. For example, one-quarter wavelength is 7 5 0 0 x VF L e n g t h ( c m ) = where: fc = center frequency Thus, at 50 MHz,...
Page 374 CAL 20: SYSTEM 20 is selected when the desired measurement impedance differs from the impedance of the line standard. This requires a knowledge of the exact value of the Z0 of the line. The system reference impedance is set using SET 20 under the calibration menu.
Page 375: Power Meter Calibration
Power Meter Calibration The PURMTR CAL [ 3 softkey within the correction menu, leads to a series of menus associated with power meter calibration. An HP-IB-compatible power meter can monitor and correct RF source power to achieve leveled power at the test port. During a power meter calibration, the power meter samples the power at each measurement point across the frequency band of interest.
Page 376: Loss Of Power Meter Calibration Data
Loss of Power Meter Calibration Data The power meter calibration data will be lost by committing any of the following actions: Changing sweep type. If the sweep type is changed (linear, log, list, CW, power) while power meter calibration is on, the calibration data will be lost. However, calibration data is retained if you change the sweep type while power meter calibration is off.
Page 377: Sample-And-Sweep Mode (One Sweep)
NETWORK ANALYZER Figure 6-57. ‘l&t Setup for Continuous Sample Mode Sample-and-Sweep Mode (One Sweep) You can use the ~~~~~~~~~ softkey to activate the sample-and-sweep mode. This will correct the analyzer output power and update the power meter calibration data table during the initial measurement sweep.
Page 378: Power Loss Correction List
Power Loss Correction List If a directional coupler or power splitter is used to sample the RF power output of the analyzer, the RF signal going to the power meter may be different than that going to the test device. A directional coupler will attenuate the RF signal by its specified coupling factor.
Page 379: Notes On Accuracy
1 Sweep speed applies to every sweep in continuous correction mode, and to the 5mt sweep in sample-and-sweep mode. Subsequent sweeps in sample-and-sweep mode will be much faster. The accumcy values were derived by combining the accuracy of the power meter and linearity of the analyzer’s iuternal source, as well as the mismatch uncertainty associated with the power sensor.
Page 380: Alternate And Chop Sweep Modes
Alternate and Chop Sweep Modes menu to activate either one or the other sweep modes. For information about sweep types, refer to “Sweep Type Menu,” located earlier in this chapter. Alternate unwanted signak, such as crosstalk from sampler A to B when measuring B/R. Thus, this mode optimizes the dynamic range for ah four S-parameter measurements.
Page 381: Calibrating For Non-Insertable Devices
Calibrating for Non-Insertable Devices A test device having the same sex connector on both the input and output cannot be connected directly into a transmission test configuration. Therefore, the device is considered to be and one of the following calibration methods must performed.
Page 382: Using The Instrument State Functions
Using the Instrument State Functions Fiiure 6-60. Instrument State Function Block The instrument state function block keys provide control of channel-independent system functions. The following keys are described in this chapter: Information on the remaining instrument state keys can be found in the following chapters: 6-108 Application and Operation Concepts...
Page 383: Hp-Ib Menu
HP-IB Menu This section contains information on the following topics: local key using the parallel port This key is allows you to return the analyzer to local (front panel) operation from remote (computer controlled) operation. This key will also abort a test sequence or hardcopy print/plot.
Page 384: System Controller Mode
HP-IB STATUS Indicators When the analyzer is connected to other instruments over HP-IB, the HP-IB STATUS indicators in the instrument state function block light up to display the current status of the analyzer. R = remote operation L = listen mode T = talk mode S = service request (SRQ) asserted by the analyzer System Controller Mode...
Page 385: Using The Parallel Port
Most of the HP-IB addresses are set at the factory and need not be modified for normal system operation. The standard factory-set addresses for instruments that may be part of the system are as follows: Instrument (decimal) Analyzer Plotter Printer External Disk Drive Controller Power Meter...
Page 386: The System Menu
The System Menu The &ZG?) key provides access to the system menu. This menu leads to additional menus which control various aspects of the analyzer system. The following softkeys are located within the system menu: The Limits Menu You can have limit lines drawn on the display to represent upper and lower limits or device specifications with which to compare the test device.
Page 387: Edit Limits Menu
Limit lines are displayed only on Cartesian formats. In polar and Smith chart formats, limit testing of one value is available: the value tested depends on the marker mode and is the magnitude or the first value in a complex pair The message NO LIMIT LINES DISPLAYED is shown on the display in polar and Smith chart formats.
Page 388: Offset Limits Menu
Offset Limits Menu This menu allows the complete limit set to be offset in either stimulus value or amplitude value. This is useful for changing the limits to correspond with a change in the test setup, or for device specifications that differ in stimulus or amplitude. It can also be used to move the limit lines away from the data trace temporarily for visual examination of trace detail.
Page 389: Knowing The Instrument Modes
Knowing the Instrument Modes There are three major instrument modes of the analyzer: network analyzer mode tuned receiver mode The instrument mode menu can be accessed by pressing (sx) IISTRIJNEZST MODE . This menu contains the following softkeys: . I$XT R GHAN (Option 085 Only) .
Page 390: Frequency Offset Menu (Option 089)
Mixer measurements and frequency offset mode applications are explained in application note Analyzer,” HP part number 5956-4362. This application note was written for the HP 8753B but also applies to the HP 8719D/20D/22D. Also see product note 8753-2A, HP part number 5952-2771.
Page 391: Frequency Offset In-Depth Description
NETWORK ANALYZER SYNTHESIZER ATTENUATOR Figure 6-61. Typical ‘lkst Setup for a Frequency Offset Measurement Frequency Offset In-Depth Description The source and receiver operate at two different frequencies in frequency offset operation. The difference between the source and receiver frequencies is the Lo frequency that you specify.
Page 392 Compatible Instrument Modes and Sweep Types. Frequency offset is compatible with all sweep types in the network analyzer mode. Receiver and Source Requirements. Refer to Chapter 7, “Specifications and Measurement Uncertainties. n IF Input: R always; and port 1 or port 2 for a ratio measurement. Display hmotations.
Page 393 An HP 8719D/20D/22D can be ordered with Option 010, or the option can be Note added at a later date using the HP 85019B time domain retrofit kit.
Page 394 The analyzer has one time-to-frequency transform mode: Forward transform mode transforms CW signals measured over time into the frequency domain, to measure the spectral content of a signal. This mode is known as the CW time mode. In addition to these transform modes, this section discusses special transform concepts such as masking, windowing, and gating.
Page 395: Reflection Measurements Using Bandpass Mode
The time domain measurement shows the effect of each discontinuity as a function of time (or distance), and shows that the test device response consists of three separate impedance changes. The second discontinuity has a reflection coefficient magnitude of 0.035 (i.e. 3.5% of the incident signal is reflected).
Page 396: A Reflection Measurement Of Two Cables
NETWORK ANALYZER Figure 6-63. A Reflection Measurement of Two Cables The ripples in reflection coefficient versus frequency in the frequency domain measurement are caused by the reflections at each connector “beating” against each other. One at a time, loosen the connectors at each end of the cable and observe the response in both the frequency domain and the time domain.
Page 397: Transmission Measurements Using Bandpass Mode
Reflection CoeBkient (unitless) (0 REAL Reflection Coefficient (unitless) (-1 LOGMAG Return Lo&3 (CEI) Standing Wave Ratio (unitless) Transmission Measurements Using Bandpass Mode The bandpass mode can also transform transmission measurements to the time domain. For example, this mode can provide information about a surface acoustic wave (SAW) lllter that is not apparent in the frequency domain.
Page 398: Timedomainlowpass
Time Domain Low Pass This mode is used to simulate a traditional time domain reflectometry (TDR) measurement. It provides information to determine the type of discontinuity (resistive, capacitive, or inductive) that is present. Low pass provides the best resolution for a given bandwidth in the frequency domain.
Page 399: Reflection Measurements In Time Domain Low Pass
Reflection Measurements In Time Domain Low Pass Figure 6-65 shows the time domain response of an unterminated cable in both the low-pass step and low-pass impulse modes. Figure 6-65. Time Domain Low Pass Measurements of an Unterminated Cable Interpreting the low pass response horizontal axis. The low pass measurement horizontal axis is the two-way travel time to the discontinuity (as in the bandpass mode).
Page 400 ELEMENT STEP RESPONSE IMPULSE RESPONSE Fiie 6-66. Impulse Response Waveforms (Real Format) Simulated Low Pass Step and with the real format.
Page 401 Figure 6-67. Low Pass Step Measurements of Common Gable Transmission Measnrements In Time Domain Low Pass Measuring small signal transient response using low pass step. Use the low pass mode to analyze the test device’s small signal transient response. The transmission response of a device to a step input is often measured at lower frequencies, using a function generator (to provide the step to the test device) and a sampling oscilloscope (to analyze the test device output response).
Page 402 Figure 6-68. Time Domain Low Pass Measurement of an Amplifier Small Signal Transient Response Interpreting the low pass step transmission response horizontal axis. The low pass transmission measurement horizontal axis displays the average transit time through the test device over the frequency range used in the measurement. The response of the thru connection used in the calibration is a step that reaches 50% unit height at approximately time = 0.
Page 403: Time Domain Concepts
THRU LINE FIBER OPTIC CABLE Transmission Figure 6-69. Transmission Measurements Using Low Pass Impulse Mode Time Domain Concepts Masking occurs when a discontinuity (fault) closest to the reference plane affects the response of each subsequent discontinuity. This happens because the energy reflected from the first discontinuity never reaches subsequent discontinuities.
Page 404: Windowing
Circuit Circuit Figure 6-70. Masking Example Windowing The analyzer provides a windowing feature that makes time domain measurements more useful for isolating and identifying individual responses. Windowing is needed because of the abrupt transitions in a frequency domain measurement at the start and stop frequencies. The band limiting of a frequency domain response causes overshoot and ringing in the time domain response, and causes a non-windowed impulse stimulus to have a sin(kt)/kt shape, where k = a/frequency span and t = time (see F’igure 6-71).
Page 405 Windowing improves the dynamic range of a time domain measurement by altering the frequency domain data prior to converting it to the time domain, producing an impulse stimulus that has lower sidelobes This makes it much easier to see time domain responses that are very different in magnitude.
Page 406: Range
Figure 6-72. The Effects of Widowing on the Time Domain Responses of a Short Circuit In the time domain, range is defined as the length in time that a measurement can be made without encountering a repetition of the response, tailed aiiasing. A time domain response repeats at regular intervals because the frequency domain data is taken at discrete frequency points, rather than continuously over the frequency band.
Page 407: Resolution
To increase the time domain measurement range, llrst increase the number of points, but remember that as the number of points increases, the sweep speed decreases. Decreasing the frequency span also increases range, but reduces resolution. Resolution Two different resolution terms are used in the time domain: response resolution range resolution Response resolution.
Page 408: Response Resolution
Figure 6-73. Response Resolution While increasing the frequency span increases the response resolution, keep the following points in mind: The time domain response noise floor is directly related to the frequency domain data noise floor. Because of this, if the frequency domain data points are taken at or below the measurement noise floor, the time domain measurement noise floor is degraded.
Page 409: Gating
Gating Gating provides the flexibility of selectively removing time domain responses. The remaining time domain responses can then be transformed back to the frequency domain. For reflection (or fault location) measurements, use this feature to remove the effects of unwanted discontinuities in the time domain.
Page 410: Transforming Cw Time Measurements Into The Frequency Domain
Figure 6-76. Gate Shape Selecting gate shape. The four gate shapes available are listed in ‘lhble 6-11. Each gate has a different passband flatness, cutoff rate, and sidelobe levels. -68 dB Normal Wide -67 dB -70 dB Maximum The passband ripple and sidelobe levels are descriptive of the gate shape. The cutoff time is the time between the stop time (-6 dE3 on the filter skirt) and the peak of the first sidelobe, and is equal on the left and right side skirts of the Biter.
Page 411: Forward Transform Measurements
Forward Transform Measurements This is an ezample of a measurement using the Fourier transform in the forward direction, from the time domain to the frequency domain (see Figure 6-77): Figure 6-77. Amplifier Gain Measurement Interpreting the forward transform vertical axis. With the log magnitude format selected, the vertical axis displays dB.
Page 412: Forward Transform Range
Figure 6-78. Combined Effects of Amplitude and Phase Modulation Using the demodulation capabilities of the analyzer, it is possible to view the amplitude or the phase component of the modulation separately. The window menu includes the following of any test device modulation appear on the display. displays only the amplitude modulation, as illustrated in F’igure 6-79(a).
Page 413: Range Of A Forward Transform Measurement
Number of points - Range = time span x 10-S = 200 = 1000 Hertz For the example given above, a 201 point CW time measurement made over a 200 ms time span, choose a span of 1 kHz or less on either side of the center frequency (see Figure 6-80). That is, choose a total span of 2 kHz or less.
Page 414: Test Sequencing
The following is a list of some of the key test sequencing features available on the HP 8719D/20D/22D network analyzer: Limited decision-making functions increase the versatility of the test sequences you create by allowing you to jump from one sequence to another.
Page 415: Commands That Require A Clean Sweep
Commands That Require a Clean Sweep Many front panel commands disrupt the sweep in progress. For example, changing the channel or measurement type. When the analyzer does execute a disruptive command in a sequence, some instrument functions are inhibited until a complete sweep is taken. This applies to the following functions: autoscale data + memory...
Page 416: The Sequencing Menu
Pressing the Isecl] key accesses the Sequencing menu. This menu leads to a series of menus that allow you to create and control sequences. The GOStTB SEQUENCE softkey, located in the Sequencing menu, activates a feature that allows the sequence to branch off to another sequence, then return to the original sequence. For example, you could perform an amplifier measurement in the following manner: 1.
Page 417 Pin assignments: pin 1 is the data strobe pin 16 selects the printer pin 17 resets the printer pins 18-25 are ground Electrical specifications for lTL high: volts(H) = 2.7 volts (V) Electrical specifications for TI’L low: current = 0.2 milliamps (mA) 4 3 2 I 0 Figure 6-81.
Page 418: Sequencing Special Functions Menu
The TTL OUT softkey provides access to the TIZ out menu. This menu allows you to choose between the following output parameters of the ‘ITL output signal: n TTL OUT HfGH . TTL OUT LOW The TI’L output signals are sent to the sequencing BNC rear panel output. Sequencing Special Functions Menu This menu is accessed by pressing the SPECIAL FUNL”ffONS softkey in the Sequencing menu.
Page 419: Naming Files Generated By A Sequence
Loop counter/loop counter decision making The analyzer has a numeric register called a loop counter. The value of this register can be set by a sequence, and it can be decremented each time a sequence repeats itself....i ... . . _ ..L/ i . : I. . : . , . , ..to another sequence if the stated condition is true.
Page 420: Entering Sequences Using Hp-Ib
menu) sends the HP-GL command string to the analyzer’s HP-GL address. The address of the analyzer’s HP-GL graphics interface is always offset from the instrument’s HP-IB address by 1: If the current instrument address is an even number: HP-GL address = instrument address + 1. If the current instrument address is an odd number: HP-GL address = instrument address - 1.
Page 421: Gain Compression
Amplifier lksting The HP 8719D/20D/22D allows you to measure the transmission and reflection characteristics of many amplifiers and active devices. You can measure scalar parameters such as gain, gain flatness, gain compression, reverse isolation, return loss (SWR), and gain drift versus time.
Page 422: Metering The Power Level
Figure 6-84 illustrates a simultaneous measurement of gain compression and amplifier output power as a function of input power. Figure 6-84. Gain Compression Using Power Sweep In a compression measurement it is necessary to know the RF input or output power at a certain level of gain compression.
Page 423 NETWORK ANALYZER POWER METER UNDER TEST POWER SENSOR Figure 6-85. High Power Amplifier Testing (Option OS6 Only) Analyzers equipped with Option 085 are capable of increasing their RF output levels by means of inserting an external, high power booster amplifier. As a result, up to 20 Watts (+43 dRm) can be delivered to a device or amplifier under test.
Page 424: Frequency Offset (Option 089 Only)
Mixer Tksting input and output frequencies. Mixer tests can be performed using the frequency offset operation of the analyzer (with an external LO source) or using the tuned receiver operation of the analyzer (with an external RF and LO source). The most common and convenient method used is frequency offset.
Page 425: Accuracy Considerations
Mixer Parameters That lbu Can Measure Figure 6-86. Mixer Parameters and RF feedthru. Reflection include return loss, SWR and complex impedance. characteristics Output power. Other parameters of concern are isolation terms, including LO to RF isolation and LO to IF isolation.
Page 426: Attenuation At Mixer Ports
Attenuation at Mixer Ports Mismatch between the instruments, cables, and mixer introduces errors in the measurement that you cannot remove with a frequency response calibration. You can reduce the mismatch by using high quality attenuators as close to the mixer under test as possible. When characterizing linear devices, you can use vector accuracy enhancement (measurement calibration) to mathematically remove all systematic errors from the measurement, including source and load mismatches.
Page 427: Example Of Conversion Loss Versus Output Frequency With Correct If Signal
Harmonics, linearity, and spurious signals also introduce errors that are not removed by frequency response calibration. These errors are smaller with a narrowband detection scheme, but they may still interfere with your measurements. You should filter the IF signal to reduce these errors as much as possible.
Page 428: Frequency Selection
Filtering is required in both ilxed and broadband measurements, but you can implement it more easily in the fixed situation. Therefore, when configuring broad-band (swept) measurements, you may need to trade some measurement bandwidth for the ability to more selectively illter signals entering analyzer’s receiver.
Page 429 In standard mixer measurements, the input of the mixer is always connected to the analyzer’s RF’ source, and the output of the mixer always produces the IF frequencies that are received by the analyzer’s receiver. However, the ports labeled RF and IF on most mixers are not consistently connected to the analyzer’s source and receiver ports, respectively.
Page 430: Up Converter Port Connections
In an up converter measurement where the ‘%I$ ~~~~ softkey is selected, the notation on the setup diagram indicates that the analyzer’s source frequency is labeled IF, connecting to the mixer IF port, and the analyzer’s receiver frequency is labeled RF, connecting to the mixer RF port.
Page 431: Conversion Loss
Conversion Loss Figure 6-93. Example Spectrum of RF, LQ, and IF signals Present in a Conversion Loss Measurement Conversion loss is a measure of how efficiently a mixer converts energy from one frequency to another. It is the ratio of the sideband output power to input signal power and is usually expressed in dB.
Page 432: Rf Feedthru
RF Feedthru RF feedthru, or RF-to-IF isolation, is the amount the RF power that is attenuated when it reaches the IF port. This value is low in double balanced mixers. RF feedthru is usually less of a problem than the LO isolation terms because the LO power level is significantly higher than the RF power drive.
Page 433: Conversion Compression
Conversion Compression I n p u t Signal ( P F ) Figure 6-95. Conversion Loss and Output Power as a Function of Input Power Level Conversion compression is a measure of the maximum RF input signal level for which the mixer will provide linear operation.
Page 434: Amplitude And Phase Tracking
Amplitude and Phase Tracking The match between mixers is defined as the absolute difference in amplitude and/or phase response over a specified frequency range. The tracking between mixers is essentially how well the devices are matched over a specified interval. This interval may be a frequency interval or a temperature interval, or a combination of both.
Page 435 In standard vector error-correction, a thru (delay = 0) is used as a calibration standard. The solution to this problem is to use a calibration mixer with very smaIl group delay as the calibration standard. An important characteristic to remember when selecting a calibration mixer is that the delay of the device should be kept as low as possible.
Page 436: Connection Considerations
Connection Considerations Adapters adapter needs to have low SWR or mismatch, low loss, and high repeatability. Total = Ad + ,-, Figure 6-97. Adapter Considerations In a reflection measurement, the directivity of a system is a measure of the error introduced device.
Page 437: Fixtures
Fixtures Fixtures are needed to interface non-coaxial devices to coaxial test instruments. It may also be necessary to transform the characteristic impedance from standard 50 ohm instrwnents to a non-standard impedance and to apply bias if an active device is being measured. For accurate measurements, the fixture must introduce minimum change to the test signal, not destroy the test device, and provide a repeatable connection to the device.
Page 438: Reference Documents
Reference Documents Hewlett-Packard Company, “Simplify Your Amplifier and Mixer Testing” 5956-4363 Hewlett-Packard Company, “RF and Microwave Device Test for the ’90s - Seminar Papers” Hewlett-Packard Company “Testing Amplifiers and Active Devices with the HP 8720 Network Analyzer” Product Note 8720-l 5091-1942E Hewlett-Packard Company “Mixer Measurements Using the HP 8753 Network Analyzer”...
Page 439: On-Wafer Measurements
On-Wafer Measurements Hewlett-Packard Company, “On-Wafer Measurements Using the HP 8510 Network Analyzer and Cascade Microtech Wafer Probes,” Product Note 8510-6 HP publication number 5954-1579 Barr, J.T., T. Burcham, A.C. Davidson, E. W. Strid, “Advancements in On-Wafer Probing Calibration Techniques, n Hewlett-Packard RF and Microwave Measurement Symposium paper, 1991 Lautzenhiser, S., A.
Page 440: Specifications And Measurement Uncertainties
The specifications listed in Table 7-3 range from those guaranteed by Hewlett-Packard to those characteristic of most HP 8719D/20D/22D instruments, but not guaranteed. Codes in the far right column of Table 7-3 reference a deGnition, listed below. These detlnitions are intended to clarify the extent to which Hewlett-Packard supports the performance of the HP 8719D/8720D/8722D network analyzers.
Page 441 apply, Option 089 R input specifications apply, and all other standard instrument specifications apply. For HP 8719DX/8720DX/8722DX preconfigured analyzers, standard instrument specificatins apply, except for frequency stability; Option lD5 specifications apply.
Page 442: Uncorrected Performance
Uncorrected Performance Parameter Frequency Range 0.05 to 0.5 GE I to 20 GE 27 dB 27 dB 21 dB 16 dB Source Match (Standard) 12 dB 10 dB Source Match (Option 40C 20 dB 12 dB 10 dB Source Match (Option 007 20 dB 14 dB 11 dB...
Page 443 7.5 ppm Option lD5 Option lD5 Resolution Power Range HP 8719D (Std., Opts. 007,085,400) HP 8720D (Std., Opts. 007,085,400) HP 8722D (Std., Opts. 085,400: 0.05 to 20 GHz) 70 dE HP 8722D (Std., Opts. 085,400: 20 to 40 GHz) 65 dI3 HP 8722D (Opt.
Page 444 Power Linearity -5 dBm for BP 871QD/8720D (std., Opts. 085, 400) 0 dBm for BP 871QD/8720D (Opt. 007) -10 dBm for BP 8722D (Std., Opts. 085,400) -5 dBm for BP 8722D (Opt. 007) -5 dB from reference + 5 dB from reference l 0.35 dB + 10 dB* from reference (871QDnOD only) fl.O dB...
Page 445 Damage level (test port) Reference (R) Input Level (Opt. 080) HP 8719DLZOD -12 dBm HP 87221) -34 dBm I-IF’ 8719D/20D/22D Magnitude (zero-peak) Phase (zero-peak) 0.30 dB 0.40 cm 20-40 GI-Iz * Input power level that causes 0.1 dB compression in the receiver.
Page 446 maximum output level <-15 dBc Phase Noise <-55 dBc <-35 dBc to 60 kI-Iz from carrier @ 20 GHz Non-Harmonic Spurious Signals at 100 kHz oKset at 200 kHz oKset <-65 dBc at 2200 kHz offset OPTION Compression* 2-8 GHz -7 dBm 8-20 GI-Iz -12 dBm...
Page 447 Band Sweep (lo-12 GBz) Uncorrected 240/94 1 -port calibration* 2-port BP 871OD Full Sweep (0.05-13.5 GI-R) Uncorrected l-port calibration* calibration+ HP 8720D Full Sweep (0.05-20 Glib) 17261560 Uncorrected l-port calibration* Uncorrected l-port calibration* 3255 64 bit 3575 Sll l-port calibration, with a 3 kBz IF bandwidth. Includes system retrace time. Time domain assumed OK.
Page 448 HP 8719D and HP 8720D Measurement Port Specifwations The following specifications show the residual system performance, including switch repeatability, after error-correction. The error-correction consists of a fuII 2-port measurement calibration, including isolation, with an IF bandwidth of 10 Hz and the specified calibration kit.
Page 449 The following specifications describe the system performance of the HP 8719D/8720D network analyzers. The system hardware includes the following: Options: ................Standard Cables: .
Page 450: Hp 8719D/8720D With 3.5 Mm Connectors
HP 8719D/8720D with 3.5 mm Connectors The following specifications describe the system performance of the HP 8719D/8720D network analyzers. The system hardware includes the following: Options: ......... , ........Option 400 Calibration kit:.
Page 451: Hp 8719D/8720D With 7 Mm Connectors
HP 8719D/8720D with 7 mm Connectors The following specifications describe the system performance of HP 8719D/872OD network analyzers. The system hardware includes the following: Options: ................Standard Calibration kit: .
Page 452 HP 8719DB720D with 7 mm Connectors The following specifications describe the system performance of the HP 8719DB720D network analyzers. The system hardware includes the following: Options: ................Option 400 Calibration kit:.
Page 453: Hp 8719D/8720D With Type-N Connectors
HP 8719D/8720D with Type-N Connectors The following specifications describe the system performance of the HP 8719D/872OD network analyzers, The system hardware includes the following: Options: ......, ............Standard Calibration kit: .
Page 454: Hp 8719D/8720D With Type-N Connectors
HP 8719D/8720D with Type-N Connectors The following specifications describe the system performance of the HP 8719D/8720D network analyzers. The system hardware includes the following: Standard Options: ................
Page 455: Hp 8722D Measurement Port Specifications
HP 8722D Measurement Port Specifications The following specifications show the residual system performance, including switch repeatability, after error-correction. The error-correction consists of a fuII Z-port measurement calibration, including isolation, with an IF bandwidth of 10 Hz and the specified calibration kit.
Page 456: Hp8722Dwith2.4Mmconnectors
The following specifications describe the system performance of the HP 8722D network analyzers. The system hardware includes the following: Options: ................Standard Calibration kit: .
Page 457 The following specifications describe the system performance of the HP 8722D network analyzers. The system hardware includes the following: Options: ................Standard Calibration kit: .
Page 458 system The following specifications describe the performance of the HP 87221) network analyzers. The system hardware includes the following: Options: ................Standard Calibration kit: .
Page 459: Hp8722Dwith3.5Mmconnectors
The following specifications describe the system performance of the HP 8722D network analyzers. The system hardware includes the following: Options: ................Option 400 Calibration kit:.
Page 460 The following specifications describe the system performance of the HP 8722D network analyzers. The system hardware includes the following: Options: ................Standard Adapter (Type-N to 7 mm): .
Page 461 The following specifications describe the system performance of the HP 87221) network analyzers. The system hardware includes the following: Options: ................Standard Cables:.
Page 462: General Characteristics
HP 8719D/8720D........
Page 463: Rear Panel Connectors
Rear Panel Connectors External Reference Frequency Input (EXT BEF INPUT) Frequency..........1, 2, 5, and 10 MHz (GO0 Hz at 10 MHz) Level.
Page 464: Din Keyboard
This connector outputs a ‘ll”L, signal of the limit test results. Pass: ‘ITL high; F’ail: TTL low. Maximum voltage ............... +40 Vdc Maximum current...............~500~ This connector is used for the optional AT compatible keyboard for titles and remote front-panel operation.
Page 465: Environmental Characteristics
RFI and EMI susceptibility: de9ned by VADE 0730, CISPR Publication 11, and FCC Class B Standards. ESD (electrostatic discharge): must be eliminated by use of static-safe work procedures and an anti-static bench mat (such as HP 9217511. Dust: the environment should be as dust-free as possible. Calibration Temperature .
Page 466: Cabinet Dimensions
222 mm H x 425 mm W x 457 mm D (8.75 x 16.75 x 18.0 in) (These dimensions exclude front and rear panel protrusions.) Physical Dimensions Temperature at 70 O C ............250 days (0.68 year) Temperature at 40 OC .
Page 470 84 Menu Maps...
Page 471 Menu Maps 8-5...
Page 473 Menu Maps 8-7...
Page 475 Menu Maps a-9...
Page 477 Menu Maps 9-11...
Page 478 Menu Maps...
Page 481 Menu Maps...
Page 482 Chapter 5, “Cptimizing Measurement Results,” describes techniques and functions for achieving the best measurement results. about many applications and analyzer operation. HP 8719D/2ODL22D Ndwork Armlgger of all HP-IB mnemonics...
Page 483 Guide Thus and Conventions The eight keys along the right side of the analyzer display are called softkeys. Their labels are shown on the display. The softkeys appear in shaded boxes in this chapter. For example, ii:.:..: front-panel keys. The front-panel keys appear in unshaded boxes in this chapter. For example, Analyzer Functions This section contains an alphabetical listing of softkey and front-panel functions, and a brief description of each function.
Page 484 turns off the delta marker mode, so that the values displayed for the active marker are absolute values. establishes marker 1 as a reference. The active marker stimulus and response values are then shown relative to this delta reference. Once marker 1 hasbeen selected as the delta reference, the softkey label $ ,i&? ‘: i 1:: is underlined in this menu, and the marker menu is returned to the screen.
Page 485 calculates and displays the complex ratio of the signal at input A to the reference signal at input R. puts the name of the active entry in the display title. puts the active marker magnitude in the display title. selects coaxial as the type of port used in adapter removal calibration.
Page 486 (Option 085 only) allows you to set the value of the step attenuator that is located between the A coupler and A sampler. (Option 085 only) allows you to set the value of the step attenuator that is located between the B coupler and B sampler. turns the plotter auto feed function on or off when in the in the define print menu.
Page 487 is used to access three different noise reduction techniques: sweep-to-sweep averaging, display smoothing, and variable IF bandwidth. Any or all of these can be used simultaneously. Averaging and smoothing can be set independently for each channel, and the IF bandwidth can be set independently if the stimulus is uncoupled.
Page 488 accepts a calibration factor % for the segment. brings up the segment modify menu and segment edit (calibration factor menu) which allows you to enter a power sensor’s calibration factors The calibration factor data entered in this menu will be stored for power sensor A. sets the preset state of interpolated error-correction on or off.
Page 489 is used, along with the &GJ key, define the frequency range of the stimulus. When the 1Center) key is pressed, its function becomes the active function. The value is displayed in the active entry area, and can be changed with the knob, step keys, or numeric keypad.
Page 490 selects channel 3 memory trace for display color modification, selects channel 3 memory trace for printer color modification. selects channel 4 data trace for printer color modification. selects channel 4 data trace and limit line for display color modification. selects channel 4 memory trace for display color modification. selects channel 4 memory trace for display color modification.
Page 491 located under the (Menu) key, is the standard sweep mode of the analyzer, in which the sweep is triggered automatically and continuously and the trace is updated with each sweep. which converts brings up the conversion menu the measured data to impedance (Z) or admittance (Y). When a conversion parameter has been dellned, it is shown in brackets under the label reads .~~~~~~,;~~~~~.i.
Page 492 subtracts the memory from the data. The vector subtraction is performed on the complex data. This is appropriate for storing a measured vector error, for example directivity, and later subtracting it from the device measurement. stores the current active measurement data in the memory of the active channel.
Page 493 sets the limits an equal amount above and below a specified middle value, instead of setting upper and lower limits to set limits for testing a device that is ii ..i . . / . : . . : . : : ..specified at a particular value plus or minus an equal tolerance.
Page 494 run when the ‘b.0. ~~~~~. command is executed. This ... i ..; ; : . . . : . . . command prompts the operator to select a destination sequence position.
Page 495 adjusts the electrical delay to balance the phase of the DUT. It simulates a variable length lossless transmission line, which can be added to or removed from a receiver input to compensate for interconnecting cables, etc. This function is similar to the mechanical or analog “line stretchers”...
Page 496 supplies a name for the saved istate and or data file. Brings up the TITLE FILE MENU. provides access to the lile utilities menu. is used only with a polar or Smith format. It changes the auxiliary response value of the iixed marker. This is the second part of a complex data pair, and applies to a magnitude/phase marker, a real/imaginary marker, an R + jX marker, or a G + jB marker.
Page 497 initializes media in external drive, and formats the disk using the selected (DOS or LIF) format. clears all internal save registers and associated cal data and memory traces. (Option 089 only) leads to the frequency offset menu. (Option 089 only) switches the frequency offset mode on and O f f .
Page 498 (Option 010 only) allows you to specify the time at the center of the gate. (Option 010 only) allows you to specify the gate periods. (Option 010 only) allows you to specify the starting time of the gate. (Option 010 only) allows you to specify the stopping time of the gate.
Page 499 is used to select bandwidth value for IF bandwidth reduction. Allowed values (in Hz) are 3000, 1000, 300, 100, 30, and 10. Any other value will default to the closest allowed value. A narrow bandwidth slows the sweep speed but provides better signal-to-noise ratio.
Page 500 leads to a series of service tests. selects the analyzer internal disk for the storage device. selects internal non-volatile memory as the storage medium for subsequent save and recall activity. turns interpolated error correction on or off. The interpolated error correction feature allows the operator to calibrate the system, then select a subset of the frequency range or a different number of points Interpolated error correction functions in linear frequency, power sweep and CW time...
Page 501 If limit lines are on, they are plotted with the data on a plot, and saved in memory with an instrument state. In a listing of values from the copy menu with limit lines on, the upper limit and lower limit are listed together with the pass or fail margin, as long as other listed data allows sufficient space.
Page 502 turns limit testing on or off. When limit testing is on, the data is compared with the defmed limits at each measured point. Limit tests occur at the end of each sweep, whenever the data is updated, when formatted data is changed, and when limit testing is first turned on.
Page 503 provides a user-delinable arbitrary frequency list mode. This list is defined and modified using the edit list menu and the edit subsweep menu. Up to 30 frequency subsweeps (called “segments”) of several different types can be specified, for a maximum total of 1632 points One list is common to both channels.
Page 504 Two power sensor lists are provided because no single power sensor can cover the frequency range possible with an HP 8719D/20D/22D. selects low band as the calibration standard load. (Option 010 only) sets the transform to low pass impulse mode, which simulates the time domain response to an impulse input.
Page 505 waits for a manual trigger for each point. Subsequent pressing of this softkey triggers each measurement. The annotation “man” will appear at the left side of the display when the instrument is waiting for the trigger to occur. This feature is useful in a test sequence when an external device or instrument requires changes at each point.
Page 506 makes the reference value equal to the active marker’s response value, without changing the reference position. In a polar or Smith chart format, the full scale value at the outer circle is changed to the active marker response value. This changes the start and stop values of the stimulus span to the values of the active marker and the delta reference marker.
Page 507 couples the marker stimulus values for the two display channels. Even if the stimulus is uncoupled and two sets of stimulus values are shown, the markers track the same stimulus values on each channel as long as they are within the displayed stimulus range.
Page 508 is used to define the lowest frequency at which a calibration kit standard can be used during measurement calibration. In waveguide, this must be the lower cutoff frequency of the standard, so that the analyzer can calculate dispersive effects leads to the marker search menu, which is used to search the trace for a particular value or bandwidth.
Page 509 is used to select the number of data points per sweep to be measured and displayed. Using fewer points allows a faster sweep time but the displayed trace shows less horizontal detail. Using more points gives greater data density and improved trace resolution, but slows the sweep and requires more memory for error correction or saving instrument states.
Page 510 leads to the series of menus used to perform a high-accuracy two-port calibration without an S-parameter test set. This calibration procedure effectively removes directivity, source match, load match, isolation, reflection tracking, and transmission tracking errors in one direction only. Isolation correction can be omitted for measurements of devices with limited dynamic range.
Page 511 when editing a sequence, ~~~~~~.~~~~.;.~~~~;. appears when you the menu of up to 6 available sequences (softkeys containing non-empty sequences). The message “CHOOSE ONE OF THESE SEQUENCES” is displayed and the present sequence is stopped. If the operator selects one of the sequences, that sequence is executed.
Page 512 specifies whether the memory trace is to be drawn (on) or not drawn (off) on the plot. Memory can only be plotted if it is displayed (refer to “Display Menu” in Chapter 6). specifies whether the markers and marker values are to be drawn (on) or not drawn (off) on the plot.
Page 513 allows you to set different power levels at each port. makes power level the active function and sets the RF output power level of the analyzer’s internal source. The analyzer will detect an input power overload at any of the three receiver inputs, and automatically reduce the output power of the source to below -65 dBm.
Page 514 when displaying list values, prints the entire list in color. When displaying operating parameters, prints all but the last page in color. The data is sent to the printer as ASCII text rather than as raster graphics, which causes the printout to be faster. when displaying list values, prints the entire list in monochrome.
Page 515 This is the default Smith chart marker. The power ranges for instruments equipped with Option 007 will be shifted 5 dB higher. (HP 8719D/20D) selects power range 0 when in manual power range. (HP 8719DI20D) selects power range 1 when in manual power range.
Page 516 (HP 8722D) selects power range 7 when in manual power range. (HP 8722D) selects power range 8 when in manual power range. (HP 8722D) selects power range 9 when in manual power range. (HP 8722D) selects power range 10 when in manual power range.
Page 517 displays only the real (resistive) portion of the measured data on a Cartesian format. This is similar to the linear magnitude format, but can show both positive and negative values. It is primarily used for analyzing responses in the time domain, and also to display an auxiliary input voltage signal for service purposes.
Page 518 coefficient (magnitude and phase) of the test device input. defines the measurement as $2, the complex reflection coefficient (magnitude and phase) of the output of the device under test. measures the reflection and thru paths of the current calibration standard. leads to the reflection calibration menu.
Page 519 eliminates the need to restart a calibration sequence that was interrupted to access some other menu. This softkey goes back to the point where the calibration sequence was interrupted. measures the reverse isolation of the calibration standard. lets you enter a label for the reverse match class. The label appears during a calibration that uses this class.
Page 520 provides a measurement calibration for reflection-only measurements of one-port devices or properly terminated two-port devices, at port 2 of an S-parameter test set or the test port of a transmission/reflection test set. is used to enter the standard numbers for the first class required for an &Z l-port calibration.
Page 521 makes scale per division the active function. A menu is displayed that is used to modify the vertical axis scale and the reference line value and position. In addition this menu provides electrical delay offset capabilities for adding or subtracting linear phase to maintain phase linearity. searches the trace for the next occurrence of the target value to the left.
Page 522 activates editing mode for the segment titled “SEQ3” (default title). activates editing mode for the segment titled “SEQ4” (default title). activates editing mode for the segment titled “SEQ5” (default title). activates editing mode for the segment titled “SEQ6” (default title). accesses a lllenaming menu which is used to automatically increment or decrement the name of a i#e that is generated by the network analyzer during a sequence.
Page 523 sets up, ,a two-graticule, four-channel display as described in the menu. Refer to Figure 6-25. sets up single~graticule, four-channel display as described in the sets up four-graticule, four-channel display as described in the sets up a two-graticule, four-channel display as described in the sets up a three-graticule, three-channel display as described in the ~~~~~~~“~~~~ menu.
Page 524 displays a Smith chart format. This is used in reflection measurements to provide a readout of the data in terms of impedance. leads to a menu of special markers for use with a Smith chart format. lets you change the value of the smoothing aperture as a percent of the span.
Page 525 toggles between a full-screen single-graticule display of one or both primary channels, and a split display with two half-screen graticules one above the other. SI?LIT,,@E$P o@~&WE.: interacts is used to define the start frequency of a frequency range. When the m key is pressed it becomes the active function. The value is displayed in the active entry area, and can be changed with the knob, step keys, or numeric keypad.
Page 526 defines the standard type as an open used for calibrating reflection measurements. Opens are assigned a terminal impedance of infinite ohms, but delay and loss offsets may still be added. Pressing this key also brings up a menu for de&ring the open, including its capacitance.
Page 527 is the mode used when peripheral devices are to be used and there is no external controller. In this mode, the analyzer can directly control peripherals (plotter, printer, disk drive, or power meter). System controller mode must be set in order for the analyzer to access peripherals from the front panel to plot, print, store on disk, or perform power meter functions, if there is no other controller on the bus.
Page 528 is used to specify the (arbitrary) impedance of the standard, in is used to set configurations before running the service tests. is used to direct the RF power to port 1 or port 2. (For non-S parameter inputs only.) is used to support specialized test sets, such as a testset that measures duplexers.
Page 529 moves the title string data obtained with the numeric, reads the numeric value, and then discards everything else. The number is converted into analyzer internal format, and is placed into the real portion of the memory trace at: Display point = total points - 1 - loop counter If the value of the loop counter is zero, then the title number goes in the last point of memory.
Page 530 transmission coefficient (magnitude and phase) of the test device. transmission coefficient (magnitude and phase) of the test device. (Option 010 only) leads to a series of menus that transform the measured data from the frequency domain to the time domain. (Option 010 only) switches between time domain transform on and off.
Page 531 Refer to the “HP-IB Programming Reference” and “HP-IB Programming Examples” chapters in the HP 8719D/%ID/22D Network Analyzer Progmmmer’s Guide more information. In general, use the talker/Iistener mode for programming the analyzer unless direct peripheral access is required.
Page 532 toggles to become view setup when the analyzer is in frequency offset mode. specifies the number of the disk volume to be accessed. In general, all 3.5 inch floppy disks are considered one volume (volume 0). For hard disk drives, such as the HP 9153A (Winchester), a switch in the disk drive must be set to defme the number of volumes on the disk.
Page 533 search turns on the bandwidth feature and calculates the center stimulus value, bandwidth, and Q of a bandpass or band reject shape on the trace. The amplitude value that defines the Four markers are turned on, and each has a dedicated use. Marker 1 is a starting point from which the search is begun.
Page 534 Cross Reference of Key Function to Programming Command The following table lists the front-panel keys and softkeys alphabetically. The “Command” column identifies the command that is similar to the front-panel or softkey function. Softkeys that do not have corresponding programming commands are not included in this se&ion. Command Step Up Step Down...
Page 535 Cross Reference of Key Function to Programming Co mmand (continued) Analog Bus On ANAI Analog In Arbitrary Impedance STDTARBI Save ASCII Format SAVUASCI Service Request ASSS Attenuator A Attenuator B Plotter Auto Feed On Plotter Auto Feed Off Printer Auto Feed On PRNTRAUTFON Printer Auto Feed Off PRNTRAUTOFF...
Page 536 Cross Reference of Key Function to Programming Co mmand (continued) Name Command Calibrate Calibration Factor Calibration Factor Sensor A CALPSENA Calibration Pactor Sensor B CALFSENB TRL 3.5mm Calibration Kit CALKTRLK Type-N 509 Calibration Kit Type-N 750 Calibration Kit User Calibration Kit CALKUSED line impedance CALZINE...
Page 538 Cross Reference of Key Function to Prog ramming command (continued) Data Minus Memory DISPDMM Data to Memory DATI Data Only On EXTMDATOON Data Only Off EXTMDATOOFF Decrement Loop Counter DECRLOOC Default Colors DEFC Default Plot Setup DFLX Default Print Setup DEFLPRINT DEFS Delay...
Page 539 Cross Reference of Key Function to Programming Co mmand (continued) Calibrate Each Sweep PWMCEACS Edit SEDI Edit Limit Line EDITLIML Edit List Electrical Delay ELED Emit Beep EMIB End Sweep High Pulse End Sweep Low Pulse Entry Off External R Channel EXTRCHAN External Trigger on Point External Trigger on Sweep...
Page 540 Cross Reference of Key Function to Prog ramming co mmand (continued) Name Frequency Offset On FREQOFFSON Frequency Offset Off FREQOFFSOFF Frequency CALFFREQ Frequency Blank FREO Full 2-Port Full Page FULP FWDI Forward Isolation Label Forward Match LABEFWDM Specify Forward Match SPECFWDM Forward Match Thru FWDM...
Page 541 Cross Reference of Key Function to Programming Command (continued) Name HP-IB Diagnostics Off DEBUOFF IF Bandwidth If Limit Test Fail If Limit Test Pass IF Loop Counter = 0 IF Loop < > Counter 0 IFLCNEZE Imaginary IMAG Increment Loop Counter INCRLOOC Intensity INTE...
Page 542 Cross Reference of Key Function to Programming Co mmand (continued) Line/Match 1 LO Frequency LOFREQ Load STDTLOAD Load No Offset LOAN Load Offset LOAO Load Sequence From Disk Logarithmic Frequency LOGFREQ Logarithmic Magnitude LOGM Logarithmic Marker SMIMLOG Loop Counter Loss Low Band STANC LOWPIMPU...
Page 543 Cross Reference of Key Function to Prog rununing co mmand (continued) Markers Continuous MARKCONT Markers Coupled Markers Discrete Markers Uncoupled MARKUNCO Maximum Frequency Measure MENUMEAS Measure Restart REST Memory DISPMEMO Middle Value LIMM Minimum Minimum Frequency MINF Search Off Marker Marker Zero Modify Kit Network Analyzer...
Page 544 Cross Reference of Key Function to Programm’ mg Command (continued) Name Set parallel port to copy mode Set parallel port to GPIO mode Parallel Out All PARAOUT Pause Pause to Select Pen Number Data Pen Number Graticule PENNGRAT Pen Number Marker Pen Number Memory Pen Number Text Phase...
Page 545 Cross Reference of Key Function to Programming Command (continued) Name Printer Polar Port Power Coupled PORTPCPLD Port Power Uncoupled PORTPUNCPLD Power POWE Power Meter Power Meter 436A POWMON Power Meter 437B/438A POWMOFF Power Ranges PWRR Power Sweep POWS Factory Preset PRES Factory Preset PRES...
Page 546 Cross Reference of Key Function to Prog ramming Command (continued) Name Command Power Range Auto PWRRPAUTO Power Range Man PWRRPMAN Power Meter Calibration Power Meter Calibration Off Measure Channel R MEASR R + jX Marker Readout Power Range 0 Power Range 1 Power Range 2 Power Range 3 Power Range 4...
Page 547: Response
Cross Reference of Key Function to Programming Command (continued) Name Command Real REAL Recall Cal Port 1 Recall Cal Port 2 Recall Colors RECO Recall Register 1 Recall Register 2 Recall Register 3 Recall Register 5 Recall Register 6 Recall Register 7 Receiver Calibration REIC Reference Line...
Page 548 Cross Reference of Key Function to Prog ramming co mmand (continued) Name Command (Label Class) Label Reverse Match LABEREVM LABE’ITRM Specify Reverse Match SPECREVM Reverse Match Thru REVM Label Reverse Transmission LABEREVT Specify Reverse Transmission SPECREVT Reverse Transmission Thru REVT RF Greater Than LO RF Less Than LO Right Lower...
Page 549 Cross Reference of Key Function to Programm’ mg Caunumd (continued) Name Command LABETLRM SPECTLRM LABETLRT SPECTLRT Save Colors svco Save User Kit SAVEUSEK Save Using Binary SAVUBINA Scale/Division Scale Plot Full SCAPFULL Scale Plot Graticule SCAPGRAT Search Left SEAL Search Right SEAR Search Maximum Search Minimum...
Page 550 Cross Reference of Key Function to Programming (hunand (continued) Name Command Select Sequence 6 Select Sequence 1 to Title Select Sequence 2 to Title Select Sequence 3 to Title Select Sequence 4 to Title Select Sequence 5 to Title Select Sequence 6 to Title Set Bit Set Date Set Frequency Low Pass...
Page 551 Cross Reference of Key Function to Programming Co mmand (continued) Name Command Split Display Off SPLDOFF One-Graticule Display Two-Graticule Display Four-Graticule Display MEASTATON Statistics On Statistics Off MEASTATOFF Standard Done STDD Standard Type: Arbitrary Impedance STDTARBI Standard Type: Delay/Thru STDTDELA STDTLOAD Standard Type: Load STDTOPEN...
Page 552 Cross Reference of Key Function to Programming Co mmand (continued) Name Command TSTIOREV TSSWI COLOTEXT Print Color - Text Time Stamp On TIMESTAMON Time Stamp Off TIMESTAMOFF TINT Title TITL Title File 1 Title File 2 Title File 3 Title File 4 Title File 5 Title Sequence Title to Memory...
Page 553 Cross Reference of Key Function to Prog rammingco nuuand (continued) Name TRL Line or Match SPECTRLL (Specify Class) TRL Line or Match LABETRLL ..i i; :: (Label Class) (Specify Class) (Label Class) TRL Reflect SPECTRLR (Specify Class) TRL Reflect...
Page 554 Cross Reference of Key Function to Prog ramming Command (continued) Name Command Widths Off WIDTOFF Window WINDOW Window Maximum Window Minimum Window Normal Transmit Control (printer) PRNHNDSHKXON Transmit Control (printer) PRNHNDSHKDTR Transmit Control (plotter) Transmit Control (plotter) CONVYREF CONVYTRA YELLOW Yellow Z: Reflection CONVZREF...
Page 555 The following table lists the softkey functions alphabetically, and the corresponding front-panel access key. This table is useful in determining which front-panel key leads to a specific softkey. Front-Panel Access Key...
Page 556 Front-Panel Access Key Key Definitions 9-75...
Page 557 9.76 Key Definitions...
Page 558 Front-Panel Access Key Key Definitions D-77...
Page 559 Key Definitions...
Page 560 Key Definitions...
Page 562 Access Key Key Definitions 841...
Page 563 Definitions...
Page 564 Front-Panel Access Key ...., , ../ i ::. : / <: . ; . : ..Key Definitions 8-83...
Page 565 Front-Panel Access Key Key Definitions...
Page 566 Key Definitions...
Page 567 Kay Definitions...
Page 568 Key Definitions...
Page 569 Front-Panel Access Key Key Definitions...
Page 570 Front-Panel Access Key Key Definitions 8-88...
Page 571 Front-Panel Access...
Page 572 Front-Panel Key Definitions 8-8 1...
Page 573 Front-Panel Access Key...
Page 574 Error Messages This chapter contains the following information to help you interpret any error messages that may be displayed on the analyzer LCD or transmitted by the instrument over HP-IB: An alphabetical listing of all error messages, including: An explanation of the message Suggestions to help solve the problem A numerical listing of all error messages Note...
Page 575 Error Messages in Alphabetical Order Error Number This message is displayed if you pressed Then you can enable an auxiliary channel. ABORTING COPY OUTPUT Information This message is displayed briefly if you have pressed ILocal) to abort a copy operation. If the message is not subsequently replaced by error message Message number 25, PRINT ABORTED, the copy device may be hung.
Page 576 ANALOG INPUT OVERLOAD Error Number The power level of the analog input is too high. Reduce the power level of the analog input source. ANOTHER SYSTEM CONTROLLER ON HP-IB BUS Error Number You must remove the active controller from the bus or the controller must relinquish the bus before the analyzer can assume the system controller mode.
Page 577 Error Number The battery protection of the non-volatile CMOS memory has failed. The CMOS memory has been cleared. Refer to the HP 8719D/ZOD&?2D Network Anulgm State and Memory Allocation, n for more information about the CMOS memory. BATTERY LOW! STORE SAVE REGS TO DISK Error Number The battery protection of the non-volatile CMOS memory is in danger of failing.
Page 578 CALIBRATION REQUIRED Error Number A calibration set could not be found that matched the current stimulus state or measurement parameter. You will have to perform a new calibration. CANNOT FORMAT DOS DISKS ON THIS DRIVE Error Number You have attempted to initialize a floppy disk to DOS format on an external disk drive that does not support writing to aII 80 tracks of the double density and high density disks.
Page 579 Check to see if the power level you set is within specifications. If it is, refer to the HP 8719D/2OD’22D Network Analpm Semvice Error Number Your target value for the marker search function does not exist on the current data trace.
Page 580 A9 CPU assembly. Refer to the “A9 CC Jumper Position Procedure” in the “Adjustments and Correction Constants” chapter of HP 8719D/2OD/22D Network Anulgzer Semrice Guide. CORRECTION ON: AUXCHANNEL(S) REESTORED Error Number This message is displayed when a calibration is restored and that calibration previously had one or both auxiliary channels enabled.
Page 581 Error Number There is no room left in the directory to add liles. Either delete files or get a new disk. DISK HARDWARE PROBLEM Error Number The disk drive is not responding correctly. Refer to the HP 8719D/2OD/22D Network Anulgzer external disk drive, refer to the disk drive operating manual.
Page 582 DISK IS WRITE PROTECTED Error Number The store operation cannot write to a write-protected disk. Slide the write-protect tab over the write-protect opening in order to write data on the disk. DISK MEDIUM NOT INITIALIZED Error Number You must initialize the disk before it can be used. DISK MESSAGE LENGTH ERROR Error Number The analyzer and the external disk drive aren’t communicating properly.
Page 583 DOS NAME LIMITED TO 8 CHARS+ 3 CHAR EXTENSION Error Number A DOS me name must meet the following criteria: minimum of 1 character format is filenarne.ext maximum of 8 characters in the filename maximum of 3 characters in the extension field (optional) a dot separates the filename from the extension field (the dot is not part of the name on the disk) DUPLICATING TO THIS SEQUENCE NOT ALLOWED...
Page 584 FILE NOT COMPATIBLE WITH INSTRUMENT Information You cannot recall user graphics that had been saved on an earlier model of Message analyzer with a monochrome display. These hles cannot be used with the HP FILE NOT FOUND Error Number The requested file was not found on the current disk medium. FILE NOT FOUND OR WRONG TYPE Error Number During a resave operation, either the file was not found or the type of file was not an instrument state file.
Page 585 FUNCTION NOT AVAILABLE Error Number The function you requested over HP-IB is not available on the current instrument. FUNCTION NOT VALID Error Number The function you requested is incompatible with the current instnmrent state. FUNCTION NOT VALID DURING MOD SEQUENCE Error Number You cannot perform sequencing operations while a sequence is being modified.
Page 586 HPIB COPY IN PROGRESS, ABORT WITH LOCAL Error Number An HP-IB copy was already in progress when you requested the HP-IB for another function. lb abort the first copy, press LLocal), otherwise the HP-IB is unavailable until the ilrst copy is completed. ILLEGAL UNIT OR VOLUME NUMBER Error Number The disk unit or volume number set in the analyzer is not valid.
Page 587 INSUFFICIENT MEMORY, PWR MTR CAL OFF Error Number There is not enough memory space for the power meter calibration array. Increase the available memory by clearing one or more save/recall registers, or by reducing the number of points. INVALID KEY Error Number You pressed an undefined softkey.
Page 588 Error Number The Rrst IF signal was not detected during pretune. Check the front panel R channel jumper. If there is no visible problem with the jumper, refer to the HP 8719D/2OD/22D Network Armlgm Semrice NO LIMIT LINES DISPLAYED Error Number You can turn limit lines on but they cannot be displayed on polar or Smith chart display formats.
Page 589 NO MARKER DELTA -SPANNOT SET Error Number You must turn the delta marker mode on, with at least two markers displayed, in order to use the .EIAXl%lt -> MEMORY AVAILABLE INTERPOLATION Error Number You cannot perform interpolated error correction due to insufficient memory. NO MEMORY AVAILABLE FOR SEQUENCING Error Number You cannot modify the sequence due to insufficient memory.
Page 590 Error Number You have requested the analyzer, over HP-IB (or by sequencing), to load an instrument state from an ernptg internal register. Error Number You can only use alpha-numeric characters (and underscores) in disk file titles or internal save register titles. Other symbols are not allowed, except for the “underscore”...
Page 591 PHASE LOCK FAILURE Error Number The first IF signal was detected at pretune, but phase lock could not be acquired. Refer to the HP 8719D/ZOD&?ZD Network Aruzlgm Service Guide troubleshooting. PHASE LOCK LOST Error Number Phase lock was acquired but then lost. Refer to the...
Page 592 POWER METER NOT SETTLED Error Number Sequential power meter readings are not consistent. Verify that the equipment is set up correctly. If so, preset the instrument and restart the operation. POWER SUPPLY HOT! Error Number The temperature sensors on the A8 post-regulator assembly have detected an over-temperature condition.
Page 593 PRINTER: not connected Error Number There is no printer connected to the parallel port. PRINTER: not handshaking Error Number The printer at the parallel port is not responding. PRINTER: not online Error Number The printer at the parallel port is not set on line. Error Number The printer does not respond to control.
Page 594 Service Error Internal test #‘n has failed. Several internal test routines are executed at Number 112 instrument preset. The analyzer reports the hrst failure detected. Refer to the HP 8719D/.ZOD/ZZD Network An.algz.er information on internal tests and the self-diagnose feature.
Page 595 SEQUENCE MAY HAVE CHANGED, CAN'T CONTINUE Error Number When you pause a sequence, you cannot continue it if you have modified it. You must start the sequence again. SLIDES ABORTED (MEMORY REALLOCATION) Error Number You cannot perform sliding load measurements due to insufficient memory. Increase the available memory by clearing one or more save/recall registers and pressing B), or by storing files to a disk.
Page 596 SWEEP TIME TOO FAST Error Number The fractional-N and digital IF circuits have lost synchronization. Refer to the HP 8719D/ZOD/ZZD Network Anulgzer Service information. SWEEP TRIGGER SET TO HOLD Information The instrument is in a hold state and, is no longer sweeping. lb take a new Message sweep, press LMenu) TRJTGGER MEHU SI$lG*~ or ~~~~~~~~~.
Page 597 TROUBLE! CHECK SETUP AND START OVER Service Error Your equipment setup for the adjustment procedure in progress is not correct. Number 115 Check the setup diagram and instructions HP 8719D/ZOD/ZZD N&work WAITING FOR CLEAN SWEEP Information In single sweep mode, instrument ensures that all changes to the instrument state, if any, have been implemented before taking the sweep.
Page 598 WAITING FOR HP-IB CONTROL Information You have instructed the analyzer to use pass control (USEPASC). When you send the analyzer an instruction that requires active controller mode, the Message analyzer requests control of the bus and simultaneously displays this message. If the message remains, the system controller is not relinquishing the bus.
Page 599 Error Messages in Numerical Order Refer to the alphabetical listing for explanations and suggestions for solving the problems. Error Error Number OPTIONAL FUNCTION; NOT INSTALLED INVALID KEY CORRECTION CONSTANTS NOT STORED PHASE LOCK CAL FAILED NO IF FOUND: CHECK R INPUT LEVEL POSSIBLE FALSE LOCK PHASE LOCK FATLURE PHASE LOCK LOST...
Page 600 Error Error Number REQUESTED DATA NOT CURRENTLY AVAILABLE I WRITE AlTEMPTED WITHOUT SELECTING INPUT. TYPE SYST CTRL OR PASS CTRL IN LOCAL MENU ANOTHER SYSTEM CONTROLLER ON HP-IB BUS DISK HARDWARE PROBLEM DISK MEDIUM NOT INITIALIZED NO DISK MEDIUM IN DRIVE FIRST CHARACTER MUST BE A LETTER INITIALIZATION FATLED DISK IS WRITE PROTECTED...
Page 601 Error Error Number PLOTTER NOT READY-PINCH WHEELS UP REQUESTED DATA NOT CURRENTLY AVAILABLE ADDRESSED TO TALK WITH NOTHING TO SAY WRITE ATTEMPTED WITHOUT SELECTING INPUT TYPE SYNTAX ERROR BLOCK INPUT ERROR BLOCK INPUT LENGTH ERROR SYST CTRL OR PASS CTRL IN LOCAL MENU ANOTHER SYSTEM CONTROLLER ON HP-IB BUS DISK: not on, not connected, wrong addrs DISK HARDWARE PROBLEM...
Page 602 Error Error Number HP 8720 SOURCE PARAMETERS CHANGED CALIBRATION REQUIRED CURRENT PARAMETER NOT IN CAL SET CORRECTION AND DOMAIN RESET CORRECTION TURNED OFF DOMAIN RESET ADDITIONAL STANDARDS NEEDED NO CALIBRATION CURRENTLY IN PROGRESS NO SPACE FOR NEW CAL. CLEAR REGISTERS EXCEEDED 7 STANDARDS PER CLASS SLIDES ABORTED (MEMORY REALLOCATION) FORMAT NOT VALID FOR MEASUREMENT...
Page 603 Error Error Number NO MEMORY AVAILABLE FOR SEQUENCING CAN’T STORE/LOAD SEQUENCE, INSUFFICIENT MEMORY FUNCTION NOT VALID DURING MOD SEQUENCE MEMORY FOR CURRENT SEQUENCE IS FULL THIS LIST FREQ INVALID FREQ OFFSET ONLY VALID IN NETWORK ANALYZER MODE not used NO LIMIT LINES DISPLAYED LOG SWEEP REQUIRES 2 OCTAVE MINIMUM SPAN SAVE FAILED / INSUFFICIENT MEMORY PARALLEL PORT NOT AVAILABLE FOR COPY...
Page 604 PRINTER: error PRINTER: busy BAD FREQ FOR HARMONIC OR FREQ OFFSET ASCII: MISSING ‘BEGIN’ statement ASCII: MISSING ‘CITIFILE’ statement ASCII: MISSING ‘DATA’ statement ASCII: MISSING ‘VAR’ statement 1030 Error Messages...
Page 605 Error Error Number CORRECTION ON: AUX CHANNEL(S) RESTORED CORRECTION OFF: AUX CHANNEL(S) DISABLED AUX CHANNELS MEASURE S-PARAMETERS ONLY Error Messages 1 O-3 1...
Page 606 Compatible Peripherals This chapter contains the following information: Measurement Accessories Available System Accessories Available Connecting and Conllguring Peripherals HP-IB Programming Overview Where to Look for More Information Additional information about many of the topics discussed in this chapter is located in the following areas: Chapter 2, “Making Measurements,”...
Page 607 3.5 inch disk, together with a hard-copy listing. A system verification procedure is provided with these kits and also in HP 8719D/ZOD/ZZD Network Anulgzer Semrice Guide. HP 85057B 2.4~mm Verification Kit HP 85053B 3.5~mm Verification Kit HP 85051B 7-mm Verification Kit...
Page 608 HP 85130B Special 3.5~mm to 7-mm Adapter Set This set converts the 3.5~mm test ports of the HP 8719D/20D to a 7-mm connector interface. HP 85130C Special 3.5~mm to Type-N Adapter Set This set converts the 3.5~mm test ports of the HP 8719D/20D to a Type-N connector...
Page 609 Transistor Test Fixtures The following Hewlett-Packard transistor test fixture is compatible with the HP 8719D/20D/22D. Additional test fixtures for transistors and other devices are available from Inter-Continental Microwave. ‘Ib order their catalog, request HP literature number 5091-4254E. Or contact Inter-Continental Microwave as follows:...
Page 610 Bias Networks The following bias networks can be used to supply DC bias to the center conductor of a coaxial line which can to a device under test. The bias network also provides a DC block to the RF input ports. HP 11590B This bias network uses Type-N connectors and can supply a maximum current of 0.5 A from 100 MHz to 12.4 GHz.
Page 611 System Accessories Available System Cabinet The HP 85043D system cabinet is designed to rack mount the analyzer in a system configuration. The 132 cm (52 in) system cabinet includes a bookcase, a drawer, and a convenient work surface. System Testmobile The HP 1181A system testmobile is designed to provide mobility for instruments, test systems, and work stations.
Page 612 Using the internal disk drive is the preferred method, but the capability of previous generation HP 8719/20/22 network analyzers to use external disk drives still exists with the HP 8719D/20D/22D. Most external disks using CS80 protocol are compatible. Note The analyzer does not support the LIF-1 (hierarchy file system) directory format.
Page 613 HP BASIC versions 2.0 and later, QuickBasic, and QuickC, and will nm on an IBM PC compatible computer (as well as the HP 9000 series 200/300/700 workstations), using any HP 8719D/20D/22D compatible printer or plotter. The following additional software products are also available for the HP 8719D/20D/22D: HP 85190A IC-CAP Modelling Suite Touchstone...
Page 614 External Monitor Requirements: VGA Compatible 640 (horizontal) x 480 (vertical) resolution 59.83 Hz vertical refresh rate 16.716 mS vertical time 31.840 PS horizontal time 75 ohm video input impedance video analog amplitude 0.7 Vp-p negative true TI’L logic for vertical and horizontal synchronization Compatible Peripherals 1 l-9...
Page 615 Connecting Peripherals Connecting the Peripheral Device Connect the peripheral to the corresponding interface port. Parallel HP 922s4A HP 245420 HP-IB HP 10833AMD Figure 1 l-l. Peripheral Connections to the Analyzer Note The keyboard can be connected to the analyzer while the power is on or off. 1 l-l 0 Compatible Peripherals...
Page 616 Configuring the Analyzer for the Peripheral All copy configuration settings are stored in non-volatile memory. Therefore, they are not affected if you press Ipreset) or switch off the analyzer power. If the Peripheral Is a Printer Press ../ ..: s . . . Note Selecting $$%&...
Page 617 If the Peripheral Is a Power Meter HP 436A HP 437B or 438A If the Peripheral Is an External Disk Drive where you want to store the instrument state file. If the Peripheral Is a Computer Controller Analyzer configuration is not necessary. 11-12 Compatible Peripherals...
Page 618 Configuring the Interface Port If the Peripheral Interface Is HP-IB 1. Select the softkey that corresponds to the peripheral: Choose I%FlX ~$WRT ljPIB for a printer...., . . , ..i .i Choose P&XI%.
Page 619 If the Peripheral Interface Is Serial 3. Select the transmission control method that matches the peripheral setup, by pressing . If you choose .3. z. . . : . . : . /..: .:..’ exchange sequence by telling the analyzer when it has room in its buffer for data and when to stop the data flow.
Page 620 Configuring the Analyzer to Produce a Time Stamp You can set a clock, and then activate it, if you want the time and date to appear on your hardcopies. Press ..~~~~~~~~~~ when the current time is exactly as you have set it. until Compatible Peripherals 1 l-15...
Page 621 HP-IB Programming Overview The analyzer is factory-equipped with a remote progr arnming digital interface using the Hewlett-Packard Interface Bus (HP-IB). HP-IB is Hewlett-Packard’s hardware, software, documentation, and support for IEEE 488.1 and IEC-625, worldwide standards for interfacing instruments. The HP-IB lets you control the analyzer with an external computer that sends commands or instructions to and receives data from the analyzer.
Page 622 HP-IB Operation The Hewlett-Packard Interface Bus (HP-IB) is Hewlett-Packard’s hardware, software, documentation, and support for IEEE 488.2 and IEC-625 worldwide standards for interfacing instruments. This interface allows you to operate the analyzer and peripherals in two methods: by an external system controller by the network analyzer in system-controller mode Device Types The HP-IB employs a party-line bus structure in which up to 15 devices can be...
Page 623: Hp-Ib Bus Structure
HP-IB Bus Structure A b l e t o talk HANDSHAKE LINES D a t a B y t e T r a n s f e r ( 3 s i g n a l l i n e s ) Figure 11-2.
Page 624 The active controller uses this line to define whether the information on the data bus is command-oriented or data-oriented. When this line is true (low), the bus is in the command mode, and the data lines carry bus commands. When this line is false (high), the bus is in the data mode, and the data lines carry device-dependent instructions or data.
Page 625 HP-IB Operational Capabilities On the network analyzer’s rear panel, next to the HP-IB connector, there is a list of HP-IB device subsets as defined by the IEEE 488.2 standard. The analyzer has the following capabilities: Pull-source handshake. Pull-acceptor handshake. Basic talker, answers serial poll, unaddresses if MLA is issued. No talk-only mode. Basic listener, unaddresses if MTA is issued.
Page 626 HP-IB Status Indicators When the analyzer is connected to other instruments over the HP-IB, the HP-IB status indicators illuminate to display the current status of the analyzer. The HP-IB status indicators are located in the instrument-state function block on the front panel of the network analyzer. R = Remote Operation L = Listen mode T = lhlk mode...
Page 627 System-Controller Mode This mode allows the analyzer to control peripherals directly in a stand-alone environment (without an external controller). This mode can only be selected manually from the analyzer’s front panel. It can only be used if no active computer or instrument controller is connected to the system via HP-IB.
Page 628 Note There is also an address for the system controller. This address refers to the controller when the network analyzer is being used in pass-control mode. This is the address that control is passed back to when the analyzer-controlled operation is complete. Analyzer Command Syntax Code Naming Convention The analyzer HP-IB commands are derived from their front-panel key titles (where possible),...
Page 629 Convention For BP-IB Code Use Example One Word Power POWE start Two Words Electrical Delay of Second Word Search Right Two Words in a Group Marker -4enter Four Letters of Both Gate -&pan Three Words First Three Lett.e~~ of First Word, First Letter CALKN50 of Second Word, First Four Letters of Third Word Pen Num Data...
Page 630 HP-IB commands across the display. Nonprintable characters are represented with a ?r. Any time the analyzer receives a syntax error, the commands halt, and a pointer indicates the misunderstood character. See the HP 8719D/ZOD/ZZD Network Aruzlgzer Programmer’s programming syntax. Compatible Peripherals 1 l-25...
Page 631 Preset State and Memory Allocation The analyzer is capable of saving complete instrument states for later retrieval. It can store these instrument states into the internal memory, to the internal disk, or to an external disk. This chapter describes these capabilities in the following sections: instrument state definition memory allocation internal and external data storage...
Page 632 Non-Volatile Memory This is CMOS read/write memory that is protected by a battery to provide storage of data when line power to the instrument is turned off. With this battery protection, data can be retained in memory for ~250 days at 70° C and for ~10 years at 25O C (characteristically). Non-volatile memory consists of a block of user-allocated memory and a block of fixed memory.
Page 633 of 2MBytes available. (For information on special option H02, which increases the amount of available memory to 2 MB, contact your HP sales associate.) If you have deleted registers since the last time the instrument was preset, the bytes available for you to use may be less than the actual “bytes free”...
Page 634 The analyzer attempts to allocate memory at the start of a calibration. If insufficient memory is available, an error message is displayed. It is possible that the CMOS memory might be fragmented due to the sequence of saving and deleting states of various sizes. So another alternative would be to store the current state to disk and then press w.
Page 635 Definition Definition Instrument state1 Four-channel instrument state Graphics Display graphics Graphics index Channel 1 Error corrected data Channel 2 Channel 3 Channel 4 Channel l/3, raw arrays 1 to 42 Raw data Channel 2/4, raw arrays 6 to 8 Formatted data Channel 1 Channel 2 Channel 3...
Page 636 7, “Specifications and Measurement Uncertainties,” for allowable temperature ranges for individual specifications The HP 8719D/20D/22D can read disk files created by the HP 8719A/20A/22A and the HP 8719A/20A/22A can read 6les created by the HP 8719D/20D/22D. A disk file translator is available to make HP 8719C/2OC/22C disk flies compatible with HP 8719A/20A/22A ties.
Page 637 Preset State When the B key is pressed, the analyzer reverts to a known state called the factory preset state. This state is defined in ‘lhble 12-3. There are subtle differences between the preset state and the power-up state. These differences are documented in ‘l’hble 12-4. If power to non-volatile memory is lost, the analyzer will have certain parameters set to default settings.
Page 638 Preset Ckmditions Preset Preset Value Preset Conditions Start Power Analyzer Mode (HP 8719D/20D, Opt. 007) Analyzer Mode Network Analyzer Mode Start Power -20.0 dBm Frequency Offset (HP 8719D/20D, Opt. 400) Start Power -20.0 (HP 8722D) High Power (Opt. 085) Start Power -15.0 dBm...
Page 639 0 Hz Marker stimulus Offset 10 dB/Division Marker Value Offset Marker Aux Offset (Phase) 0 Degrees None Smith Marker R+jX Mkr 3.5 mm HP 8719D/20D) 2.4 mm Lines Limit HP 8722D) Upper/Lower Limita Port 1 Port 2 Amplitude Offset Input A...
Page 640 Preset Conditions Preset Value Preset Conditions Preset Value Time Domain Disk Save Conflgnration Transform (Define Store) Transform Type Data Array start Transform -1 nanosecond Raw Data Array nanoseconds Formatted Data Array Graphics Gate Shape Normal Data Only Gate Start -500 picoseconds Directory Size Gate stop 500 picoseconds...
Page 641 Preset Conditions Preset Value Preset Conditions Preset Value Pen Number: Print Printer Mode Last Active State Auto-Feed Printer Colors Green Blue line Type: Graticule Warning Black Text Black Reference Line Black Reference Scale Position 10.0 Phase (degree) 90.0 Group Delay (ns) 10.0 1.00 Smith Chart...
Page 642 HP 8719D/20D/22D ........
Page 643 The CITIfile Data Format and Keyword Reference This appendix contains the following information: The CITIllle Data Format Description and Overview Definition Of CITIfile Terms The CI’IUle Keyword Reference. The CITIfde Data Format Description and Overview CITIflle is a standardized data format, used for exchanging data between different computers and instruments.
Page 644 This section will define the following terms: package header data array A CITHlle Package A typical package is divided into two parts: The llrst part, the header, is made up of keywords and setup information. The second part, the data, usually consists of one or more arrays of data.
Page 645 Keywords are always the first word on a new line. They are always one continuous word without embedded spaces. A listing of all the keywords used in the latest A.O1.O1 version of CITIfile is shown in “The When reading a CITIfile, unrecognized keywords should be ignored. This allows new keywords to be added, without affecting an older program or instrument that might not use the new keywords.
Page 646 Example 2, An 8510 Display Memory F’ile Example 2 shows a simple file that contains no frequency information. Some instruments do not keep frequency information for display memory data, so this information is not included in the CITIllle package. Note that instrument-specific information (#NA = Network Analyzer information) is also stored in this file.
Page 647 Example 4,861O 3-l&m Frequency List Cd Set File Example 4 shows how CITIfiie may be used to store instrument setup information. In the case of an 8510 Cal Set, a limited instrument state is needed in order to return the instrument to the same state that it was in when the calibration was done.
Page 648 Example (continued) BEGIN BEGIN BEGIN When an instrument’s frequency list mode is used, as it was in Example 4, a list of frequencies is stored in the hle after the VAFLLIST-BEGIN statement. The unsorted frequency list segments used by this instrument to create the VAR-LIST-BEGIN data are defined in the #NA ARB-SEG statements.
Page 649 The CITIfUe Keyword Reference Keyword Explanation and Examples CI’I’IFILE CITIFILE A. 01.01 identifies the file as a CITIEle, and indicates the revision level of the file. The CITIFILE keyword and revision code must precede any other keywords. The CITIFILE keyword at the beginning of the package assures the device reading the file that the data that follows is in the CITIille format.
Page 650 VAR_LIST_BEGIN VAR_LIST_BEGIN indicates that a list of the values for the independent variable (declared in the VAR statement) follow. Only the MAG format is supported in revision A.O1.OO. VAR_LIST_END VAR_LIST_END dehnes the end of a list of values for the independent variable.
Page 651 Index alternate sweep mode, 6-25, 6-106 10 MHz reference adjust, l-11 altitude conditions, 7-26 amplifier testing, 6-147-149 high power, 6-149 parameters, 6-147 power level metering, 6-148 Amplitude and Phase Tracking, 3-27 amplitude search using markers, 2-30 aborting a print or plot, 4-30 amplitude tracking, 2-32 aborting a sequence, 2-67 analog in menu, 6-29...
Page 652 auto sweep time mode noninsertable devices, 5-48 how to set, 5-53 calibration concepts, 6-56-107 auxiliary channels, 6-8 considerations, 6-71 enabling, 6-41 data lost, 12-2 auxiliary channels;stimulus coupling, 6-43 device measurements, 6-71 auxiliary input connector location, l-11 available options, 1-12 for non-insertable devices, 6-107 averaging, 6-50 for noninsertable devices, 5-41 sweep-to-sweep, 6-5...
Page 653 calibration standards, 5-6 compatible plotters, 1 l-6 compatible printers, 1 l-6 definitions, 5-28 compensating for directional coupler electrical offset, 6-73 response, 5-37 fabricating, 6-97 compensating for electrical delay of frequency response of, 6-72 calibration standards, 5-6 fringe capacitance, 6-73 complete service request capabilities (SRI), modifying, 5-29 11-20 optimizing, 5-6...
Page 654 external trigger, l-11 creating a sequence, 2-66 for external monitor, l-11 crosstalk, 6-59 for HP-IB, l-10 reducing, 5-59 for keyboard, l-10 CA status notation, l-7 CW time sweep, 6-25 parallel (centronics) interface, l-10 CW time-to-frequency domain, 6-136 R channel, l-5 serial (RS-232) interface, l-10 test sequence, l-11 data and memory viewing, 2-6...
Page 655 deviation from linear phase measurement, divide measurement data by the memory 2-40 trace, 2-7 device clear (DCl), 11-20 documents device types for HP-IB, 11-17 reference, 6-164 dimensions of 7 mm test port, 7-23 does not respond to parallel poII (PPO), 11-20 dimensions of analyzer, 7-26 DOS format, 11-7 DIN keyboard, 7-25...
Page 656 interpolated, 5-7 fan location, l-10 invalidating, 5-5 fast 2-port calibration, 5-57 one-port calibration, 6-79 faster sweep speed, 5-53 one-port reflection measurements, 5-18 fault location measurements response and isolation, 6-79 using low pass mode, 6-125 response and isolation for reflection features measurements, 5-14 rear panel, l-10 response and isolation for transmission...
Page 657 frequency offset mode operation, 3-4 Gat status notation, l-7 frequency offset mode option, 1-12 G+jB MKR, 2-25 frequency offset operation, 6-116 GPIO interface, l-10 applications, 6- 116 GPIO mode, 6-111, 6-141 compatible instrument modes, 6-l 18 group delay, 6-37 description, 6-l 17 group delay format, 6-32 display annotations, 6- 118 group delay measurement, 2-40...
Page 658 construct a loop structure in a sequence, measure deviation from linear phase, 2-40 2-74 measure devices using the time domain, control the test set switch, 5-57 2-79 couple and uncouple display markers, 2-23 measure electrical length and phase create a limit test sequence, 2-77 distortion, 2-37 create a test sequence, 2-66 measure fixed IF mixers, 3-17...
Page 659 purge a sequence from disk, 2-72 use MKR ZERO to activate a 6xed reference ratio measurements in channel 1 and 2, marker, 2-22 use polar format markers, 2-23 use receiver calibration, 5-12 reduce receiver crosstalk, 5-59 use Smith chart markers, 2-24 reduce receiver noise floor, 5-58 use the tuned receiver mode, 2-64 reduce the averaging factor, 5-54...
Page 660 information messages, 10-l key definitions, 9-l initializing key menu maps, 8-l DOS, 11-7 keys LIF, 11-7 active channel. 6-8 input ports menu, 6-30 inserting a sequence command, 2-68 insertion phase and magnitude response measurement, 2-34 instrument modes, 6-115-118 6 - 4 1 frequency offset, 6-l 16 entry, 6-10-11 network analyzer, 6-l 15...
Page 661 reviewing limit line segments, 2-50 test sequence connector, l-11 running a limit test, 2-50 test set interconnect, l-11 sequencing, 2-77 logarithmic frequency sweep, 6-24 limit test output (LIMIT TEST), 7-24 log mag format, 6-31 linear frequency sweep, 6-23 LOG MKR, 2-24, 2-25 linear magnitude format, 6-35 loop counter sequence, 2-74 linear phase deviation measurement, 2-40...
Page 662 set frequency span, 2-27 measurement averaging set measurement parameters, 2-25 changing, 5-58 setting center frequency, 2-26 measurement calibration setting start frequency, 2-25 concepts, 6-56-107 setting stop frequency, 2-26 measurement channel, how to view a single, smith chart, 6-55 5-55 Smith chart markers, 2-24 measurement channel viewing, 2-5 Smith or polar format, 2-21 measurement data points...
Page 663 measurement title, 4-29 messages measurement type error, 10-l setting, 2-4 information, 10-l measure restart, l-11 message transfer scheme, 11-19 mechanical transfer switch option, l-12 methods of HP-IB operation, 11-17 memory microprocessor, 6-3 available, 12-2 microwave connector care, 2-2 battery backup, 12-2 minimum amplitude search, 2-30 CMOS, 12-2 conserving, 12-6...
Page 664 tuned receiver mode, 6-150 noninsertable devices up conversion, 6-154 calibrating for, 5-41 non-operating storage conditions, 7-26 non-volatile memory, 12-2 mode available, 12-2 auto sweep time, 5-53 notations of display, l-7 frequency offset, 3-7 number of HP-IB devices allowed, 11-17 receiver mode, 3-17 number of Iisteners allowed, 11-17 modes number of points...
Page 665 output video, 7-25 pass/fail indicators in limit testing, 2-51 output power pass fail indicators on display, l-9 specifications, 7-4 PC? status notation, l-8 output power, maintaining during sweep retrace, 5-50 pen number settings, 4-13 outputting measurement results, 4-l outputting multiple plots to a single page using a printer, 4-25 outputting plot fiIes, 4-19 outputting plot files from a PC to a plotter,...
Page 666 power (output) characteristics, 7-4 power ranges, 6-14 plotting a measurement to disk, 4-19 auto, 6-14 plotting arrays, 4-12 manual, 6-14 plotting components deEned, 4-12 power sensor plotting measurement results, 4-3 calibration factor list, 6-104 plotting multiple measurements on a full power sensor calibration data, 5-36 page, 4-26 power sweep, 6-25...
Page 667 configuring a plot function, 4-8 modifying calibration standards, 5-29 configuring a print function, 4-3 modifying TRL calibration standards, 5-30 constructing a loop structure in a sequence, modifying TRMM calibration standards, 2-74 5-32 coupling and uncoupling display markers, offsetting limit lines, 2-51 2-23 outputting a single page of values, 4-30 creating a sequence, 2-66...
Page 668 saving an instrument state, 4-35 programming specifications, 7-23 searching for a target amplitude, 2-30 programs searching for bandwidth, 2-31 example, 1 l-8 searching for maximum amplitude, 2-30 P? status notation, l-8 searching for minimum amplitude, 2-30 purging a sequence from disk, 2-72 sequencing, 3-17 setting center frequency with markers, quadrants plotted, 4-28...
Page 669 reflection response in time domain, 2-83 register contents, 4-33 register data retention, 4-33 sample-and-sweep correction mode, 5-38 sampler/IF correction, 6-5 relative marker mode, 2-20 save a data trace to the display memory, 2-6 relative velocity factor adjusting of, 6-121 saving a fiIe, 4-33 relative velocity for time domain, 2-85 saving a user kit, 5-30 remote control, 11-16...
Page 670 printing a sequence, 2-72 purging a sequence from disk, 2-72 reading using HP-IB, 6-146 running a test sequence, 2-67 special functions menu, 6-144 hiding, 2-18 stopping a sequencing, 2-67 storing a sequence on a disk, 2-71 software subprograms, 2-73 sample, 1 l-8 titles, 6-141 solutions for printing or plotting problems, 4-32...
Page 671 status notations, l-7 swept power conversion compression step attenuator, 6-3 measurement, 3-32 switch protection, 6-21 swept RF/IF mixer measurement, 3-7 step keys, 6-11 switch protection, 6-21 stepped frequency, 6-25 syntax for commands, 11-23 steps of making a measurement, 2-3 synthesized source, 6-2 system accessories, 1 l-6 stimulus function block location, l-4 systematic errors, 5-4...
Page 672 concepts, 6-140-146 transmission response measurement, 2-79 decision making functions, 6-144 velocity factor, 2-85 deleting commands, 2-68 windowing, 6-130 editing, 6-141 time domain measurements, 2-79 editing a sequence, 2-68 time domain option, 1-13 time domain transform, 6-7 GPIO, 6-141 time for measurements, 7-8 HP-GL commands, 6-145 time stamp, 4-30, 11-15 inserting a command, 2-68...
Page 673 load match, 6-94 saving, 5-30 options, 6-99 user kit saved to disk, 5-30 procedure, 6-96 using reason for using, 6-91 requirements for standards, 6-96 Freelance, 4-22 source match, 6-94 terminology, 6-92 valid calibration, enswring, 6-77 TRL standard modification, 5-30 TRM error-correction, 5-24 TRM standard modification, 5-32 trouble solving for printing or plotting, 4-32 vector error-correction, 6-6...

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