Agilent Technologies 93000 SOC Series Training Manual page 348

Lesson 4 – Executing the ADC Linearity Test
to methods used for the DAC tests. See the Appendix "Definition
of DAC and ADC Characteristics" on page 567 for more
information.
Waveform Capture Parameters
I P : Type in the pin name for the waveform generator. This
•
NPUT IN
pin sources the test waveform to the DUT.
M : Synchronous or asynchronous.
•
ODE
Synchronous mode means synchronized start of AWG and digital
waveform capturing. The delay between the AWG trigger pulse and
the waveform start must be specified with the Analog Setup Tool.
Asynchronous mode does not care about setup delays. This mode
can be used to capture a certain number of data points of a
waveform that is repeated.
R : Specify the resolution of the ADC as number of bits.
•
ESOLUTION
W : Select the type of waveform that is sourced to the ADC
•
FM TYPE
input: ramp or sine wave. Depending on your selection a different
set of formulas is used to calculate the linearity parameters.
F : Data format, such as binary or 2's complement. Supports
•
ORMAT
also special formats.
M : Can be normal or complementary (inverted).
•
ODE
O : If you specify an offset of N the first N samples of the
•
FFSET
captured data will be discarded. Note that this offset is in addition
to the initial discard defined in the vector variable.
# : Specifies the total number of data points (captured samples)
•
PTS
to be used for the result evaluation.
F : Enter the sampling frequency.
•
REQ
C : Enter the number of cycles within the captured waveform.
•
YCLES
As the number of data points to be captured is even (2
number of cycles should be odd in order to support coherent
sampling.
FS : FSnom is the nominal ADC input voltage swing.
•
NOM
Datalog
The D section provides checkboxes which allow to control
ATALOG
the storage of captured and calculated waveforms in the Event
Datalog file.
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), the