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Keysight U7233B Manuals
Manuals and User Guides for Keysight U7233B. We have
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Keysight U7233B manual available for free PDF download: Testing Notes
Keysight U7233B Testing Notes (196 pages)
DDR1 Compliance Test Application
Brand:
Keysight
| Category:
Analytical Instruments
| Size: 5.26 MB
Table of Contents
Quick Reference
3
DDR1 Compliance Test Application - at a Glance
5
Required Equipment and Software
6
In this Book
7
See also
8
Contact Keysight
9
Phone or Fax
9
Table of Contents
11
1 Installing the DDR1 Compliance Test Application
21
Installing the Software
22
Installing the License Key
23
2 Preparing to Take Measurements
25
Calibrating the Oscilloscope
26
Starting the DDR1 Compliance Test Application
27
Online Help Topics
29
3 Single-Ended Signals AC Input Parameters Tests
31
Probing for Single-Ended Signals AC Input Parameters Tests
32
Test Procedure
32
Slewr Test Method of Implementation
35
Signals of Interest
36
Test Definition Notes from the Specification
36
PASS Condition
36
Measurement Algorithm
36
Test References
37
Slewf Test Method of Implementation
38
Signals of Interest
39
Test Definition Notes from the Specification
39
PASS Conditionpass Condition
39
Measurement Algorithm
39
Test References
40
VIH(AC) Test Method of Implementation
41
Signals of Interest
41
Test Definition Notes from the Specification
42
PASS Condition
42
Measurement Algorithm
42
Test References
43
VIH(DC) Test Method of Implementation
44
Signals of Interest
44
Test Definition Notes from the Specification
45
PASS Condition
45
Measurement Algorithm
45
Test References
46
VIL(AC) Test Method of Implementation
47
Signals of Interest
47
Test Definition Notes from the Specification
48
PASS Condition
48
Measurement Algorithm
48
Test References
49
VIL(DC) Test Method of Implementation
50
Signals of Interest
50
Test Definition Notes from the Specification
51
PASS Condition
51
Measurement Algorithm
51
Test References
51
4 Single-Ended Signals AC Output Parameters Tests
54
Probing for Single-Ended Signals AC Output Parameters Tests
54
Test Procedure
54
VOH(AC) Test Method of Implementation
57
Signals of Interest
57
Test Definition Notes from the Specification
58
PASS Condition
58
Measurement Algorithm
58
Test References
58
VOL(AC) Test Method of Implementation
59
Signals of Interest
59
Test Definition Notes from the Specification
60
PASS Condition
60
Measurement Algorithm
60
Test References
60
5 Single-Ended Signals Overshoot/Undershoot Tests
61
Probing for Overshoot/Undershoot Tests
62
Test Procedure
62
AC Overshoot Test Method of Implementation
65
Signals of Interest
65
Test Definition Notes from the Specification
66
PASS Condition
66
Measurement Algorithm
66
Test References
67
AC Undershoot Test Method of Implementation
68
Signals of Interest
68
Test Definition Notes from the Specification
69
PASS Condition
69
Measurement Algorithm
69
Test References
70
6 Differential Signals AC Input Parameters Tests
72
Probing for Differential Signals AC Input Parameters Tests
72
Test Procedure
72
VID(AC), AC Differential Input Vol Tage - Test Method of Implementation
75
Signals of Interest
76
Test Definition Notes from the Specification
77
PASS Condition
77
Measurement Algorithm
77
Test References
77
VIX(AC), AC Differential Input Cross Point Vol Tage -Test Method of Implementation
78
Signals of Interest
79
PASS Condition
79
Measurement Algorithm
79
Test References
79
7 Data Strobe Timing (DST) Tests
81
Probing for Data Strobe Timing Tests
82
Test Procedure
82
Thz(Dq), DQ High Impedance Time from CK/CK# - Test Method of Implementation
85
Signals of Interest
85
Test Definition Notes from the Specification
85
PASS Condition
86
Measurement Algorithm
86
Test References
86
Thz(Dqs), DQS High Impedance Time from CK/CK# - Test Method of Implementation
87
Signals of Interest
87
Test Definition Notes from the Specification
87
PASS Condition
88
Measurement Algorithm
88
Test References
88
Tlz(Dqs), DQS Low-Impedance Time from CK/CK# - Test Method of Implementation
89
Signals of Interest
89
Test Definition Notes from the Specification
89
PASS Condition
90
Measurement Algorithm
90
Test References
90
Tlz(Dq), DQ Low-Impedance Time from CK/CK# - Test Method of Implementation
91
Signals of Interest
91
Test Definition Notes from the Specification
92
PASS Condition
92
Measurement Algorithm
92
Test References
93
Implementation
94
Signals of Interest
94
Test Definition Notes from the Specification
94
PASS Condition
94
Measurement Algorithm
94
Tdqsq, DQS-DQ Skew for DQS and Associated DQ Signals - Test Method of Implementation
94
Test References
95
Tqh, DQ/DQS Output Hold Time from DQS - Test Method of Implementation
96
Signals of Interest
96
Test Definition Notes from the Specification
96
PASS Condition
96
Measurement Algorithm
96
Test References
97
Tdqss, DQS Latching Transition to Associated Clock Edge - Test Method of Implementation
98
Signals of Interest
98
Test Definition Notes from the Specification
98
PASS Condition
98
Measurement Algorithm
98
Test References
99
Tdqsh, DQS Input High Pulse Width - Test Method of Implementation
100
Signals of Interest
100
Test Definition Notes from the Specification
100
PASS Condition
100
Measurement Algorithm
100
Test References
101
Tdqsl, DQS Input Low Pulse Width - Test Method of Implementation
102
Signals of Interest
102
Test Definition Notes from the Specification
102
PASS Condition
102
Measurement Algorithm
102
Test References
103
Tdss, DQS Falling Edge to CK Setup Time - Test Method of Implementation
104
Signals of Interest
104
Test Definition Notes from the Specification
104
PASS Condition
104
Measurement Algorithm
104
Test References
105
Tdsh, DQS Falling Edge Hold Time from CK - Test Method of Implementation
106
Signals of Interest
106
Test Definition Notes from the Specification
106
PASS Condition
106
Measurement Algorithm
106
Test References
107
Twpst, Write Postamble - Test Method of Implementation
108
Signals of Interest
108
Test Definition Notes from the Specification
108
PASS Condition
108
Measurement Algorithm
108
Test References
109
Twpre, Write Preamble - Test Method of Implementation
110
Signals of Interest
110
Test Definition Notes from the Specification
110
PASS Condition
111
Measurement Algorithm
111
Test References
111
Trpre, Read Preamble - Test Method of Implementation
112
Signals of Interest
112
Test Definition Notes from the Specification
112
PASS Condition
112
Measurement Algorithm
113
Test References
113
Trpst, Read Postamble - Test Method of Implementation
114
Signals of Interest
114
Chip Select Signal (CS as Additional Signal, Which Requires an Additional Channel)
114
Test Definition Notes from the Specification
114
PASS Condition
114
Measurement Algorithm
114
Test References
115
8 Clock Timing (CT) Tests
117
Probing for Clock Timing Tests
118
Test Procedure
118
Tac, DQ Output Access Time from CK/CK# - Test Method of Implementation
121
Signals of Interest
121
Test Definition Notes from the Specification
121
Pass Condition
122
Measurement Algorithm
122
Test References
123
Tdqsck, DQS Output Access Time from CK/CK #- Test Method of Implementation
124
Signals of Interest
125
Test Definition Notes from the Specification
126
PASS Condition
126
Measurement Algorithm
126
Test References
127
Average Clock Period - Tck(Avg) - Test Method of Implementation
128
Signals of Interest
128
Test Definition Notes from the Specification
128
PASS Condition
128
Measurement Algorithm
129
Test References
129
Average High Pulse Wid Th - Tch(Avg) - Test Method of Implementation
130
Average High Pulse Width - Tch(Avg) - Test Method of Implementation
130
Measurement Algorithm
130
Pass Condition
130
Signals of Interest
130
Test Definition Notes from the Specification
130
Test References
130
Average Low Pulse Wid Th - Tcl(Avg) - Test Method of Implementation
131
Average Low Pulse Width - Tcl(Avg) - Test Method of Implementation
131
Measurement Algorithm
131
Pass Condition
131
Signals of Interest
131
Test Definition Notes from the Specification
131
Test References
131
Probing for Data Mask Timing Tests
134
Test Procedure
134
Tds(Base), DQ and DM Input Setup Time - Test Method of Implementation
137
Signals of Interest
137
Test Definition Notes from the Specification
137
PASS Condition
137
Measurement Algorithm
138
Test References
138
Tdh(Base), DQ and DM Input Hold Time - Test Method of Implementation
139
Signals of Interest
139
Test Definition Notes from the Specification
139
PASS Condition
140
Measurement Algorithm
140
Test References
140
10 Command and Address Timing (CAT) Tests
141
Probing for Command and Address Timing Tests
142
Test Procedure
143
Tis(Base) - Address and Control Input Setup Time - Test Method of Implementation
145
Signals of Interest
145
Test Definition Notes from the Specification
145
PASS Condition
145
Measurement Algorithm
146
Test References
146
Tih(Base) - Address and Control Input Hold Time - Test Method of Implementation
147
Signals of Interest
147
Test Definition Notes from the Specification
147
PASS Condition
147
Measurement Algorithm
148
Test References
148
11 Advanced Debug Mode Clock Tests
150
Probing for Clock Tests
150
Test Procedure
150
Clock Period Jitter - Tjit(Per) - Test Method of Implementation
154
Signals of Interest
154
Measurement Algorithm
154
Cycle to Cycle Period Jitter - Tjit(CC) - Test Method of Implementation
155
Signals of Interest
155
Measurement Algorithm
155
Cumulative Error - Terr(N Per) - Test Method of Implementation
156
Signals of Interest
156
Measurement Algorithm
156
Half Period Jitter - Tjit(Duty) - Test Method of Implementation
157
Signals of Interest
157
Measurement Algorithm
157
12 Advanced Debug Mode High-Low State Ringing Tests
159
Probing for Advanced Debug Mode High-Low State Ringing Tests
160
Test Procedure
160
High State Ringing Tests Method of Implementation
164
Signals of Interest
164
Measurement Algorithm
165
Low State Ringing Tests Method of Implementation
166
Signals of Interest
166
Measurement Algorithm
167
13 Calibrating the Infiniium Oscilloscope and Probe
169
Required Equipment for Oscilloscope Calibration
170
Internal Calibration
171
Required Equipment for Probe Calibration
174
Probe Calibration
175
Connecting the Probe for Calibration
175
Verifying the Connection
177
Running the Probe Calibration and Deskew
179
Verifying the Probe Calibration
182
Required Triggering Condition Not Met
188
Software License Error
190
Frequency out of Range Error
191
Missing Signal Error
192
Invalid Pre/Postamble Signal Error
193
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