Test Spe-Standby - Avaya Definity SI Maintenance Manual

test spe-standby

test spe-standby
This command allows the technician to perform hardware diagnostic tests on the
standby Switch Processing Element (SPE) in a duplex SPE system. This
command tests all MOs in the standby MO. The STBY-SPE MO itself does not
have any defined tests. Instead, tests are run on the following MOs when the test
spe-standby command is run.
MEMORY
SHDW-LNK
SHDW-CIR
SW-CTL
Refer to these MOs for more details. This command is only for a High or Critical
Reliability systems.
Action/
Object Qualifiers
test short
spe-standby
long
repeat
number
clear
1 If no alarms are registered against the maintenance object then the test sequence is run only once. The long
clear option forces a clear of all alarms if no errors are encountered during testing. The short clear option only
clears alarms pertinent to tests in the short sequence.
Feature Interactions
Testing the standby SPE maintenance object makes the standby SPE unavailable
to take over for the active SPE.
555-233-123
DUPINT PROCR
DATA-BD PR-MAINT
DATA-CHL PI-PT
CARD-MEM PKT-CTRL
Qualifier Description
Option for a brief series of
nondestructive diagnostic tests.
Option for a longer, more
comprehensive series of both
destructive and nondestructive
diagnostic tests.
How many times each test in the
sequence is repeated (1-100)
This option causes the test
sequence (short or long) to
repeat until the alarm (if any) is
cleared or a single test in the
1
sequence fails.
Examples:
test spe-standby long
test spe-standby l
test spe-standby s r 2
test spe-standby c
FL-DATA
PI-BD
SPE_SELEC
Logins Defaults
init Test
inads Sequence
craft = short;
Repeat = 1
Issue 4 May 2002
Feature
Interactions
See below
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