Agilent Technologies 93000 SOC Series Training Manual page 133

N OT E
SPA: Dual High Speed Sampler (1 GHz 12-bit)
SPB: 3GHz Sampler (3 GHz 12-bit)
TIA: Time Interval Analyzer (High Performance or General
Purpose TIA)
MCA: Multi-site Baseband Analog Measure
For the TIAs and the WGC, the slot locations shown here are the
locations of the frond-end cards for these analog instruments. The
actual instruments are installed in the analog support rack of the test
system.
The fill order of analog modules (in the Agilent 93000 SOC Series
Configuration Guidelines) is as follows. In the figure, for example,
"WGB/D -n" indicates either the High Speed AWG (WGB) or 500M
AWG (WGD), and n is the fill order.
Group 7
SOURCE MEAS SOURCE
224 220 232
8 4 8
WGA/E -3 WDB/E -5 WGA/E -1
223 219 231
7 3 7
WGB/D -3 -5 WGA/E -2
WDA/D/G
222 218 230
6 2 6
WGB/D -2 SPA/B(5,6) WGB/D -1
221 217 229
5 1 5
WGC/F -2/4 Blank WGC/F -1/3
Cage6
MCA Source&Measure module: 231=>232=>224
MCA Measure module:
Fill Order of Analog Modules
In the above figure, if necessary, digital channels can occupy group
6, 7, and/or 8 instead of analog modules according to the fill order
of digital channels:
512 pin testhead: 1 > 2 > 3 > (8)
1024 pin testhead: 1 > 2 > 3 > 4 > 5 > (7) > (6) > (8)
Lesson 2 – Addressing the Analog Modules
Group 8 Group 2
MEAS Digital
228
116
4 8
WDB/E -1
227
115
3 7
-1
WDA/D/G
226
114
2 6
SPA/B(1,2)
225
113
1 5
TIA -1A/B
Cage4 (small TH) Cage2 (small TH)
Cage2 (large TH) Cage4 (large TH)
Same as for WDB
Small Testhead
Group 6
Digital MEAS MEAS
216 212
112
4 8 4
WDB/E -3 WDB/E -2
215 211
111
3 7 3
-3
WDA/D/G WDA/D/G
214 210
110
2 6 2
-4 SPA/B(3,4)
WDA/D/G
213 209
109
1 5 1
WDB/E -4 TIA -2A/B
Cage8
Large Testhead
-2
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