Agilent Technologies 93000 SOC Series Training Manual page 514

Advanced Testflow Control 18-4 Using the Optimizer
If two limits are specified, as in this propagation delay and data hold
time example, two functional tests are performed back to back with
timing sets containing each of the two limits.
These timing sets become part of the data that is downloaded to the
per-pin test processors, thus achieving the same throughput as a
simple pass/fail functional test.
level-oriented AC tests For level-oriented AC tests, the same method is applied, in this case
adding new level sets to cover the limit conditions.
Functional tests Functional tests, by themselves, are already as optimized as they can
be.
DC Test Optimization
Figure 314 DC Test Optimization
DC tests For DC tests, the optimization strategy is based on the premise that a
pass/fail DC test may be done with only two firmware command
sequences sent to the tester: one to set up the test, and one to make the
pass/fail determination.
By stringing together these commands into a single message to the
tester, the Throughput Optimizer greatly reduces the communications
overhead. The firmware-escape test function is used to create these
optimized tests, so that they can be viewed in the graphical environ-
ment.
In the example shown, an Input DC (leakage) test has been optimized.
The boxes contain a number of low level firmware commands sepa-
rated by semicolons (;).
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Agilent 93000 SOC Series User Training Part 1, October 2004