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Specifications and Regulatory Information
Definition of Terms
procedure in "Performing a User Wavelength Calibration" on page 3-17.
• Relative accuracy is the difference between the wavelengths measured by
two different markers on the same trace.
• Tuning Repeatability refers to the wavelength accuracy of returning to a
wavelength after having tuned to a different wavelength.
• Reproducibility refers to the amount of wavelength drift which can occur
over the specified time while the WDCA sweeps across a DUT of known
wavelength.
• Total Amplitude Accuracy is the RSS (root sum of the square) of the total
Amplitude
amplitude accuracy, amplitude stability, polarization dependent loss, and
scale fidelity.
• Scale Fidelity refers to the potential errors in amplitude readout at ampli-
tudes other than at the normalization point. This specification is sometimes
called linearity.
• Polarization Dependence, sometimes termed PDL for polarization depen-
dent loss, refers to the amplitude change that can be seen by varying the po-
larization of the light entering the analyzer. This is not to be confused with
amplitude variations caused by the varying distribution of energy between
the different modes in fiber that is multi mode at the wavelength of interest.
Minimum DUT
The WDCA has finite receiver bandwidth. If the DUT response changes too
Bandwidth
fast as a function of wavelength, the detectors will lag, introducing an error.
The instrument is sensitive to both slew and bandwidth. The bandwidth is pro-
vided as a guide to what the instrument can perform.
Sensitivity
Sensitivity is the smallest amplitude that can be detected, relative to the
amplitude at the top graticule of the display. Increasing sensitivity reduces
trace noise and also increases the sweep time. Leaving sensitivity in Auto
mode allows the instrument to set the maximum sensitivity while maintaining
the fastest sweep time.
Dynamic range
Dynamic Range takes into account interactions between the DUT, laser line
width, and the receiver detection bandwidth. These characteristics limit how
finely you can resolve trace features, particularly if they are close together and
at different amplitudes.
9-4
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