QuadTech Guardian 6100 Plus Instruction Manual page 50

GB
1 Test Step
1-50
2 Test Mode
GB
3 Current
1-60A
4 High Limit
0.1–510mΩ
5 Low Limit
0-100mΩ
6 Test Time
0, 0.3-999s
7 Twin Port
On/Off
8 CHNL (H-L)
OFF
N/A
9
10
11
* 6mA Limit for UL544NP Circuit Model
The Function Keys allow you to select the backlit item. Use the [↑] and [↓] arrow keys
In any of the menus, when the text appears ghost-like "
If programmed sequentially, paragraphs 2.4.1 through 2.4.6 illustrate a 7-step test as
listed in Table 2-6 and detailed in paragraph 2.4.7, "Programming a Multi-Step Test".
Test parameters must be programmed before instrument offset is performed.
Page 50 of 177
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Table 2-5: Program Parameters
AC Hipot DC Hipot
Test Step Test Step
1-50 1-50
Test Mode Test Mode
AC DC
Voltage Voltage
0.05-5kV 0.05-6kV
High Limit High Limit
0.001-40mA 0.0001-12mA
Low Limit Low Limit
0 - 40mA 0 - 12mA
Arc Limit Dwell Time
1-20mA 0-999s
Arc Filter Arc Limit
3-230kHz 1-10mA
Test Time Arc Filter
0, 0.3-999s 3-230kHz
Ramp Time Test Time
0-999s 0, 0.3-999s
CHNL (H-L) Ramp Time
1, 3 0-999s
CHNL (H-L)
1, 3
Note – Moving through Menus
or the [ENTER] key to move up and down the list.
it means that optional function is not installed and unavailable.
LC
Test Step Test Step
1-50
Test Mode Test Mode
LC
Device
UL544NP, 544P, 0.05-1kV
1563, 2601, 1950
Line Input Low Limit
Normal, Reverse, 0.1-50000MΩ
SF-N, SF-R
GB Switch High Limit
Open/Closed 0-50000MΩ
High Limit Test Time
0.0001-10mA* 0, 0.3-999s
Low Limit Ramp Time
0-10mA*
Power CHNL (H-L)
V, A, VA,
Simulate
Power High
0-300V, 0-20A, 0-
4400VA, 80-300V
Power Low
0-300V, 0-20A, 0-
4400VA, N/A
Test Time
0, 0.3-999s
CHNL (H-L)
3
Note:
150799 Rev A3
IR PA
Test Step
1-50 1-50
Test Mode
IR PA
Voltage Message
13 charc
Under Test
On/Off
0-999s
1, 3
" with dashed lines
Operation
OSC
Test Step
1-50
Test Mode
OSC
Open Check
10-100%
Short Check
0, 100-500%
CHNL (H-L)
1, 3