Soc Series Mixed-Signal System Overview - Agilent Technologies 93000 SOC Series Training Manual

2-2
Digital Pins or AWG
stimulate the DUT
SOC Series Mixed-Signal System
Overview
All models of the Agilent 93000 SOC Series have the capability to
perform mixed-signal tests. They are structured alike, and basically
use the same components for mixed-signal tests.
For testing mixed-signal devices, components are needed for
sourcing analog or digital signals to the DUT, and for capturing
and analyzing analog or digital responses of the DUT.
SOC Series Structure for Mixed-Signal Testing
The figure below shows the SOC Series structure for mixed-signal
testing:
SOC Series Structure for Mixed-Signal Testing
The CPU of the workstation that controls the test system also
controls the stimulus to the DUT. The stimulus can be an arbitrary
digital or analog signal.
Digital signals are generated by digital pins of the test system.
Analog signals are generated by an Arbitrary Waveform Generator
(AWG).
Lesson 2 – Introduction to the Test System
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