Omron FZ4 Series User Manual page 60

2
Other
positioning
Detecting defects and foreign materials
Method, objective
Detection of the defect,
stain and spot of plain
measurement objects
Scratches, burrs
Inspection for minor
defects, contamination
and objects with
backgrounds other than
plain
58 Processing Item Selection Guidelines
[Search]
If the shape and background of the measurement object are constant, a processing item such as
one that registers an image as a model and searches for this image is effective.
Reference: "Processing Item List Manual", "Search" (p.57)
[Defect] [Precise Defect (FZ4-Hxxx series)]
Effective for inspection for contamination or spots on plain backgrounds.
Reference: "Processing Item List Manual", "Defect" (p.290)
Reference: "Processing Item List Manual", "Precise Defect" (p.299)
[Defect] [Precise Defect (FZ4-Hxxx series)]
Effective for exterior inspection of scratches and burrs on parts.
Reference: "Processing Item List Manual", "Defect" (p.290)
Reference: "Processing Item List Manual", "Precise Defect" (p.299)
[Fine Matching]
Effective for detection of minor defects and contamination on labels, etc.
Reference: "Processing Item List Manual", "Fine Matching" (p.308)
References
FZ4 User's Manual