Agilent Technologies 8719D User Manual page 671

status notations, l-7
step attenuator, 6-3
switch protection, 6-21
step keys, 6-11
stepped frequency, 6-25
steps of making a measurement, 2-3
stimulus function block location, l-4
stimulus menu, 6-13
stimulus state, 5-5
stop frequency
setting with markers, 2-26
stopping a print or plot, 4-30
stopping a sequencing, 2-67
stop values possible, l-7
storage conditions, 7-26
storage locations, 4-33
storage mediums, 4-33
storing
to external disk, 11-7
to internal disk, 11-7
to internal memory, 11-7
storing a sequence on a disk, 2-71
storing data
methods of, 12-1
structure of HP-IB bus, 11-18
subtract memory trace from the measurement
data trace, 2-7
support and service options, 1-13
sweep
definition of, 6-5
how to set auto sweep time, 5-53
how to set chop sweep, 5-56
sweep modes
alternate, 6-25, 6-106
chop, 6-25, 6-106
sweep retrace, maintaining output power
during, 5-50
sweep speed
sweep speed increase, 5-53
sweep time
auto, 6-18
manual, 6-18
minimum, 6-18
sweep type
how to set, 5-55
sweep types, 6-23
time, 6-25
CW
linear, 6-23
logarithmic, 6-24
power, 6-25
swept frequency, 6-25
swept power conversion compression
measurement, 3-32
swept RF/IF mixer measurement, 3-7
switch protection, 6-21
syntax for commands, 11-23
synthesized source, 6-2
system accessories, 1 l-6
systematic errors, 5-4
characterizing, 6-59
system bandwidth
how to widen, 5-54
system bandwidth, how to change, 5-58
system cabinet, 11-6
system characterization, 5-8
system controller capabilities (Cl,C2,C3),
11-20
system-controller mode, 1 l-2 1, 1 l-22
system controller mode, 6-110
5
system menu, 6-112
system overview, 6-2-3
system testmobile, 1 l-6
T
talk mode (T), 11-21
target amplitude search, 2-30
TEO (no extended talker capabilities), 11-20
techniques
optimizing measurements, 4-43
temperature conditions, 7-26
temperature drift, 5-2
test fixtures
transistors, 1 l-4
testing with Iimit lines, 2-43
test port bias input (BIAS CONNECT), 7-24
test port coupling, 6-17
test port dimensions, 7-23
test port power
increasing, 5-58
test sequence
size of, 6-141
using HP-IB, 6-146
test sequence connector location, l-11
test sequence output (TEST SEQ), 7-24
test sequencing
autostarting, 6-141
cascading multiple sequences, 2-73
changing the sequence title, 2-70
clearing a sequence from memory, 2-69
command information, 6-140