Tdqss, Dqs Latching Transition To Associated Clock Edge - Test Method Of Implementation; Signals Of Interest; Test Definition Notes From The Specification; Pass Condition - Keysight U7233A Testing Notes

Ddr1 compliance test application
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7
Data Strobe Timing (DST) Tests

tDQSS, DQS Latching Transition to Associated Clock Edge - Test Method of Implementation

The purpose of this test is to verify that the time interval from the data strobe output (DQS falling
edge) access time to the associated clock (crossing point) is within the conformance limit as
specified in the JEDEC Standard JESD79E.

Signals of Interest

Based on the test definition (Write cycle only):
Signals required to perform the test on the oscilloscope:
Optional signal required to separate the signals for the different Ranks:

Test Definition Notes from the Specification

Table 39
Electrical Characteristics and AC Timing
AC Characteristics Parameter
Write command to first DQS latching transition
AC Characteristics Parameter
Write command to first DQS latching transition

PASS Condition

The measured time interval between the rising edge of the data strobe access output and the clock
crossing should be within specification limit.

Measurement Algorithm

1
2
3
4
5
6
98
Data Strobe Signal (DQS as Pin Under Test Signal)
Clock Signal (CK as Reference Signal)
Data Strobe Signal (DQS as Pin Under Test Signal)
Data Signal (DQ as Supporting Signal)
Clock Signal (CK as Reference Signal)
Chip Select Signal (CS as additional signal, which requires additional channel)
Obtain the parameters and settings from the Configuration page.
Pre-condition the scope settings. Verify the actual DUT speed against the user speed selection at
the Setup page.
Perform signal checking on all the signals in-use in the measurement to ensure that it can be
triggered during the test. This includes Vp-p, Vmin, Vmax and Vmid of each signal.
Perform signal skew checking on the DQ-DQS to ensure that it can be triggered during the
Read/Write separation later.
Chip Select (CS) option is only applicable if the user has selected "Yes" for the Verify Selected
Rank Only option in the Configuration page. It uses the CS-DQS for signal separation. Else, by
default, the DQS-DQ is used for signal separation.
Use the InfiniiScan feature with the Setup time and Hold time to find and capture the Read cycle.
Symbol
DDR 333
Min
Max
Min
tDQSS
0.75
1.25
0.75
Symbol
DDR 400A
(2.5-3-3)
Min
Max
Min
tDQSS
0.72
1.25
0.72
DDR1 Compliance Testing Methods of Implementation
DDR 266
DDR 200
Max
Min
Max
1.25
0.75
1.25
DDR 400B
DDR 400C
(3-3-3)
(3-4-4)
Max
Min
Max
1.25
0.72
1.25
Units
Notes
tCK
Units
Notes
tCK

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