Table of Contents
Advertisement
Chapter 10
Test Support
ARM DDI 0186A
This chapter describes the test methodology employed for the ARM966E-S synthesized
logic and tightly-coupled SRAM. It contains the following sections:
•
About the ARM966E-S test methodology on page 10-2
•
Scan insertion and ATPG on page 10-3
•
BIST of tightly-coupled SRAM on page 10-4.
Copyright © 2000 ARM Limited. All rights reserved.
10-1
Advertisement
Chapters
Table of Contents
