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2-40
Table 2-5
Command sequence for memory patterns test example
Command sequence
Initial Setup – perform initial setup of instrument, including setting global parameters that apply to all
tests to be executed.
*RST
Delay 2
:FORM:ELEM READ
:SYST:AZER:STAT ON or OFF
:DISP:ENAB ON or OFF
*** Setup Slot 1 Sources – if the same source settings will be used for all tests, you can set them once as
part of an initial setup. If you must change source levels for different tests, then save the source settings in
the appropriate Memory Pattern for each individual test:
:SOUR:VOLT 500, (@128)
:SOUR:CURR 0.05, (@127)
Note: Allow 250ms maximum settling time for V-source whenever source levels are increased. Fall times
are much slower and settling times up to 1000ms may be required whenever source levels are decreased.
:ROUT:MEM:CLE:ALL
Setup Contact Check Test – Memory Pattern Location 1:
:ROUT:MEM:CHAN 1,(@108,115,118)
:ROUT:MEM:DEL 1,0
:SENS:FUNC 'RES',(@M1)
:SENS:RES:RANG 100,(@M1)
:SENS:RES:NPLC 1,(@M1)
:ROUT:MEM:READ:STAT 1,ON
Model 2790 SourceMeter
Reset 2790; opens all channels.
Wait a little for reset to finish.
Send READINGS only when data is requested.
Enable or Disable A/D Autozero feature. Disabling
increases speed, but A/D accuracy will decrease
over time.
Turn front panel display on or off. Turning off dis-
play increases speed somewhat.
Set V-Source to 500V.
Set I-Source 50mA.
Clear all memory patterns.
Specify relays to close.
Set Memory Delay = 0.
Select 2-wire ohms measurement function.
Select 100 ohm fixed measurement range.
Set A/D integration time to 1 power line cycle,
which is 16.67ms for 60Hz power.
Enable measurement during scan; during a scan the
measurement is initiated automatically. This does not
apply when a memory pattern is recalled as shown
below. In the latter case, the reading must be initiated
explicitly as also shown later in this example.
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