Agilent Technologies 93000 SOC Series Training Manual page 622

Mixed-signal training
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Appendix D
operating characteristics at V
otherwise noted)
PARAMETER
f conv
Maximum conversion rate
BW
Analog input bandwidth
t d(D)
Digital output delay time
Differential gain
Differential phase
t AJ
Aperture jitter time
t d(s)
Sampling delay time
t en
Enable time, OE↓ to valid data
t dis
Disable time, OE↑ to high impedance
Spurious free dynamic range (SFDR)
p
SNR
Signal-to-noise ratio
NOTE 1: C L includes probe and jig capacitance.
t w(H)
CLK (clock)
t d(s)
ANALOG IN
(input signal)
D1 – D8
(output data)
8-BIT HIGH-SPEED ANALOG-TO-DIGITAL CONVERTERS
= 5 V, V
= 2.5 V, V
DD
REFT
TEST CONDITIONS
TLC5510
f I = 1-kHz ramp
p
TLC5510A
At – 1 dB
C L ≤ 10 pF (see Note 1 and Figure 1)
NTSC 40 Institute of Radio Engineers (IRE)
modulation wave,
C L = 10 pF
C L = 10 pF
Input tone = 1 MHz
p
Input tone = 3 MHz
p
Input tone = 6 MHz
p
Input tone = 10 MHz
p
T A = 25°C
Full range
t w(L)
N + 1
N
N – 3
N – 2
t d(D)
Figure 1. I/O Timing Diagram
622
POST OFFICE BOX 655303
SLAS095L – SEPTEMBER 1994 – REVISED JUNE 2003
= 0.5 V, f
= 20 MHz, T
REFB
(CLK)
V I(ANLG) = 0.5 V – 2.5 V
V I(ANLG) = 0 V – 4 V
f conv = 14.3 MSPS
T A = 25°C
Full range
T A = 25°C
Full range
T A = 25°C
Full range
T A = 25°C
Full range
N + 2
N + 3
N – 1
DALLAS, TEXAS 75265
TLC5510, TLC5510A
= 25°C (unless
A
MIN
TYP
MAX
UNIT
20
MSPS
20
MSPS
14
MHz
18
30
ns
1%
0.7
degrees
30
ps
4
ns
5
ns
7
ns
45
43
45
46
dB
43
42
39
39
46
dB
44
N + 4
N
N + 1
5

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