In This Book - Keysight U7233A Testing Notes

In This Book

This manual describes the tests that are performed by the DDR1 Compliance Test
more detail; it contains information from (and refers to) the JESD79E, and it describes how the tests
are performed.
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DDR1 Compliance Testing Methods of Implementation
Chapter 1, "Installing the DDR1 Compliance Test Application shows how to install and license
the automated test application software (if it was purchased separately).
Chapter 2, "Preparing to Take Measurements shows how to start the DDR1 Compliance Test
Application and gives a brief overview of how it is used.
Chapter 3, "Single-Ended Signals AC Input Parameters Tests shows how to run the single-ended
signals AC input parameters tests. This chapter includes maximum ac output logic high and
minimum ac output logic low.
Chapter 4, "Single-Ended Signals AC Output Parameters Tests shows how to run the
single-ended signals AC output parameters tests. This chapter includes input logic high tests,
input logic low tests, and maximum and minimum ac output logic high and low.
Chapter 5, "Single-Ended Signals Overshoot/Undershoot Tests describes the AC overshoot and
undershoot tests probing and method of implementation.
Chapter 6, "Differential Signals AC Input Parameters Tests describes the V
voltage tests and V AC differential cross point voltage tests.
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Chapter 8, "Clock Timing (CT) Tests describes the clock timing operating conditions of SDRAM as
defined in the specification.
Chapter 7, "Data Strobe Timing (DST) Tests describes various data strobe timing tests including
tHZ(DQ), tHZ(DQS), tLZ(DQS), tLZ(DQ), tDQSQ, tQH, tDQSS, tDQSH, tDQSL, tDSS, tDSH,
tWPST, tWPRE, tRPRE and tRPST tests.
Chapter 9, "Data Mask Timing (DMT) Tests describes the DQ and DM input setup time and input
hold time.
Chapter 10, "Command and Address Timing (CAT) Tests describes the address and control input
setup time and input hold time.
Chapter 11, "Advanced Debug Mode Clock Tests describes the measurement clock tests
including clock period jitter, cycle to cycle period jitter, cumulative error, and half period jitter.
Chapter 12, "Advanced Debug Mode High-Low State Ringing Tests shows the high state and low
state ringing test method of implementation.
Chapter 13, "Calibrating the Infiniium Oscilloscope and Probe describes how to calibrate the
oscilloscope in preparation for running the
Chapter 14, "InfiniiMax Probing describes the probe amplifier and probe head recommendations
for testing.
Chapter 15, "Common Error Messages describes the error dialog boxes that can appear and how
to remedy the problem.
automated tests.
Application in
AC differential input
ID
7