Agilent Technologies 93000 SOC Series Training Manual page 106

Main Test Setup Components
Vector or Pattern
Test Function (AC) or (DC)
106
format and rising and falling edge timings to input the drive signals to
the device. To compare (recieve) the output data from the device, you
will need the clock (strobe) timing.
The Vector Setup has close dependencies to the Timing Setup. You have
to know how the timing will be used in the Vector Setup before you
begin to generate any vectors.
You will need to know whether you want to drive low (0) or high (1) for
a pin at a particular cycle. You will also want to know if you want to
compare low (L), high (H), don't care (X), or tristatet (Z).
This information will be saved in a file cycle by cycle, and will become
your vector or pattern file.
You cannot generate any vectors if your Timing Setup isn't finished.
When your test vectors are ready, you cannot make major changes to
the Timing Setup, as these would lead to false interpretation of the
Vector Memory contents. You can, however, still change the position of
edges.
After defining the parameters for the device pins, levels, timing and
vectors, you have all the necessary information actually test the device.
The next step is determining what exactly to test. The following method
is just one way of creating your test program:
• Determine whether your testflow will be testfunction based, or data
set based:
– data set based testflows consist of tests — based on data sets —
which test one parameter at a time
– testfunction based testflows have one "global" set of parameters
(pin configuration, timing, levels and vectors) for the complete
flow, with individual tests based on testfunctions.
• Testflow Efficiency:
For maximum efficiency when creating your testflow the following
rules should be obeyed.
– place tests with a high fault coverage early in your testflow
– place time-consuming tests later in your testflow.
There are basically functional, AC and DC tests, so you have to define
the function of the test. For example, the CONTINUITY test would test
the continuity between the device and the tester channels.
Pin Attributes
The pin attributes are the edge delays per pin to fine-tune the calibra-
tion of the device setup. This is in some cases necessary, because there
could be a time delay between the DUT and the tester pin.
Agilent 93000 SOC Series User Training Part 1, October 2004
6-1 Basic Test Elements