Table of Contents
Advertisement
2. Adjust the pulse generator for the output in figure 3-31.
20NS
-4
+-
-
?
----
3.2v
5NS+
4
DATA,OUTPUT
A
----
Ov
0165OW15
Figure
3-31.
Waveform
for Glitch Test
Setting
for HP
8161A:
Parameter
Output A
Output
B
Input Mode
Norm
---
Period (PER)
20
ns
---
Width (WID)
5
ns
---
Leading Edge (LEE)
1 ns
---
Trailing Edge (TRE)
1
ns
0-0
High Level (HIL)
3.2 V
---
Low Level (LOL)
ov
---
Delay (DEL)
0 ns
---
Output Mode
ENABLE
---
3.
Assign the pod under test to
Analyzer 1 in
the
System Configuration
as in
figure 3-32. Refer to steps a through c if you are unfamiliar with menus.
I
System
Configuration
r
~~~~
Analyzer
1
Name1 [nCICHINE[
Type:
1-J
( Autoscale
)
Unassl
;izg analyzer
+iiT-,
Figure
3-32.
System Configuration
for Glitch Test
a. Move the cursor to the Type field of
Analyzer 1
and press SELECT.
b. Set the analyzer Type to
Timing
using the cursor and SELECT key.
c. Move the cursor to the pod to be tested and assign it to
Machine 1
(Analyzer 1).
Performance
Tests
3-28
HP
1652B/16538
Service Manual
Advertisement
Chapters
Table of Contents
