Agilent Technologies 8719D User Manual page 657

Network analyzers
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frequency offset mode operation, 3-4
frequency offset mode option, 1-12
frequency offset operation, 6-116
applications, 6- 116
compatible instrument modes, 6-l 18
description, 6-l 17
display annotations, 6- 118
error message, 6-118
frequency hierarchy, 6-l 17
frequency ranges, 6-117
LO frequency, 6-117
offset frequency, 6-l 17
receiver and source requirements, 6- 118
receiver frequency, 6-l 17
spurious SignaIS, 6- 118
test setup, 6-116
frequency range
frequency response, 6-59
frequency response and isolation error-
corrections, 5-14
frequency response error-corrections, 5-9
frequency response of calibration standards,
6-72
frequency selection for mixers, 3-2
frequency span
decrease, 5-53
frequency, stepped, 6-25
frequency, swept, 6-25
frequency-to-time domain, 6-l 19
fringe capacitance, 6-73
front panel access key for softkeys, 9-75
front panel connectors, 7-23
front panel features, 14
front-panel key definitions, 9-l
ftime domain range
defining, 6-12
full-acceptor handshake (AHl), 1 l-20
full two-port calibration, 6-79
fuse location, l-10
G
gain and reverse isolation measurement,
2-56
gain compression measurement, 2-52
gate flags, 2-81
gate parameter setting, 2-81
gate shaping, 2-81
gate span setting, 2-81
gating, 6-6
time domain, 6-135
gating procedure, 2-81
Gat status notation, l-7
G+jB MKR, 2-25
GPIO interface, l-10
GPIO mode, 6-111, 6-141
group delay, 6-37
group delay format, 6-32
group delay measurement, 2-40
group delay mixer measurements, 3-24
group delay or phase mixer measurements,
3-24
group execute trigger response (DTl), 1 l-20
guidelines for code naming, 11-23
H
handshake lines, 11-18
handshaking protocol, 11-14
harmonics
specifications, 7-4
hide softkey menu, 6-11
high dynamic range swept RF/IF conversion
loss, 3-12
high power amplifier testing, 6-149
high power measurements, 2-58
high power system option, 1-12
(Option lD5), 7-24
high stability frequency reference option,
1-12
hold mode, test set switch, 5-57
how to
abort a print or plot process, 4-30
activate a hxed marker, 2-20
activate chop sweep mode, 5-56
activate display markers, 2-17
calculate data statistics, 2-33
calibrate the analyzer receiver to measure
absolute power, 5-40
change measurement averaging, 5-58
change system bandwidth, 5-58
change the sequence title, 2-70
clean connectors, 2-2
clear a sequence from memory, 2-69
compensate for directional coupler
response, 5-37
configure a plot function, 4-8
configure a plot function to disk drive,
4-11
configure a plot function using and HPGL/B
compatible printer, 4-8
configure a plot function using a pen
plotter, 4-10
configure a print function, 4-3

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