Agilent Technologies 93000 SOC Series Training Manual page 515

18-4 Using the Optimizer
Agilent 93000 SOC Series User Training Part 1, October 2004
This results in significantly faster test execution than the standard test
functions by eliminating commands that are not necessary to obtain a
pass/fail result, and reducing communications overhead on those that
remain.
N O T E
The created optimized firmware command sequence is handled inter-
nally, not using the FW-escape test function. Therefore, you cannot edit
the created firmware strings manually.
Optimizeable Testfunctions
The following lists provide information on which test functions can
automatically be optimized in which way.
Table 6 DC Testfunctions
Test Function
continuity (using PMU)
continuity (using PL)
dps connectivity
dps status
dvm
general PMU
high-z
iddq
leakage
operating current
output dc (using PMU)
output dc (using AL)
production iddq
standby current
Table 7 AC Testfunctions
Test Function
functional
global search
parametric functional
jitter
frequency
spec search
Advanced Testflow Control
Optimization
yes
only one continuity test (PL)
per testflow
no
yes
no
yes
yes
no
yes
yes
no
yes
yes
yes
Optimization
yes
no
yes
no
no
no
Expression Support
yes
yes
not applicable
not applicable
yes
yes
yes
yes
yes
yes
yes
yes
yes
yes
Expression Support
yes
no
yes
no
no
no
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