Agilent Technologies 93000 SOC Series Training Manual page 262

Mixed-signal training

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Lesson 6 – Executing the DAC Linearity Test

Test Methodology

This section specifies further processing of the retrieved data

before the actual calculation of results.

You can specify averaging per point, per waveform, or both.

You can also specify certain data points and/or whole waveform

cycles to be discarded.

As the number of captured samples is defined with the Analog

Setup Tool, the Analog Setup Tool provides a button labeled

SW AVG/DISC which can be used for calculating the required

number of samples to be taken, when software averaging and

discarding with the testfunction used.

For details see "How to Create a New Waveform Label" on

Calculation Parameter

: Here you enter the nominal full scale voltage (V

This parameter is required by the gain error calculations.

section provides checkboxes which allow you to

control the storage of captured and calculated waveforms in the

Event Datalog file.

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