Agilent Technologies 8719D User Manual page 33

6-26. EffectofAveragingonaTrace
6-27. Effect of Smoothing on a Trace . . . . . . . . . . . . . . . . . . . . . . .
6-28. IF Bandwidth Reduction . . . . . . . . . . . . . . . . . . . . . . . . . .
6-29. Markers on Trace . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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6-30. Directivity
6-31. Source Match . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6-32. Load Match . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6-33. Sources of Error in a Reflection Measurement . . . . . . . . . . . . . . . .
6-34. Reflection Coefficient
6-35. Effective Directivity Ear . . . . . . . . . . . . . . . . . . . . . . . . . .
6-36. Source Match Esr . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6-37. Reflection Tracking Em . . . . . . . . . . . . . . . . . . . . . . . . . .
6-38. "Perfect Load" Termination
6-39. Measured Effective Directivity . . . . . . . . . . . . . . . . . . . . . . .
6-40. Short Circuit Termination
6-41. Open Circuit Termination . . . . . . . . . . . . . . . . . . . . . . . . . .
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6-42. Measured S11
6-43. Major Sources of Error . . . . . . . . . . . . . . . . . . . . . . . . . . .
6-45. Load Match ELF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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6-46. Isolation EXF
6-47. FuIi Two-Port Error Model . . . . . . . . . . . . . . . . . . . . . . . . .
6-48. FuII Two-Port Error Model Equations . . . . . . . . . . . . . . . . . . . .
6-49. Typical Responses of Calibration Standards after Calibration . . . . . . . . .
6-50. Response versus Sll l-Port Calibration on Log Magnitude Format . . . . . . .
6-51. Response versus Sll l-Port Calibration on Smith Chart . . . . . . . . . . . .
6-52. Response versus FuII Two-Port Calibration
6-53. HP 8719D/20D/22D functional block diagram for a 2-port error-corrected
measurement& system. . . . . . . . . . . . . . . . . . . . . . . . . .
6-54. g-term TRL* error model and generalized coefficients. . . . . . . . . . . . .
6-55. Comparison of Standard and Option 400 Instruments . . . . . . . . . . . . .
6-56. Typical Measurement Setup
6-57. Test Setup for Continuous Sample Mode . . . . . . . . . . . . . . . . . . .
6-58. Test Setup for Sample-and-Sweep Mode . . . . . . . . . . . . . . . . . . .
6-59. Alternate and Chop Sweeps Overlaid . . . . . . . . . . . . . . . . . . . .
6-60. Instrument State Function Block . . . . . . . . . . . . . . . . . . . . . .
6-61. Typical Test Setup for a Frequency Offset Measurement . . . . . . . . . . .
6-62. Device Frequency Domain and Time Domain Reflection Responses . . . . . .
6-63. A Reflection Measurement of Two Cables . . . . . . . . . . . . . . . . . .
6-64. Transmission Measurement in Time Domain Bandpass Mode . . . . . . . . .
6-65. Time Domain Low Pass Measurements of an Unterminated Cable . . . . . . .
6-66. Simulated Low Pass Step and Impulse Response Waveforms (Real Format) . . .
6-67. Low Pass Step Measurements of Common Cable Faults (Real Format) . . . . .
6-68. Time Domain Low Pass Measurement of an AmpIifier SmaII SiiaI Transient
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Response
6-69. Transmission Measurements Using Low Pass Impulse Mode . . . . . . . . . .
6-70. Masking Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6-71. Impulse Width, Sidelobes, and Windowing . . . . . . . . . . . . . . . . . .
6-72. The Effects of Windowing on the Time Domain Responses of a Short Circuit . .
6-73. Response Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6-74. Range Resolution of a Siie Discontinuity
6-75. Sequence of Steps in Gating Operation . . . . . . . . . . . . . . . . . . .
6-76. Gate Shape . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6-77. Amplifier Gain Measurement . . . . . . . . . . . . . . . . . . . . . . . .
6-78. Combined Effects of Amplitude and Phase Modulation . . . . . . . . . . . .
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