Ddr1 Compliance Test Application - At A Glance - Keysight U7233A Testing Notes

Ddr1 compliance test application
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DDR1 Compliance Test Application — At A Glance
The Keysight U7233A/U7233B DDR1 Compliance Test
test solution that covers electrical, clock and timing parameters of the JEDEC (Joint Electronic
Device Engineering Council) specifications, specifically JESD79E. The software helps you in testing
all the un-buffered device under test (DUT) compliance, with the Keysight 54850A, 8000 and 80000
and 90000A series Infiniium digital storage oscilloscope.
There are 2 main categories of test modes:
The DDR1 Compliance Test
The minimum number of probes required for the tests are:
The tests performed by the DDR1 Compliance Test
NOTE
of the physical layer performance of the DUT. These tests are not replacement for an exhaustive test
validation plan.
DDR SDRAM electrical, clock and timing test standards and specifications are described in the
JESD79E document. For more information, please refer to JEDEC web site at
DDR1 Compliance Testing Methods of Implementation
Compliance Tests - These tests are based on the DDR JEDEC compliance specifications and are
compared to corresponding compliance test limits.
Debug Mode - These tests are not based on any compliance specification. The primary use of
these tests is to perform signal debugging.
Lets you select individual or multiple tests to run.
Lets you identify the device being tested and its configuration.
Shows you how to make oscilloscope connections to the device under test.
Automatically checks for proper oscilloscope configuration.
Automatically sets up the oscilloscope for each test.
Allows you to determine the number of trials for each test, with the new multi trial run capability.
Provides detailed information of each test that has been run. The result of maximum twenty five
worst trials can be displayed at any one time.
Creates a printable HTML report of the tests that have been run.
Clock tests - 1 probe.
Electrical tests - 3 probes.
Clock Timing tests - 3 probes.
Advanced Debug tests - 3 probes.
Application:
Application are intended to provide a quick check
Application is a DDR (Double Data Rate)
www.jedec.org.
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