Agilent Technologies 93000 SOC Series Training Manual page 374

Test Result Analysis 13-2 Identifying Failed Pins and Test Cycles (Error Map)
Cycle Oriented Detailed Error Map
Result -
To activate the Cycle Oriented Detailed Error Map select
Acquisition Mode - Force Cycle Oriented.
The Cycle Oriented Detailed Error Map allows you to gather the data of
a specific 8K section of the error map pattern for analysis. These data
are stored in the sequencer memory. The 8K memory in the Force Cycle
Oriented Mode stores all the information of the focused cells, which
includes all failure and all pass data.
If most of the pins of the test device fail, using the Cycle Oriented
Detailed Error Map can be faster then using the Failure Oriented
Detailed Error Map without the Fine Result Granularity.
Per Pin View
Per Pin View shows you either all pins of the currently selected port or
the pins of a user defined format if the format mode is active. If the
Error Count submenu is activated, the total number of errors per pin in
the last executed functional test will be displayed.
The Per Pin View window can be modified via the View Menu. This
Menu contains a Pins Per Row submenu and an Error Count submenu.
Figure 236 The Per Pin View
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Agilent 93000 SOC Series User Training Part 1, October 2004