Agilent Technologies 93000 SOC Series Training Manual page 422

Lesson 1 – Test Method Structure
Retrieving Results
from the Vector
Memory
To retrieve measurement data that was measured under the
present primary analog set condition, you can use the following
API:
result_data = Analog.TIA(pin, coreNum).getXXX();
or
result_data = TIA(pin, coreNum).getXXX();
coreNum parameter is used only if one front-end module is
occupied by two TIAs. In this case, coreNum is used to specify
which TIA to retrieve the results.
To retrieve the captured digital data from the vector memory, use
the VECTOR and getVectors as follows:
captured_data=VECTOR(name).getVectors(size);
where, the name parameter means the providing label of vector
variable, and the size parameter means the amount of digital
data to be uploaded.
Computation API
The test method APIs provide an extensive set of computation
algorithms required for a typical mixed-signal device test. The
algorithm covers simple arithmetic operations (e.g. add/subtract/
arrays) through to application-specific calculations (e.g. compute
ADC linearity errors).
Basic arithmetic operations on complex numbers
•
Converting data type, multiplying by a scaling factor, and adding
•
an offset to each array element; for extracting and copying
elements to another array; for Polar and Rectangular coordinate
conversions; and for combining bit blocks from two arrays.
Converting bit-level data
•
Basic arithmetic calculations and for computing the absolute
•
values of array elements
• Performing matrix operations on two-dimensional arrays
Performing bit-wise logical operations on array elements
•
• Searching a specified pattern on array elements
Statistical processing
•
• Computing trigonometric or transcendental functions of array
elements
Time series analysis
•
Special operations like settling time and DG/DP for ADC and DAC
•
devices.
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